| Article | |
| Report number | arXiv:2109.02448 ; CERN-ACC-2022-0010 |
| Title | Measurement of Excess Noise in Thin Film and Metal Foil Resistor Networks |
| Author(s) | Beev, Nikolai (CERN) |
| Publication | 2022-05-16 |
| Imprint | 30 Jun 2022 |
| Number of pages | 6 |
| In: | 2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), Ottawa, Ca, 16 - 19 May 2022 |
| DOI | 10.1109/I2MTC48687.2022.9806690 |
| Subject category | Accelerators and Storage Rings |
| Accelerator/Facility, Experiment | CERN LHC |
| Project | CERN HL-LHC |
| Free keywords | High Luminosity LHC |
| Abstract | Low-frequency resistance fluctuations cause excess noise in biased resistors. The magnitude of these fluctuations varies significantly between different resistor types. In this work measurements of excess noise in precision thin film and metal foil resistor networks are presented. The lowest levels were found in metal foil devices, followed by thin film NiCr networks deposited on silicon substrates. Higher excess noise with a significant spread between different types was seen in thin film devices deposited on ceramic substrates. |
| Copyright/License | preprint: (License: arXiv nonexclusive-distrib 1.0) © 2022-2025 IEEE |
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Record created 2022-07-01, last modified 2023-06-13