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Internal Note
Report number CERN-ACC-NOTE-2025-0017
Title An Interferometric Multi-Sensor Absolute Distance Measurement System for Use in Harsh Environments
Author(s) Sosin, Mateusz (CERN) ; Gonzalez Cobas, Juan David (CERN) ; Mohammed, Isa (Nottingham U.) ; Leach, Richard (Nottingham U.) ; Lipinski, Maciej Marek (CERN) ; Rude, Vivien (CERN) ; Rutkowski, Jaroslaw Marek ; Watrelot, Leonard
Corporate author(s) CERN. Geneva. ATS Department
Publication 2025
Imprint 22 Jul 2025
Number of pages 33
Subject category Accelerators and Storage Rings
Accelerator/Facility, Experiment CERN LHC
Keywords frequency sweeping interferometry ; frequency scanning interferometry ; accelerator alignment ; robust sensor ; distance measurement
Abstract Fourier transform-based frequency sweeping interferometry (FT-FSI) is an interferometric technique that enables absolute distance measurement by detecting the beat frequencies from the interference of reflected signals. This method allows robust, simultaneous distance measurements to multiple targets and is largely immune to variations in the reflected optical signal intensity. As a result, FT-FSI maintains accuracy even when measuring reflectors with low reflectance. FT-FSI has recently been integrated into the full remote alignment system (FRAS) developed for the High-Luminosity Large Hadron Collider (HL-LHC) project at CERN. Designed to operate in harsh environments with electromagnetic interference, ionizing radiation and cryogenic temperatures, FRAS employs FT-FSI for the precise monitoring of the alignment of accelerator components. The system includes specialized interferometers and a range of sensors, including inclinometers, distance sensors, and leveling sensors. This paper presents a comprehensive review of the challenges associated with remote measurement and monitoring systems in harsh environments such as those of particle accelerators. It details the development and validation of the FT-FSI-based measurement system, emphasizing its critical role in enabling micrometric alignment accuracy. The developments and results presented in this work can be readily translated to other demanding metrology applications in harsh environments.
Submitted by [email protected]

 


 Δημιουργία εγγραφής 2025-09-04, τελευταία τροποποίηση 2025-09-04