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100324

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品牌：FAIRCHILD

描述：Low Power Hex TTL-to-ECL Translator

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100324 概述

Low Power Hex TTL-to-ECL Translator 低功耗六角TTL至ECL转换器

100324 数据手册

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July 1988

Revised August 2000

100324

Low Power Hex TTL-to-ECL Translator

General Description

Features

The 100324 is a hex translator, designed to convert TTL

logic levels to 100K ECL logic levels. The inputs are com-

patible with standard or Schottky TTL. A common Enable

(E), when LOW, holds all inverting outputs HIGH and holds

all true outputs LOW. The differential outputs allow each

circuit to be used as an inverting/non-inverting translator, or

as a differential line driver. The output levels are voltage

compensated over the full −4.2V to −5.7V range.

■ Pin/function compatible with 100124

■ Meets 100124 AC specifications

■ 50% power reduction of the 100124

■ Differential outputs

■ 2000V ESD protection

■ −4.2V to −5.7V operating range

■ Available to MIL-STD-883

When the circuit is used in the differential mode, the

100324, due to its high common mode rejection, over-

comes voltage gradients between the TTL and ECL ground

systems. The V_EEand V_TTLpower may be applied in either

■ Available to industrial grade temperature range

(PLCC package only)

order.

The 100324 is pin and function compatible with the 100124

with similar AC performance, but features power dissipa-

tion roughly half of the 100124 to ease system cooling

requirements.

Ordering Code:

Order Number Package Number

Package Description

100324SC

100324PC

100324QC

100324QI

M24B

N24E

V28A

28-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide

24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-010, 0.400 Wide

28-Lead Plastic Lead Chip Carrier (PLCC), JEDEC MO-047, 0.450 Square

Industrial Temperature Range (−40°C to +85°C)

Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code.

Connection Diagrams

24-Pin DIP/SOIC

28-Pin PLCC

DS009878

www.fairchildsemi.com

Pin Descriptions

Truth Table

Pin Names

Description

Data Inputs

Enable Input

Inputs

Outputs

D₀–D₅

D_n

Q_n

Q₀–Q₅

Data Outputs

Complementary

Data Outputs

H = HIGH Voltage Level

L = LOW Voltage Level

Logic Diagram

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Absolute Maximum Ratings(Note 1)

Recommended Operating

Conditions

Storage Temperature (T_STG

Maximum Junction Temperature (T_J)

_EEPin Potential to Ground Pin

)

−65°C to +150°C

+150°C

Case Temperature (T_C)

Commercial

−7.0V to +0.5V

−0.5V to +6.0V

−50 mA

0°C to +85°C

−40°C to +85°C

−5.7V to −4.2V

V_TTLPin Potential to Ground Pin

Input Voltage (DC)

Industrial

Supply Voltage (V_EE

)

Output Current (DC Output HIGH)

ESD (Note 2)

Note 1: The “Absolute Maximum Ratings” are those values beyond which

the safety of the device cannot be guaranteed. The device should not be

operated at these limits. The parametric values defined in the Electrical

Characteristics tables are not guaranteed at the absolute maximum rating.

The “Recommended Operating Conditions” table will define the conditions

for actual device operation.

≥2000V

Note 2: ESD testing conforms to MIL-STD-883, Method 3015.

Commercial Version

DC Electrical Characteristics ^{(Note 3)}

V_EE= −4.2V to −5.7V, V_CC= V_CCA= GND, T_C= 0°C to +85°C, V_TTL= +4.5V to +5.5V

Symbol

Parameter

Output HIGH Voltage

Min

Typ

−955

−1705

Max

−870

Units

Conditions

Loading with

V_OH

V_OL

−1025

−1830

−1035

_IN=V_{IH (Max)}

or V_{IL (Min)}

_IN= V_IH(Min)

Output LOW Voltage

Output HIGH Voltage

Output LOW Voltage

Input HIGH Voltage

−1620

50Ω to −2.0V

Loading with

50Ω to −2.0V

V_OHC

V_OLC

V_IH

−1610

or V_{IL (Max)}

2.0

5.0

Guaranteed HIGH

Signal for All Inputs

Guaranteed LOW

Signal for All Inputs

V_IL

Input LOW Voltage

0.8

V_CD

I_IH

Input Clamp Diode Voltage

Input HIGH Current

Data

−1.2

_IN= −18 mA

_IN= +2.4V,

All Other Inputs V_IN= GND

µA

Enable

120

Input HIGH Current

Breakdown Test, All Inputs

Input LOW Current

Data

_IN= +5.5V,

All Other Inputs = GND

V_IN= +0.4V,

1.0

I_IL

−0.9

−5.4

−70

All Other Inputs V_IN= V_IH

Enable

I_EE

V_EEPower Supply Current

V_TTLPower Supply Current

−45

−22

All Inputs V_IN= +4.0V

All Inputs V_IN= GND

I_TTL

Note 3: The specified limits represent the “worst case” value for the parameter. Since these values normally occur at the temperature extremes, additional

noise immunity and guardbanding can be achieved by decreasing the allowable system operating ranges. Conditions for testing shown in the tables are cho-

sen to guarantee operation under “worst case” conditions.

DIP AC Electric Characteristics

V_EE= −4.2V to −5.7V, V_CC= V_CCA= GND, V_TTL= +4.5V to +5.5V

_C= 0°C

_C= +25°C

T_C= +85°C

Symbol

Parameter

Units

Conditions

Min

Max

Min

Max

Min

Max

t_PLH

t_PHL

t_TLH

t_THL

Propagation Delay

0.50

0.45

3.00

1.80

0.50

2.90

0.50

3.00

Data and Enable to Output

Transition Time

Figures 2, 1

0.45

1.80

0.45

1.80

20% to 80%, 80% to 20%

www.fairchildsemi.com

Commercial Version (Continued)

SOIC and PLCC AC Electrical Characteristics

_EE= −4.2V to −5.7V, V_CC= V_CCA= GND, V_TTL= +4.5V to +5.5V

_C= 0°C

_C= +25°C

T_C= +85°C

Symbol

Parameter

Units

Conditions

Min

Max

Min

Max

Min

Max

t_PLH

t_PHL

t_TLH

t_THL

t_OSHL

Propagation Delay

0.50

0.45

2.80

1.70

0.50

2.70

0.50

2.80

Data and Enable to Output

Transition Time

Figures 2, 1

0.45

1.70

0.95

0.45

1.70

0.95

20% to 80%, 80% to 20%

Maximum Skew Common Edge

Output-to-Output Variation

Data to Output Path

PLCC Only

(Note 4)

0.95

0.70

1.60

1.20

t_OSLH

t_OST

t_PS

Maximum Skew Common Edge

Output-to-Output Variation

Data to Output Path

PLCC Only

(Note 4)

0.70

1.60

1.20

0.70

1.60

1.20

Maximum Skew Opposite Edge

Output-to-Output Variation

Data to Output Path

PLCC Only

(Note 4)

Maximum Skew

PLCC Only

(Note 4)

Pin (Signal) Transition Variation

Data to Output Path

Note 4: Output-to-Output Skew is defined as the absolute value of the difference between the actual propagation delay for any outputs within the same pack-

aged device. The specifications apply to any outputs switching in the same direction either HIGH-to-LOW (t_OSHL), or LOW-to-HIGH (t_OSLH), or in opposite

directions both HL and LH (t_OST). Parameters t_OSTand t_PSguaranteed by design.

www.fairchildsemi.com

Industrial Version

DC Electrical Characteristics ^{(Note 5)}

_EE= −4.2V to −5.7V, V_CC= V_CCA= GND, T_C= −40°C to +85°C, V_TTL= +4.5V to +5.5V

_C= −40°C

T_C= 0°C to +85°C

Symbol

Parameter

Units

Conditions

Loading with

Min

Max

−870

Min

Max

−870

V_OH

Output HIGH Voltage

Output LOW Voltage

Output HIGH Voltage

Output LOW Voltage

Input HIGH Voltage

−1085

−1830

−1095

−1025

−1830

−1035

_IN=V_{IH (Max)}

or V_{IL (Min)}

V_IN= V_IH(Min)

V_OL

−1575

−1620

50Ω to −2.0V

Loading with

50Ω to −2.0V

V_OHC

V_OLC

V_IH

−1565

−1610

or V_{IL (Max)}

2.0

5.0

2.0

5.0

Guaranteed HIGH

Signal for All Inputs

Guaranteed LOW

Signal for All Inputs

V_IL

Input LOW Voltage

0.8

V_CD

I_IH

Input Clamp Diode Voltage

Input HIGH Current

Data

−1.2

_IN= −18 mA

_IN= +2.4V,

All Other Inputs V_IN= GND

µA

Enable

120

Input HIGH Current

Breakdown Test, All Inputs

Input LOW Current

Data

_IN= +5.5V,

All Other Inputs = GND

_IN= +0.4V,

1.0

I_IL

−0.9

−5.4

−70

−0.9

−5.4

−70

All Other Inputs V_IN= V_IH

Enable

I_EE

V_EEPower Supply Current

V_TTLPower Supply Current

−22

All Inputs V_IN= +4.0V

All Inputs V_IN= GND

I_TTL

Note 5: The specified limits represent the “worst case” value for the parameter. Since these values normally occur at the temperature extremes, additional

noise immunity and guardbanding can be achieved by decreasing the allowable system operating ranges. Conditions for testing shown in the tables are cho-

sen to guarantee operation under “worst case” conditions.

AC Electrical Characteristics

V_EE= −4.2V to −5.7V, V_CC= V_CCA= GND, V_TTL= +4.5V to +5.5V

_C= −40°C

_C= +25°C

T_C= +85°C

Symbol

Parameter

Propagation Delay

Units

Conditions

Figures 2, 1

Min

Max

Min

Max

Min

Max

t_PLH

t_PHL

t_TLH

t_THL

0.50

2.80

0.50

2.70

0.50

2.80

Data and Enable to Output

Transition Times

0.35

1.80

0.45

1.70

0.45

1.70

20% to 80%, 80% to 20%

www.fairchildsemi.com

Test Circuit

Note:

•

V_CC, V_CCA= 0V, V_EE= −4.5V, V_TTL= +5.0V, V_IH= +3.0V

L1, L2 and L3 = equal length 50Ω impedance lines

•

_T= 50Ω terminator internal to scope

•

Decoupling 0.1 µF from GND to V_CC, V_EEand V_TTL

•

All unused outputs are loaded with 50Ω to −2V or with equivalent ECL terminator network

_L= Fixture and stray capacitance ≤ 3 pF

FIGURE 1. AC Test Circuit

Switching Waveform

FIGURE 2. Propagation Delay and Transition Times

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Physical Dimensions inches (millimeters) unless otherwise noted

28-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide

Package Number M24B

24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-010, 0.400 Wide

Package Number N24E

www.fairchildsemi.com

Physical Dimensions inches (millimeters) unless otherwise noted (Continued)

28-Lead Plastic Lead Chip Carrier (PLCC), JEDEC MO-047, 0.450 Square)

Package Number V28A

Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and

Fairchild reserves the right at any time without notice to change said circuitry and specifications.

LIFE SUPPORT POLICY

FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT

DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD

SEMICONDUCTOR CORPORATION. As used herein:

1. Life support devices or systems are devices or systems

which, (a) are intended for surgical implant into the

body, or (b) support or sustain life, and (c) whose failure

to perform when properly used in accordance with

instructions for use provided in the labeling, can be rea-

sonably expected to result in a significant injury to the

user.

2. A critical component in any component of a life support

device or system whose failure to perform can be rea-

sonably expected to cause the failure of the life support

device or system, or to affect its safety or effectiveness.

www.fairchildsemi.com

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