SSDeez 🥜

I present SSDeez 🥜, A tiny NAND flash-based SSD simulator written in C.

• Page
  • Error Correction Code (ECC)
  • Layer-to-Layer Endurance Variation
  • Page States (Free, Valid, Bad, etc.)
  • Page-Level Statistics
    • Last Program Time
    • Last Read Time
    • Total Program Count
    • Total Read Count
  • "Program Page" Operation
  • Physical Page Address (PPA)
  • "Probablistic" P/E Cycle Counts
  • "Probablistic" Program/Read Latencies
  • "Program Page" Operation
  • "Read Page" Operation
  • Read Disturbance
• Block
  • Block States (Free, Active, Bad, etc.)
  • Block-Level Statistics
    • Last Erase Time
    • Page State Bitmap
    • Total Erase Count
  • "Erase" Operation
  • "Lock/Unlock Blocks" Operations
  • Physical Block Address (PBA)
  • "Probablistic" Erase Latencies
  • Sequential Page Programming
• Plane
  • Plane-Level Statistics
    • Block State Bitmap
    • Least Worn Block
• Die
  • Factory Bad Block Injection
    • "Spatial Correlation" Model
  • One-Time Programmable (OTP) Area
• Chip (Package)
  • Open NAND Flash Interface (ONFI) 1.0
• Channel
• SSD

TODO: More Features

• C99 Compiler
  • Clang 4.0.1+
  • GCC 4.9.3+
• POSIX-conformant Make
  • GNU Make 4.1+
  • NetBSD Make 20160220+
  • Public Domain POSIX Make 2.0.0+

$ git clone https://github.com/jdeokkim/ssdeez && cd ssdeez
$ make && make -C tests
$ ./tests/bin/ssdeez-tests

• A. Tavakkol, J. Gómez-Luna, M. Sadrosadati, S. Ghose, and O. Mutlu, "MQSim: A Framework for Enabling Realistic Studies of Modern Multi-Queue SSD Devices," USENIX Conference on File and Storage Technologies (FAST), Feb. 2018.
• M. Raquibuzzaman, A. Milenkovic and B. Ray, "Intrablock Wear Leveling to Counter Layer-to-Layer Endurance Variation of 3-D NAND Flash Memory," IEEE Transactions on Electron Devices, Jan. 2023.
• Open NAND Flash Interface Working Group, "Open NAND Flash Interface Specification, Revision 1.0," onfi.org, Dec. 2006.
• T. Gleixner, "MTD NAND Driver Programming Interface," The Linux Kernel Documentation, 2025.
• Y. Kai, E. F. Haratsch, O. Mutlu, and K. Mai, "Threshold Voltage Distribution in MLC NAND Flash Memory: Characterization, Analysis, and Modeling," Design, Automation & Test in Europe (DATE) Conference & Exhibition, 2013.
• Y. Kim, B. Tauras, A. Gupta and B. Urgaonkar, "FlashSim: A Simulator for NAND Flash-Based Solid-State Drives," International Conference on Advances in System Simulation (SIMUL), Sep. 2009.

MIT License

Copyright (c) 2025 Jaedeok Kim ([email protected])

Permission is hereby granted, free of charge, to any person obtaining a copy of this software and associated documentation files (the "Software"), to deal in the Software without restriction, including without limitation the rights to use, copy, modify, merge, publish, distribute, sublicense, and/or sell copies of the Software, and to permit persons to whom the Software is furnished to do so, subject to the following conditions:

The above copyright notice and this permission notice shall be included in all copies or substantial portions of the Software.

THE SOFTWARE IS PROVIDED "AS IS", WITHOUT WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, INCLUDING BUT NOT LIMITED TO THE WARRANTIES OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE AND NONINFRINGEMENT. IN NO EVENT SHALL THE AUTHORS OR COPYRIGHT HOLDERS BE LIABLE FOR ANY CLAIM, DAMAGES OR OTHER LIABILITY, WHETHER IN AN ACTION OF CONTRACT, TORT OR OTHERWISE, ARISING FROM, OUT OF OR IN CONNECTION WITH THE SOFTWARE OR THE USE OR OTHER DEALINGS IN THE SOFTWARE.