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Rietveld

The document discusses Rietveld refinement technique for crystal structure approximation using X-ray diffraction. It describes Bragg's law, typical diffractograms, and information obtained from XRD data. Rietveld refinement software FullProf is explained, including indexing patterns, selecting peak shapes, entering phase and structural information, and refining parameters.

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Anshul Gupta
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0% found this document useful (0 votes)
91 views28 pages

Rietveld

The document discusses Rietveld refinement technique for crystal structure approximation using X-ray diffraction. It describes Bragg's law, typical diffractograms, and information obtained from XRD data. Rietveld refinement software FullProf is explained, including indexing patterns, selecting peak shapes, entering phase and structural information, and refining parameters.

Uploaded by

Anshul Gupta
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
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Download as PDF, TXT or read online on Scribd
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Crystal structure approximation using

Rietveld Refinement technique: Part 1

Rajesh Katoch
PhD, MSE
IIT Kanpur

Interaction with matter & diffraction

Braggs law:
where

n= 2dsin

n is the order of diffraction


is the wavelength of radiation
d is interplanar spacing and
is the angle of incidence

Remember: < 2d for diffraction to occur !

Typical X Ray diffractograms

Information hidden in X-ray spectrum

Extracting information from X-ray data

Search and match


ICDD or JCPDS
High Score Plus
Pearson crystal database

Indexing
Structural refinement

Rietveld refinement

Useful softwares

XPert High score plus


Rietan
MAUD
FullProf
www.ill.eu/sites/fullprof/

In the FullProf Suite toolbar, select ED PCR tab

Following window pops up on clicking ED PCR tab. Note all


the tabs on the right hand side are inactive

Click new data to make a


new data file and all tabs
get activated.

Press the General tab and fill in the sample name at the
given space for title

Click on patterns tab to fill information related to diffraction


pattern

Click the Data file/Peak shape tab to enter the data file and peak
profile parameters

Browse for diffraction data file which should be in .dat


format

To make a data file, copy the intensity


column into notepad. At the top, enter the
value of the start angle, press space, enter
the step, space and then enter the final
angle. Save the file with .dat extension.

Click on the Refinement/simulation tab to inform the


software what you intend to do

For simulation

For refinement

Target material can be


changed as applicable

Click the pattern calculation/peak shape tab to select the peak


shape function

It is a combination of Lorentian and


Gaussian function and holds good for
most of the profiles

Click on background tab to estimate the background

Select one of the background functions from the list

Holds good only if the background is


linear. For sloppy background,
choose linear interpolation

Click on Phases tab to enter the phase and space group of


the material

Tetragonal
Structural model/ Rietveld method

X Ray

Pseudo-Voigt

Press symmetry tab and fill the space group and press OK.

Each descriptor separated by a space

Press the refinement tab and the following window appears

Press the background tab. Insert background parameters

Contd.

Press profile to input profile parameters

Press atoms to fill atomic information

Label: IUPAC symbol of the element with a suffix if more than one atoms
are present of the same type.
Ntyp: Simply IUPAC symbol or oxidation state if the same atom is present
with different oxidation states.
B:
Isotropic thermal parameters
Occ: No of atoms of a particular type in the unit cell

Save the file in the same folder containing the .dat file

Click on this to
Save the file

Select the parameters to vary and run the program

Click on this icon to run the program. It will promptly ask for the data file.
Browse for it and select to open it. You will see the refinement taking place.

Sequence for varying the parameters

Scale factor
Background and instrumental parameters
Lattice parameters and more background parameters
Atomic positions
Peak shape parameters
Atomic occupancies
Thermal parameters
Microstructural parameters

To be continued

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