SourceMeter® SMU Instruments

Technical Information . . . . . . . . . . . . . . . . . . . . . . . . . 2
Selector Guide Source Measure Unit (SMU) Instruments . . . . . . . . . . 8
Series 2600B System SourceMeter
Multi-Channel I-V Test Solutions . . . . . . . . . . . . . . . . 10
2601B Single-Channel System SourceMeter SMU Instrument
(3A DC, 10A Pulse)
2602B Dual-Channel System SourceMeter SMU Instrument
(3A DC, 10A Pulse)
2604B Dual-Channel System SourceMeter SMU Instrument
(3A DC, 10A Pulse, Benchtop Version)
2611B Single-Channel System SourceMeter SMU Instrument
(200V, 10A Pulse)
2612B Dual-Channel System SourceMeter SMU Instrument
(200V, 10A Pulse)
2614B Dual-Channel System SourceMeter SMU Instrument
(200V, 10A Pulse, Benchtop Version)
2634B Dual-Channel System SourceMeter SMU Instrument
(1fA, 10A Pulse, Benchtop Version)
2635B Single-Channel System SourceMeter SMU Instrument
(0.1fA, 10A Pulse)
2636B Dual-Channel System SourceMeter SMU Instrument
(0.1fA, 10A Pulse)
2651A High Power System SourceMeter SMU
Instrument . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
2657A High Power System SourceMeter SMU
Instrument . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32
2450 SourceMeter SMU Instrument . . . . . . . . . . . . . . . . . . 36
Series 2400 SourceMeter SMU Instruments . . . . . . . . . . . . . . . . . 43
2400 General-Purpose SourceMeter SMU Instrument
2401

® (SMU ) INSTRUMENTS
21V SourceMeter SMU Instrument
2410 High Voltage SourceMeter SMU Instrument
2420 High Current SourceMeter SMU Instrument
2425 100W SourceMeter SMU Instrument
SMU INSTRUMENTS

2430 1kW Pulse Mode SourceMeter SMU Instrument

2440 5A SourceMeter SMU Instrument
6430 Sub-Femtoamp Remote SourceMeter
SMU Instrument . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51
SourceMeter

4200-SCS Parameter Analyzer . . . . . . . . . . . . . . . . . . . . . . . . . . 55

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 Technical SourceMeter® SMU Instruments
Information

All of Keithley’s source measure unit (SMU)

instruments can source voltage while measuring Voltmeter Configuration
current and source current while measuring HI
voltage. Some also measure resistance. All are Ileakage
Technical information: Source Measure Unit (SMU) Instruments

Technical information: Source Measure Unit (SMU) Instruments

fully programmable instruments that can stand
alone as complete source, measurement, and V meter Technical Tip: Use the low-
I = 0A
automation solutions. They are also easy to inte- est current range setting to
grate into larger systems. ­minimize Ileakage.

Keithley’s SMU instruments are faster, easier to LO

use, and more economical than using individual Source I = 0A, Measure V
power supplies and measurement instruments
that are harnessed together. Additionally, they
Ammeter Configuration
provide more accurate and repeatable results.
Keithley’s SMU instruments are ideal for produc- HI
tion and automation, yet precise and sensitive +
I meter
enough for laboratory applications.
Technical Tip: Use the low-
V V = 0V Vburden
Keithley’s SMU instruments include our Series est voltage source range to
2400 SourceMeter® SMU instruments, Series ­minimize voltage burden.
2600B System SourceMeter SMU instru- –
LO
ments, and Model 4200-SCS Semiconductor
Source V = 0V, Measure I
Characterization System.
How does an SMU instrument work?
Ohmmeter Configuration
SMU instruments can be used as stand-alone
HI Technical Tip: The Auto
constant voltage or constant current sources and Ohms feature in Series 2400
as stand-alone voltmeters or ammeters. However, I meter Sense HI
SourceMeter SMU instruments
their real strength is their ability to simultane- automatically selects the
ously source and measure—applying voltage to a I = test V meter
current best test current and voltage
device under test (load) and measuring the cur- range for optimal resistance
Sense LO
rent flowing through it, or supplying current to a measurements. Use 4-wire
load and measuring the voltage drop across it. LO remote sensing (Kelvin
Source I = test current, Measure V and I, Remote Sense ON sensing) for the best accuracy.
The SMU instrument topology (Figure 1) pro-
tects the device under test (DUT) from damage
due to accidental overloads, thermal runaway, Power Supply Configuration
and other problems. Both the current and volt- HI
age source are programmable with readback to Sense HI
I meter/
maximize device measurement integrity. If the limit Technical Tip: Use 4-wire
readback reaches a programmed compliance Load remote sensing to deliver an
V
limit, then the source is clamped at the limit, accurate voltage to the load at
providing fault protection. Sense LO
high output current levels.
LO

Source V, Measure I, Remote Sense ON

Power Load Configuration

HI
SMU INSTRUMENTS

I meter Sense HI Technical Tip: Make sure the

voltage limit is set above the
I = desired V meter/ Power maximum voltage output of
V I V meter load limit Source the power source. Use 4-wire
current remote sensing to assure an
Sense LO
accurate voltage measurement
LO
with a large sink current.
Sink I = Desired load current, Measure V, Remote Sense ON

Figure 1. Basic SMU instrument topology Figure 2. SMU instrument configurations

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 Technical SourceMeter® SMU Instruments
Information

2602B SourceMeter SMU Instrument Typical Power Supply

SMU instruments are optimized for speed

Technical information: Source Measure Unit (SMU) Instruments

Technical information: Source Measure Unit (SMU) Instruments

and precision. In most models, both the
Speed source voltages and source currents settle
to within 0.01% of the specified accuracy
in as little as 50µs. This is 50 times faster
0 1 2 3 4 5 6 7 0 1 2 3 4 5 6 7
than what a conventional power supply
ms ms can provide.

Source/
Measure 10µA measurement 10µA measurement
uncertainty = 5nA uncertainty = 2500nA
Precision

Voltage Voltage
SMU instruments offer a much broader
Voltage and range of voltage and current resolution than
Current 1µV 40V 1µV 1mV 40V conventional power supplies. This allows
Resolution Current Current you to use SMU instruments in many more
types of applications.
1pA 3A 1pA 1mA 3A

Source + Sink Source Only A conventional power supply sources

(supplies) voltage and/or current. An
+I +I SMU instrument also sources power, but
it can additionally sink (dissipate) power.
II I II I It provides four-quadrant operation. In
4 Quadrant quadrants I and III it sources power to a
Operation –V +V –V +V load and in quadrants II and IV it sinks
power from a load. (Voltage, current, and
resistance can be measured during source
III IV III IV or sink operations.) A conventional power
supply only functions in quadrant IV.
–I –I

Figure 3. Precision power supplies vs. SMU instruments

Advantages What are the most popular SMU ments offer a Pulse mode, include programma-
Many advantages are achieved by combining instrument configurations? ble delays, and provide a test sequencer that
source and measurement circuitry into a sin- allows you to set up and execute tests without
The fully isolated, floating configuration of PC intervention. Figure 4 illustrates a typical
gle unit: Keithley’s SMU instruments provide maximum precision power supply test that uses an SMU
flexibility in configuring test setups. SMU instrument.
• Supports faster test times with improved instruments can be configured as many different
accuracy and repeatability instruments (Figure 2). This makes them invalu- I-V characterization
• Allows you to source voltage or current while able tools in flexible product test racks and in
R&D test bench tools. Keithley’s SMU instruments are core instruments
making time-stamped voltage, current, and for I-V characterization tests. Their ability to
resistance measurements without changing source voltage while simultaneously measuring
How does an SMU instrument
SMU INSTRUMENTS

connections current or source current while simultaneously

compare to a precision power supply?
• Eliminates many of the complex measuring voltage can be combined with both
The power supply capabilities of Keithley’s DC and sweep operations to perform measure-
synchronization, connection, and SMU instruments surpass those provided by
programming issues associated with using ments such as forward voltage (V F), reverse leak-
conventional power supplies. This is illustrated age, and reverse breakdown voltage (V B) without
multiple instruments in Figure 3. In addition to the highly stable changing a single connection to the device under
• Minimizes the time required for test station DC power source, low noise, and readback, test (Figure 5).
development, setup, and maintenance Keithley’s SMU instruments include other
features not usually available on conventional Built-in features allow multiple SMU instruments
• Lowers the overall cost of system ownership power supplies. For example, most SMU instru- to be synchronized for parametric measure-

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 Technical SourceMeter® SMU Instruments
Information

SMU Instrument I (Amps)

+I
SMU
V
Technical information: Source Measure Unit (SMU) Instruments

Technical information: Source Measure Unit (SMU) Instruments

VD

IC –100 +100
Vbias
V meter –V +V
V GND

Test Description Reading

Idd ON (5V) Power supply current, 14.294 mA –I
V D = 5V, device active
Idd OFF (5V) Power supply current, 50.361 nA Figure 5. Typical diode characterization
V D = 5V, device in standby
Idd ON (3.3V) Power supply current, 12.871 mA
V D = 3.3V, device active
c
Idd ON (3.3V) Power supply current, 42.198 nA
V D = 3.3V, device in standby b
IIL Input leakage current 1.2358 µA
e IC
SMU SMU Ib4
Figure 4. Typical precision power supply tests
I meter Ib3
I source V meter Ib2
ments like threshold voltage, beta, and transcon-
ductance. Output interlocks provide controlled V V Source Ib1
access to a test fixture, which is particularly
important for the extended voltage range of the VCE
Model 2657A (up to 3000V). Guarded 4-wire
connections provide high quality measurements
over a wide range (0.1fA to 10A). Figure 6. Typical family of curves for transistors
A family of semiconductor curves can be
obtained with just two SMU instruments (Figure Instrumentation and software solutions including: managing tests, generating reports,
6). At each step of base current from SMU1, for I-V characterization automating test sequencing, and creating user
SMU2 sweeps VCE and measures IC. An SMU Figure 8 illustrates various hardware and soft- libraries. The Model 4200-SCS is a complete
instrument can store data from a sweep in its ware solutions for I-V characterization. In the one box solution that combines sub-femtoamp
buffer, thus reducing data transfer time to a com- first example, Series 2400 SourceMeter SMU resolution with real-time plotting and analysis.
puter. A family of curves could also be produced instruments are connected to a PC. Key capabilities include instrument and prober
using pulse-sweeps to reduce power dissipation drivers, interfaces to popular modeling/circuit
within a device. In the second example, selected Series 2600B simulation software, and WLR test capabilities.
SourceMeter SMU instruments are connected
Built-In Sweeps with TSP-Link Technology technology. TSP-Link High-Speed I-V Functional Testing
Keithley’s SMU instruments simplify capturing Technology seamlessly integrates multiple Series Keithey’s SMU instruments are designed for
the data needed to characterize a wide range 2600B SMU instruments into a single system that maximum throughput on the production floor.
of devices with the SMU instruments’ built- can be programmed and controlled as a single Each SMU instrument provides high-speed meas-
in pulsed and DC sweeps, including linear instrument through the master 2600B SMU urements, an internal pass/fail comparator, pro-
staircase, logarithmic staircase, and custom instrument or the PC. grammable test sequencing, and digital I/O to
sweeps (Figure 7). Sweeps coupled with other control material handlers (Figure 9). Single- or
The third example is the Model 4200-SCS
SMU INSTRUMENTS

throughput enhancements like built-in limit multi-point pass/fail testing can be performed on
inspection, digital I/O, and a component han- Parameter Analyzer. This system includes an
embedded PC, Windows® operating system, and a wide range of components, such as: network
dling interface are ideal for high speed, nonstop devices, circuit protection devices, active discrete
production environments. All sweep configu- mass storage. It is a complete DC characteriza-
tion solution for semiconductor devices and test devices, and sensors. The onboard pass/fail
rations can be programmed for single-event or comparator simplifies high-speed pass/fail tests
­continuous  operation. structures. It supports up to nine SMU modules
and provides an array of Windows based soft- by avoiding the delay caused by computer and
ware that is so intuitive that even a novice can GPIB bus interaction. The buffer memory stores
use the system with ease. This point-and-click results, again avoiding the computer/GPIB bus
software supplies a full range of functionality, interaction delay.

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 Technical SourceMeter® SMU Instruments
Information
Meas.

Delay Delay Meas.

Level A fixed level sweep outputs a sin-
Technical information: Source Measure Unit (SMU) Instruments

Technical information: Source Measure Unit (SMU) Instruments

Bias Bias gle level of voltage and ­current with
LEVEL, COUNT (number of DELAY- ­multiple measurements to bias and/or
Fixed Level MEASURE cycles), DELAY, BIAS
stress devices.

Stop

Step

Start
Bias Bias The linear staircase sweep goes from
the start level to the stop level in equal
Linear Stair START, STOP, STEP, DELAY, BIAS
­linear steps.

Stop

Start
The logarithmic staircase sweep is
Bias Bias ­similar to the linear staircase sweep,
START, STOP, POINTS/DECADE but it is done on a log scale with a
Logarithmic Stair (5, 10, 25, or 50), DELAY, BIAS specified number of steps per decade.

t off t on
Level

Bias Bias
Pulse LEVEL, COUNT, ton , toff , BIAS

Stop
Step Pulsed sweeps greatly reduce the
Start power dissipation within a device, so
the effects of temperature (drift, device
Bias Bias failure, etc.) are virtually eliminated.
Linear Stair Pulse START, STOP, STEP, ton , toff , BIAS

Stop
Start
Bias Bias
START, STOP, POINTS/DECADE
Logarithmic Stair Pulse (5, 10, 25, or 50), ton , toff , BIAS
SMU INSTRUMENTS

The custom sweep allows you to

Custom sweeps allow the user to c­ onstruct special sweeps by specifying
program individual steps to create the number of measurement points and
Custom waveforms the source level at each point.

Figure 7. Various sweeps supported by SMU instruments.

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 Technical SourceMeter® SMU Instruments
Information

Advanced automation for system throughput

Discrete instruments with Series 2600B TSP® Technology
remote control capability
Any Series 2600B SMU instrument or 2600B-based system can run high
PC Low Cost
Technical information: Source Measure Unit (SMU) Instruments

Technical information: Source Measure Unit (SMU) Instruments

Series 2400 speed, embedded test scripts with Test Script Processor (TSP) technology.
• Modular TSP technology eliminates more than 90% of GPIB/LAN traffic and performs
Series 2400 • PC control with advanced tests without PC intervention (Figure 11). TSP test scripts allow
LabVIEW, Labtracer, or throughput gains of up to 10× over equivalent PC-based programs con-
ACS Basic trolling the same instruments via GPIB. TSP test scripts can be loaded and
Series 2400
run from the front panel or over the system’s GPIB interface. A single TSP
test script, running on the master 2600B unit, can control all Series 2600B
channels and acquire data from any Series 2600B SMU instrument connect-
Scalable, flexible instruments ed to the system with TSP-Link Technology.
with TSP-Link
A Series 2600B-based system can stand alone as a complete measurement
PC Series 2600B Parallel Test and automation solution for semiconductor device or component testing
• Expands test systems with the master 2600B unit controlling sourcing, measurements, pass/fail
without cost of decisions, test sequence flow control, binning, the component handler,
Series 2600B
mainframe prober, and much more.
• PC control or
Series 2600B self-contained Source-Memory List
execution for highest
throughput
The Source-Memory List in Series 2400 SourceMeter SMU instruments,
now available in emulation mode on Series 2600B SourceMeter SMU
Turnkey SMU systems with
instruments, is a key feature for production testing. This programmable
built-in Graphical User Interface (GUI) sequencer lets you set up a complete sequence of up to 100 tests. Each test
Performance + can contain totally different test conditions, measurements, math, pass/fail,
SMU Capability and binning criteria. The tests are executed sequentially without additional
Modules • Complete external commands. Conditional branching leads to different points on the
Model semiconductor test list, depending on the results.
4200-SCS
characterization system
The Source-Memory Sweep feature allows you to store up to 100 unique
• Configurable source and measure configurations in nonvolatile memory. This feature
SMU/Pulse/C-V
channels with remote
makes it possible to sweep through a group of source memory locations
low current preamps and execute a complete test sequence all at one time.
Digital I/O
Figure 8. Examples of I-V characterization solutions Digital communication is one of the most common requirements of a pro-
duction test system because of the need to communicate with handlers,
Need more test pins? binning equipment, and user controls. The SMU instruments’ digital I/O
can also be used to interact with racks of instruments to trigger events,
Keithley’s new TSP-Link Technology is a high speed interface for system start readings, and collect results. Digital triggering and response enable
expansion. It allows you to connect a virtually unlimited number of fast and reliable results that are not dependent on the communication
Series 2600B SourceMeter SMU instruments in a master/slave c­onfigura- bus in use. (Digital I/O is not available on the Model 2401, 2604B, 2614B,
tion (Figure 10). All connected Series 2600B SMU instruments can be and 2634B.)
programmed and operated under the control of the master instrument.
TSP-Link Technology provides an easy way to scale your system’s chan- Contact check
nel count up or down to match changing application needs. There is no The optional Contact Check function eliminates measurement errors and
­chassis  involved. false product failures by verifying good connections to the DUT quickly
and easily before testing begins. In just 350µs (Series 2400) or 1ms (Series
In Series 2400 SourceMeter SMU instruments, Trigger Link can be used to 2600B), this function’s verification and notification routine ensures that
SMU INSTRUMENTS

coordinate multiple instruments with hardware triggers. you have good contact to a device before sending energy through it and
spending time testing it (Figure 12). (The Contact Check function is not
Parallel test capability available on Models 2401, 2604B, 2614B, and 2634B.)
Series 2600B SMU instruments support true parallel testing. Each 2600B Some of the problems this function can detect while verifying connector,
in a system can run its own test sequences, so the number of devices that fixture, and test harness integrity are contact fatigue, breakage, contami-
can be tested in parallel is equivalent to the number of 2600B SMU instru- nation, corrosion, loose or broken connections, and relay failures. If a bad
ments in the system. Parallel testing coupled with the 20,000 rdgs/s of each contact is detected, it can abort the measurement, protecting the DUT.
2600B creates a system that offers extremely high throughput. Three methods of fault notification are provided.

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 Technical SourceMeter® SMU Instruments
Information

SMU Instrument I

Test B
Technical information: Source Measure Unit (SMU) Instruments

Technical information: Source Measure Unit (SMU) Instruments

Test A
V meter
Test C V
Test D

Test
Pass/Fail Test Description Reading Time If Passes Test If A Test Fails Figure 10. Series 2600B back panel
Test A Check Vf(A) at 100mA Forward voltage 0.6534 V 300 µs Go to Test B
against pass/fail limits test at 0.1A
Test B Check Vf(B) at 1A Forward voltage 0.7268 V 300 µs Go to Test C
against pass/fail limits test at 1.0A 1. Bin part to bad bin.
Test C Check leakage current, Reverse leakage 10.122 nA 5 ms Go to Test D 2. Transmit data to
Ir(C), at–10V and test current at –10V computer while
against pass/fail limits bias handler is placing new
part.
Test D Check Vbr(D) Breakdown 146.12 V 1 ms 1. Bin part to good bin. 3. Return to Test A.
voltage 2. Transmit readings to
computer while handler
is placing new part.
3. Return to Test A.

Figure 9. Typical high speed I-V functional test

• Conditional branching Test Script SMU Instument

• Advanced calculations
+
Guard
–
and flow control Guard Sense Pass
• Variable Pass/Fail test
• Prober/Handler control I meter
350µs In/Out HI
• Datalogging/ Contact
Formatting Check Sense HI
(optional) Fail
V or I
Source V meter DUT
Sense LO
DUT Pass
In/Out LO

Figure 11. Series 2600B test script Figure 12. Series 2400 contact check
SMU INSTRUMENTS

The Contact Check function was designed for high throughput 4-wire and contact check function is not suitable for that application and alternative
6-wire test applications. In Series 2400 SourceMeter SMU instruments, approaches should be considered. Series 2600B SMU instruments provide
three reference value choices (2W, 15W, and 50W) are supplied. If the more flexibility with programmable values.
resistance of good connections normally exceeds 50W, then the built-in

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 Selector Guide SourceMeter® SMU Instruments
20–100W BENCH SMU INSTRUMENTS

2400, 2401
2400-C 2410 2420 2425 2440
MODEL 2400-LV 2410-C 2420-C 2425-C 2440-C 2450
Page 43 43 43 43 43 36

POWER OUTPUT 22 W 22 W 66 W 110W 55 W 20 W

Selector guide: Source Measure Unit (SMU) Instruments

CURRENT Capability
Min. ±1 pA ±1 pA ±10 pA ±10 pA ±10 pA ±10 fA

Max ±1.05 A ±1.05 A ±3.15 A ±3.15 A ±5.25 A ±1.05 A

VOLTAGE Capability
Min. ±100 nV ±100 nV ±100 nV ±100 nV ±100 nV ±10 nV
Max. ±21/±210 V 2 ±1100 V ±63 V ±105 V ±42 V ±210 V
Ohms Range 3 <0.2 W to >200 MW <0.2 W to >200 MW <0.2 W to >200 MW <0.2 W to >200 MW <2.0 W to >200 MW <2.0 W to >200 MW
Basic ACCURACY
I 0.035% 0.035% 0.035% 0.035% 0.035% 0.020%
V 0.015% 0.015% 0.015% 0.015% 0.015% 0.012%
W 0.06 % 0.07 % 0.06 % 0.06 % 0.06 % 0.043%

READING SPEED 2,081 rdgs/s 2,081 rdgs/s 2,081 rdgs/s 2,081 rdgs/s 2,081 rdgs/s 3,130 rdgs/s

FEATURE Summary
Pulse Mode No No No No No No
Source-Memory List, Config
Embedded Scripting/
Source-Memory List Source-Memory List Source-Memory List Source-Memory List Source-Memory List List, Test Script Processor
Execution
(TSP®) Technology
Contact Check -C version -C version -C version -C version -C version No
Selectable Front/Rear Inputs Yes Yes Yes Yes Yes Yes

Front: Banana
Test Leads/Cables Banana Banana Banana Banana Banana
Rear: Triax

USB 2.0, LAN/LXI 1.4 Core,

Computer Interface IEEE-488, RS-232 IEEE-488, RS-232 IEEE-488, RS-232 IEEE-488, RS-232 IEEE-488, RS-232
IEEE-488
1 In/4 Out with
1 In/4 Out with 1 In/4 Out with 1 In/4 Out with 1 In/4 Out with
built-in component
Digital I/O built-in component built-in component built-in component built-in component 6 digital I/O-trigger lines
handler interfaces
handler interfaces. handler interfaces. handler interfaces. handler interfaces.
(except Model 2401).
5 inch capacitive touchscreen.
6½-digit resolution. Built-in
“Quickset” configuration
6½-digit resolution. 6½-digit resolution. 6½-digit resolution. 6½-digit resolution. 6½-digit resolution. modes. Context-sensitive
Other 6 wire ohms mode. 6 wire ohms mode. 6 wire ohms mode. 6 wire ohms mode. 6 wire ohms mode. help. Scalable to 32 channels
SMU INSTRUMENTS

LabView drivers. LabView drivers. LabView drivers. LabView drivers. LabView drivers. with TSP-Link Technology.

KickStart out-of-the box
software. LabView drivers. IVI
drivers.
Compliance CE, UL CE CE CE CE CE, NRTL listed
1. In pulse mode.
2. Models 2401 and 2400-LV 21V max.
3. Ohms measurements on Series 2600 instruments are user-calculated.

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Selector Guide SourceMeter® SMU Instruments
20–100W SYSTEM
100–200W POWER SMU INSTRUMENTS LOW CURRENT SMU INSTRUMENTS
SMU INSTRUMENTS
2601B 2611B 2634B
2602B 2612B 2430 2635B
2604B 2614B 2430-C 2651A 2657A 2636B 6430
10 10 43 25 32 10 51
2,000W pulsed/200W
40 W/channel 30 W/channel 1100 W 1 180 W 30 W/channel 2W

Selector guide: Source Measure Unit (SMU) Instruments

DC

±0.1 fA (2635B, 2636B)

±100 fA ±100 fA ±10 pA ±100 fA ±1 fA ±0.01 fA
±1 fA (2634B)
±50A (±100 A when
±3 A DC/10 A pulsed ±1.5 A DC/10 A pulsed ±1.5 A DC/10 A pulsed
±10.5 A 1 two units are connected ±120 mA ±105 mA
per channel per channel per channel
in parallel)

±100 nV ±100 nV ±100 nV ±100 nV ±100 nV ±100 nV ±1 µV

±40 V ±200 V ±105 V ±40 V ±3000 V ±200 V ±210 V
0.5 µW to 40 TW 0.5 µW to 100 TW <0.2 W to >200 MW <0.1 µW to 20 TW <0.4 W to 100 PW 0.5 µW to 10 PW <2.0 W to >20 TW

0.02 % 0.02 % 0.035% 0.02 % 0.02 % 0.02 % 0.035%

0.015% 0.015% 0.015% 0.015% 0.015% 0.015% 0.012%
Based on V and I range Based on V and I range 0.06 % Based on V and I range Based on V and I range Based on V and I range 0.063%
38,500 rdgs/s and 38,500 rdgs/s and
20,000 rdgs/s 20,000 rdgs/s 2,081 rdgs/s 20,000 rdgs/s 256 rdgs/s
1µs per pt digitzer 1µs per pt digitzer

Yes Yes Yes Yes Yes Yes No

Test Script Processor Test Script Processor Test Script Processor Test Script Processor Test Script Processor
Source-Memory List Source-Memory List
(TSP®) Technology (TSP®) (TSP®) (TSP®) (TSP®)
Yes (not available for Yes (not available for Yes (not available for
-C version Yes Yes No
2604B) 2614B) 2634B)
Rear only Rear only Yes Rear only Rear Only Rear only Rear and Preamp
Screw terminal; Screw terminal; Screw terminal;
adapters adapters adapters
Banana HV triax Triax Triax
available for banana available for banana available for banana
or triax or triax or triax
USB 2.0, LAN/LXI-C, USB 2.0, LAN/LXI-C, LAN/LXI, IEEE-488, LAN/LXI-C, IEEE-488, USB 2.0, LAN/LXI,
IEEE-488, RS-232 IEEE-488, RS-232
IEEE-488, RS-232 IEEE-488, RS-232 RS-232 RS-232 IEEE-488, RS-232
14 digital I/O-trigger 14 digital I/O-trigger 1 In/4 Out with built-in 14 digital I/O-trigger
1 In/4 Out with built-in
lines lines component handler 14 digital I/O trigger 14 digital I/O trigger lines
component handler
(no digital I/O available (no digital I/O available interfaces (except lines lines (no digital I/O available
interfaces
for 2604B) for 2614B) Model 2401). for 2634B)
6½-digit resolution. 6½-digit resolution. 6½-digit resolution. 6½-digit resolution. 6½-digit measurement
Scalable to 64 Scalable to 64 Scalable to 32 Scalable to 32 resolution. Scalable
channels with TSP- channels with TSP- channels with TSP- channels with TSP- to 64+ channels with
Link Technology (not Link Technology (not 6½-digit resolution. Link Technology. Link Technology. TSP-Link Technology 6½-digit resolution.
available for 2604B). available for 2614B.) 6 wire ohms mode. 6 wire ohms mode. 6 wire ohms mode. (not available for 6 wire ohms mode.
SMU INSTRUMENTS

Built-in Web-based Built-in Web-based LabView drivers. Built-in Web-based Built-in Web-based 2634B.) Built-in Web- LabView drivers.
characterization characterization characterization characterization based characterization
software. software. LabView software. software. software. LabView
LabView driver. driver. LabView drivers. LabView drivers. driver.
CE, UL CE, UL CE CE, UL CE, ETL CE, UL CE

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 Series 2600B System SourceMeter® SMU Instruments

• Tightly integrated, 4-quadrant

voltage/current source and
measure instruments offer
best in class performance with
6½-digit resolution
• Family of models offer
industry’s widest dynamic
Scalable, integrated source and measure solutions

Scalable, integrated source and measure solutions

range: 10A pulse to 0.1fA and
200V to 100nV
• Built-in, Java-based test
software enables true plug &
play I/V characterization and
test through any browser.
• TSP (Test Script Processing)
technology embeds complete
test programs inside the
instrument for best-in-class
system-level throughput The Series 2600B System SourceMeter SMU Instruments are the industry’s leading current/voltage
• TSP-Link expansion technology source and measure solutions, and are built from Keithley’s third generation SMU technology. The
for multi-channel parallel test Series 2600B offers single- and dual-channel models that combine the capabilities of a precision
without a mainframe power supply, true current source, 6½-digit DMM, arbitrary waveform generator, pulse generator,
and electronic load – all into one tightly integrated instrument. The result is a powerful solution that
• Software emulation for significantly boosts productivity in applications ranging from bench-top I-V characterization through
Keithley’s Model 2400 highly automated production test. For bench-top use, Series 2600B SMU instruments feature built-
SourceMeter SMU Instrument in, Java-based software that enables plug & play I-V testing through any browser, on any computer,
• USB 2.0, LXI-C, GPIB, RS-232, from anywhere in the world. For automated system applications, the Series 2600B’s Test Script
and digital I/O interfaces Processor (TSP®) runs complete test programs from inside the instrument for industry-best through-
put. In larger, multi-channel applications, Keithley’s TSP-Link® Technology works together with TSP
• Free software drivers and Technology to enable high-speed, SMU-per-pin parallel testing. Because Series 2600B SourceMeter
development/debug tools SMU Instruments have fully isolated channels that do not require a mainframe, they can be easily
• Optional ACS-Basic reconfigured and re-deployed as your test applications evolve.
semiconductor component
characterization software Java-based Plug & Play I-V Test Software
The Series 2600B are the only SMU instruments to feature built-in, Java-based test software that
enables true plug & play I-V characterization through any browser, on any computer, from anywhere
in the world. This unique capability boosts productivity across a wide range of applications such as
R&D, education, QA/FA, and more. Simply connect the 2600B to the internet via the supplied LAN
cable, open a browser, type in the 2600B’s I.P. address, and begin testing. Resulting data can be
downloaded to a spreadsheet such as Excel for further analysis and formatting, or for inclusion in
other documents or presentations.

Built-in, Java-based test software runs directly

from any web browser to boost productivity.
SMU INSTRUMENTS

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 Series 2600B System SourceMeter® SMU Instruments

Unmatched Throughput for

Ordering Information Automated Test with TSP Technology
<500ns

2601B Single-channel System For test applications that demand the highest
SourceMeter SMU Instrument levels of automation and throughput, the Model
(3A DC, 10A Pulse)
2600B’s TSP technology delivers industry-best
2602B Dual-channel System performance. TSP technology goes far beyond
Scalable, integrated source and measure solutions

Scalable, integrated source and measure solutions

SourceMeter SMU Instrument SMU1
traditional test command sequencers… it fully
(3A DC, 10A Pulse)
embeds then executes complete test programs SMU2
2604B Dual-channel System from within the SMU instrument itself. This SMU3
SourceMeter SMU
virtually eliminates all the time-consuming
Instrument (3A DC, 10A
Pulse, Benchtop Version) bus communications to and from the PC con-
SMU4
troller, and thus dramatically improves overall
2611B Single-channel System
SourceMeter SMU Instrument
test times.
(200V, 10A Pulse)
• Conditional branching Test Script All channels in the TSP-Link system are
2612B Dual-channel System • Advanced calculations
synch­ronized to under 500ns.
and flow control
SourceMeter SMU Instrument • Variables
(200V, 10A Pulse) • Pass/Fail test
• Prober/Handler control Model 2400 Software Emulation
2614B Dual-channel System • Datalogging/
SourceMeter SMU Formatting The Series 2600B is compatible with test
Instrument (200V, 10A code developed for Keithley’s Model 2400
Pulse, Benchtop Version) DUT
SourceMeter SMU instrument. This enables
2634B Dual-channel System an easier upgrade from Model 2400-based
SourceMeter SMU test systems to Series 2600B, and can improve
Instrument (1fA, 10A Pulse, TSP technology executes complete test pro- test speeds by as much as 80%. In addition, it
Benchtop Version) grams from the 2600B’s non-volatile memory. provides a migration path from SCPI program-
2635B Single-channel System ming to Keithley’s TSP technology, which when
SourceMeter SMU Instrument SMU-Per-Pin Parallel Testing
(0.1fA, 10A Pulse)
implemented can improve test times even more.
with TSP-Link Technology For complete support of legacy test systems, the
2636B Dual-channel System Model 2400’s Source-Memory-List test sequencer
SourceMeter SMU Instrument
TSP-Link is a channel expansion bus that enables
(0.1fA, 10A Pulse) multiple Series 2600B’s to be inter-connected is also fully supported in this mode.
and function as a single, tightly-synchronized,
multi-channel system. The 2600B’s TSP-Link Third-generation SMU Instrument
Accessories Supplied
Technology works together with its TSP technol- Design Ensures Faster Test Times
Operators and Programming Manuals
ogy to enable high-speed, SMU-per-pin parallel Based on the proven architecture of earlier Series
2600-ALG-2: Low Noise Triax 2600 instruments, the Series 2600B’s SMU instru-
Cable with Alligator Clips, 2m
testing. Unlike other high-speed solutions such
(6.6 ft.) (two supplied with 2634B as large ATE systems, the 2600B achieves parallel ment design enhances test speed in several ways.
and 2636B, one with 2635B) test performance without the cost or burden of For example, while earlier designs used a parallel
2600-Kit: Screw Terminal
a mainframe. The TSP-Link based system also current ranging topology, the Series 2600B uses a
Connector Kit (2601B/ enables superior flexibility, allowing for quick patented series ranging t­opology, which provides
2602B/2604B/2611B/2612B/2614B) and easy system re-configuration as test require- faster and smoother range ­changes and outputs
2600B-800A: Series 2400 Emulation ments change. that settle more quickly.
Script for Series 2600B (supplied
on USB memory stick)
7709-308A: Digital I/O Connector Test 1 Test 2 Test 3
SMU INSTRUMENTS

running running running

CA-180-3A: TSP-Link/Ethernet
Cable (two per unit)
TSP Express Software Tool (embedded)
Test Script Builder Software (supplied
on CD) GPIB, USB, or Ethernet To To To
TSP-Link Device 1 Device 2 Device 3
LabVIEW Driver (supplied on CD)
ACS Basic Edition Software (optional) SMU-Per-Pin Parallel Testing using TSP and TSP-Link improves test throughput and lowers the
cost of test.

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 Series 2600B System SourceMeter® SMU Instruments

The Series 2600B SMU instrument design sup- Table 1. Series 2600B software tools
ports two modes of operation for use with a vari- Feature/
ety of loads. In normal mode, the SMU instru- Functionality ACS Basic Edition Java-based Plug & Play Test Script Builder (TSB)
ment provides high bandwidth performance Semiconductor Quick Start Java-based Plug &
for maximum throughput. In high capacitance characterization software for Play Tool for fast and easy I-V Custom script writing tool for
Description
component test, verification, testing, primarily for bench and TSP instruments
(high-C) mode, the SMU instrument uses a slow- lab users
and analysis
er bandwidth to provide robust performance
Scalable, integrated source and measure solutions

Scalable, integrated source and measure solutions

Supported Series 2400, Series 2600B,
with higher capacitive loads. hardware 4200-SCS
Series 2600B Series 2600B, Series 3700

Simplify Semiconductor Component Supported

GPIB, LAN/LXI LAN/LXI GPIB, RS-232, LAN/LXI, USB
Test, Verification, and Analysis buses
Linear/Log Sweeps, Pulsing,
The optional ACS Basic Edition software Custom sweeps, Single point
maximizes the productivity of customers who Intuitive, wizard-based GUI, Custom scripts with total
source-measures. Note: Uses
perform packaged part characterization during Functionality Rich set of test libraries, flexibility, full featured
new 2600B’s new API’s for
curve trace capability debugger
development, quality verification, or failure anal- precision timing and channel
ysis. Key features include: synchronization
• Rich set of easy-to-access test libraries Data Formulator tool with wide
.csv export User defined
management range of math functions
• Script editor for fast customization of Not necessary. Free Download or CD Install
existing tests Installation Optional purchase
Embedded in the instrument. on PC.
• Data tool for comparing results quickly
• Formulator tool that analyzes captured curves
and provides a wide range of math functions
For more information about the ACS Basic
Edition software, please refer to the ACS Basic
Edition data sheet.
Powerful Software Tools
In addition to the embedded Java-based plug &
play software and optional ACS Basic Edition
software, the free Test Script Builder software
tool is provided to help users create, modify,
debug, and store TSP test scripts. Table 1
describes key features of Series 2600B soft-
ware tools.
Three New Dual-Channel Bench-
Top Models of Series 2600B Offer
Industry-Best Value and Performance
For applications that do not require leading-edge
system-level automation capabilities, Keithley
has expanded the Series 2600B to include 3 new When you need to acquire data on a packaged
value-priced “bench-top” models – the 2604B, part quickly, the wizard-based user interface
2614B, and 2634B. These models offer similar of ACS Basic Edition makes it easy to find and
performance to Models 2602B, 2612B, and run the test you want, like this common FET
2636B, respectively, however do not include TSP- curve trace test.
Link, Contact Check, and Digital I/O capabilities.
SMU INSTRUMENTS

Complete Automated provide innovative measurement features and

System Solutions system flexibility, scalable to your needs. The
Keithley’s S500 Integrated Test Systems are unique measurement capability, combined
highly configurable, instrument-based systems with the powerful and flexible Automated
for semiconductor characterization at the Characterization Suite (ACS) software, provides The flexible software architecture of ACS Basic
Edition allows configuring systems with a wide
device, wafer, or cassette level. Built on our a comprehensive range of applications and fea- range of controllers and test fixtures, as well as the
proven Series 2600B System SourceMeter SMU tures not offered on other comparable systems exact number of SourceMeter SMU instruments the
instruments, our S500 Integrated Test Systems on the market. application requires.

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 Series 2600B System SourceMeter® SMU Instruments

In the first and third quadrants, Series 2600B SMU instruments operate as
Typical Applications
a source, delivering power to a load. In the second and fourth quadrants,
I-V functional test and characterization of a wide they operate as a sink, dissipating power internally.
range of devices, including:
• Discrete and passive components +10A

–– Two-leaded – Sensors, disk drive heads, +5A

metal oxide varistors (MOVs), diodes, zener
Scalable, integrated source and measure solutions

Scalable, integrated source and measure solutions

+3A
diodes, sensors, capacitors, thermistors
+1.5A
–– Three-leaded – Small signal bipolar junction +1A
transistors (BJTs), field-effect transistors
DC
(FETs), and more 0A
Pulse
• Simple ICs – Optos, drivers, switches, sensors,
–1A
converters, regulators –1.5A

• Integrated devices – small scale integrated (SSI) –3A

and large scale integrated (LSI)
–5A
–– Analog ICs
–10A
–– Radio frequency integrated circuits (RFICs)
–40V –35V –20V –6V 0V +6V +20V +35V +40V
–– Application specific integrated circuits (ASICs)
–– System on a chip (SOC) devices Models 2601B, 2602B, and 2604B I-V capability
• Optoelectronic devices such as light-emitting
diodes (LEDs), laser diodes, high brightness
LEDs (HBLEDs), vertical cavity surface-emitting +10A

lasers (VCSELs), displays

• Wafer level reliability
–– NBTI, TDDB, HCI, electromigration +1.5A
+1A
• Solar Cells
+0.1A
• Batteries 0A
DC
–0.1A Pulse
• And more...
–1A
–1.5A

–10A
–200V –180V –20V –5V 0V +5V +20V +180V +200V

Models 2611B, 2612B, and 2614B I-V capability

+10A

Model 2604B/2614B rear panel

(Single channels 2601B, 2611B, 2635B not shown)
+1.5A
+1A

+0.1A DC
SMU INSTRUMENTS
0A
–0.1A Pulse

–1A
–1.5A

–10A
–200V –180V –20V –5V 0V +5V +20V +180V +200V

Model 2636B rear panel Models 2634B, 2635B, and 2636B I-V capability

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 Series 2600B System SourceMeter® SMU Instruments

SPECIFICATION CONDITIONS ADDITIONAL SOURCE SPECIFICATIONS

This document contains specifications and supplemental information for the Models 2601B, TRANSIENT RESPONSE TIME: <70µs for the output to recover to within 0.1% for a 10% to 90%
2602B, and 2604B System SourceMeter® SMU instruments. Specifications are the standards against step change in load.
which the Models 2601B, 2602B, and 2604B are tested. Upon leaving the factory, the 2601B, VOLTAGE SOURCE OUTPUT SETTLING TIME: Time required to reach within 0.1% of final value
2602B, and 2604B meet these specifications. Supplemental and typical values are non-­warranted, after source level command is processed on a fixed range.
apply at 23°C, and are provided solely as useful information. 100mV, 1V Ranges: <50µs typical.
Accuracy specifications are applicable for both normal and high capacitance modes. 6V Range: <100µs typical.
The source and measurement accuracies are specified at the SourceMeter CHANNEL A (2601B, 40V Range 10: <150µs typical.
2602B, and 2604B) or SourceMeter CHANNEL B (2602B and 2604B) terminals under the following
conditions: CURRENT SOURCE OUTPUT SETTLING TIME: Time required to reach within 0.1% of final value
after source level command is processed on a fixed range. Values below for Iout × R load = 1V
1. 23°C ± 5°C, <70% relative humidity
unless noted.
2. After 2 hour warm-up
3A Range: <80µs typical (current less than 2.5A, R load >2W).
3. Speed normal (1 NPLC)
Series 2600B specifications

Series 2600B specifications

1A–10mA Ranges: <80µs typical (R load >6W).
4. A/D auto-zero enabled
1mA Range: <100µs typical.
5. Remote sense operation or properly zeroed local operation
100µA Range: <150µs typical.
6. Calibration period = 1 year
10µA Range: <500µs typical.
1µA Range: <2.5ms typical.
SOURCE SPECIFICATIONS 100nA Range: <25ms typical.
Voltage Source Specifications DC FLOATING VOLTAGE: Output can be floated up to ±250VDC from chassis ground.
REMOTE SENSE OPERATING RANGE 11:
VOLTAGE PROGRAMMING ACCURACY1 Maximum voltage between HI and SENSE HI = 3V .
Accuracy (1 Year) Typical Noise Maximum voltage between LO and SENSE LO = 3V .
Programming 23°C ±5°C (peak-peak) VOLTAGE OUTPUT HEADROOM:
Range Resolution ±(% rdg. + volts) 0.1Hz–10Hz 40V Range: Max. output voltage = 42V – total voltage drop across source leads (maximum 1W
100 mV   5 µV 0.02% + 250 µV  20 µV per source lead).
1 V  50 µV 0.02% + 400 µV  50 µV 6V Range: Max. output voltage = 8V – total voltage drop across source leads (maximum 1W per
6 V  50 µV 0.02% + 1.8 mV 100 µV source lead).
40 V 500 µV 0.02% + 12 mV 500 µV OVER TEMPERATURE PROTECTION: Internally sensed temperature overload puts unit in
TEMPERATURE COEFFICIENT (0°–18°C and 28°–50°C) 2: ±(0.15 × accuracy specification)/°C. standby mode.
Applicable for normal mode only. Not applicable for high capacitance mode. VOLTAGE SOURCE RANGE CHANGE OVERSHOOT: <300mV + 0.1% of larger range (typical).
MAXiMUM OUTPUT POWER AND SOURCE/SINK LIMITS 3: 40.4W per channel maximum. Overshoot into an 100kW load, 20MHz BW.
±40.4V @ ±1.0A, ±6.06V @ ±3.0A, four quadrant source or sink operation. CURRENT SOURCE RANGE CHANGE OVERSHOOT: <5% of larger range + 300mV/R load (typical
VOLTAGE REGULATION: Line: 0.01% of range. Load: ±(0.01% of range + 100µV). with source settling set to SETTLE_SMOOTH_100NA). See Current Source Output Settling Time
NOISE 10Hz–20MHz: <20mV peak-peak (typical), <3mV RMS (typical), 6V range. for additional test conditions.
CURRENT LIMIT/COMPLIANCE 4: Bipolar current limit (compliance) set with single value. NOTES
Minimum value is 10nA. Accuracy same as current source.
1. Add 50µV to source accuracy specifications per volt of HI lead drop.
OVERSHOOT: <±(0.1% + 10mV) typical. Step size = 10% to 90% of range, resistive load, 2. High Capacitance Mode accuracy is applicable at 23°C ±5°C only.
maximum c­ urrent limit/compliance. 3. Full power source operation regardless of load to 30°C ambient. Above 30°C and/or power sink operation,
GUARD OFFSET VOLTAGE: <4mV typical. Current <10mA. refer to “Operating Boundaries” in the Series 2600B Reference Manual for additional power derating
information.
Current Source Specifications 4. For sink mode operation (quadrants II and IV), add 0.06% of limit range to the corresponding current limit
accuracy specifications. Specifications apply with sink mode operation enabled.
CURRENT PROGRAMMING ACCURACY 5. Full power source operation regardless of load to 30°C ambient. Above 30°C and/or power sink operation,
refer to “Operating Boundaries” in the Series 2600B Reference Manual for additional power derating
Accuracy (1 Year) Typical Noise information.
Programming 23°C ±5°C (peak-peak) 6. 10A range accessible only in pulse mode.
Range Resolution ±(% rdg. + amps) 0.1Hz–10Hz 7. High Capacitance Mode accuracy is applicable at 23°C ±5°C only.
100 nA 2 pA 0.06% + 100 pA 5 pA 8. Full power source operation regardless of load to 30°C ambient. Above 30°C and/or power sink operation,
refer to “Operating Boundaries” in the Series 2600B Reference Manual for additional power derating
1 µA 20 pA 0.03% + 800 pA 25 pA information.
10  µA 200 pA 0.03% + 5 nA 60 pA 9. For sink mode operation (quadrants II and IV), add 10% of compliance range and ±0.02% of limit setting to
100 µA 2 nA 0.03% + 60 nA 3 nA corresponding voltage source specification. For 100mV range add an additional 60mV of uncertainty.
1 mA 20 nA 0.03% + 300 nA 6 nA 10. Add 150μs when measuring on the 1A range.
11. Add 50μV to source accuracy specifications per volt of HI lead drop.
10 mA 200 nA 0.03% + 6 µA 200 nA
100 mA 2 µA 0.03% + 30 µA 600 nA
SMU INSTRUMENTS

1 A 5 20 µA 0.05% + 1.8 mA 70 µA
3 A 5 20 µA 0.06% + 4 mA 150 µA
10 A 5, 6 200 µA 0.5  % + 40 mA (typical)
TEMPERATURE COEFFICIENT (0°–18°C and 28°–50°C) 7: ±(0.15 × accuracy specification)/°C.
MAXiMUM OUTPUT POWER AND SOURCE/SINK LIMITS 8: 40.4W per channel maximum.
±1.01A @ ±40.0V , ±3.03A @ ±6.0V , four quadrant source or sink operation.
CURRENT REGULATION: Line: 0.01% of range. Load: ±(0.01% of range + 100pA).
VOLTAGE LIMIT/COMPLIANCE 9: Bipolar voltage limit (compliance) set with a single value.
Minimum value is 10mV. Accuracy is the same as voltage source.
OVERSHOOT: <±0.1% typical (step size = 10% to 90% of range, resistive load; see Current Source
Output Settling Time for additional test conditions).

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 2601B, 2602B, System SourceMeter® SMU Instruments
2604B

SOURCE SPECIFICATIONS (continued) METER SPECIFICATIONS

PULSE SPECIFICATIONS VOLTAGE MEASUREMENT ACCURACY 16, 17
Maximum Maximum Maximum Accuracy (1 Year)
Region Current Limit Pulse Width 12 Duty Cycle 13 Default Display Input 23°C ±5°C
Range Resolution 18 Resistance ±(% rdg. + volts)
1 1 A @ 40 V DC, no limit 100%
100 mV 100 nV >10 GW 0.015% + 150 µV
1 3 A @ 6 V DC, no limit 100%
1 V   1 µV >10 GW 0.015% + 200 µV
2 1.5 A @ 40 V 100 ms 25%
6 V   10 µV >10 GW 0.015% + 1 mV
3 5 A @ 35 V 4 ms 4%
40 V   10 µV >10 GW 0.015% + 8 mV
4 10 A @ 20 V 1.8 ms 1%
TEMPERATURE COEFFICIENT (0°–18°C and 28°–50°C) 19: ±(0.15 × accuracy specification)/°C.
MINIMUM PROGRAMMABLE PULSE WIDTH 14, 15: 100µs. NOTE: Minimum pulse width for settled Applicable for normal mode only. Not applicable for high capacitance mode.
source at a given I/V output and load can be longer than 100µs.
Series 2600B specifications

Series 2600B specifications

Pulse width programming resolution: 1µs. CURRENT MEASUREMENT ACCURACY 17
Pulse width programming accuracy 15: ±5µs. Accuracy (1 Year)
pulse width jitter: 2µs (typical). Default Display Voltage 23°C ±5°C
Range Resolution 20 Burden 21 ±(% rdg. + amps)
Quadrant Diagram:
100 nA 100 fA <1 mV 0.05% + 100 pA
+10A
1 µA 1 pA <1 mV 0.025% + 500 pA
4 10 µA 10 pA <1 mV 0.025% + 1.5 nA
+5A
100 µA 100 pA <1 mV 0.02% + 25 nA
+3A
3 3 1 mA 1 nA <1 mV 0.02% + 200 nA
+1.5A 10 mA 10 nA <1 mV 0.02% + 2.5 µA
2 2
+1A
100 mA 100 nA <1 mV 0.02% + 20 µA
1 A 1 µA <1 mV 0.03% + 1.5 mA
0A 1
DC 3 A 1 µA <1 mV 0.05% + 3.5 mA
–1A
Pulse 10 A 22 10 µA <1 mV 0.4% + 25 mA (typical)
2 2 Pulse
–1.5A Current Measure Settling Time (Time for measurement to settle after a Vstep) 23: Time
Pulse
–3A 3
required to reach within 0.1% of final value after source level command is processed on a fixed
3
range. Values for Vout = 1V unless noted. Current Range: 1mA. Settling Time: <100μs (typical).
–5A
4 TEMPERATURE COEFFICIENT (0°–18°C and 28°–50°C) 24: ±(0.15 × accuracy specification/°C.
Applicable for normal mode only. Not applicable for high capacitance mode.
–10A

–40V –35V –20V –6V 0V +6V +20V +35V +40V

Contact Check 25 (not available on Model 2604B)
Maximum Measurement Accuracy (1 Year)
NOTES Time To Memory 23°C ±5°C
12. Times measured from the start of pulse to the start off-time; see figure below. Speed For 60Hz (50Hz) ±(%rdg. + ohms)
Pulse Level
FAST 1 (1.2) ms 5% + 10 W
90%
MEDIUM 4 (5) ms 5% + 1 W
Start ton Start toff SLOW 36 (42) ms 5% + 0.3 W

10% 10%
Bias Level
t t
ADDITIONAL METER SPECIFICATIONS
on off
Maximum LOAD IMPEDANCE:
13. Thermally limited in sink mode (quadrants II and IV) and ambient temperatures above 30°C. See power equa- Normal Mode: 10nF (typical). High Capacitance Mode: 50µF (typical).
tions in the reference manual for more information. COMMON MODE VOLTAGE: 250VDC.
14. Typical performance for minimum settled pulse widths:
Source Settling
COMMON MODE ISOLATION: >1GW, <4500pF.
Source Value Load (% of range) Min. Pulse Width OVERRANGE: 101% of source range, 102% of measure range.
6V 2W 0.2% 150 µs MAXIMUM SENSE LEAD RESISTANCE: 1kW for rated accuracy.
20 V 2W 1% 200 µs SENSE INPUT IMPEDANCE: >10GW.
35 V 7W 0.5% 500 µs
40 V 27 W 0.1% 400 µs
NOTES
1.5 A 27 W 0.1% 1.5 ms 16. Add 50µV to source accuracy specifications per volt of HI lead drop.
17. De-rate accuracy specifications for NPLC setting < 1 by increasing error term.
3A 2W 0.2% 150 µs Add appropriate % of range term using table below.
SMU INSTRUMENTS

5A 7W 0.5% 500 µs 100mV 1V–40V 100nA 1μA–100mA 1A–3A

10 A 2W 0.5% 200 µs NPLC Setting Range Ranges Range Ranges Ranges
Typical tests were performed using remote operation, 4W sense, and best, fixed measurement range. For more 0.1 0.01% 0.01% 0.01% 0.01% 0.01%
information on pulse scripts, see the Series 2600B Reference Manual. 0.01 0.08% 0.07% 0.1% 0.05% 0.05%
15. Times measured from the start of pulse to the start off-time; see figure below. 0.001 0.8 % 0.6 % 1% 0.5 % 1.1 %
Pulse Level
18. Applies when in single channel display mode.
90% 19. High Capacitance Mode accuracy is applicable for 23°C ±5°C only.
20. Applies when in single channel display mode.
Start ton Start toff 21. Four-wire remote sense only with current meter mode selected. Voltage measure set to 100mV or 1V range only.
22. 10A range accessible only in pulse mode.
Bias Level 10% 10% 23. Compliance equal to 100mA.
ton toff
24. High Capacitance Mode accuracy is applicable for 23°C ±5°C only.
25. Includes measurement of SENSE HI to HI and SENSE LO to LO contact resistances.

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15
 2601B, 2602B, System SourceMeter® SMU Instruments
2604B

HIGH CAPACITANCE MODE 26, 27, 28

Voltage Source Output Settling Time: Time required to reach 0.1% of final value after Mode Change Delay:
source level command is processed on a fixed range. Current limit = 1A. 100μA Current Range and Above:
Voltage Source Range Settling Time with Cload = 4.7μF Delay into High Capacitance Mode: 10ms.
100 mV 200 μs (typical) Delay out of High Capacitance Mode: 10ms.
1 V 200 μs (typical) 1μA and 10μA Current Ranges:
6 V 200 μs (typical) Delay into High Capacitance Mode: 230ms.
40 V 7 ms (typical) Delay out of High Capacitance Mode: 10ms.
Current Measure Settling Time: Time required to reach 0.1% of final value after voltage Voltmeter Input Impedance: 10GW in parallel with 3300pF.
source is stabilized on a fixed range. Values below for Vout = 1V unless noted. Noise, 10Hz–20MHz (6V Range): <30mV peak-peak (typical).
Current Measure Range Settling Time Voltage Source Range Change Overshoot: <400mV + 0.1% of larger range (typical).
3 A – 1 A <120 μs (typical) (R load > 2W) Overshoot into a 100kW load, 20MHz BW.
100 mA – 10 mA <100 μs (typical)
Series 2600B specifications

Series 2600B specifications

1 mA < 3 ms (typical) NOTES
100 μA < 3 ms (typical) 26. High Capacitance Mode specifications are for DC measurements only.
10 μA < 230 ms (typical) 27. 100nA range is not available in High Capacitance Mode.
1 μA < 230 ms (typical) 28. High Capacitance Mode utilizes locked ranges. Auto Range is disabled.
Capacitor Leakage Performance Using HIGH-C scripts 29: Load = 5μF||10MW. 29. Part of KI Factory scripts. See reference manual for details.
Test: 5V step and measure. 200ms (typical) @ 50nA.

GENERAL
IEEE-488: IEEE-488.1 compliant. Supports IEEE-488.2 common commands and status Absolute Maximum Input Voltage: 5.25V.
model topology. Absolute Minimum Input Voltage: –0.25V.
USB Control (rear): USB 2.0 device, TMC488 protocol. Maximum Logic Low Input Voltage: 0.7V, +850µA max.
RS-232: Baud rates from 300bps to 115200bps. Minimum Logic High Input Voltage: 2.1V, +570µA.
Ethernet: RJ-45 connector, LXI Class C, 10/100BT, no auto MDIX. Maximum Source Current (flowing out of Digital I/O bit): +960µA.
EXPANSION INTERFACE: The TSP-Link expansion interface allows TSP enabled instruments to Maximum Sink Current @ Maximum Logic Low Voltage (0.7V): –5.0mA.
trigger and communicate with each other. (Not available on Model 2604B.) Absolute Maximum Sink Current (flowing into Digital I/O pin): –11mA (not including
Cable Type: Category 5e or higher LAN crossover cable. Model 2604B).
Length: 3 meters maximum between each TSP enabled instrument. 5V Power Supply Pins: Limited to 250mA total for all three pins, solid state fuse protected.
LXI Compliance: LXI Class C 1.4. Output Enable: Active high input pulled down internally to ground with a 10kΩ resistor;
LXI Timing: Total Output Trigger Response Time: 245μs min., 280μs typ., (not when the output enable input function has been activated, each SourceMeter channel will
specified) max. Receive LAN[0-7] Event Delay: Unknown. Generate LAN[0-7] Event not turn on unless the output enable pin is driven to >2.1V (nominal current = 2.1V/10kΩ
Delay: Unknown. = 210µA).
DIGITAL I/O INTERFACE: (Not available on Model 2604B) USB File System (Front): USB 2.0 Host: Mass storage class device.
POWER SUPPLY: 100V to 250VAC, 50–60Hz (auto sensing), 240VA max.
Solid State COOLING: Forced air. Side intake and rear exhaust. One side must be unobstructed when
+5V Pins Fuse +5VDC
(on DIGITAL I/O rack mounted.
connector)
EMC: Conforms to European Union Directive 2004/108/EEC, EN 61326-1.
5.1kΩ
Read by SAFETY: Conforms to European Union Directive 73/23/EEC, EN 61010-1, and UL 61010-1.
Digital I/O Pin 100Ω firmware
(on DIGITAL I/O DIMENSIONS: 89mm high × 213mm wide × 460mm deep (3½ in × 83⁄8 in × 17½ in). Bench
connector)
Written by Configuration (with handle and feet): 104mm high × 238mm wide × 460mm deep (41⁄8 in ×
firmware
93⁄8 in × 17½ in).
GND Pin WEIGHT: 2601B: 4.75kg (10.4 lbs). 2602B, 2604B: 5.50kg (12.0 lbs).
(on DIGITAL I/O
connector) ENVIRONMENT: For indoor use only.
Rear Panel
Altitude: Maximum 2000 meters above sea level.
Connector: 25-pin female D. Operating: 0°–50°C, 70% R.H. up to 35°C. Derate 3% R.H./°C, 35°–50°C.
Input/Output Pins: 14 open drain I/O bits. Storage: –25°C to 65°C.
SMU INSTRUMENTS

See pages 23 and 24 for measurement speeds and other specifications.

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 2611B, 2612B, System SourceMeter® SMU Instruments
2614B

SPECIFICATION CONDITIONS ADDITIONAL SOURCE SPECIFICATIONS

This document contains specifications and supplemental information for the Models 2611B, 2612B, TRANSIENT RESPONSE TIME: <70µs for the output to recover to within 0.1% for a 10% to 90%
step change in load.
and 2614B System SourceMeter® SMU instruments. Specifications are the standards against which
the Models 2611B, 2612B, and 2614B are tested. Upon leaving the factory the 2611B, 2612B, and VOLTAGE SOURCE OUTPUT SETTLING TIME: Time required to within reach 0.1% of final value
2614B meet these specifications. Supplemental and typical values are non-­warranted, apply at after source level command is processed on a fixed range.
23°C, and are provided solely as useful information. Range Settling Time
200 mV <50 μs (typical)
Accuracy specifications are applicable for both normal and high capacitance modes. 2 V <50 μs (typical)
The source and measurement accuracies are specified at the SourceMeter CHANNEL A (2611B, 20 V <110 μs (typical)
2612B, and 2614B) or SourceMeter CHANNEL B (2612B, 2614B) terminals under the following 200 V <700 μs (typical)
conditions: CURRENT SOURCE OUTPUT SETTLING TIME: Time required to reach within 0.1% of final value after
1. 23°C ± 5°C, <70% relative humidity. source level command is processed on a fixed range. Values below for Iout · R load = 2V unless noted.
2. After 2 hour warm-up. Current Range Settling Time
1.5 A – 1 A <120 μs (typical) (R load > 6W)
Series 2600B specifications

Series 2600B specifications

3. Speed normal (1 NPLC). 100 mA – 10 mA <80 μs (typical)
4. A/D auto-zero enabled. 1 mA <100 μs (typical)
5. Remote sense operation or properly zeroed local sense operation. 100 μA <150 μs (typical)
6. Calibration period = 1 year. 10 μA <500 μs (typical)
1 μA <2 ms (typical)
100 nA <20 ms (typical)
SOURCE SPECIFICATIONS DC FLOATING VOLTAGE: Output can be floated up to ±250VDC from chassis ground.
REMOTE SENSE OPERATING RANGE 11: Maximum voltage between HI and SENSE HI = 3V .
Voltage Source Specifications Maximum voltage between LO and SENSE LO = 3V .
VOLTAGE OUTPUT HEADROOM:
VOLTAGE PROGRAMMING ACCURACY1
200V Range: Max. output voltage = 202.3V – total voltage drop across source leads (maximum
Accuracy (1 Year) Typical Noise 1W per source lead).
Programming 23°C ±5°C (Peak-Peak) 20V Range: Max. output voltage = 23.3V – total voltage drop across source leads (maximum
Range Resolution ±(% rdg. + volts) 0.1Hz–10Hz 1W per source lead).
200 mV   5 µV 0.02% + 375 µV 20 µV OVER TEMPERATURE PROTECTION: Internally sensed temperature overload puts unit in
2 V   50 µV 0.02% + 600 µV 50 µV standby mode.
20 V 500  µV 0.02% + 5 mV 300 µV VOLTAGE SOURCE RANGE CHANGE OVERSHOOT: <300mV + 0.1% of larger range (typical).
200 V   5 mV 0.02% + 50 mV 2 mV Overshoot into a 200kW load, 20MHz BW.
TEMPERATURE COEFFICIENT (0°–18°C and 28°–50°C) 2: ±(0.15 × accuracy specification)/°C. CURRENT SOURCE RANGE CHANGE OVERSHOOT: <5% of larger range + 300mV/R load (typical
Applicable for normal mode only. Not applicable for high capacitance mode. – With source settling set to SETTLE_SMOOTH_100NA). See Current Source Output Settling
Time for additional test conditions.
MAXiMUM OUTPUT POWER AND SOURCE/SINK LIMITS 3: 30.3W per channel maximum.
±20.2V @ ±1.5A, ±202V @ ±100mA, four quadrant source or sink operation. NOTES
VOLTAGE REGULATION: Line: 0.01% of range. Load: ±(0.01% of range + 100µV). 1. Add 50µV to source accuracy specifications per volt of HI lead drop.
NOISE 10Hz–20MHz: <20mV peak-peak (typical), <3mV RMS (typical), 20V range. 2. High Capacitance Mode accuracy is applicable at 23°C ±5°C only.
CURRENT LIMIT/COMPLIANCE 4: Bipolar current limit (compliance) set with single value. 3. Full power source operation regardless of load to 30°C ambient. Above 30°C and/or power sink operation,
Minimum value is 10nA. Accuracy is the same as current source. refer to “Operating Boundaries” in the Series 2600B Reference Manual for additional power derating information.
OVERSHOOT: <±(0.1% + 10mV) (typical). Step size = 10% to 90% of range, resistive load, maxi- 4. For sink mode operation (quadrants II and IV), add 0.06% of limit range to the corresponding current limit
mum c­ urrent limit/compliance. accuracy specifications. Specifications apply with sink mode operation enabled.
5. Accuracy specifications do not include connector leakage. Derate accuracy by Vout/2E11 per °C when operating
GUARD OFFSET VOLTAGE: <4mV (current <10mA). between 18°–28°C. Derate accuracy by Vout/2E11 + (0.15·Vout/2E11) per °C when operating <18°C and >28°C.
6. Full power source operation regardless of load to 30°C ambient. Above 30°C and/or power sink operation,
Current Source Specifications refer to “Operating Boundaries” in the Series 2600B Reference Manual for additional power derating information.
7. 10A range accessible only in pulse mode.
CURRENT PROGRAMMING ACCURACY 5
8. High Capacitance Mode accuracy is applicable at 23°C ±5°C only.
Accuracy (1 Year) Typical Noise 9. Full power source operation regardless of load to 30°C ambient. Above 30°C and/or power sink operation,
Programming 23°C ±5°C (Peak-Peak) refer to “Operating Boundaries” in the Series 2600B Reference Manual for additional power derating information.
Range Resolution ±(% rdg. + amps) 0.1Hz–10Hz 10. For sink mode operation (quadrants II and IV), add 10% of compliance range and ±0.02% of limit setting to
corresponding voltage source specification. For 200mV range add an additional 120mV of uncertainty.
100 nA 2 pA 0.06% + 100 pA 5 pA 11. Add 50μV to source accuracy specifications per volt of HI lead drop.
1 µA 20 pA 0.03% + 800 pA 25 pA
10 µA 200 pA 0.03% + 5 nA 60 pA PULSE SPECIFICATIONS
100 µA 2 nA 0.03% + 60 nA 3 nA Maximum Maximum Maximum
1 mA 20 nA 0.03% + 300 nA 6 nA Region Current Limit Pulse Width 12 Duty Cycle 13
10 mA 200 nA 0.03% + 6 µA 200 nA
1 100 mA @ 200 V DC, no limit 100%
100 mA 2 µA 0.03% + 30 µA 600 nA
1 1.5 A @ 20 V DC, no limit 100%
1 A 6 20 µA 0.05% + 1.8 mA 70 µA
SMU INSTRUMENTS

2 1 A @ 180 V 8.5 ms 1%
1.5 A 6 50 µA 0.06% + 4 mA 150 µA
3 14 1 A @ 200 V 2.2 ms 1%
10 A 6, 7 200 µA 0.5% + 40 mA (typical)
4 10 A @ 5 V 1 ms 2.2%
TEMPERATURE COEFFICIENT (0°–18°C and 28°–50°C) 8: ±(0.15 × accuracy specification)/°C.
Applicable for normal mode only. Not applicable for high capacitance mode. MINIMUM PROGRAMMABLE PULSE WIDTH 15, 16: 100µs. NOTE: Minimum pulse width for settled
source at a given I/V output and load can be longer than 100µs.
MAXiMUM OUTPUT POWER AND SOURCE/SINK LIMITS 9: 30.3W per channel maximum.
±1.515A @ ±20V , ±101mA @ ±200V , four quadrant source or sink operation. Pulse width programming resolution: 1µs.
CURRENT REGULATION: Line: 0.01% of range. Load: ±(0.01% of range + 100pA). Pulse width programming accuracy 16: ±5µs.
VOLTAGE LIMIT/COMPLIANCE 10: Bipolar voltage limit (compliance) set with a single value. pulse width jitter: 2µs (typical).
Minimum value is 20mV. Accuracy is the same as voltage source.
OVERSHOOT: <±0.1% (typical). Step size = 10% to 90% of range, resistive load; see Current
Source Output Settling Time for additional test conditions.

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 2611B, 2612B, System SourceMeter® SMU Instruments
2614B

SOURCE SPECIFICATIONS (continued) METER SPECIFICATIONS

PULSE SPECIFICATIONS (continued) VOLTAGE MEASUREMENT ACCURACY 17, 18
Quadrant Diagram: Accuracy (1 Year)
Default Display Input 23°C ±5°C
+10A Range Resolution 19 Resistance ±(% rdg. + volts)
200 mV 100 nV >10 GW 0.015% + 225 µV
4
2 V 1 µV >10 GW 0.02% + 350 µV
20 V 10 µV >10 GW 0.015% + 5 mV
+1.5A 3 3
+1A
200 V 100 µV >10 GW 0.015% + 50 mV
2 2 TEMPERATURE COEFFICIENT (0°–18°C and 28°–50°C) 20: ±(0.15 × accuracy specification)/°C.
+0.1A DC
0A 1 Applicable for normal mode only. Not applicable for high capacitance mode.
–0.1A Pulse
Series 2600B specifications

Series 2600B specifications

2 2 Pulse
–1A
–1.5A 3 3
Pulse CURRENT MEASUREMENT ACCURACY 18, 21
Accuracy (1 Year)
Default Display Voltage 23°C ±5°C
4 Range Resolution 22 Burden 23 ±(% rdg. + amps)
100 nA 100 fA <1 mV 0.06% + 100 pA
–10A
1 µA 1 pA <1 mV 0.025% + 500 pA
–200V –180V –20V –5V 0V +5V +20V +180V +200V
10 µA 10 pA <1 mV 0.025% + 1.5 nA
100 µA 100 pA <1 mV 0.02% + 25 nA
NOTES 1 mA 1 nA <1 mV 0.02% + 200 nA
12. Times measured from the start of pulse to the start off-time; see figure below.
10 mA 10 nA <1 mV 0.02% + 2.5 µA
Pulse Level 100 mA 100 nA <1 mV 0.02% + 20 µA
90% 1 A 1 µA <1 mV 0.03% + 1.5 mA
1.5 A 1 µA <1 mV 0.05% + 3.5 mA
Start ton Start toff 10 A 24 10 µA <1 mV 0.4% + 25 mA (typical)
Current Measure Settling Time (Time for measurement to settle after a Vstep) 25: Time
Bias Level 10% 10%
required to reach 0.1% of final value after source level command is processed on a fixed range.
ton toff
Values for Vout = 2V unless noted. Current Range: 1mA. Settling Time: <100μs (typical).
13. Thermally limited in sink mode (quadrants II and IV) and ambient temperatures above 30°C. TEMPERATURE COEFFICIENT (0°–18°C and 28°–50°C) 26: ±(0.15 × accuracy specfication)/°C.
See power equations in the reference manual for more information. Applicable for normal mode only. Not applicable for high capacitance mode.
14. Voltage source operation with 1.5 A current limit.
15. Typical performance for minimum settled pulse widths:
Source Settling Contact Check 27 (not available on Model 2614B)
Source Value Load (% of range) Min. Pulse Width Maximum Measurement Accuracy (1 Year)
5V 0.5 W 1% 300 μs Time to Memory 23°C ±5°C
20 V 200 W 0.2% 200 μs Speed For 60Hz (50Hz) ±(%rdg. + ohms)
180 V 180 W 0.2% 5 ms
FAST 1 (1.2) ms 5% + 10 W
200 V (1.5 A Limit) 200 W 0.2% 1.5 ms
100 mA 200 W 1% 200 μs MEDIUM 4 (5) ms 5% + 1 W
1A 200 W 1% 500 μs SLOW 36 (42) ms 5% + 0.3 W
1A 180 W 0.2% 5 ms
10 A 0.5 W 0.5% 300 μs
ADDITIONAL METER SPECIFICATIONS
Typical tests were performed using remote operation, 4W sense, and best, fixed measurement range. For more
information on pulse scripts, see the Series 2600B Reference Manual. Maximum LOAD IMPEDANCE:
Normal Mode: 10nF (typical). High Capacitance Mode: 50µF (typical).
16. Times measured from the start of pulse to the start off-time; see figure below.
Pulse Level COMMON MODE VOLTAGE: 250VDC.
90% COMMON MODE ISOLATION: >1GW, <4500pF.
OVERRANGE: 101% of source range, 102% of measure range.
Start ton Start toff
MAXIMUM SENSE LEAD RESISTANCE: 1kW for rated accuracy.
Bias Level 10% 10% SENSE INPUT IMPEDANCE: >10GW.
ton toff

SMU INSTRUMENTS

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 2611B, 2612B, System SourceMeter® SMU Instruments
2614B

METER SPECIFICATIONS (continued) GENERAL

NOTES IEEE-488: IEEE-488.1 compliant. Supports IEEE-488.2 common commands and status
model topology.
17. Add 50µV to source accuracy specifications per volt of HI lead drop.
18. De-rate accuracy specifications for NPLC setting <1 by increasing error term. Add appropriate % of range term USB Control (rear): USB 2.0 device, TMC488 protocol.
using table below. RS-232: Baud rates from 300bps to 115200bps.
200mV 2V–200V 100nA 1μA–100mA 1A–1.5A Ethernet: RJ-45 connector, LXI Class C, 10/100BT, no auto MDIX.
NPLC Setting Range Ranges Range Ranges Ranges
EXPANSION INTERFACE: The TSP-Link expansion interface allows TSP enabled instruments
0.1 0.01% 0.01% 0.01% 0.01% 0.01%
to trigger and communicate with each other. (Not available on Model 2614B.)
0.01 0.08% 0.07% 0.1% 0.05% 0.05%
0.001 0.8 % 0.6 % 1% 0.5 % 1.1 % Cable Type: Category 5e or higher LAN crossover cable.
19. Applies when in single channel display mode. Length: 3 meters maximum between each TSP enabled instrument.
20. High Capacitance Mode accuracy is applicable at 23°C ±5°C only. LXI Compliance: LXI Class C 1.4.
21. Accuracy specifications do not include connector leakage. De-rate accuracy by Vout/2E11 per °C when operating LXI Timing: Total Output Trigger Response Time: 245μs min., 280μs typ., (not speci-
Series 2600B specifications

Series 2600B specifications

between 18°–28°C. Derate accuracy by Vout/2E11 + (0.15 * Vout/2E11) per °C when operating <18° and >28°C. fied) max. Receive LAN[0-7] Event Delay: Unknown. Generate LAN[0-7] Event Delay:
22. Applies when in single channel display mode. Unknown.
23. Four-wire remote sense only and with current meter mode selected. Voltage measure set to 200mV or
2V range only. DIGITAL I/O INTERFACE: (Not available on Model 2614B)
24. 10A range accessible only in pulse mode.
25. Compliance equal to 100mA. Solid State
26. High Capacitance Mode accuracy is applicable at 23°C ±5°C only. +5V Pins Fuse +5VDC
(on DIGITAL I/O
27. Includes measurement of SENSE HI to HI and SENSE LO to LO contact resistances. connector)

5.1kΩ
Read by
HIGH CAPACITANCE MODE 28, 29, 30 Digital I/O Pin
(on DIGITAL I/O
100Ω firmware
connector)
Written by
Voltage Source Output Settling Time: Time required to reach within 0.1% of final value firmware
after source level command is processed on a fixed range. Current limit = 1A.
GND Pin
Voltage Source Range Settling Time with Cload = 4.7μF (on DIGITAL I/O
connector)
200 mV 600 μs (typical) Rear Panel
2 V 600 μs (typical)
20 V 1.5 ms (typical) Connector: 25-pin female D.
200 V 20 ms (typical) Input/Output Pins: 14 open drain I/O bits.
Current Measure Settling Time: Time required to reach within 0.1% of final value after Absolute Maximum Input Voltage: 5.25V.
voltage source is stabilized on a fixed range. Values below for Vout = 2V unless noted. Absolute Minimum Input Voltage: –0.25V.
Current Measure Range Settling Time Maximum Logic Low Input Voltage: 0.7V, +850µA max.
1.5 A – 1 A <120 μs (typical) (R load >6W) Minimum Logic High Input Voltage: 2.1V, +570µA.
100 mA – 10 mA <100 μs (typical)
1 mA < 3 ms (typical) Maximum Source Current (flowing out of Digital I/O bit): +960µA.
100 μA < 3 ms (typical) Maximum Sink Current @ Maximum Logic Low Voltage (0.7V): –5.0mA.
10 μA < 230 ms (typical) Absolute Maximum Sink Current (flowing into Digital I/O pin): –11mA.
1 μA < 230 ms (typical)
5V Power Supply Pins: Limited to 250mA total for all three pins, solid state fuse protected.
Capacitor Leakage Performance Using HIGH-C scripts 31: Load = 5μF||10MW.
Safety Interlock Pin: Active high input. >3.4V @ 24mA (absolute maximum of 6V) must
Test: 5V step and measure. 200ms (typical) @ 50nA. be externally applied to this pin to ensure 200V operation. This signal is pulled down
Mode Change Delay: to chassis ground with a 10kW resistor. 200V operation will be blocked when the
100μA Current Range and Above: INTERLOCK signal is <0.4V (absolute minimum –0.4V). See figure below:
Delay into High Capacitance Mode: 10ms. Read by firmware
Delay out of High Capacitance Mode: 10ms. Coil +220V Supply
Resistance
1μA and 10μA Current Ranges: INTERLOCK Pin 145Ω ±10% –220V Supply
(on DIGITAL I/O
Delay into High Capacitance Mode: 230ms. connector)
Delay out of High Capacitance Mode: 10ms. 10kΩ
Voltmeter Input Impedance: 30GW in parallel with 3300pF.
Noise, 10Hz–20MHz (20V Range): <30mV peak-peak (typical). Chassis
Ground To output stage
Voltage Source Range Change Overshoot (for 20V range and below): <400mV + 0.1%
of larger range (typical). Overshoot into a 200kW load, 20MHz BW. * Rear Panel

NOTES USB File System (Front): USB 2.0 Host: Mass storage class device.
28. High Capacitance Mode specifications are for DC measurements only. POWER SUPPLY: 100V to 250VAC, 50–60Hz (auto sensing), 240VA max.
29. 100nA range is not available in High Capacitance Mode. COOLING: Forced air. Side intake and rear exhaust. One side must be unobstructed when
SMU INSTRUMENTS

30. High Capacitance Mode utilizes locked ranges. Auto Range is disabled. rack mounted.
31. Part of KI Factory scripts, See reference manual for details.
EMC: Conforms to European Union Directive 2004/108/EEC, EN 61326-1.
SAFETY: Conforms to European Union Directive 73/23/EEC, EN 61010-1, and UL 61010-1.
DIMENSIONS: 89mm high × 213mm wide × 460mm deep (3½ in × 83⁄8 in × 17½ in). Bench
Configuration (with handle and feet): 104mm high × 238mm wide × 460mm deep (41⁄8 in
× 93⁄8 in × 17½ in).
WEIGHT: 2611B: 4.75kg (10.4 lbs). 2612B, 2614B: 5.50kg (12.0 lbs).
ENVIRONMENT: For indoor use only. Altitude: Maximum 2000 meters above sea level.
See pages 23 and 24 for measurement
Operating: 0°–50°C, 70% R.H. up to 35°C. Derate 3% R.H./°C, 35°–50°C.
speeds and other specifications.
Storage: –25°C to 65°C.

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 2634B, 2635B, System SourceMeter® SMU Instruments
2636B

SPECIFICATION CONDITIONS ADDITIONAL SOURCE SPECIFICATIONS

This document contains specifications and supplemental information for the Models 2634B, TRANSIENT RESPONSE TIME: <70µs for the output to recover to within 0.1% for a 10% to 90%
2635B, and 2636B System SourceMeter® SMU instruments. Specifications are the standards against step change in load.
which the Models 2634B, 2635B, and 2636B are tested. Upon leaving the factory the 2634B, 2635B, VOLTAGE SOURCE OUTPUT SETTLING TIME: Time required to reach within 0.1% of final value
and 2636B meet these specifications. Supplemental and typical values are non-­warranted, apply at after source level command is processed on a fixed range.
23°C, and are provided solely as u­ seful information. Range Settling Time
Accuracy specifications are applicable for both normal and high capacitance modes. 200 mV <50 μs (typical)
The source and measurement accuracies are specified at the SourceMeter CHANNEL A (2634B, 2 V <50 μs (typical)
2635B, and 2636B) or SourceMeter CHANNEL B (2634B, 2636B) terminals under the following 20 V <110 μs (typical)
conditions: 200 V <700 μs (typical)
1. 23°C ± 5°C, <70% relative humidity. CURRENT SOURCE OUTPUT SETTLING TIME: Time required to reach within 0.1% of final value after
2. After 2 hour warm-up source level command is processed on a fixed range. Values below for Iout · R load = 2V unless noted.
3. Speed normal (1 NPLC) Current Range Settling Time
1.5 A – 1 A <120 μs (typical) (R load > 6W)
Series 2600B specifications

Series 2600B specifications

4. A/D auto-zero enabled
100 mA – 10 mA <80 μs (typical)
5. Remote sense operation or properly zeroed local sense operation 1 mA <100 μs (typical)
6. Calibration period = 1 year 100 μA <150 μs (typical)
10 μA <500 μs (typical)
SOURCE SPECIFICATIONS 1 μA <2 ms (typical)
100 nA <20 ms (typical)
Voltage Source Specifications 10 nA <40 ms (typical)
1 nA <150 ms (typical)
VOLTAGE PROGRAMMING ACCURACY1 DC FLOATING VOLTAGE: Output can be floated up to ±250VDC.
Accuracy (1 Year) Typical Noise REMOTE SENSE OPERATING RANGE 10: Maximum voltage between HI and SENSE HI = 3V .
Programming 23°C ±5°C (peak-peak) Maximum voltage between LO and SENSE LO = 3V .
Range Resolution ±(% rdg. + volts) 0.1Hz–10Hz VOLTAGE OUTPUT HEADROOM:
200 mV   5 µV 0.02% + 375 µV 20 µV 200V Range: Max. output voltage = 202.3V – total voltage drop across source leads (maximum
2 V   50 µV 0.02% + 600 µV 50 µV 1W per source lead).
20 V 500 µV 0.02% + 5 mV 300 µV 20V Range: Max. output voltage = 23.3V – total voltage drop across source leads (maximum
1W per source lead).
200 V   5 mV 0.02% + 50 mV 2 mV
OVER TEMPERATURE PROTECTION: Internally sensed temperature overload puts unit in
TEMPERATURE COEFFICIENT (0°–18°C and 28°–50°C) 2: ±(0.15 × accuracy specification)/°C. standby mode.
Applicable for normal mode only. Not applicable for high capacitance mode.
VOLTAGE SOURCE RANGE CHANGE OVERSHOOT: <300mV + 0.1% of larger range (typical).
MAXiMUM OUTPUT POWER AND SOURCE/SINK LIMITS 3: 30.3W per channel maximum. Overshoot into a 200kW load, 20MHz BW.
±20.2V @ ±1.5A, ±202V @ ±100mA, four quadrant source or sink operation.
CURRENT SOURCE RANGE CHANGE OVERSHOOT: <5% of larger range + 300mV/R load (typical
VOLTAGE REGULATION: Line: 0.01% of range. Load: ±(0.01% of range + 100µV). – With source settling set to SETTLE_SMOOTH_100NA). See Current Source Output Settling
NOISE 10Hz–20MHz: <20mV pk-pk (typical), <3mV rms (typical), 20V range. Time for additional test condtions.
CURRENT LIMIT/COMPLIANCE 4: Bipolar current limit (compliance) set with single value.
Minimum value is 100pA. Accuracy is the same as current source.
OVERSHOOT: <±(0.1% + 10mV) typical (step size = 10% to 90% of range, resistive load,
PULSE SPECIFICATIONS
Maximum Maximum Maximum
maximum current limit/compliance).
Region Current Limit Pulse Width 11 Duty Cycle 12
GUARD OFFSET VOLTAGE: <4mV (current <10mA).
1 100 mA @ 200 V DC, no limit 100%
Current Source Specifications 1 1.5 A @ 20 V DC, no limit 100%
CURRENT PROGRAMMING ACCURACY 2 1 A @ 180 V 8.5 ms 1%
Accuracy (1 Year) Typical Noise 3 13 1 A @ 200 V 2.2 ms 1%
Programming 23°C ±5°C (peak-peak) 4 10 A @ 5 V 1 ms 2.2%
Range Resolution ±(% rdg. + amps) 0.1Hz–10Hz MINIMUM PROGRAMMABLE PULSE WIDTH 14, 15: 100µs. NOTE: Minimum pulse width for set-
1 nA 20 fA 0.15% + 2 pA 800 fA tled source at a given I/V output and load can be longer than 100µs.
10 nA 200 fA 0.15% + 5 pA 2 pA Pulse width programming resolution: 1µs.
100 nA 2 pA 0.06% + 50 pA 5 pA
1 µA 20 pA 0.03% + 700 pA 25 pA Pulse width programming accuracy 15: ±5µs.
10 µA 200 pA 0.03% + 5 nA 60 pA pulse width jitter: 50µs (typical).
100 µA 2 nA 0.03% + 60 nA 3 nA Quadrant Diagram:
1 mA 20 nA 0.03% + 300 nA 6 nA
+10A
10 mA 200 nA 0.03% + 6 µA 200 nA
100 mA 2 µA 0.03% + 30 µA 600 nA
4
1 A 5 20 µA 0.05% + 1.8 mA 70 µA
SMU INSTRUMENTS

1.5 A 5 50 µA 0.06% + 4 mA 150 µA

+1.5A
10 A 5, 6 200 µA 0.5  % + 40 mA (typical) 3 3
+1A
TEMPERATURE COEFFICIENT (0°–18°C and 28°–50°C) 7: ±(0.15 × accuracy specification)/°C. 2 2
+0.1A DC
Applicable for normal mode only. Not applicable for high capacitance mode. 0A 1
–0.1A Pulse
MAXiMUM OUTPUT POWER AND SOURCE/SINK LIMITS 8: 30.3W per channel maximum. 2 2 Pulse
±1.515A @ ±20V, ±101mA @ ±200V, four quadrant source or sink operation. –1A
Pulse
–1.5A 3 3
CURRENT REGULATION: Line: 0.01% of range. Load: ±(0.01% of range + 100pA).
VOLTAGE LIMIT/COMPLIANCE 9: Bipolar voltage limit (compliance) set with a single value.
Minimum value is 20mV. Accuracy is the same as voltage source. 4

OVERSHOOT: <±0.1% typical (step size = 10% to 90% of range, resistive load, maximum ­
–10A
current limit/compliance; see Current Source Output Settling Time for additional
–200V –180V –20V –5V 0V +5V +20V +180V +200V
test ­conditions).

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 2634B, 2635B, System SourceMeter® SMU Instruments
2636B

SOURCE SPECIFICATIONS (continued) METER SPECIFICATIONS

NOTES VOLTAGE MEASUREMENT ACCURACY 16, 17
1. Add 50µV to source accuracy specifications per volt of HI lead drop. Accuracy (1 Year)
2. High Capacitance Mode accuracy is applicable at 23°C ±5°C only.
Default Display Input 23°C ±5°C
3. Full power source operation regardless of load to 30°C ambient. Above 30°C and/or power sink operation, refer
to “Operating Boundaries” in the Series 2600B Reference Manual for additional power derating information. Range Resolution 18 Resistance ±(% rdg. + volts)
4. For sink mode operation (quadrants II and IV), add 0.06% of limit range to the corresponding current limit 200 mV 100 nV >1014 W 0.015% + 225 µV
accuracy specifications. Specifications apply with sink mode operation enabled. 2 V 1 µV >1014 W 0.02% + 350 µV
5. Full power source operation regardless of load to 30°C ambient. Above 30°C and/or power sink operation, refer
to “Operating Boundaries” in the Series 2600B Reference Manual for additional power derating information. 20 V 10 µV >1014 W 0.015% + 5 mV
6. 10A range accessible only in pulse mode. 200 V 100 µV >1014 W 0.015% + 50 mV
7. High Capacitance Mode accuracy is applicable at 23°C ±5°C only.
TEMPERATURE COEFFICIENT (0°–18°C and 28°–50°C) 19: ±(0.15 × accuracy specification)/°C.
8. Full power source operation regardless of load to 30°C ambient. Above 30°C and/or power sink operation,
refer to “Operating Boundaries” in the Series 2600B Reference Manual for additional power Applicable for normal mode only. Not applicable for high capacitance mode.
Series 2600B specifications

Series 2600B specifications

derating information.
9. For sink mode operation (quadrants II and IV), add 10% of compliance range and ±0.02% of limit setting to
corresponding voltage source specification. For 200mV range add an additional 120mV of uncertainty. CURRENT MEASUREMENT ACCURACY 17
10. Add 50μV to source accuracy specifications per volt of HI lead drop. Accuracy (1 Year)
11. Times measured from the start of pulse to the start off-time; see figure below. Default Display Voltage 23°C ±5°C
Pulse Level Range Resolution 20 Burden 21 ±(% rdg. + amps)
90% *100 pA 22, 23 0.1 fA <1 mV 0.15% + 120 fA
1 nA 22, 24 1 fA <1 mV 0.15% + 240 fA
Start ton Start toff 10 nA 10 fA <1 mV 0.15% + 3 pA
100 nA 100 fA <1 mV 0.06% + 40 pA
Bias Level 10% 10% 1 µA 1 pA <1 mV 0.025% + 400 pA
ton toff 10 µA 10 pA <1 mV 0.025% + 1.5 nA

100 µA 100 pA <1 mV 0.02% + 25 nA
12. Thermally limited in sink mode (quadrants II and IV) and ambient temperatures above 30°C. See power equa-
tions in the Reference Manual for more information. 1 mA 1 nA <1 mV 0.02% + 200 nA
13. Voltage source operation with 1.5 A current limit. 10 mA 10 nA <1 mV 0.02% + 2.5 µA
14. Typical performance for minimum settled pulse widths: 100 mA 100 nA <1 mV 0.02% + 20 µA
Source Settling 1 A 1 µA <1 mV 0.03% + 1.5 mA
Source Value Load (% of range) Min. Pulse Width
1.5 A 1 µA <1 mV 0.05% + 3.5 mA
5V 0.5 W 1% 300 μs
10 A 25 10 µA <1 mV 0.4  % + 25 mA
20 V 200 W 0.2% 200 μs
180 V 180 W 0.2% 5 ms * 100 pA range not available on Model 2634B.
200 V (1.5 A Limit) 200 W 0.2% 1.5 ms Current Measure Settling Time (Time for measurement to settle after a Vstep) 26: Time
100 mA 200 W 1% 200 μs required to reach within 0.1% of final value after source level command is processed on a fixed
1A 200 W 1% 500 μs range. Values for Vout = 2V unless noted. Current Range: 1mA. Settling Time: <100μs (typical).
1A 180 W 0.2% 5 ms
TEMPERATURE COEFFICIENT (0°–18°C and 28°–50°C) 27: ±(0.15 × accuracy specfication)/°C.
10 A 0.5 W 0.5% 300 μs
Applicable for normal mode only. Not applicable for high capacitance mode.
Typical tests were performed using remote operation, 4W sense, and best, fixed measurement range. For more
information on pulse scripts, see the Series 2600B Reference Manual.
15. Times measured from the start of pulse to the start off-time; see figure below.
Contact Check 28 (Not available on Model 2634B)
Pulse Level Maximum Measurement Accuracy (1 Year)
Time to Memory 23°C ±5°C
90%
Speed For 60Hz (50Hz) ±(%rdg. + ohms)
FAST 1 (1.2) ms 5% + 10 W
Start ton Start toff
MEDIUM 4 (5) ms 5% + 1 W
Bias Level 10% 10% SLOW 36 (42) ms 5% + 0.3 W
ton toff

ADDITIONAL METER SPECIFICATIONS
Maximum LOAD IMPEDANCE:
Normal Mode: 10nF (typical). High Capacitance Mode: 50µF (typical).
COMMON MODE VOLTAGE: 250VDC.
COMMON MODE ISOLATION: >1GW, <4500pF.
SMU INSTRUMENTS

OVERRANGE: 101% of source range, 102% of measure range.

MAXIMUM SENSE LEAD RESISTANCE: 1kW for rated accuracy.
SENSE INPUT IMPEDANCE: >1014W.

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 2634B, 2635B, System SourceMeter® SMU Instruments
2636B

METER SPECIFICATIONS (continued) GENERAL

IEEE-488: IEEE-488.1 compliant. Supports IEEE-488.2 common commands and status
NOTES model topology.
16. Add 50µV to source accuracy specifications per volt of HI lead drop.
17. De-rate accuracy specifications for NPLC setting <1 by increasing error term. Add appropriate % of range term USB Control (rear): USB 2.0 device, TMC488 protocol.
using table below. RS-232: Baud rates from 300bps to 115200bps. Programmable number of data bits, p­ arity
200mV 2V–200V 100nA 1μA–100mA 1A–1.5A type, and flow control (RTS/CTS hardware or none).
NPLC Setting Range Ranges Range Ranges Ranges Ethernet: RJ-45 connector, LXI Class C, 10/100BT, no auto MDIX.
0.1 0.01% 0.01% 0.01% 0.01% 0.01%
0.01 0.08% 0.07% 0.1% 0.05% 0.05% EXPANSION INTERFACE: The TSP-Link expansion interface allows TSP enabled instruments
0.001 0.8 % 0.6 % 1% 0.5 % 1.1 %
to trigger and communicate with each other. (Not available on Model 2614B.)
18. Applies when in single channel display mode.
Cable Type: Category 5e or higher LAN crossover cable.
19. High Capacitance Mode accuracy is applicable at 23°C ±5°C only. Length: 3 meters maximum between each TSP enabled instrument.
20. Applies when in single channel display mode. LXI Compliance: LXI Class C 1.4.
Series 2600B specifications

Series 2600B specifications

21. Four-wire remote sense only and with current meter mode selected. Voltage measure set to 200mV or
2V range only. LXI Timing: Total Output Trigger Response Time: 245μs min., 280μs typ., (not
22. 10-NPLC, 11-Point Median Filter, <200V range, measurements made within 1 hour after zeroing. 23°C ± 1°C specified) max. Receive LAN[0-7] Event Delay: Unknown. Generate LAN[0-7] Event
23. Under default specification conditions: ±(0.15% + 750fA). Delay: Unknown.
24. Under default specification conditions: ±(0.15% + 1pA). DIGITAL I/O INTERFACE: (Not available on Model 2614B)
25. 10A range accessible only in pulse mode.
26. Delay factor set to 1. Compliance equal to 100mA. Solid State
27. High Capacitance Mode accuracy is applicable at 23°C ±5°C only. +5V Pins Fuse +5VDC
(on DIGITAL I/O
28. Includes measurement of SENSE HI to HI and SENSE LO to LO contact resistances. connector)

5.1kΩ
HIGH CAPACITANCE MODE 29, 30, 31 Digital I/O Pin
(on DIGITAL I/O
100Ω
Read by
firmware
connector)
Written by
Voltage Source Output Settling Time: Time required to reach within 0.1% of final value firmware
after source level command is processed on a fixed range. Current limit = 1A.
GND Pin
Voltage Source Range Settling Time with Cload = 4.7μF (on DIGITAL I/O
connector)
200 mV 600 μs (typical) Rear Panel
2 V 600 μs (typical)
20 V 1.5 ms (typical) Connector: 25-pin female D.
200 V 20 ms (typical) Input/Output Pins: 14 open drain I/O bits.
Current Measure Settling Time: Time required to reach within 0.1% of final value after Absolute Maximum Input Voltage: 5.25V.
voltage source is stabilized on a fixed range. Values below for Vout = 2V unless noted. Absolute Minimum Input Voltage: –0.25V.
Current Measure Range Settling Time Maximum Logic Low Input Voltage: 0.7V, +850µA max.
1.5 A – 1 A <120 μs (typical) (R load >6W) Minimum Logic High Input Voltage: 2.1V, +570µA.
100 mA – 10 mA <100 μs (typical) Maximum Source Current (flowing out of Digital I/O bit): +960µA.
1 mA < 3 ms (typical) Maximum Sink Current @ Maximum Logic Low Voltage (0.7V): –5.0mA.
100 μA < 3 ms (typical) Absolute Maximum Sink Current (flowing into Digital I/O pin): –11mA.
10 μA < 230 ms (typical)
1 μA < 230 ms (typical) 5V Power Supply Pins: Limited to 250mA total for all three pins, solid state fuse protected.
Capacitor Leakage Performance Using HIGH-C scripts 32: Load = 5μF||10MW. Safety Interlock Pin: Active high input. >3.4V @ 24mA (absolute maximum of 6V) must
be externally applied to this pin to ensure 200V operation. This signal is pulled down
Test: 5V step and measure. 200ms (typical) @ 50nA. to chassis ground with a 10kW resistor. 200V operation will be blocked when the
Mode Change Delay: INTERLOCK signal is <0.4V (absolute minimum –0.4V). See figure below:
100μA Current Range and Above: Read by firmware
Delay into High Capacitance Mode: 10ms. Coil +220V Supply
Resistance
Delay out of High Capacitance Mode: 10ms. INTERLOCK Pin 145Ω ±10% –220V Supply
(on DIGITAL I/O
1μA and 10μA Current Ranges: connector)

Delay into High Capacitance Mode: 230ms. 10kΩ

Delay out of High Capacitance Mode: 10ms.
Voltmeter Input Impedance: 30GW in parallel with 3300pF. Chassis
To output stage
Ground
Noise, 10Hz–20MHz (20V Range): <30mV peak-peak (typical).
Voltage Source Range Change Overshoot (for 20V range and below): <400mV + 0.1% * Rear Panel

of larger range (typical). Overshoot into a 200kW load, 20MHz BW. USB File System (Front): USB 2.0 Host: Mass storage class device.
POWER SUPPLY: 100V to 250VAC, 50–60Hz (auto sensing), 240VA max.
NOTES
COOLING: Forced air. Side intake and rear exhaust. One side must be unobstructed when
29. High Capacitance Mode specifications are for DC measurements only.
SMU INSTRUMENTS

rack mounted.
30. 100nA range and below are not available in high capacitance mode.
31. High Capacitance Mode utilizes locked ranges. Auto Range is disabled. EMC: Conforms to European Union Directive 2004/108/EEC, EN 61326-1.
32. Part of KI Factory scripts. See reference manual for details. SAFETY: Conforms to European Union Directive 73/23/EEC, EN 61010-1, and UL 61010-1.
DIMENSIONS: 89mm high × 213mm wide × 460mm deep (3½ in × 83⁄8 in × 17½ in). Bench
Configuration (with handle and feet): 104mm high × 238mm wide × 460mm deep (41⁄8 in
× 93⁄8 in × 17½ in).
WEIGHT: 2635B: 4.75kg (10.4 lbs). 2634B, 2636B: 5.50kg (12.0 lbs).
ENVIRONMENT: For indoor use only. Altitude: Maximum 2000 meters above sea level.
See pages 23 and 24 for measurement Operating: 0°–50°C, 70% R.H. up to 35°C. Derate 3% R.H./°C, 35°–50°C.
speeds and other specifications. Storage: –25°C to 65°C.

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 Series 2600B System SourceMeter® SMU Instruments
Applicable to Models 2601B, 2602B, 2604B, 2611B, 2612B, 2614B, 2634B, 2635B, and 2636B.
Measurement Speed Specifications 1, 2, 3
Maximum SWEEP OPERATION RATES (operations per second) FOR 60Hz (50Hz):
Measure Measure Source Measure Source Measure Source Measure Source Measure
A/D Converter To Memory Using To Gpib Using To Memory Using To Gpib Using To Memory Using To Gpib Using
Speed Trigger Origin User Scripts User Scripts User Scripts User Scripts Sweep API Sweep API
0.001 NPLC Internal 20000 (20000) 10500 (10500) 7000 (7000) 6200 (6200) 12000 (12000) 5900 (5900)
0.001 NPLC Digital I/O 8100 (8100) 7100 (7100) 5500 (5500) 5100 (5100) 11200 (11200) 5700 (5700)
0.01  NPLC Internal 5000 (4000) 4000 (3500) 3400 (3000) 3200 (2900) 4200 (3700) 3100 (2800)
0.01  NPLC Digital I/O 3650 (3200) 3400 (3000) 3000 (2700) 2900 (2600) 4150 (3650) 3050 (2775)
0.1   NPLC Internal 580 (490) 560 (475) 550 (465) 550 (460) 575 (480) 545 (460)
0.1   NPLC Digital I/O 560 (470) 450 (460) 545 (460) 540 (450) 570 (480) 545 (460)
1.0   NPLC Internal 59 (49) 59 (49) 59 (49) 59 (49) 59 (49) 59 (49)
Series 2600B specifications

Series 2600B specifications

1.0   NPLC Digital I/O 58 (48) 58 (49) 59 (49) 59 (49) 59 (49) 59 (49)

Maximum SINGLE MEASUREMENT RATES (operations per second) FOR 60Hz (50Hz): TRIGGERING AND
Source Measure SYNCHRONIZATION
A/D Converter Measure Source Measure To Pass/Fail
Speed Trigger Origin To Gpib Gpib To Gpib SPECIFICATIONS 1
0.001 NPLC Internal 1900 (1800) 1400 (1400) 1400 (1400) Triggering:
0.01  NPLC Internal 1450 (1400) 1200 (1100) 1100 (1100) Trigger in to trigger out: 0.5μs, typical.
0.1   NPLC Internal 450 (390) 425 (370) 425 (375) Trigger in to source change:2 10 μs, typical.
1.0   NPLC Internal 58 (48) 57 (48) 57 (48) Trigger Timer accuracy: ±2μs, typical.
Source change2 after LXI Trigger: 280μs, typical.
Maximum Measurement RANGE CHANGE RATE: <150µs for ranges >10µA, typical. When changing to or from a range ≥1A, Synchronization:
maximum rate is <450µs, typical. Single-node synchronized source change:4 <0.5μs, typical.
Maximum SOURCE Range CHANGE RATE: <2.5ms for ranges >10µA, typical. When changing to or from a range ≥1A, maximum Multi-node synchronized source change:4 <0.5μs, typical.
rate is <5.2ms, typical.
Maximum SOURCE FUNCTION CHANGE RATE: <1ms, typical. NOTES
1. TSP-Link not available on Models 2604B, 2614B, and 2634B.
COMMAND PROCESSING TIME: Maximum time required for the output to begin to change following the receipt of the smux.
2. Fixed source range, with no polarity change.
source.levelv or smux.source.leveli command. <1ms typical.

NOTES
1. Tests performed with a 2602B, 2612B, or 2636B on Channel A using the following equipment: PC Hardware (Pentium® 4 2.4GHz, 512MB RAM,
National Instruments PCI-GPIB). Driver (NI-486.2 Version 2.2 PCI-GPIB). Software (Microsoft® Windows® 2000, Microsoft Visual Studio 2005, VISA
version 4.1).
2. Exclude current measurement ranges less than 1mA.
3. 2635B/2636B with default measurement delays and filters disabled.

SMU INSTRUMENTS

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 Series 2600B System SourceMeter® SMU Instruments
Applicable to Models 2601B, 2602B, 2604B, 2611B, 2612B, 2614B, 2634B, 2635B, and 2636B.
SUPPLEMENTAL INFORMATION
FRONT PANEL INTERFACE: Two-line vacuum fluorescent display (VFD) with keypad and rotary knob. SYSTEM EXPANSION: The TSP-Link expansion interface allows TSP enabled instruments to
Display: ­trigger and communicate with each other. Not applicable for Models 2604B, 2614B, and 2634B.
Show error messages and user defined messages See figure below:
Display source and limit settings
Show current and voltage measurements
View measurements stored in dedicated reading buffers
Keypad Operations:
Change host interface settings
Save and restore instrument setups
Load and run factory and user defined test scripts (i.e. sequences) that prompt for input and send
results to the display
Series 2600B specifications

Series 2600B specifications

Store measurements into dedicated reading buffers
PROGRAMMING: Embedded Test Script Processor (TSP) accessible from any host interface. Responds
to individual instrument control commands. Responds to high speed test scripts comprised of
instrument control commands and Test Script Language (TSL) statements (e.g. branching, looping,
math, etc.). Able to execute high speed test scripts stored in memory without host intervention.
Minimum Memory Available: 16MB (approximately 250,000 lines of TSL code).
Test Script Builder: Integrated development environment for building, running, and managing TSP
scripts. Includes an instrument console for communicating with any TSP enabled instrument in
an interactive manner. Requires:
VISA (NI-VISA included on CD) Pentium III 800MHz or faster personal computer
Microsoft .NET Framework (included on CD) Microsoft Windows 98, NT, 2000, or XP

Keithley I/O Layer (included on CD)
Each SourceMeter SMU instrument has two TSP-Link connectors to facilitate chaining instru-
Software Interface: TSP Express (embedded), Direct GPIB/VISA, READ/WRITE for VB, VC/C++, ments together.
LabVIEW, LabWindows/CVI, etc.
Once SourceMeter SMU instruments are interconnected via TSP-Link, a computer can access
READING BUFFERS: Dedicated storage area(s) reserved for measurement data. Reading buffers are all of the resources of each SourceMeter SMU instrument via the host interface of any
arrays of measurement elements. Each element can hold the following items: SourceMeter SMU instrument.
Measurement Source setting (at the time the measurement was taken) A maximum of 32 TSP-Link nodes can be interconnected. Each SourceMeter SMU instrument
Measurement status Range information consumes one TSP-Link node.
Timestamp TIMER: Free running 47-bit counter with 1MHz clock input. Reset each time instrument powers
Two reading buffers are reserved for each SourceMeter channel. Reading buffers can be filled using up. Rolls over every 4 years.
the front panel STORE key and retrieved using the RECALL key or host interface. Timestamp: TIMER value automatically saved when each measurement is triggered.
Buffer Size, with timestamp and source setting: >60,000 samples. Resolution: 1µs.
Buffer Size, without timestamp and source setting: >140,000 samples.
Accuracy: ±100ppm.

SERVICES AVAILABLE FOR ALL

ACCESSORIES AVAILABLE SERIES 2600B MODELS
Software GPIB Interfaces and Cables Extended Warranties
ACS-BASIC Component Characterization Software 7007-1 Double Shielded GPIB Cable, 1m (3.3 ft.) 26xxB-EW 1 Year Factory Warranty extended to 2 years
7007-2 Double Shielded GPIB Cable, 2m (6.6 ft.) 26xxB-3Y-EW 1 Year Factory Warranty extended to 3 years
Rack Mount Kits
KPCI-488LPA IEEE-488 Interface/Controller for the PCI Bus 26xxB-5Y-EW 1 Year Factory Warranty extended to 5 years
4299-1 Single Rack Mount Kit with front and rear support
4299-2 Dual Rack Mount Kit with front and rear support Digital I/O, Trigger Link, and TSP-Link CALIBRATION CONTRACTS
4299-5 1U Vent Panel 2600-TLINK Digital I/O to TLINK Adapter Cable, 1m C/26xxB-3Y-STD 3 Calibrations within 3 years
CA-126-1A Digital I/O and Trigger Cable, 1.5m C/26xxB-5Y-STD 5 Calibrations within 5 years
Cables and Connectors
CA-180-3A CAT5 Crossover Cable for TSP-Link and C/26xxB-3Y-DATA 3 Calibrations within 3 years and includes
2600-BAN Banana Test Leads/Adapter Cable. For a calibration data before and after adjustment
single 2601B/2602B/2604B/2611B/261 direct Ethernet connection (two supplied)
2B/2614B SMU instrument channel C/26xxB-5Y-DATA 5 Calibrations within 5 years and includes
TEST FIXTURES calibration data before and after adjustment
2600-KIT Extra screw terminal connector, strain 8101-PIV DC, Pulse I-V and C-V Component Test Fixture
relief, and cover for a single SourceMeter C/26xxB-3Y-17025 3 IS0-17025 accredited calibrations within
8101-4TRX 4 Pin Transistor Fixture 3 years
SMU INSTRUMENTS

channel (one supplied with 2601B/2611B,

two with 2602B/2604B/2612B/2614B) LR8028 Component Test Fixture – Optimized for device C/26xxB-5Y-17025 5 IS0-17025 accredited calibrations within
testing at up to 200V/1A 5 years
2600-FIX-TRIAX Phoenix-to-Triax Adapter for 2 wire sensing
2600-TRIAX Phoenix-to-Triax Adapter for 4 wire sensing Switching
7078-TRX-* 3-Slot, Low Noise Triax Cable, 0.3m–6.1m. Series 3700A DMM/Switch Systems
For use with 2600-TRIAX Adapter 707B Semiconductor Switching Matrix Mainframe
7078-TRX-GND 3-Slot male triax to BNC adapter Calibration and Verification
(guard removed)
2600-STD-RES Calibration Standard 1GW Resistor for
7709-308A Digital I/O Connector (model specific) Models 2634B, 2635B, and 2636B
8606 High Performance Modular Probe
Kit. For use with 2600B-BAN

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 2651A 50A, High Power System
SourceMeter® SMU Instrument
• Source or sink:
–– 2,000W of pulsed power
(±40V, ±50A)
–– 200W of DC power
(±10V@±20A, ±20V@±10A,
±40V@±5A)
High power System SourceMeter SMU instrument

High power System SourceMeter SMU instrument

• Easily connect two units (in
series or parallel) to create
solutions up to ±100A or ±80V
• 1pA resolution enables precise
measurement of very low
The high power Model 2651A SourceMeter SMU Instrument is specifically designed to characterize
leakage currents
and test high power electronics. This SMU instrument can help you improve productivity in applica-
• 1μs per point (1MHz), tions across the R&D, reliability, and production spectrums, including high brightness LEDs, power
18-bit sampling, accurately semiconductors, DC-DC converters, batteries, solar cells, and other high power materials, compo-
characterizes transient behavior nents, modules, and subassemblies.
• 1% to 100% pulse duty cycle for The Model 2651A offers a highly flexible, four-quadrant voltage and current source/load coupled with
pulse width modulated (PWM) precision voltage and current meters. It can be used as a:
drive schemes and device- • Semiconductor characterization instrument
specific drive stimulus
• V or I waveform generator
• Combines a precision power • V or I pulse generator
supply, current source, DMM, • Precision power supply
arbitrary waveform generator, • True current source
V or I pulse generator with
measurement, electronic load, • Digital multimeter (DCV, DCI, ohms, and power with 6½-digit resolution)
and trigger controller—all in one • Precision electronic load
instrument
+50A
• Includes TSP® Express I-V
characterization software,
LabVIEW® driver, and Keithley’s
Test Script Builder software +20A
development environment
+10A
+5A
0A
–5A DC and
Pulse
–10A
Pulse
APPLICATIONS –20A only

• Power semiconductor,
HBLED, and optical device
characterization and testing
–50A
• Solar cell characterization
and testing –40V –20V –10V 0V +10V +20V +40V

• Characterization of GaN, SiC, and The Model 2651A can source or sink up to ±40V and ±50A.
other compound materials and
devices
SMU INSTRUMENTS

Two Measurement Modes: Digitizing or Integrating

• Semiconductor junction Precisely characterize transient and steady-state behavior, including rapidly changing thermal effects,
temperature characterization with the two measurement modes in the Model 2651A. Each mode is defined by its independent ana-
• High speed, high precision log-to-digital (A/D) converters.
digitization The Digitizing Measurement mode enables 1µs per point measurements. Its 18-bit A/D converters
• Electromigration studies allow you to precisely measure transient characteristics. For more accurate measurements, use its
Integrating Measurement mode, which is based on 22-bit A/D converters.
• High current, high power
device testing

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 2651A 50A, High Power System
SourceMeter® SMU Instrument
unit can pulse up to 50A; combine two units
Ordering Information
0.020

to pulse up to 100A. 0.018

Id = 10A
2651A High Power System
0.016
Expansion Capabilities 0.014
Id = 20A
Id = 30A
SourceMeter® SMU Id = 40A
Through TSP-Link Technology technology, mul-

Rds (ohms)
0.012 Id = 50A
Instrument
tiple Model 2651As and selected Series 2600B 0.010

Accessories Supplied SMU instruments can be combined to form a 0.008

High power System SourceMeter SMU instrument

High power System SourceMeter SMU instrument

larger integrated system with up to 64 channels.
0.006

2651A-KIT-1A: Low Impedance Precision timing and tight channel synchroniza-

0.004

Cable Assembly (1m) 0.002

tion are guaranteed with built-in 500ns trigger 0.000

CS-1592-2: High Current controllers. True SMU instrument-per-pin testing
2.0 2.5 3.0 3.5 4.0 4.5
Vgs (V)
5.0 5.5 6.0 6.5

Phoenix Connector (male) is assured with the fully isolated, independent

CS-1626-2: High Current channels of the SourceMeter SMU instruments. 1μV measurement resolution and current
Phoenix Connector (female) sourcing up to 50A (100A with two units)
CA-557-1: Sense Line enable low-level Rds measurements to
Cable Assembly (1m) 2651A support next-generation devices.
7709-308A: Digital I/O Connector 2651A Standard Capabilities of Series
CA-180-3A: TSP-Link/Ethernet Cable TSP-Link 2600B SMU Instruments
Documentation CD Up to Each Model 2651A includes all the features and
Software Tools and Drivers CD 100A
capabilities provided in most Series 2600B SMU
LXI or GPIB 26xxB
to PC instruments, such as:
Controller
Accessories Available • Ability to be used as either a bench-top
2600-KIT Screw Terminal Connector Kit I-V characterization tool or as a building
ACS-BASIC Component Charaterization Software block component of multiple-channel I-V
4299-6 Rack Mount Kit Keithley’s TSP and TSP-Link Technologies
test systems
8011 Test Socket Kit enable true SMU-per-pin testing without • TSP Express software to quickly and
the power and/or channel limitations of a easily perform common I-V tests without
Two A/D converters are used with each mainframe-based system. programming or installing software
measurement mode (one for current and the
other for voltage), which run simultaneously for • ACS Basic Edition software for semiconductor
Also, when two Model 2651As are connected in component characterization (optional).
accurate source readback that does not sacrifice parallel with TSP-Link Technology, the current
test throughput. ACS Basic now features a Trace mode for
range is expanded from 50A to 100A. When two generating a suite of characteristic curves.
units are connected in series, the voltage range
7 60
is expanded from 40V to 80V. Built-in intelli- • Keithley’s Test Script Processor (TSP®)
6 50
gence simplifies testing by enabling the units Technology, which enables creation of
5
40 to be addressed as a single instrument, thus custom user test scripts to further automate
creating an industry-best dynamic range (100A testing, and also supports the creation of
Current (A)
Voltage (V)

3
30
to 1pA). This c­ apability enables you to test a programming sequences that allow the
2
20
much wider range of power semiconductors and instrument to operate asynchronously
1
10 other devices. without direct PC control.
0
0 25 50 75 100 125 150 175 200
0 • Parallel test execution and precision
Volts
Time (µs)
Current
60 timing when multiple SMU instruments are
50
connected together in a system
The dual digitizing A/D converters sample at • LXI compliance
40
up to 1μs/point, enabling full simultaneous Vgs = 2.01V

characterization of both current and

Vgs = 2.25V
Vgs = 2.50V • 14 digital I/O lines for direct interaction with
Id (A)

30 Vgs = 2.75V
voltage waveforms. probe stations, component handlers, or other
SMU INSTRUMENTS

Vgs = 3.00V
Vgs = 3.25V
20 Vgs = 3.51V automation tools
High Speed Pulsing
10 • USB port for extra data and test program
­storage via USB memory device
The Model 2651A minimizes the unwanted 0
0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0

effects of self heating during tests by accurately Vds (V)

sourcing and measuring pulses as short as

Precision measurements to 50A (100A with
100μs. Additional control flexibility enables you two units) enable a more complete and
to program the pulse width from 100μs to DC accurate characterization.
and the duty cycle from 1% to 100%. A single

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 2651A 50A, High Power System
SourceMeter® SMU Instrument
Specification Conditions
This document contains specifications and supplemental information for the Model 2651A High Source and measurement accuracies are specified at the Model 2651A terminals under
Power System SourceMeter SMU instrument. Specifications are the standards against which the these conditions:
Model 2651A is tested. Upon leaving the factory, the Model 2651A meets these specifications. • 23° ±5°C, <70 percent relative humidity
Supplemental and typical values are non-warranted, apply at 23°C, and are provided solely as
• After two-hour warm-up
useful information.
• Speed normal (1 NPLC)
Accuracy specifications are applicable for both normal and high-capacitance modes.
• A/D autozero enabled
• Remote sense operation or properly zeroed local operation
• Calibration period: One year

VOLTAGE ACCURACY SPECIFICATIONS 1, 2

Model 2651A specifications

Model 2651A specifications

SOURCE MEASURE
Default
Programming Accuracy Noise (Vpp) (typical) Display Integrating ADC Accuracy 3 High-Speed ADC Accuracy 4
Range Resolution ±(% reading + volts) 0.1 Hz to 10 Hz Resolution ±(% reading + volts) ±(% reading + volts)
100.000 mV   5 μV 0.02% + 500  μV 100  μV   1 μV 0.02% + 300  μV 0.05% + 600  μV
1.00000    V   50 μV 0.02% + 500  μV 500  μV   10 μV 0.02% + 300  μV 0.05% + 600  μV
10.0000    V 500 μV 0.02% +    5 mV   1 mV 100 μV 0.02% +    3 mV 0.05% +    8 mV
20.0000    V 500 μV 0.02% +    5 mV   1 mV 100 μV 0.02% +    5 mV 0.05% +    8 mV
40.0000    V 500 μV 0.02% +   12 mV   2 mV 100 μV 0.02% +   12 mV 0.05% +   15 mV

CURRENT ACCURACY SPECIFICATIONS 5

SOURCE MEASURE
Default
Programming Accuracy Noise (Ipp) (typical) Display Integrating ADC Accuracy 3 High-Speed ADC Accuracy 4
Range Resolution ±(% reading + amps) 0.1Hz to 10Hz Resolution ±(% reading + amps) ±(% reading + amps)
100.000 nA 2 pA 0.1  % + 500 pA   50 pA   1 pA 0.08% + 500 pA 0.08% + 800 pA
1.00000 μA 20 pA 0.1  % + 2 nA 250 pA   10 pA 0.08% + 2 nA 0.08% + 4 nA
10.0000 μA 200 pA 0.1  % + 10 nA 500 pA 100 pA 0.08% + 8 nA 0.08% + 10 nA
100.000 μA 2 nA 0.03% + 60 nA   5 nA   1 nA 0.02% + 25 nA 0.05% + 60 nA
1.00000 m A 20 nA 0.03% + 300 nA   10 nA   10 nA 0.02% + 200 nA 0.05% + 500 nA
10.0000 m A 200 nA 0.03% + 8 μA 500 nA 100 nA 0.02% + 2.5 µA 0.05% + 10 µA
100.000 m A 2 μA 0.03% + 30 μA   1 μA   1 μA 0.02% + 20 µA 0.05% + 50 µA
1.00000 A 200 μA 0.08% + 3.5 mA 300 μA   10 μA 0.05% + 3 mA 0.05% + 5 mA
5.00000 A 200 μA 0.08% + 3.5 mA 300 μA   10 μA 0.05% + 3 mA 0.05% + 5 mA
10.0000 A 500 μA 0.15% + 6 mA 500 μA 100 μA 0.12% + 6 mA 0.12% + 12 mA
20.0000 A 500 μA 0.15% + 8 mA 500 μA 100 μA 0.08% + 8 mA 0.08% + 15 mA
50.0000 A 6 2 mA 0.15% + 80 mA N/A 100 μA 0.05% + 50 mA 7 0.05% + 90 mA 8

NOTES
1. Add 50µV to source accuracy specifications per volt of HI lead drop.
2. For temperatures 0° to 18°C and 28° to 50°C, accuracy is degraded by ±(0.15 × accuracy specification)/°C.
High-capacitance mode accuracy is applicable at 23° ±5°C only.
3. Derate accuracy specification for NPLC setting <1 by increasing error term.
Add appropriate typical percent of range term for resistive loads using the table below.
NPLC Setting 100mV Range 1V to 40V Ranges 100nA Range 1µA to 100mA Ranges 1A to 20A Ranges
0.1 0.01% 0.01% 0.01% 0.01% 0.01%
0.01 0.08% 0.07% 0.1 % 0.05% 0.1 %
0.001 0.8 % 0.6 % 1   % 0.5 % 1.8 %
4. 18-bit ADC. Average of 1000 samples taken at 1µs intervals.
5. At temperatures 0° to 18°C and 28° to 50°C; 100nA to 10µA accuracy is degraded by ±(0.35 × accuracy specification)/°C.
100µA to 50A accuracy is degraded by ±(0.15 × accuracy specification)/°C.
High-capacitance mode accuracy is applicable at 23° ±5°C only.
6. 50A range accessible only in pulse mode.
SMU INSTRUMENTS

7. 50A range accuracy measurements are taken at 0.008 NPLC.

8. Average of 100 samples taken at 1µs intervals.

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 2651A 50A, High Power System
SourceMeter® SMU Instrument
DC POWER SPECIFICATIONS
Maximum output power: 202W maximum. +50A
Source/Sink Limits 1:
5 6
Voltage: ±10.1V at ±20.0A, ±20.2V at ±10.0A, ±40.4V at ±5.0A 2.
Four-quadrant source or sink operation. +30A 7
Current: ±5.05A at ±40V 2, ±10.1A at ±20V, ±20.2A at ±10V 2
Four-quadrant source or sink operation. +20A
3
CAUTION: Carefully consider and configure the appropriate output-off state and source and +10A 4
compliance levels before connecting the Model 2651A to a device that can deliver energy. Failure to +5A DC
consider the output-off state and source and compliance levels may result in damage to the instru- 0A 1
–5A
ment or to the device under test.
–10A
Pulse
Model 2651A specifications

Model 2651A specifications

Pulse SPECIFICATIONS –20A
Minimum programmable pulse width 3: 100μs. Note: Minimum pulse width for settled
–30A
source at a given I/V output and load can be longer than 100μs.
Pulse width programming resolution: 1μs.
Pulse width programming accuracy 3: ±5μs.
–50A
Pulse width jitter: 2μs (typical).
Pulse Rise Time (typical): –40V –20V –10V 0V +10V +20V +40V
Current Range R load Rise Time (typical) Region Maximum Maximum
50 A 0.05 W   26 μs Region Maximums Pulse Width 3 Duty Cycle 4
50 A 0.2  W   57 μs 1   5 A at 40 V DC, no limit 100%
50 A 0.4  W   85 μs 1 10 A at 20 V DC, no limit 100%
20 A 0.5  W   95 μs 1 20 A at 10 V DC, no limit 100%
50 A 0.8  W 130 μs 2 30 A at 10 V   1 ms  50%
20 A 1    W 180 μs 3 20 A at 20 V   1.5 ms  40%
10 A 2    W 330 μs
4 10 A at 40 V   1.5 ms  40%
 5A 8.2  W 400 μs
5 50 A at 10 V   1 ms  35%
6 50 A at 20 V 330 μs  10%
7 50 A at 40 V 300 μs   1%

NOTES
1. Full power source operation regardless of load to 30°C ambient. Above 30°C or power sink operation, refer to
“Operating Boundaries” in the Model 2651A Reference manual for additional power derating information.
2. Quadrants 2 and 4 power envelope is trimmed at 36V and 4.5A.
3. Times measured from the start of pulse to the start off-time; see figure below.
Pulse Level
90%

Start ton Start toff

Bias Level 10% 10%

ton toff

4. Thermally limited in sink mode (quadrants 2 and 4) and ambient temperatures above 30°C. See power equa-
tions in the Model 2651A Reference Manual for more information.
SMU INSTRUMENTS

The Model 2651A supports GPIB, LXI, Digital I/O, and Keithley’s TSP-Link Technology for multi-channel synchronization.

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 2651A 50A, High Power System
SourceMeter® SMU Instrument
ADDITIONAL SOURCE SPECIFICATIONS Additional Measurement specifications
Noise (10Hz to 20MHz): <100mV peak-peak (typical), <30mV RMS (typical), 10V range with a
20A limit. Contact Check 1
Overshoot: Maximum Measurement Accuracy (1 Year)
Voltage: <±(0.1% + 10mV) (typical). Step size = 10% to 90% of range, resistive load, maximum Speed Time to Memory 23° ±5°C
current limit/compliance. for 60Hz (50Hz) ±(% reading + ohms)
Current: <±(0.1% + 10mV) (typical). Step Size = 10% to 90% of range, resistive load. See Fast 1.1 ms (1.2 ms) 5% + 15 W
Current Source Output Settling Time specifications for additional test conditions. Medium 4.1 ms (5 ms) 5% +   5 W
Range change overshoot: Slow 36 ms (42 ms) 5% +   3 W
Voltage: <300mV + 0.1% of larger range (for <20V ranges) (typical).
<400mV + 0.1% of larger range (for ≥20V ranges) (typical). NOTES
Overshoot into a 100kW load, 20MHz bandwidth. 1. Includes measurement of SENSE HI to HI and SENSE LO to LO contact resistances.
Current: <5% of larger range + 360mV/R load (for >10μA ranges) (typical). Iout × R load = 1V.
Model 2651A specifications

Model 2651A specifications

Voltage source output settling time: Time required to reach within 0.1% of final value Additional meter specifications
after source level command is processed on a fixed range. 1 Maximum load impedance:
Range Settling Time (typical) Normal Mode: 10nF (typical), 3μH (typical).
High-Capacitance Mode: 50μF (typical), 3μH (typical).
 1V <  70 μs
10 V <160 μs Common mode voltage: 250V DC.
20 V <190 μs Common mode isolation: >1GW, <4500pF.
40 V <175 μs Measure input impedance: >10GW.
Current source output settling time: Time required to reach within 0.1% of final value Sense high input impedance: >10GW.
after source level command is processed on a fixed range. Values below for Iout × R load. Maximum sense lead resistance: 1kW for rated accuracy.
Current Range R load Settling time (typical) Overrange: 101% of source range, 102% of measure range.
20 A 0.5 W <195  μs
10 A 1.5 W <540  μs HIGH-CAPACITANCE mODE 1,2
5 A 5 W <560  μs
Accuracy specifications 3: Accuracy specifications are applicable in both normal and
1 A 1 W <  80  μs
high-capacitance modes.
100 mA 10 W <  80  μs
10 mA 100 W <210  μs Voltage Source Output Settling Time: Time required to reach within 0.1 % of final value
1 mA 1 kW <300  μs after source level command is processed on a fixed range. 4
100 μA 10 kW <500  μs Voltage Source Settling Time with
10 μA 100 kW <  15 ms Range Cload = 4.7μF (typical)
1 μA 1 MW <  35 ms  1V   75 μs
100 nA 10 MW <110 ms 10 V 170 μs
20 V 200 μs
Transient response time:
40 V 180 μs
10V and 20V Ranges: <70μs for the output to recover to within 0.1% for a 10% to 90% step
change in load. Mode change delay:
40V Range: <110μs for the output to recover to within 0.1% for a 10% to 90% step change in load. 100μA Current Range and Above:
Guard offset voltage: <4mV, current <10mA. Delay into High-Capacitance Mode: 11ms.
Remote sense operating range 2: Delay out of High-Capacitance Mode: 11ms.
Maximum Voltage between HI and SENSE HI: 3V. 1μA and 10μA Current Ranges:
Maximum Voltage between LO and SENSE LO: 3V. Delay into High-Capacitance Mode: 250ms.
Maximum impedance per source lead: Delay out of High-Capacitance Mode: 11ms.
Maximum impedance limited by 3V drop by remote sense operating range. Measure input impedance: >10GW in parallel with 25nF.
Maximum resistance = 3V/source current value (amperes) (maximum of 1W per source lead). Voltage source range change overshoot: <400mV + 0.1% of larger range (typical).
3V = L di/dt. Overshoot into a 100kW load, 20MHz bandwidth.
Voltage output headroom:
NOTES
5A Range: Maximum output voltage = 48.5V – (Total voltage drop across source leads).
1. High-capacitance mode specifications are for DC measurements only and use locked ranges. Autorange is dis-
10A Range: Maximum output voltage = 24.5V – (Total voltage drop across source leads). abled.
20A Range: Maximum output voltage = 15.9V – (Total voltage drop across source leads). 2. 100nA range is not available in high-capacitance mode.
Overtemperature protection: Internally sensed temperature overload puts unit in stand- 3. Add an additional 2nA to the source current accuracy and measure current accuracy offset for the 1µA range.
by mode. 4. With measure and compliance set to the maximum current for the specified voltage range.

Limit/compliance: Bipolar limit (compliance) set with single value.

SMU INSTRUMENTS

Voltage 3: Minimum value is 10mV; accuracy is the same as voltage source.

Current 4: Minimum value is 10nA; accuracy is the same as current source.

NOTES
1. With measure and compliance set to the maximum current for the specified voltage range.
2. Add 50µV to source accuracy specifications per volt of HI lead drop.
3. For sink mode operation (quadrants II and IV), add 0.6% of limit range to the corresponding voltage source
accuracy specifications. For 100mV range add an additional 60mV of uncertainty. Specifications apply with sink
mode enabled.
4. For sink mode operation (quadrants II and IV), add 0.6% of limit range to the corresponding current limit
accuracy specifications. Specifications apply with sink mode enabled.

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 2651A 50A, High Power System
SourceMeter® SMU Instrument
Measurement Speed Specifications 1, 2
Maximum SWEEP OPERATION RATES (operations per second) FOR 60Hz (50Hz):
Measure Measure Source Measure Source Measure Source Measure Source Measure
A/D Converter To Memory Using To Gpib Using To Memory Using To Gpib Using To Memory Using To Gpib Using
Speed Trigger Origin User Scripts User Scripts User Scripts User Scripts Sweep API Sweep API
0.001 NPLC Internal 20000 (20000) 9800 (9800) 7000 (7000) 6200 (6200) 12000 (12000) 5900 (5900)
0.001 NPLC Digital I/O 8100 (8100) 7100 (7100) 5500 (5500) 5100 (5100) 11200 (11200) 5700 (5700)
0.01  NPLC Internal 4900 (4000) 3900 (3400) 3400 (3000) 3200 (2900) 4200 (3700) 4000 (3500)
0.01  NPLC Digital I/O 3500 (3100) 3400 (3000) 3000 (2700) 2900 (2600) 4150 (3650) 3800 (3400)
0.1   NPLC Internal 580 (480) 560 (470) 550 (465) 550 (460) 560 (470) 545 (460)
0.1   NPLC Digital I/O 550 (460) 550 (460) 540 (450) 540 (450) 560 (470) 545 (460)
1.0   NPLC Internal 59 (49) 59 (49) 59 (49) 59 (49) 59 (49) 59 (49)
Model 2651A specifications

Model 2651A specifications

1.0   NPLC Digital I/O 58 (48) 58 (49) 59 (49) 59 (49) 59 (49) 59 (49)
HS ADC Internal 38500 (38500) 18000 (18000) 10000 (10000) 9500 (9500) 14300 (14300) 6300 (6300)
HS ADC Digital I/O 12500 (12500) 11500 (11500) 7500 (7500) 7000 (7000) 13200 (13200) 6000 (6000)

High Speed ADC Burst MEASUREMENT RATES 3 TRIGGERING AND SYNCHRONIZATION

SPECIFICATIONS
Burst Length Readings per
(readings) Second Bursts per Second Triggering:
Trigger In to Trigger Out: 0.5μs (typical).
 100 1,000,000 400 Trigger In to Source Change 1: 10μs (typical).
 500 1,000,000  80 Trigger Timer Accuracy: ±2μs (typical).
1000 1,000,000  40 Source Change 1 After LXI Trigger: 280μs (typical).
2500 1,000,000  16 Synchronization:
5000 1,000,000   8 Single-Node Synchronized Source Change 1: <0.5μs (typical).
Multi-Node Synchronized Source Change 1: <0.5μs (typical).

Maximum SINGLE MEASUREMENT RATES (operations per NOTES

second) FOR 60Hz (50Hz) 1. Fixed source range with no polarity change.
Source
Source Measure
A/D Converter Trigger Measure Measure Pass/Fail
Speed Origin To Gpib To Gpib To Gpib
0.001 NPLC Internal 1900 (1800) 1400 (1400) 1400 (1400)
0.01  NPLC Internal 1450 (1400) 1200 (1100) 1100 (1100)
0.1   NPLC Internal 450 (390) 425 (370) 425 (375)
1.0   NPLC Internal 58 (48) 57 (48) 57 (48)

Maximum Measurement RANGE CHANGE RATE: >4000 per second for >10µA (typical).
Maximum SOURCE Range CHANGE RATE: >325 per second for >10µA, typical. When chang-
ing to or from a range ≥1A, maximum rate is >250 per second, typical.
COMMAND PROCESSING TIME: Maximum time required for the output to begin to change fol-
lowing the receipt of the smua.source.levelv or smua.source.leveli command. <1ms typical.

NOTES
1. Tests performed with a Model 2651A on channel A using the following equipment: Computer hardware (Intel®
Pentium® 4 2.4GHz, 2GB RAM, National Instruments™ PCI-GPIB). Driver (NI-488.2 Version 2.2 PCI-GPIB).
Software (Microsoft® Windows® XP, Microsoft Visual Studio® 2010, VISA™ version 4.1).
2. Exclude current measurement ranges less than 1mA.
3. smua.measure.adc has to be enabled and the smua.measure.count set to the burst length.
SMU INSTRUMENTS

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 2651A 50A, High Power System
SourceMeter® SMU Instrument
SUPPLEMENTAL INFORMATION GENERAL
FRONT PANEL INTERFACE: Two-line vacuum fluorescent display (VFD) with keypad and Digital I/O Interface:
navigation wheel. 600mA
Solid State
Display: +5V Pin Fuse +5VDC
(on DIGITAL I/O
Show error messages and user defined messages. Display source and limit settings. connector)
Show current and voltage measurements View measurements stored in dedicated 5.1k�
Read by
(6½-digit to 4½-digit). reading buffers. Digital I/O Pin 100� firmware
(on DIGITAL I/O
Keypad Operations: connector)
Written by
Change host interface settings. firmware
Save and restore instrument setups.
GND Pin
Load and run factory and user defined test scripts that prompt for input and send results to (on DIGITAL I/O
connector)
the display. Rear Panel
Store measurements into dedicated reading buffers.
Model 2651A specifications

Model 2651A specifications

PROGRAMMING: Embedded Test Script Processor (TSP®) scripting engine is accessible from any Connector: 25-pin female D.
host interface. Input/Output Pins: 14 open drain I/O bits.
Responds to individual instrument control commands. Absolute Maximum Input Voltage: 5.25V.
Responds to high speed test scripts comprised of instrument control commands and Test Script Absolute Minimum Input Voltage: –0.25V.
Language (TSL) statements (for example, branching, looping, and math). Maximum Logic Low Input Voltage: 0.7V, +850μA max.
Able to execute high speed test scripts stored in memory without host intervention. Minimum Logic High Input Voltage: 2.1V, +570μA.
Minimum User Memory Available: 16MB (approximately 250,000 lines of TSP code). Maximum Source Current (flowing out of digital I/O bit): +960μA.
Test Script Builder: Integrated development environment for building, running, and Maximum Sink Current At Maximum Logic Low Voltage (0.7): –5.0mA.
managing TSP scripts. Includes an instrument console for communicating with any TSP enabled Absolute Maximum Sink Current (flowing into digital I/O pin): –11mA.
instrument in an interactive manner. Requires: 5V Power Supply Pin: Limited to 250mA, solid-state fuse protected.
VISA (NI-VISA included on CD), Output Enable Pin: Active high input pulled down internally to ground with a 10kW
Microsoft® .NET Framework (included on CD), resistor; when the output enable input function has been activated, the Model 2651A
Keithley I/O Layer (included on CD), channel will not turn on unless the output enable pin is driven to >2.1V (nominal
Intel® Pentium III 800MHz or faster personal computer, current = 2.1V/10kW = 210μA).
Microsoft Windows® 2000, XP, Vista®, or 7.
IEEE-488: IEEE-488.1 compliant. Supports IEEE-488.2 common commands and status model
TSP Express (embedded): Tool that allows users to quickly and easily perform common I-V tests topology.
without programming or installing software. To run TSP Express, you need:
Java™ Platform, Standard Edition 6, RS-232: Baud rates from 300bps to 115200bps. Programmable number of data bits, parity
Microsoft Internet Explorer®, Mozilla® Firefox®, or another Java-compatible web browser. type, and flow control (RTS/CTS hardware or none). When not programmed as the
active host interface, the Model 2651A can use the RS-232 interface to control other
Software Interface: TSP Express (embedded), direct GPIB/VISA, read/write with Microsoft instrumentation.
Visual Basic®, Visual C/C++®, Visual C#®, LabVIEW™, CEC TestPoint™ Data Acquisition
Software Package, NI LabWindows™/CVI, etc. Ethernet: RJ-45 connector, LXI, 10/100BT, Auto MDIX.
READING BUFFERS: Nonvolatile memory uses dedicated storage areas reserved for measurement LXI compliance: LXI Class C 1.2.
data. Reading buffers are arrays of measurement elements. Each element can hold the Total Output Trigger Response Time: 245μs minimum, 280μs (typical), (not specified)
following items: maximum.
Measurement Source setting (at the time the measurement was taken) Receive Lan[0-7] Event Delay: Unknown.
Measurement status Range information Generate Lan[0-7] Event Delay: Unknown.
Timestamp Expansion interface: The TSP-Link Technology expansion interface allows TSP-enabled
Two reading buffers are reserved for each Model 2651A channel. Reading buffers can be filled instruments to trigger and communicate with each other.
using the front panel STORE key and retrieved using the RECALL key or host interface. Cable Type: Category 5e or higher LAN crossover cable. 3 meters maximum between each
Buffer Size, with timestamp and source setting: >60,000 samples. TSP-enabled instrument.
Buffer Size, without timestamp and source setting: >140,000 samples. USB: USB 2.0 host controller.
SYSTEM EXPANSION: The TSP-Link expansion interface allows TSP-enabled instruments to Power supply: 100V to 250V AC, 50Hz to 60Hz (autosensing), 550VA maximum.
­trigger and communicate with each other. See figure below.
Cooling: Forced air; side and top intake and rear exhaust.
To Host Computer
Warranty: 1 year.
Node 1 EMC: Conforms to European Union EMC Directive.
Safety: UL listed to UL61010-1:2004. Conforms to European Union Low Voltage Directive.
Dimensions: 89mm high × 435mm wide × 549mm deep (3.5 in. × 17.1 in. × 21.6 in.).
Node 2
Bench Configuration (with handle and feet): 104mm high × 483mm wide × 620mm
deep (4.1 in. × 19 in. × 24.4 in.).
To Additional Nodes
Weight: 9.98kg (22 lbs).
SMU INSTRUMENTS

Each Model 2651A has two TSP-Link connectors to make it easier to connect instruments Environment: For indoor use only.
together in sequence.
Once source-measure instruments are interconnected through the TSP-Link expansion interface, Altitude: Maximum 2000 meters above sea level.
a computer can access all the resources of each source-measure instrument through the host Operating: 0° to 50°C, 70% relative humidity up to 35°C. Derate 3% relative humidity/°C,
interface of any Model 2651A. 35° to 50°C.
A maximum of 32 TSP-Link nodes can be interconnected. Each source-measure instrument Storage: –25° to 65°C.
consumes one TSP-Link node.
TIMER: Free-running 47-bit counter with 1MHz clock input. Resets each time instrument power is
turned on. If the instrument is not turned off, the timer is reset to zero every 4 years.
Timestamp: TIMER value is automatically saved when each measurement is triggered.
Resolution: 1µs.
Timestamp Accuracy: ±100ppm.

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 2657A High Power System SourceMeter ®

SMU Instrument
High power SourceMeter SMU instrument

High power SourceMeter SMU instrument

• Source or sink up to 180W of DC The Model 2657A is a high voltage, high power, low current source measure unit (SMU) instrument
or pulsed power (±3000V@20mA, that delivers unprecedented power, precision, speed, flexibility, and ease of use to improve produc-
±1500V@120mA) tivity in R&D, production test, and reliability environments. The Model 2657A is designed specifically
for characterizing and testing high voltage electronics and power semiconductors, such as diodes,
• 1fA low current resolution
FETs, and IGBTs, as well as other components and materials in which high voltage, fast response, and
• Dual 22-bit precision ADCs precise measurements of voltage and current are required. The Model 2657A offers the highest power
and dual 18-bit 1µs per point and best low current performance in the industry. It is supported by the industry’s most powerful
digitizers for high accuracy and parametric characterization software platforms to grow with you as your applications evolve.
high speed transient capture
The Model 2657A offers highly flexible, four-quadrant voltage and current source/load coupled with
• Fully TSP® compliant for precision voltage and current meters. It can be used as a:
easy system integration
• Semiconductor characterization instrument
with Series 2600B System
SourceMeter models • V or I waveform generator • Digital multimeter (DCV, DCI, ohms, and
• V or I pulse generator power with 6½-digit resolution)
• Combines a precision power
supply, current source, DMM, • Precision power supply with V and I readback • Precision electronic load
arbitrary waveform generator, V • True current source
or I pulse generator, electronic
18-bit load, and trigger controller
– all in one instrument
• Includes TSP® Express
characterization software,
LabVIEW® driver, and Keithley’s +120 mA
Test Script Builder software
development environment
+60 mA

+20 mA
Typical Applications 0 mA
–20 mA
• Power semiconductor device
characterization and testing –60 mA
SMU INSTRUMENTS

• Characterization of GaN, SiC,

and other compound materials –120 mA
and devices
• Breakdown and leakage
testing to 3kV
• Characterization of –3 kV –1.5 kV 0 kV +1.5 kV +3 kV

sub-millisecond transients
The Model 2657A can source or sink up to 3000V @ 20mA or 1500V @ 120mA.

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 2657A High Power System SourceMeter
SMU Instrument
Two Measurement Modes: Digitizing or Integrating
Ordering Information Precisely characterize transient and steady-state behavior, including rapidly changing thermal effects,
2657A High Power System with the two measurement modes in the Model 2657A. Each mode is defined by its independent ana-
SourceMeter SMU log-to-digital (A/D) converters.
Instrument The digitizing measurement mode provides speeds up to 1µs per sample. The dual 18-bit digitizers
8010 High Power Device allow you to capture voltage and current transients simultaneously. In the integrating measurement
Test Fixture mode, the dual 22-bit integrating analog to digital converters allow more precise measurement of volt-
age and current. Two A/D converters are used with each measurement mode, one for current and
High power SourceMeter SMU instrument

High power SourceMeter SMU instrument

Accessories Supplied the other for voltage, that run simultaneously for accurate source readback that does not sacrifice
7709-308A Digital I/O and test throughput.
Interlock Connector
CA-180-3A TSP-Link/Ethernet Cable 0.0010 700
Documentation CD 0.0008
600
Software tools and drivers CD 0.0006
Current 500
0.0004
ACCESSORIES AVAILABLE Voltage
Current (A)

Voltage (V)
0.0002
2657A-LIM-3 Low Interconnect Module 400
2657A-PM-200 200V Protection Module 0.0000
4299-6 Fixed Rack Mount Kit 300
–0.0002
SHV-CA-553-x High Voltage Triax to SHV Cable (1, 2, 3m)
HV-CA-554-x High Voltage Triax to Triax Cable (0.5, 1, 2, 3m) –0.0004 200
HV-CA-571-3 High Voltage Triax to Unterminated Cable
–0.0006
HV-CS-1613 High Voltage Triax Feedthrough Connector 100
Accessories supplied with the 8010 –0.0008
CA-558-2 25-pin D-sub Interlock Cable for 26xxA 0
–0.0010
CA-560-x 4mm Black and Red Banana Cables, 8 in.
CA-562-x 6mm Black and Red Banana Cables, 10 in. –0.0012 –100
CA-563 BNC to Banana Cable, 9.5 in. 0.000 0.005 0.010 0.015 0.020 0.025 0.030
CA-568-120 Safety Earth Ground Cable
8010-DTB Device Test Board with TO-247 Socket
Time (seconds)
Accessories available for the 8010
8010-CTB Customizable Test Board The dual high speed A/D converters sample as fast as 1µs per point, enabling full simultaneous
characterization of both voltage and current.
8010-DTB-220 Device Test Board with TO-220 Socket (1.5kV)
Expansion Capabilities
Through TSP-Link Technology technology, the Model 2657A can be linked with Series 2600B SMU
instruments to form a larger integrated system with up to 32 nodes. Precision timing and tight chan-
nel synchronization are guaranteed with built-in 500ns trigger controllers. The fully isolated, inde-
pendent channels of the SourceMeter SMU instruments make true SMU-per-pin testing possible.
High Power Device Test Fixture
2657A-PM-200 2657A
The Model 8010 High Power Device Test Fixture provides safe and easy connections for testing
­packaged high power devices at up to 3000V or 100A. The Model 8010 provides connections for a
26xxB high voltage SourceMeter SMU instrument (Model 2657A), one or two high current SourceMeter SMU
instruments (Model 2651A), and three low power SourceMeter SMU instruments (Series 2600B or
Model 4200-SCS SMU instruments). This allows devices with two terminals (diodes) or three termi-
2657A-LIM-3
nals (transistors) or even four or five terminals to be characterized safely and accurately. The Model
SMU INSTRUMENTS

8010 has full interlock capability for up to six SourceMeter SMU instruments. The Model 8010 has
The Model 2657A can be combined with integrated protection circuits that protect the low voltage SourceMeter SMU instruments from high
Series 2600B and Model 4200-SCS SMU voltages the Model 2657A can output should a device fault occur. The Model 8010 includes both a
instruments to support multi-terminal high current (100A) and a high voltage (3000V) test socket. Various replacement test socket modules
test capability. The Models 2657A-PM-200 are available, including TO-247, TO-220, axial lead, and a blank socket module that allows building
Protection Module and 2657A-LIM-3 Low
a custom socket. In addition to standard banana jumpers, the Model 8010 has rear-panel scope and
Interconnect Module make it easier to con-
nect multiple instruments to a probe station thermal probe ports to simplify system integration.
safely (not required for connecting to the
Model 8010 High Power Device Test Fixture).

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 2657A High Power System SourceMeter
SMU Instrument
Standard Capabilities of Series Model 2657A Condensed Specifications
2600B SMU instruments
VOLTAGE ACCURACY SPECIFICATIONS 1
Each Model 2657A includes all the features
Source Measure
and capabilities provided in Series 2600B Integrating ADC High Speed
SourceMeter SMU instruments: Programming Accuracy Display Accuracy 2 ADC Accuracy 3
• Flexibility for use as either a bench-top Range Resolution ±(% rdg + volts) Resolution ±(% rdg + volts) ±(% rdg + volts)
I-V characterization tool or as a building 200 V   5 mV 0.03% +   50 mV 100  µV 0.025% +   50 mV 0.05% +  100 mV
500 V 10 mV 0.03% + 125 mV 100  µV 0.025% + 100 mV 0.05% +  200 mV
block component of multiple channel I-V 1500 V 40 mV 0.03% + 375 mV   1 mV 0.025% + 300 mV 0.05% +  600 mV
test systems. 3000 V 80 mV 0.03% + 750 mV   1 mV 0.025% + 600 mV 0.05% +   1.2   V
• TSP Express software to perform common I-V
tests quickly and easily without programming
Model 2657A specifications

Model 2657A specifications

or installing software. CURRENT ACCURACY SPECIFICATIONS 4
Source Measure
• ACS Basic Edition software for semiconductor Integrating ADC High Speed
component characterization (optional). ACS Programming Accuracy Display Accuracy 2 ADC Accuracy 3
Basic Edition now features a “Trace” mode for Range Resolution ±(% rdg + amps) Resolution ±(% rdg + amps) ±(% rdg + amps)
generating a suite of characteristic curves. 1  nA   30  fA 0.1% + 2E –12 + VoE –15   1  fA 0.1% + 6E –13 + VoE –15 0.2% + 6E –13 + VoE –15
10  nA 300  fA 0.1% + 5E –12 + VoE –15   10  fA 0.1% + 5E –12 + VoE –15 0.2% + 5E –12 + VoE –15
• Keithley’s Test Script Processor (TSP) 100  nA   3 pA 0.1% + 6E –11 + VoE –13 100  fA 0.1% + 6E –11 + VoE –13 0.2% + 6E –11 + VoE –13
technology supports creating and running 1  µA   30 pA 0.03% +  700 pA   1 pA 0.025% +  400 pA 0.08% + 800 nA
custom user test scripts for high speed test 10  µA 300 pA 0.03% +     5 nA   10 pA 0.025% +   1.5 nA 0.08% +    3 nA
automation, as well as creating programming 100  µA   3 nA 0.03% +   60 nA 100 pA 0.02  % +    25 nA 0.05% +   50 nA
1 mA   30 nA 0.03% +  300 nA   1 nA 0.02  % +  200 nA 0.05% + 400 nA
sequences that allow the instrument to 2 mA   60 nA 0.03% +   1.2 µA   1 nA 0.02  % +  500 nA 0.05% +    1 µA
operate asynchronously without direct 20 mA 600 nA 0.03% +   12 µA   10 nA 0.02  % +     5 µA 0.05% +   10 µA
PC control. 120 mA   3 µA 0.03% +   36 µA 100 nA 0.02  % +   24 µA 0.05% +   50 µA
• Parallel test execution and precision timing 1. For temperatures 0° to 18°C and 28° to 50°C, accuracy is degraded by ±(0.15 × accuracy specification)/°C.
when multiple Series 2600B SMU instruments 2. Derate accuracy specification for NPLC setting <1 by increasing error term. Add appropriate typical percent of range term for resistive loads using the
table below.
are connected together in a system.
NPLC 200 V and 500 V 1500 V and 3000 V 1 µA to 120 mA
• LXI Class C compliance. Setting Ranges Ranges 100 nA Range Ranges
0.1 0.01% 0.01% 0.01% 0.01%
• 14 digital I/O lines for direct connection to a 0.01 0.08% 0.07% 0.1 % 0.05%
probe station, component handler, or other 0.001 0.8 % 0.6 % 1   % 0.5 %
automation tools. 3. 18-bit ADC. Average of 1000 samples taken at 1µs intervals.
4. For temperatures 0° to 18°C and 28° to 50°C, accuracy is degraded by ±(0.35 × accuracy specification)/°C.
• USB port for extra data and test program
­storage via USB memory device.
Supplemental Characteristics
Typical Voltage Source Noise: 0.005% of range.
Typical Current Source Noise: 0.08% of range.
Typical Voltage Source Settling: <1ms to 200V, <7ms to 3000V.
Typical Current Source Settling: <5ms to 120mA, <200ms to 1µA.

Specifications are subject to change without notice.

SMU INSTRUMENTS

Model 8010 High Power Device Test Fixture Model 2657A rear panel

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 2657A High Power System SourceMeter
SMU Instrument
TRIGGERING AND SYNCHRONIZATION SPECIFICATIONS General
Triggering: Trigger In to Trigger Out: 0.5μs, typical. USB: USB 2.1 Host Controller, supports external data storage.
Synchronization: Single- or multi-node synchronized source change: <0.5μs, typical. Contact Check: ±50W.
PC Interface: IEEE-488.1 and .2; LXI Ethernet; RS-232.
Programming Digital I/O Interface: Input/Output Pins: 14 open drain I/O bits. 5.25V max.
Test Script Builder: Integrated development environment for building, running, and Power Supply: 100V to 250VAC, 50Hz–60Hz (auto sensing), 550VA max.
managing TSP scripts.
Cooling: Forced air. Side and top intake and rear exhaust.
TSP Express (Embedded): Tool that allows users to perform common I-V tests quickly and easily
EMC: Conforms to European Union EMC Directive.
without programming or installing software.
Safety: ETL listed (PENDING). Conforms to European Union Low Voltage Directive.
Software Interface: TSP Express (Embedded), Direct GPIB/VISA, Read/Write with VB,
VC/C++, VC#, LabVIEW™, TestPoint™, LabWindows™/CVI, etc. Warranty: 1 year.
Dimensions: 89mm high × 435mm wide × 549mm deep (3.5 in × 17.1 in × 21.6 in). Bench
Model 2657A specifications

Model 2657A specifications

System Expansion Configuration (with handle and feet): 104mm high × 483mm wide × 620mm deep (4.1 in
× 19 in × 24.4 in).
The TSP-Link expansion interface allows TSP-enabled instruments to trigger and communicate
with each other. See figure below: Weight: 9.98kg (22 lbs).
Environment: For indoor use only.
To Host Computer Calibration Period: One year.

Node 1

Node 2

To Nodes 3–32

SMU INSTRUMENTS

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 2450 SourceMeter® SMU Instrument

The Model 2450 is Keithley’s next-generation SourceMeter source measure

unit (SMU) Instrument that truly brings Ohm’s law (current, voltage, and
resistance) testing right to your fingertips. Its innovative graphical user
interface (GUI) and advanced, capacitive touchscreen technology allow
intuitive usage and minimize the learning curve to enable engineers and
scientists to learn faster, work smarter, and invent easier. The 2450 is the
SMU for everyone: a versatile instrument, particularly well-suited for char-
acterizing modern scaled semiconductors, nano-scale devices and materi-
Model 2450 SourceMeter® SMU Instrument

Model 2450 SourceMeter® SMU Instrument

als, organic semiconductors, printed electronics, and other small-geometry
and low-power devices. All this combined with Keithley SMU precision and
accuracy allow users to Touch, Test, InventTM with the new favorite go-to
instrument in the lab for years to come.

Learn Faster, Work Smarter, Invent Easier

• Capabilities of analyzers, curve
tracers, and I-V systems at a Unlike conventional instruments with dedicated pushbutton technology and small, obscure, limit-
fraction of their cost. ed-character displays, the 2450 features a five-inch, full-color, high resolution touchscreen that facil-
itates ease of use, learning, and optimizes overall speed and productivity. A simple icon-based menu
• Five-inch, high resolution structure reduces configuration steps by as much as 50 percent and eliminates the cumbersome
capacitive touchscreen GUI multi-layer menu structures typically used on soft-key instruments. Built-in, context-sensitive help
enables intuitive operation and minimizes the need to review a separate manual. These capabilities
• 0.012% basic measure accuracy combined with its application versatility make the 2450 the SMU instrument inherently easy to use
with 6½-digit resolution for basic and advanced measurement applications, regardless of your experience level with SMU
• Enhanced sensitivity with
instruments.
new 20mV and 10nA source/
measure ranges

• Source and sink (4-quadrant)

operation

• Four “Quickset” modes for fast

setup and measurements

• Built-in, context-sensitive front

panel help
2450 main home screen. View of 2450 menu.
• Front panel input banana
jacks; rear panel input triaxial Fourth-Generation,
connections All-in-One SMU Instrument
Quad. II +1A Quad. I
The 2450 is the fourth-generation member of
• 2450 SCPI and TSP® scripting Keithley’s award-winning SourceMeter family
programming modes of SMU instruments and leverages the proven
+100mA
capabilities of the Model 2400 SourceMeter SMU
• Model 2400 SCPI-compatible Instrument. It offers a highly flexible, four-quad-
programming mode rant voltage and current source/load coupled with -200V -20V +20V +200V

precision voltage and current meters. This all-in-

• Front panel USB memory
one instrument can be used as a:
port for data/programming/
SMU INSTRUMENTS

-100mA
configuration I/O • Precision power supply with V and I readback
• True current source
• Digital multimeter (DCV, DCI, ohms, and Quad. III -1A Quad. IV
power with 6½-digit resolution).
• Precision electronic load 2450 power envelope.
• Trigger controller

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 2450 SourceMeter® SMU Instrument

Model 2400 Model 2450

Ordering Information V-Ranges: 200mV – 200V V-Ranges: 20mV – 200V
2450 200V, 1A, 20W I-Ranges: 1μA – 1A I-Ranges: 10nA – 1A
SourceMeter Instrument 0.012% Basic Accuracy 0.012% Basic Accuracy
2450-NFP 200V, 1A, 20W Wideband Noise: 4mVrms Typ. Wideband Noise: 2mVrms Typ.
SourceMeter Instrument, Sweep Types: Sweep Types:
with No Front Panel Linear, Log, Custom, Linear, Log, Dual Linear, Dual Log, Custom,
Model 2450 SourceMeter® SMU Instrument

Model 2450 SourceMeter® SMU Instrument

2450-RACK Source-Memory Source-Memory (SCPI 2400 Mode)
200V, 1A, 20W 5000 Point Reading Buffer >250,000 Point Reading Buffer
SourceMeter Instrument,
>2000 Readings/Sec. >3000 Readings/Sec.
without Handle
SCPI Programming SCPI (2400 + 2450) + TSP Programming
2450-NFP-RACK
200V, 1A, 20W GPIB GPIB, USB, Ethernet (LXI)
SourceMeter Instrument, Front/Rear Banana Jacks Front: Banana Jacks, Rear: Triax
with No Front Panel
Comparison of Model 2400 vs Model 2450.
and No Handle

Accessories Supplied Ease of Use Beyond the Touchscreen

8608 High Performance In addition to its five-inch, color touchscreen, the 2450 front panel has many features that supple-
Test Leads ment its speed, user-friendliness, and learnability, including a USB 2.0 memory I/O port, a HELP key,
USB-B-1 USB Cable, Type A to a rotary navigation/control knob, a front/rear input selector button, and banana jacks for basic bench
Type B, 1m (3.3 ft) applications. The USB 2.0 memory port supports easy data storing, saving instrument configurations,
loading test scripts, and system upgrades. Plus, all front panel buttons are backlit to enhance visibility
CS-1616-3 Safety Interlock
in low-light environments.
Mating Connector
CA-180-3A TSP-Link/Ethernet Cable 5˝ color graphical touchscreen display

Documentation CD
2450 QuickStart Guide
Rotary
Test Script Builder Software navigation/
(supplied on CD) Online control knob
HELP key
KickStart Startup Software
(supplied on CD) USB 2.0
memory I/O
LabVIEW and IVI Drivers Front/rear
available at www.keithley.com input selector

Model 2450 front panel with high resolution, capacitive touchscreen.

Four “Quickset” modes simplify user setup. With one touch, the instrument can be quickly config-
ured for various operating modes without the need to configure the instrument indirectly for this
operation.
Comprehensive Built-in Connectivity
Rear panel access to rear-input triax connectors,
remote control interfaces (GPIB, USB 2.0, and
SMU INSTRUMENTS

LXI/Ethernet), D-sub 9-pin digital I/O port (for

internal/external trigger signals and handler
control), instrument interlock control, and
TSP-Link® jacks enables easy configuration of
multiple instrument test solutions and elim-
inates the need to invest in additional adapt-
er accessories. Quickset modes enable fast setup and time
to measurements.

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 2450 SourceMeter® SMU Instrument

Triax inputs Interlock

TYPICAL APPLICATIONS
Ideal for current/voltage characterization and
functional test of a wide range of today’s modern
electronics and devices, including:
• Nanomaterials and Devices
–– Graphene
Model 2450 SourceMeter® SMU Instrument

Model 2450 SourceMeter® SMU Instrument

Ethernet –– Carbon nanotubes
–– Nanowires
–– Low power nanostructures
USB Digital I/O TSP-Link GPIB • Semiconductor Structures
Rear panel connections are optimized for signal integrity.
–– Wafers
–– Thin films

Convert Raw Data to Information • Organic Materials and Devices

–– E-inks
The 2450 provides a full plotting and sheet view to display sweeps,
­measurement data, and charting right on the screen. It also supports –– Printable electronics
exporting to a spreadsheet for further analysis, dramatically improv- • Energy Efficiency and Lighting
ing productivity for research, bench-top testing, device qualification, –– LEDs/AMOLEDs
and ­debugging. –– Photovoltaics/Solar Cells
–– Batteries
• Discrete and Passive Components
–– Two-leaded: Resistors, diodes,
zener diodes, LEDs, disk drive
heads, sensors
–– Three-leaded: Small signal
bipolar junction transistors
(BJTs), field effect transistors
(FETs), and more
• Material Characterization
–– Resistivity
–– Hall Effect

TriggerFlow™ Building Blocks for

Instrument Control and Execution
The 2450 incorporates Keithley’s new TriggerFlow triggering system
that allows user control of instrument execution. Similar to developing
a flow chart, TriggerFlow diagrams are created using four fundamental
­building  blocks:
• Wait – Waits for an event to occur before the flow continues
SMU INSTRUMENTS

• Branch – Branches when a condition has been satisfied

• Action – Initiates an action in the instrument, for example, measure,
source, delay, set digital I/O, etc.
• Notify – Notifies other equipment that an event has occurred
Full data display, charting, and export to a spreadsheet lets you
convert raw data to useful information.

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 2450 SourceMeter® SMU Instrument

Parallel Test Capability

With the TSP technology in the 2450, multiple devices can be tested in
parallel to meet the needs of device research, advanced semiconductor
lab applications, and even high throughput production test. This parallel
testing capability enables each instrument in the system to run its own
complete test sequence, creating a fully multi-threaded test environment.
The number of tests that can be run in parallel on a 2450 can be as high as
the number of instruments in the system.
Model 2450 SourceMeter® SMU Instrument

Model 2450 SourceMeter® SMU Instrument

Free Instrument Control Start-up
Software and Web Interface
KickStart, Keithley’s new instrument control non-programming start-up
software, lets users start taking measurements in minutes. In most cases,
users merely need to make quick measurements, graph the data, and
store the data to disk to perform analysis in software environments such
TriggerFlow building blocks let users create very simple to very as Excel.
­complex triggering models.
KickStart offers the following functionality:
A TriggerFlow model using a combination of these building blocks can be • Instrument configuration control to perform I-V characterization
created from the front panel or by sending remote commands. With the
TriggerFlow system, users can build triggering models from very simple to • Native X-Y graphing, panning, and zooming
complex with up to 255 block levels. The 2450 also includes basic trigger- • Spreadsheet/tabular viewing of data
ing functions, including immediate, timer, and manual triggering. • Saving and exporting data for further analysis
• Saving of test setups
Unmatched System Integration and • Screenshot capturing of graph
Programming Flexibility • Annotation of tests
When the 2450 is integrated as part of a multi-channel I-V test system, the • Command line dialog for sending and receiving data
Test Script Processor (TSP®) embedded scripting capability allows test • HTML help
scripts to be run by the instrument, enabling the user to create powerful • GPIB, USB 2.0, Ethernet compliant
measurement applications with significantly reduced development times.
TSP technology also offers channel expansion without a mainframe.
Keithley’s TSP-Link® channel expansion bus, which uses a 100 Base T
Ethernet cable, connects multiple 2450 instruments and other TSP instru-
ments such as Keithley’s Series 2600B SourceMeter SMU instruments and
Series 3700A Switch/Multimeter systems in a master-slave configuration
that behaves as one integrated system. The TSP-Link expansion bus
­supports up to 32 units per GPIB or IP address, making it easy to scale a
system to fit an application’s particular requirements.
The 2450 also includes a SCPI programming mode that optimizes the
instrument’s new features, as well as a SCPI 2400 mode that provides
backwards compatibility with the existing Model 2400 SourceMeter
instrument. Not only does this preserve your 2400 investment, but it also
eliminates re-work normally associated with upgrading to a new instru-
ment with new capabilities.

With KickStart start-up software, users are ready to take

SMU INSTRUMENTS

­measurements in minutes.

Simplified Programming with

Ready-to-Use Instrument Drivers
For users who want to create their own customized application software,
native National Instruments LabVIEW® drivers, IVI-C, and IVI-COM
­drivers are available at www.keithley.com.

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A Greater Measure of Confidence A Tektronix Company
39
 2450 SourceMeter® SMU Instrument

Accessories Available Voltage Specifications1,2

Test Leads and Probes Source Measure3
1754 2-wire Universal 10-Piece Test Lead Kit Accuracy (23° ± 5°C) Noise Accuracy (23° ± 5°C)
5804 Kelvin (4-Wire) Universal 10-Piece Test Lead Kit 1 Year (RMS) Input 1 Year
5805 Kelvin (4-Wire) Spring-Loaded Probes Range Resolution ±(% setting + volts) (<10Hz) Resolution Resistance ±(% rdg. + volts)
5806 Kelvin Clip Lead Set 20.00000 mV 500  nV 0.100% + 200 μV 1  μV 10 nV >10 GW 0.100% + 150 μV
5808 Low Cost Single-pin Kelvin Probe Set 200.0000 mV 5  μV 0.015% + 200 μV 1  μV 100 nV >10 GW 0.012% + 200 μV
2.000000   V 50  μV 0.020% + 300 μV 10  μV 1 μV >10 GW 0.012% + 300 μV
5809 Low Cost Kelvin Clip Lead Set
20.00000   V 500  μV 0.015% +  2.4 mV 100  μV 10 μV >10 GW 0.015% +    1 mV
8605 High Performance Modular Test Leads 200.0000   V 5 mV 0.015% +   24 mV 1 mV 100 μV >10 GW 0.015% +   10 mV
8606 High Performance Modular Probe Kit
8608 High Performance Clip Lead Set Current Specifications1,2
Cables, Connectors, Adapters
Model 2450 specifications

Model 2450 specifications

Source Measure3
237-ALG-2 3-slot Male Triax Connector to 3 Alligator Clips
237-BAN-3A Triax to Banana Plug Accuracy (23° ±5°C) 4 Noise Accuracy (23° ±5°C)
1 Year (RMS) Voltage 1 Year
2450-TRX-BAN Triax to Banana Adapter. Converts the 4 Triax
Range Resolution ±(% setting + amps) (<10Hz) Resolution Burden ±(% rdg. + amps)
adapters on the rear panel to 5 banana jacks
10.00000 nA5 500 fA 0.100% + 100 pA 500 fA 10 fA <100 μV 0.100% +   50 pA
7078-TRX-* 3-slot, Low Noise Triax Cable
100.0000 nA5 5 pA 0.060% + 150 pA 500 fA 100 fA <100 μV 0.060% + 100 pA
7078-TRX-GND 3-slot Male Triax To BNC Adapter 1.000000 μA 50 pA 0.025% + 400 pA 5 pA 1 pA <100 μV 0.025% + 300 pA
(guard removed) 10.00000 μA 500 pA 0.025% +  1.5 nA 40 pA 10 pA <100 μV 0.025% + 700 pA
8607 2-wire, 1000V Banana Cables, 1m (3.3 ft) 100.0000 μA 5 nA 0.020% +   15 nA 400 pA 100 pA <100 μV 0.020% +    6 nA
CA-18-1 Shielded Dual Banana Cable, 1.2m (4 ft) 1.000000 mA 50 nA 0.020% + 150 nA 5 nA 1 nA <100 μV 0.020% +   60 nA
CAP-31 Protective Shield/Cap for 3-lug Triax Connectors 10.00000 mA 500 nA 0.020% +  1.5 μA 40 nA 10 nA <100 μV 0.020% + 600 nA
CS-1546 Triax 3-lug Special Shorting Plug. Shorts center 100.0000 mA 5 μA 0.025% +   15 μA 100 nA 100 nA <100 μV 0.025% +    6 μA
pin to outer shield 1.000000   A 50 μA 0.067% + 900 μA 3 μA 1 μA <100 μV 0.030% + 500 μA
CS-1616-3 Safety Interlock Mating Connector TEMPERATURE COEFFICIENT (0°–18°C and 28°–50°C): ±(0.15 × accuracy specification)/°C.
Communication Interfaces & Cables 1. Speed = 1 PLC.
KPCI-488LPA IEEE-488 Interface for PCI Bus 2. All specifications are guaranteed with output ON.
3. Accuracies apply to 2- and 4-wire mode when properly zeroed.
KUSB-488B IEEE-488 USB-to-GPIB Interface Adapter
4. For sink mode, 1μA to 100mA range accuracy is ±(0.15% + offset × 4). For 1A range, accuracy is ±(1.5% + offset × 8).
7007-1 Shielded GPIB Cable, 1m (3.3 ft) 5. Rear panel triax connections only.
7007-2 Shielded GPIB Cable, 1m (6.6 ft)
CA-180-3A CAT5 Crossover Cable for TSP-Link/Ethernet Resistance Measurement Accuracy (Local or Remote Sense) 2,3
USB-B-1 USB Cable, Type A to Type B, 1m (3.3 ft)
Normal Accuracy Enhanced Accuracy 7
Triggering and Control
Default Default (23°C ±5°C) (23°C ±5°C)
2450-TLINK DB-9 to Trigger Link Connector Adapter. Range Resolution6 Test Current 1 Year, ±(% rdg. + ohms) 1 Year, ±(% rdg. + ohms)
8501-1 Trigger Link Cable, DIN-to-DIN, 1m (3.3 ft) <2.000000   W8 1 μW User defined Source I ACC + Meas. VACC Meas. I ACC + Meas. VACC
8501-2 Trigger Link Cable, DIN-to-DIN, 2m (6.6 ft) 20.00000   W 10 μW 100 mA 0.098% + 0.003   W 0.073% + 0.001 W
Rack Mount Kits 200.0000   W 100 μW 10 mA 0.077% +   0.03   W 0.053% +   0.01 W
4299-8 Single Fixed Rack Mount Kit 2.000000  kW 1 mW 1 mA 0.066% +    0.3   W 0.045% +    0.1 W
20.00000  kW 10 mW 100 μA 0.063% +     3   W 0.043% +     1 W
4299-9 Dual Fixed Rack Mount Kit
200.0000  kW 100 mW 10 μA 0.065% +    30   W 0.046% +    10 W
4299-10 Dual Fixed Rack Mount Kit. Mount one 2450 2.000000 MW 1  W 1 μA 0.110% +   300   W 0.049% +   100 W
and one Series 26xxB 20.00000 MW 10   W 1 μA 0.110% +     1 kW 0.052% +   500 W
4299-11 Dual Fixed Rack Mount Kit. Mount one 2450 200.0000 MW 100   W 100 nA 0.655% +    10 kW 0.349% +   5k W
and one Series 2400, Series 2000, etc. >200.0000 MW8 — User defined Source I ACC + Meas. VACC Meas. I ACC + Meas. VACC
2450-BenchKit Ears and Handle for 2450-NFP-RACK and
2450-RACK models TEMPERATURE COEFFICIENT (0°–18°C and 28°–50°C): ±(0.15 × accuracy specification)/°C.
Test Fixtures SOURCE CURRENT, MEASURE RESISTANCE MODE:
Total uncertainty = Isource accuracy + Vmeasure accuracy (4-wire remote sense).
8101-PIV DC Test Fixture
SOURCE VOLTAGE, MEASURE RESISTANCE MODE:
Total uncertainty = Vsource accuracy + Imeasure accuracy (4-wire remote sense).
Services Available GUARD OUTPUT IMPEDANCE: 0.5W (DC) in ohms mode.
SMU INSTRUMENTS

2450-3Y-EW 1 Year Factory Warranty extended to 3 years 6. 6.5 digit measure resolution
from date of shipment 7. Source readback enabled. Offset compensation ON.
2450-5Y-EW 1 Year Factory Warranty extended to 5 years 8. Source Current, Measure Resistance or Source Voltage, Measure Resistance only.
from date of shipment
C/2450-3Y-17025 KeithleyCare® 3 Year ISO 17025 Calibration Plan
C/2450-3Y-DATA KeithleyCare 3 Year Calibration w/Data Plan
C/2450-3Y-STD KeithleyCare 3 Year Std. Calibration Plan
C/2450-5Y-17025 KeithleyCare 5 Year ISO 17025 Calibration Plan
C/2450-5Y-DATA KeithleyCare 5 Year Calibration w/Data Plan
C/2450-5Y-STD KeithleyCare 5 Year Std. Calibration Plan

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 2450 SourceMeter® SMU Instrument

OPERATING CHARACTERISTICS
MAX. OUTPUT POWER: 20W, four-quadrant source or sink operation.
SOURCE LIMITS: Vsource: ±21V (≤ 1A range), ±210V (≤ 100mA range)
Isource: ±1.05A (≤ 20V range), ±105mA (≤ 200V range)
OVERRANGE: 105% of range, source and measure.
REGULATION: Voltage: Line: 0.01% of range. Load: 0.01% of range + 100µV.
Current: Line: 0.01% of range. Load: 0.01% of range + 100pA.
SOURCE LIMITS: Voltage Source Current Limit: Bipolar current limit set with single value. Min. 10% of range.
Current Source Voltage Limit: Bipolar voltage limit set with single value. Min. 10% of range.
V-LIMIT / I-LIMIT ACCURACY: Add 0.3% of setting and ±0.02% of reading to base specification.
OVERSHOOT: Voltage Source: <0.1% typical (full scale step, resistive load, 20V range, 10mA I-Limit.
Current Source: <0.1% typical (1mA step, R Load = 10kW, 20V range)
Model 2450 specifications

Model 2450 specifications

RANGE CHANGE OVERSHOOT: Overshoot into a fully resistive 100kW load, 10Hz to 20MHz BW, adjacent ranges: 250mV typical
OUTPUT SETTLING TIME: Time required to reach 0.1% of final value, 20V range, 100mA I-Limit: <200µs typical.
MAXIMUM SLEW RATE: 0.2V/μs, 200V range, 100mA limit into a 2kW load (typical)
OVER VOLTAGE PROTECTION: User selectable values, 5% tolerance. Factory default = none.
VOLTAGE SOURCE NOISE: 10Hz–1MHz (RMS): 2mV typical into a resistive load.
COMMON MODE VOLTAGE: 250V DC.
COMMON MODE ISOLATION: >1GW, <1000pF.
NOISE REJECTION (typical): NPLC NMRR CMRR
0.01 — 60 dB
0.1 — 60 dB
1 60 dB 100 dB*
* Except lowest two current ranges ~90dB.

LOAD IMPEDANCE: 20nF typical (standard). Stable into 50μF typical (High-C mode).
High-C mode valid for ≥100µA ranges, ≥200mV ranges.
MAX. VOLTAGE DROP BETWEEN FORCE and SENSE TERMINALS: 5V.
MAX. SENSE LEAD RESISTANCE: 1MW for rated accuracy.
SENSE INPUT IMPEDANCE: >10GW.
GUARD OFFSET VOLTAGE: <300µV, typical

System Measurement Speeds 9

Reading Rates (readings/second) typical FOR 60Hz (50Hz):
SCRIPT (TSP) Programmed
Measure Source-Measure Sweep
NPLC/Trigger Origin To Mem. To GPIB To USB To LAN To Mem. To GPIB To USB To LAN
0.01 / Internal 3130 (2800) 2830 (2570) 2825 (2600) 2790 (2530) 1710 (1620) 1620 (1540) 1630 (1540) 1620 (1540)
0.01 / External 2170 (2050) 2150 (2030) 2170 (2040) 2160 (1990) 1670 (1590) 1580 (1500) 1590 (1510) 1580 (1510)
0.1  / Internal 540 (460) 530 (450) 530 (450) 530 (450) 470 (410) 460 (400) 470 (400) 470 (400)
0.1  / External 500 (430) 490 (420) 500 (430) 500 (420) 470 (400) 460 (390) 460 (400) 460 (400)
1.00 / Internal 59 (49) 58 (49) 59 (49) 59 (49) 58 (48) 58 (48) 58 (48) 58 (48)
1.00 / External 58 (48) 57 (48) 58 (48) 58 (48) 57 (48) 57 (47) 57 (48) 57 (48)

SCPI Programmed 10
Measure Source-Measure Sweep
NPLC/Trigger Origin To Mem. To GPIB To USB To LAN To Mem. To GPIB To USB To LAN
0.01 / Internal 3130 (2800) 3060 (2760) 3000 (2790) 3010 (2710) 1710 (1630) 1610 (1600) 1440 (1380) 1690 (1590)
0.01 / External 2350 (2200) 2320 (2170) 2340 (2190) 2320 (2130) 1680 (1590) 1560 (1570) 1410 (1360) 1660 (1560)
SMU INSTRUMENTS

0.1  / Internal 540 (460) 540 (450) 540 (460) 540 (450) 470 (410) 470 (410) 450 (390) 470 (410)
0.1  / External 510 (440) 510 (430) 510 (440) 510 (430) 470 (400) 470 (400) 450 (390) 470 (400)
1.00 / Internal 59 (49) 59 (49) 59 (49) 59 (49) 58 (48) 58 (48) 57 (48) 58 (48)
1.00 / External 58 (49) 58 (49) 58 (49) 58 (49) 58 (48) 58 (48) 57 (47) 58 (48)

9. Reading rates applicable for voltage or current measurements, autozero off, autorange off, filter off, binary reading format, and source readback off.
10. SCPI programming mode. Speeds do not apply to SCPI 2400 mode.

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 2450 SourceMeter® SMU Instrument
GENERAL CHARACTERISTICS (default mode unless specified)
FACTORY DEFAULT STANDARD POWER-UP: SCPI Mode. COOLING: Forced air, variable speed.
SOURCE OUTPUT MODES: Fixed DC Level, Memory/Configuration OVER TEMPERATURE PROTECTION: Internally sensed temperature overload puts unit in stand-
List (mixed function), Stair (linear and log). by mode.
SOURCE MEMORY LIST: 100 points max. (SCPI 2400 Mode only). POWER SUPPLY: 100V to 240V RMS, 50–60Hz (automatically detected at power up).
MEMORY BUFFER: >250,000 readings. Includes selected measured value(s) VA RATING: 190 volt-amps max.
and time stamp. ALTITUDE: Maximum 2000 meters above sea level.
REAL-TIME CLOCK: Lithium battery backup (3 yr. + battery life). EMC: Conforms to European Union EMC Directive.
REMOTE INTERFACES: SAFETY: NRTL listed to UL61010-1 and UL61010-2-30. Conforms with European Union Low
GPIB: IEEE-488.1 compliant. Supports IEEE-488.2 common commands Voltage Directive.
and status model topology.
USB Device (rear panel, type B): 2.0 Full Speed USBTMC. VIBRATION: MIL-PRF-28800F Class 3 Random.
USB Host (front panel, type A): USB 2.0, support for flash drives, FAT32. WARM-UP: 1 hour to rated accuracies.
Ethernet: RJ-45 (10/100BT)
DIMENSIONS: (With handle and bumpers): 106mm high × 255mm wide × 425mm deep
PROGRAMMABILITY: SCPI or TSP command sets.
(4.18 in × 10.05 in × 16.75 in). (Without handle and bumpers): 88mm high × 213mm wide
Model 2450 specifications

Model 2450 specifications

TSP Mode: Embedded Test Script Processor (TSP) accessible from any host interface. × 403mm deep (3.46 in × 8.39 in × 15.87 in).
IP CONFIGURATION: Static or DHCP WEIGHT: With bumpers & handle: 4.04 kg (8.9 lbs.). Without bumpers & handle 3.58 kg (7.9 lbs.).
EXPANSION INTERFACE: The TSP-Link expansion interface allows TSP enabled ENVIRONMENT: Operating: 0°–50°C, 70% R.H. up to 35°C. Derate 3% R.H./°C, 35°–50°C.
instruments to trigger and communicate with each other. Storage: –25°C to 65°C.
LXI COMPLIANCE: 1.4 LXI Core 2011. ACCESSORIES SUPPLIED: Test Leads, USB Cable, Ethernet/TSP Cable, Interlock Adapter, Power
DISPLAY: 5 inch capacitive touch, color TFT WVGA (800x480) with LED backlight. Cord, Quick Start Guide, CD User’s Manual.
INPUT SIGNAL CONNECTIONS: Front: Banana. Rear: Triaxial (3-Lug)
INTERLOCK: Active High Input
DIGITAL I/O INTERFACE:
Lines: 6 Input/Output user defined for digital I/O or triggering
Connector: 9-pin female D
Input Signal Levels: 0.7 V (maximum logic low), 3.7 V (minimum logic high)
Input Voltage Limits: -0.25 V (Abs. minimum), +5.25 V (Abs. maximum)
Maximum Source Current: +2.0 mA @ >2.7 V (per pin)
Maximum Sink Current: -50 mA @ 0.7 V (per pin, solid-state fuse protected)
5 V Power Supply Pin: Limited to 500 mA @ >4V (solid-state fuse protected)
Handler: User definable Start of Test, End of Test, 4 category bits
SMU INSTRUMENTS

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 Series 2400 SourceMeter SMU Instruments ®

Keithley’s Series 2400 Source Measure Unit (SMU) Instruments

are designed specifically for test applications that demand tightly
coupled sourcing and measurement. All SourceMeter models
provide precision voltage and current sourcing as well as meas-
urement capabilities. Each SourceMeter SMU instrument is both
a highly stable DC power source and a true instrument-grade
Tightly coupled precision sourcing and measurement

Tightly coupled precision sourcing and measurement

6½-digit multimeter. The power source characteristics include
low noise, precision, and readback. The multimeter capabilities
include high repeatability and low noise. The result is a compact,
single-channel, DC parametric tester. In operation, these instru-
ments can act as a voltage source, a current source, a voltage
meter, a current meter, and an ohmmeter. Manufacturers of
components and modules for the communications, semiconduc-
tor, computer, automotive, and medical industries will find the
SourceMeter SMU instruments invaluable for a wide range of
characterization and production test applications.
Advantages of a Tightly Integrated Instrument
By linking source and measurement circuitry in a single unit,
these instruments offer a variety of advantages over systems
configured with separate source and measurement instruments.
For example, they minimize the time required for test station
development, setup, and maintenance, while lowering the overall
cost of system ownership. They simplify the test process itself
• Five instruments in one by eliminating many of the complex synchronization and connection issues associated with using
(IV Source, IVR Measure) multiple instruments. And, their compact half-rack size conserves precious “real estate” in the test
rack or bench.
• Seven models: 20–100W DC,
1000W pulsed, 1100V to 1µV, Power of Five Instruments in One (IV Source, IVR Measure)
10A to 10pA The tightly coupled nature of a SourceMeter SMU instrument provides many advantages over solu-
• Source and sink (4-quadrant) tions configured from separate instruments, such as a precision power supply and a digital multime-
operation ter. For example, it provides faster test times by reducing GPIB traffic and simplifies the remote pro-
gramming interface. It also protects the device under test from damage due to accidental overloads,
• 0.012% basic measure accuracy thermal runaway, etc. Both the current and voltage source are programmable with readback to help
with 6½-digit resolution maximize device measurement integrity. If the readback reaches a programmed compliance limit,
then the source is clamped at the limit, providing fault protection.
• 2-, 4-, and 6-wire remote
V-source and measure sensing
ACCESSORIES AVAILABLE
• 1700 readings/second at
TEST LEADS AND PROBES Communication Interface
4½ digits via GPIB
1754 2-Wire Universal 10-Piece Test Lead Kit KPCI-488LPA IEEE-488 Interface/Controller for the PCI Bus
• Pass/Fail comparator for fast 5804 Kelvin (4-Wire) Universal 10-Piece Test Lead Kit KUSB-488B IEEE-488 USB-to-GPIB Interface Adapter
sorting/binning 5805 Kelvin (4-Wire) Spring-Loaded Probes Triggering and Control
5808 Low Cost Single-pin Kelvin Probe Set 2499-DIGIO Digital I/O Expander Assembly
• Available high speed sense lead 5809 Low Cost Kelvin Clip Lead Set (not for Model 2401)
contact check function 8607 2-Wire, 1000V Banana Cables, 1m (3.3 ft) 8501-1 Trigger Link Cable, DIN-to-DIN, 1m (3.3 ft)
CA-18-1 Shielded Dual Banana Cable, 1.2m (4 ft) 8501-2 Trigger Link Cable, DIN-to-DIN, 2m (6.6 ft)
• Programmable DIO port for SWITCHING HARDWARE 8502 Trigger Link to BNC Breakout Box
automation/handler/prober 7001 Two-Slot Switch System 8503 Trigger Link Cable, DIN-to-Dual BNC, 1m (3.3 ft)
SMU INSTRUMENTS

control (except Model 2401) 7002 Ten-Slot Switch System 8505 Male to 2-Female Y-DIN Cable for Trigger Link
7019-C 6-Wire Ohms Switch Card RACK MOUNT KITS
• Standard SCPI GPIB, RS-232 and 7053 High-Current Switch Card 4288-1 Single Fixed Rack Mount Kit
Keithley Trigger Link interfaces
CABLES/ADAPTERS 4288-2 Dual Fixed Rack Mount Kit
• Keithley LabTracer 2.0 I-V curve 7007-1 Shielded GPIB Cable, 1m (3.3 ft) 4288-4 Dual Fixed Rack Mount Kit
tracing application software 7007-2 Shielded GPIB Cable, 2m (6.6 ft) 4288-5 Shelf Type Side by Side Rack Mounting Kit
7009-5 RS-232 Cable 4288-9 Dual Fixed Rack Mounting Kit
(download)
8620 Shorting Plug Software
LabTracer 2.0 Curve Tracing Software (downloadable)

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 Series 2400 SourceMeter SMU Instruments ®

I-V Characteristics
Ordering Information All SourceMeter SMU instruments provide four-quadrant operation. In the first and third quadrants
2400 200V, 1A, 20W they o­ perate as a source, delivering power to a load. In the second and fourth quadrants they oper-
SourceMeter SMU ate as a sink, d­ issipating power internally. Voltage, current, and resistance can be measured during
Instrument source or sink ­operation.
2400-C 200V, 1A, 20W
Tightly coupled precision sourcing and measurement

Tightly coupled precision sourcing and measurement

SourceMeter SMU Imeter Local IN/OUT HI Imeter/Compliance Local IN/OUT HI

Instrument with Contact Remote SENSE HI Remote SENSE HI

Check Isource Vsource Vmeter

2401 20V, 1A, 20W SourceMeter DUT DUT

Feedback to
SMU Instrument Vmeter/Compliance
Remote SENSE LO
Adjust Vsource
Remote SENSE LO

2410 1100V, 1A, 20W Local IN/OUT LO Local IN/OUT LO

SourceMeter SMU
Instrument
2410-C 1100V, 1A, 20W Source I–Measure V, I, or W configuration Source V–Measure I, V, or W configuration
SourceMeter SMU
Instrument with Contact Series 2400 SourceMeter SMU Instruments
Check
+1A
+1A
2420 60V, 3A, 60W SourceMeter Model 2400 Model 2401
SMU Instrument SourceMeter Low-Voltage
SMU Instrument SourceMeter
2420-C 60V, 3A, 60W SourceMeter +100mA SMU Instrument +100mA

SMU Instrument with –200V –20V +20V +200V –200V –20V +20V +200V
Contact Check
2425 100V, 3A, 100W 2400 2400
only only
SourceMeter SMU –100mA –100mA
Instrument
2425-C 100V, 3A, 100W Duty cycle limited Duty cycle limited
SourceMeter SMU –1A –1A

Instrument with Contact Model 2410 Model 2420 Model 2425

Check High-Voltage 3A SourceMeter 100W SourceMeter
SourceMeter +1A SMU Instrument +3A SMU Instrument +3A
2430 100V, 10A, 1000W SMU Instrument
+1A +1A
Pulse Mode SourceMeter +200mA

SMU Instrument +100mA +100mA

+20mA
2430-C 100V, 10A, 1000W –1100V –200V –20V +20V +200V +1100V –60V –20V +20V +60V –100V –60 –20 +20 +60 +100V
Pulse Mode SourceMeter
SMU Instrument with
Contact Check –20mA –100mA –100mA

2440 40V, 5A, 50W SourceMeter –100mA

SMU Instrument Duty cycle
–1A
Duty cycle
–1A
Duty cycle
2440-C 40V, 5A, 50W SourceMeter –1A limited –3A limited –3A limited

SMU Instrument with

Contact Check +10A 5A
Model 2430 Model 2440
1kW Pulse Mode +3A 5A SourceMeter
Accessories Supplied SourceMeter SMU Instrument 3A
SMU INSTRUMENTS

+1A
SMU Instrument
Model 8605 Test Leads 1A
+100mA
LabVIEW Software Driver –100V –60 –20 +20 +60 +100V
100mA
–40V –10V +10V +40V
­(downloadable)
LabTracer Software –100mA
–100mA

­(downloadable) –1A
–1A
–3A
–3A Duty cycle limited
Pulse mode only Duty cycle limited
–10A –5A

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 Series 2400 SourceMeter SMU Instruments ®

Automation for Speed

A SourceMeter SMU instrument streamlines production testing. It sources voltage or current while Typical Applications
making measurements without needing to change connections. It is designed for reliable operation Devices:
in non-stop production environments. To provide the throughput demanded by production applica- • Discrete semiconductor devices
tions, the SourceMeter SMU instrument offers many built-in features that allow it to run complex test
sequences without computer control or GPIB communications slowing things down. • Passive devices
Tightly coupled precision sourcing and measurement

Tightly coupled precision sourcing and measurement

• Transient suppression devices
Standard and Custom Sweeps
Stop
• ICs, RFICs, MMICs
Sweep solutions greatly accelerate testing with
automation hooks. Three basic sweep waveforms • Laser diodes, laser diode
are provided that can be programmed for sin- Start
modules, LEDs, photodetectors
gle-event or continuous operation. They are ideal • Circuit protection devices: TVS,
for I/V, I/R, V/I, and V/R characterization. Bias Bias MOV, Fuses, etc.
• Linear Staircase Sweep: Moves from the start • Airbags
level to the stop level in equal linear steps Linear staircase sweep • Connectors, switches, relays
• Logarithmic Staircase Sweep: Done on a • High brightness LEDs
log scale with a specified number of steps Stop (DC and pulse)
per decade
Start
Tests:
• Custom Sweep: Allows construction of
special sweeps by specifying the number of • Leakage
measurement points and the source level at Bias Bias • Low voltage/resistances
each point • LIV
Logarithmic staircase sweep
• Up to 1700 readings/second at 4½ digits to • IDDQ
the GPIB bus • I-V characterization
Start Stop
• 5000 readings can be stored in the non- • Isolation and trace resistance
volatile buffer memory User
defined
steps
• Temperature coefficient
Built-In Test Sequencer • Forward voltage, reverse
(Source Memory List) Bias Bias breakdown, leakage current
The Source Memory list provides faster and eas- • DC parametric test
Custom sweep
ier testing by allowing you to setup and execute • DC power source
up to 100 different tests that run without PC
intervention. • HIPOT
• Photovoltaic cell efficiency
• Stores up to 100 instrument configurations, each containing source settings, measurement
(source and sink)
­settings, pass/fail criteria, etc.
• Dielectric withstanding
• Pass/fail limit test as fast as 500µs per point
• Onboard comparator eliminates the delay caused when sending data to the computer for analysis
• Built-in, user definable math functions to calculate derived parameters
Example Test Sequence
I Test Pass/Fail Test If Passes Test If Fails Test
Test 1 Check V F1 at Go to Test 2
100mA against
pass/fail limits
SMU INSTRUMENTS

Test 2 Check V F2 at 1A Go to Test 3 1. Bin part to bad bin

VF2 against pass/fail 2. Transmit data to
VF1 Test 2 computer while
limits
IR Test 1 handler is placing
V Test 3 Check leakage 1. Bin part to good bin
new part
­current at –500V 2. Transmit readings to
Test 3 and test against computer while handler
3. Return to Test 1
pass/fail limits is placing new part
3. Return to Test 1

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 Series 2400 SourceMeter SMU Instruments®

Digital I/O Interface Unique 6-Wire Ohms Technique

The digital I/O interface can link a SourceMeter SMU instrument to many SourceMeter SMU instruments can make standard 4-wire, split Kelvin, and
popular component handlers, including Aetrium, Aeco, and Robotronics. 6-wire, guarded ohms measurements and can be configured for either the
Other capabilities of the interface include: constant current or constant voltage method. The 6-wire ohms technique:
• Tight systems integration for applications such as binning and sorting • Uses guard and guard sense leads in addition to the 4-wire sense and
Tightly coupled precision sourcing and measurement

Tightly coupled precision sourcing and measurement

• Built-in component handler interface source leads.
• Start of test and end of test signals • Locks out parallel current paths when measuring resistor networks or
• 5V, 300mA power supply hybrid c­ ircuits to isolate the component under test.
• Optional expander accessory (Model 2499-DIGIO) adds 16 digital I/O lines • Allows users to configure and plot data easily from Series 2400
SourceMeter SMU instruments, making characterization of two, three,
The digital I/O interface is available on all Series 2400 SoourceMeter and four terminal devices a snap.
instruments except the Model 2401.
Trigger Link Interface
+
All SourceMeter SMU instruments include Keithley’s unique Trigger Link GUARD
-
interface which provides high-speed, seamless communications with many GUARD SENSE
of Keithley’s other instruments. For example, use the Trigger Link interface Imeter
to connect a SourceMeter SMU instrument with a Series 7000 Switching IN/OUT HI
System for a complete multi-point test solution. With Trigger Link, the
Series 7000 Switching Systems can be controlled by a SourceMeter SMU SENSE HI
instrument during a high-speed test sequence independent of a computer DUT
and GPIB. R2
Isource Vmeter R1
Optional Contact Check Function R3

SENSE LO
The Contact Check function makes it simple to verify good connections
quickly and easily before an automated test sequence begins. This elimi- IN/OUT LO
nates measurement errors and false product failures associated with con-
tact fatigue, breakage, contamination, loose or broken connection, relay
failures, etc. Some capabilities of this function are:
• 350µs verification and notification process time 6-Wire Ohms Circuit. All test current flows through R1 because the
• The output of the SourceMeter SMU instrument is automatically shut high current guard drives the voltage across R2 to 0V.
off after a fault and is not re-activated until good contact is verified,
protecting the device under test from damage and the operator from
potential safety h­ azards.
• 3 pass/fail threshold values: 2W, 15W, and 50W
• No energy passes through the device under test during the operation.
• Enabled either from the front panel or remotely over the GPIB
• 3 fault notification methods

GUARD
+

Pass
-

350µs GUARD SENSE

Imeter
Contact Check
SMU INSTRUMENTS

IN/OUT HI

SENSE HI
Fail
V or I Vmeter (optional)
Source
Pass
SENSE LO

IN/OUT LO

Contact check option for 4-wire or 6-wire applications Free LabTracer 2.0 device characterization software (downloadable)

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 Series 2400 SourceMeter SMU Instruments ®

Voltage Accuracy (Local or Remote Sense)

Source1 Measurement 2, 3, 4
Accuracy (1 Year) Default Accuracy (1 Year)
Programming 23°C ±5°C Measurement 23°C ±5°C Output Slew Rate
Model Range Resolution ±(% rdg. + volts) Resolution ±(% rdg. + volts) (±30%) Source/Sink Limit
200.000 mV 5 µV 0.02% + 600 µV 1 µV 0.012% + 300 µV
2400, 2400-C, 2.00000 V 50 µV 0.02% + 600 µV 10 µV 0.012% + 300 µV ±21 V @ ±1.05 A
2401 20.0000 V 500 µV 0.02% + 2.4 mV 100 µV 0.015% + 1.5 mV 0.08 V/µs ±210 V @ ±105 mA*
200.000 V* 5 mV 0.02% + 24 mV 1 mV 0.015% + 10 mV 0.5 V/µs
200.000 mV 5 µV 0.02% + 600 µV 1 µV 0.012% + 300 µV
Series 2400 condensed specifications

Series 2400 condensed specifications

2.00000 V 50 µV 0.02% + 600 µV 10 µV 0.012% + 300 µV ±21 V @ ±1.05 A
2410, 2410-C
20.0000 V 500 µV 0.02% + 2.4 mV 100 µV 0.015% + 1 mV 0.15 V/µs ±1100 V @ ±21 mA
1000.00 V 50 mV 0.02% + 100 mV 10 mV 0.015% + 50 mV 0.5 V/µs
200.000 mV 5 µV 0.02% + 600 µV 1 µV 0.012% + 300 µV
2.00000 V 50 µV 0.02% + 600 µV 10 µV 0.012% + 300 µV ±21 V @ ±3.15 A
2420, 2420-C
20.0000 V 500 µV 0.02% + 2.4 mV 100 µV 0.015% + 1 mV 0.08 V/µs ±63 V @ ±1.05 A
60.0000 V 1.5 mV 0.02% + 7.2 mV 1 mV 0.015% + 3 mV 0.14 V/µs
200.000 mV 5 µV 0.02% + 600 µV 1 µV 0.012% + 300 µV
2.00000 V 50 µV 0.02% + 600 µV 10 µV 0.012% + 300 µV ±21 V @ ±3.15 A
2425, 2425-C
20.0000 V 500 µV 0.02% + 2.4 mV 100 µV 0.015% + 1 mV 0.08 V/µs ±105 V @ ±1.05 A
100.0000 V 2.5 mV 0.02% + 12 mV 1 mV 0.015% + 5 mV 0.25 V/µs
200.000 mV 5 µV 0.02% + 600 µV 1 µV 0.012% + 300 µV ±105 V @ ±1.05 A
2.00000 V 50 µV 0.02% + 600 µV 10 µV 0.012% + 300 µV
2430, 2430-C ±105 V @ ±10.5 A
20.0000 V 500 µV 0.02% + 2.4 mV 100 µV 0.015% + 1 mV 0.08 V/µs
100.0000 V 2.5 mV 0.02% + 12 mV 1 mV 0.015% + 5 mV 0.25 V/µs (pulse mode only)
200.000 mV 5 µV 0.02% + 600 µV 1 µV 0.012% + 300 µV
2.00000 V 50 µV 0.02% + 600 µV 10 µV 0.012% + 300 µV ±10.5 V @ ±5.25 A
2440, 2440-C
10.0000 V 500 µV 0.02% + 1.2 mV 100 µV 0.015% + 750 µV 0.08 V/µs ±42 V @ ±1.05 A
40.0000 V 5 mV 0.02% + 4.8 mV 1 mV 0.015% + 3 mV 0.25 V/µs
*Not available on Model 2401.

Temperature Coefficient (0°–18°C and 28°–50°C): ±(0.15 × accuracy specification)/°C. Additional Pulse Mode Source Specifications
Voltage Regulation: Line:  0.01% of range. Load: 0.01% of range + 100µV. (2430 and 2430-C only)
Over Voltage Protection: User selectable values, 5% tolerance. Factory default = none. Maximum Duty Cycle: 8%, hardware limited, 10A range only. All other ranges 100%.
Current Limit: Bipolar current limit (compliance) set with single value. Min. 0.1% of range. Maximum Pulse Width: 5ms from 90% rising to 90% falling edge, 2.5ms 10A range.
Overshoot: <0.1% typical (full scale step, resistive load, 10mA range). Minimum Pulse Width: 150µs.
Minimum Pulse Resolution: 50µs typical, 70µs max., limited by system ­jitter.
ADDITIONAL SOURCE SPECIFICATIONS (All Models) Source Accuracy: Determined by settling time and source range specifications.
TRANSIENT RESPONSE TIME: 30µs minimum for the output to recover to its spec. following a Output Settling Time 0.1%:
step change in load. 800µs typ., source I = 10A into 10W, limited by voltage slew rate.
COMMAND PROCESSING TIME: Maximum time required for the output to begin to change 500µs typ., source I = 10A into 1W, limited by voltage slew rate.
following the receipt of :SOURce:VOLTage|CURRent <nrf> command. Autorange On: 10ms. Output Slew Rate:
Autorange Off: 7ms. Voltage (10W load): 0.25V/µs ±30% on 100V range. 0.08V/µs ±30% on 20V range, 10A range.
OUTPUT SETTLING TIME: Time required to reach 0.1% of final value after command is pro- Current (0W load): 0.25A/µs ±30% on 100V range. 0.08A/µs ±30% on 20V range, 10A range.
cessed. 100µs typical. Resistive load. 10µA to 100mA range.
DC FLOATING VOLTAGE: Output can be floated up to ±250VDC (Model 2440 ±40VDC) from
NOTES
chassis ground.
1. 2400, 2401, 2410 Only: Specifications valid for continuous output currents below 105mA. For operation above
REMOTE SENSE: Up to 1V drop per load lead. 105mA continuous for >1 minute, derate accuracy 10%/35mA above 105mA.
COMPLIANCE ACCURACY: Add 0.3% of range and ±0.02% of reading to base specification. 2. Speed = Normal (1 PLC). For 0.1 PLC, add 0.005% of range to offset specifications, except 200mV, 1A, 10A
ranges, add 0.05%. For 0.01 PLC, add 0.05% of range to offset specifications, except 200mV, 1A, 10A ranges, add
OVER TEMPERATURE PROTECTION: Internally sensed temperature overload puts unit in stand- 0.5%.
by mode. 3. Accuracies apply to 2- or 4-wire mode when properly zeroed.
RANGE CHANGE OVERSHOOT: Overshoot into a fully resistive 100kW load, 10Hz to 1MHz BW, 4. In pulse mode, limited to 0.1 PLC measurement.
SMU INSTRUMENTS

adjacent ranges: 100mV typical, except 20V/200V (20V/60V on Model 2420), 20V/100V on Model
2425 and 2430, range boundary, and Model 2440.
MINIMUM COMPLIANCE VALUE: 0.1% of range.

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 Series 2400 SourceMeter SMU Instruments ®

Current Accuracy (Local or Remote Sense)

Source 1, 3
Accuracy Measurement 5, 6, 7
(1 Year) Accuracy (1 Year)
Programming 23°C ±5°C Default Measurement 23°C ±5°C
Model Range Resolution ±(% rdg. + amps) Resolution ±(% rdg. + amps) Source/Sink Limit
1.00000 µA   50 pA 0.035% + 600 pA   10 pA 0.029% + 300 pA
10.0000 µA 500 pA 0.033% +    2 nA 100 pA 0.027% + 700 pA
100.000 µA   5 nA 0.031% +   20 nA   1 nA 0.025% +    6 nA
2400, 2400-C, ±1.05A @ ±21 V
1.00000 mA   50 nA 0.034% + 200 nA   10 nA 0.027% +   60 nA
2401 ±105 mA @ ±210 V 8
Series 2400 condensed specifications

Series 2400 condensed specifications

10.0000 mA 500 nA 0.045% +    2 µA 100 nA 0.035% + 600 nA
100.000 mA   5 µA 0.066% +   20 µA   1 µA 0.055% +    6 µA
1.00000 A 2   50 µA 0.27  % + 900 µA   10 µA 0.22  % + 570 µA
1.00000 µA   50 pA 0.035% + 600 pA   10 pA 0.029% + 300 pA
10.0000 µA 500 pA 0.033% +    2 nA 100 pA 0.027% + 700 pA
100.000 µA   5 nA 0.031% +   20 nA   1 nA 0.025% +    6 nA
±1.05A @ ±21 V
2410, 2410-C 1.00000 mA   50 nA 0.034% + 200 nA   10 nA 0.027% +   60 nA
±21 mA @ ±1100 V
20.0000 mA 500 nA 0.045% +    4 µA 100 nA 0.035% + 1.2 µA
100.000 mA   5 µA 0.066% +   20 µA   1 µA 0.055% +    6 µA
1.00000 A 2   50 µA 0.27  % + 900 µA   10 µA 0.22  % + 570 µA
10.0000 µA 500 pA 0.033% +    2 nA 100 pA 0.027% + 700 pA
100.000 µA   5 nA 0.031% +   20 nA   1 nA 0.025% +    6 nA
1.00000 mA   50 nA 0.034% + 200 nA   10 nA 0.027% +   60 nA
±3.15A @ ±21 V
2420, 2420-C 10.0000 mA 500 nA 0.045% +    2 µA 100 nA 0.035% + 600 nA
±1.05 A @ ±63 V
100.000 mA   5 µA 0.066% +   20 µA   1 µA 0.055% +    6 µA
1.00000 A 2   50 µA 0.067% + 900 µA   10 µA 0.066% + 570 µA
3.00000 A 2   50 µA 0.059% + 2.7 mA   10 µA 0.052% + 1.71 mA
10.0000 µA 500 pA 0.033% +    2 nA 100 pA 0.027% + 700 pA
100.000 µA   5 nA 0.031% +   20 nA   1 nA 0.025% +    6 nA
1.00000 mA   50 nA 0.034% + 200 nA   10 nA 0.027% +   60 nA
±3.15A @ ±21 V
2425, 2425-C 10.0000 mA 500 nA 0.045% +    2 µA 100 nA 0.035% + 600 nA
±1.05 A @ ±105 V
100.000 mA   5 µA 0.066% +   20 µA   1 µA 0.055% +    6 µA
1.00000 A 2   50 µA 0.067% + 900 µA   10 µA 0.060% + 570 µA
3.00000 A 2   50 µA 0.059% + 2.8 mA   10 µA 0.052% + 1.71 mA
10.0000 µA 500 pA 0.033% +    2 nA 100 pA 0.027% + 700 pA
100.000 µA   5 nA 0.031% +   20 nA   1 nA 0.025% +    6 nA
1.00000 mA   50 nA 0.034% + 200 nA   10 nA 0.027% +   60 nA ±1.05A @ ±105 V
10.0000 mA 500 nA 0.045% +    2 µA 100 nA 0.035% + 600 nA
2430, 2430-C
100.000 mA   5 µA 0.066% +   20 µA   1 µA 0.055% +    6 µA ±10.5 A @ ±105 V
1.00000 A   50 µA 0.067% + 900 µA   10 µA 0.060% + 570 µA (pulse mode only)
3.00000 A 2 500 µA 0.059% + 2.8 mA   10 µA 0.052% + 1.71 mA
10.00000 A4 500 µA 0.089% + 5.9 mA   10 µA 0.082% + 1.71 mA
10.0000 µA 500 pA 0.033% +    2 nA 100 pA 0.027% + 700 pA
100.000 µA   5 nA 0.031% +   20 nA   1 nA 0.025% +    6 nA
1.00000 mA   50 nA 0.034% + 200 nA   10 nA 0.027% +   60 nA
±5.25A @ ±10.5 V
2440, 2440-C 10.0000 mA 500 nA 0.045% +    2 µA 100 nA 0.035% + 600 nA
±1.05 A @ ±42 V
100.000 mA   5 µA 0.066% +   20 µA   1 µA 0.055% +    6 µA
1.00000   A   50 µA 0.067% + 900 µA   10 µA 0.060% + 570 µA
5.00000   A   50 µA 0.10  % + 5.4 mA   10 µA 0.10  % + 3.42 mA

Temperature Coefficient (0°–18°C and 28°–50°C): ±(0.15 × accuracy specification)/°C. NOTES

CURRENT Regulation: Line:  0.01% of range. Load: 0.01% of range (except Model 2440 1. 2400, 2401, 2410 Only: Specifications valid for continuous output currents below 105mA. For operation above
5A range 0.05%) + 100pA. 105mA continuous for >1 minute, derate accuracy 10%/35mA above 105mA.
2. Full operation (1A) regardless of load to 30°C (50°C for Model 2420 and 2440). Above 30°C (50°C for Model
Voltage LIMIT: Bipolar voltage limit (compliance) set with single value. Min. 0.1% of range. 2420 and 2440) ambient, derate 35mA/°C and prorate 35mA/W load. 4-wire mode. For current sink operation
SMU INSTRUMENTS

OVERSHOOT: <0.1% typical (1mA step, RL = 10kW, 20V range for Model 2400, 2401, 2410, 2420, on 1A, 3A, or 5A ranges, maximum continuous power is limited to approximately 1/2 rated power or less,
depending on current, up to 30°C ambient. See power equations in the User’s Manual to calculate allowable
2425, 2430), (10V range for Model 2440). duty cycle for specific conditions.
3. For sink mode, 1µA to 100mA range, accuracy is:
Model 2400, 2401: ±(0.15% + offset*4). Models 2410, 2420, 2425, 2430, 2440: ±(0.5% + offset*3).
Contact Check Specifications (requires -C version) For 1A range, accuracy is:
Model 2400, 2401: ±(1.5% + offset*8). Models 2410, 2420, 2425, 2430, 2440: ±(1.5% + offset*3).
(Not available for Model 2401)
4. 10A range only in pulse mode. Limited to 2.5ms pulse width maximum. 10% duty cycle maximum.
Speed: 350µs for verification and notification. 5. Speed = Normal (1 PLC). For 0.1 PLC, add 0.005% of range to offset specifications, except 200mV, 1A, 10A
Contact Check: 2 W 15 W 50 W ranges, add 0.05%. For 0.01 PLC, add 0.05% of range to offset specifications, except 200mV, 1A, 10A ranges,
add 0.5%.
No contact check failure <1.00 W <13.5 W <47.5 W 6. Accuracies apply to 2- or 4-wire mode when properly zeroed.
Always contact check failure >3.00 W >16.5 W >52.5 W 7. In pulse mode, limited to 0.1 PLC measurement.
8. Model 2400 and 2400-C only.

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 Series 2400 SourceMeter SMU Instruments ®

Resistance Measurement Accuracy (Local or Remote Sense)1, 2, 5

Default Test Enhanced Accuracy

Default Test Current Normal Accuracy (23°C ±5°C) (23°C ±5°C) 4
Default Current 2420, 2425, 1 Year, ±(% rdg. + ohms) 1 Year, ±(% rdg. + ohms)
Range Resolution 2400, 2401, 2410 2430, 2440 2400, 2401 2410 2420, 2425, 2430, 2440 2400, 2401
<0.20000 W3 – – – Source I ACC + Meas. VACC Source I ACC + Meas. VACC Source I ACC + Meas. VACC Source I ACC + Meas. VACC
2.00000 W3 10 µW – 1 A Source I ACC + Meas VACC Source I ACC + Meas. VACC 0.17% + 0.0003 W Source I ACC + Meas. VACC
20.0000 W 100 µW 100 mA 100 mA 0.10% + 0.003 W 0.11% + 0.006 W 0.10% + 0.003 W 0.07% + 0.001 W
Series 2400 condensed specifications

Series 2400 condensed specifications

200.000 W 1 mW 10 mA 10 mA 0.08% + 0.03 W 0.09% + 0.1 W 0.08% + 0.03 W 0.05% + 0.01 W
2.00000 kW 10 mW 1 mA 1 mA 0.07% + 0.3 W 0.08% + 0.6 W 0.07% + 0.3 W 0.05% + 0.1 W
20.0000 kW 100 mW 100 µA 100 µA 0.06% + 3 W 0.07% + 6 W 0.06% + 3 W 0.04% + 1 W
200.000 kW 1 W 10 µA 10 µA 0.07% + 30 W 0.07% + 60 W 0.07% + 30 W 0.05% + 10 W
2.00000 MW6 10 W 1 µA 1 µA 0.11% + 300 W 0.12% + 600 W 0.11% + 300 W 0.05% + 100 W
20.0000 MW7 100 W 1 µA 1 µA 0.11% + 1 kW 0.12% + 2.4 kW 0.11% + 1 kW 0.05% + 500 W
200.000 MW3 1 kW 100 nA – 0.66% + 10 kW 0.66% + 24 kW Source I ACC + Meas. VACC 0.35% + 5 kW
>200.000 MW3 – – – Source I ACC + Meas. VACC Source I ACC + Meas. VACC Source I ACC + Meas. VACC Source I ACC + Meas. VACC

TEMPERATURE COEFFICIENT (0°–18°C and 28°–50°C): ±(0.15 × accuracy spec-

NOTES
ification)/°C.
1. Speed = Normal (1 PLC). For 0.1 PLC, add 0.005% of range to offset specifications, except 200mV, 1A, 10A ranges, add 0.05%. For
Source I Mode, Manual Ohms: Total uncertainty = I source accuracy + V meas- 0.01 PLC, add 0.05% of range to offset specifications, except 200mV, 1A, 10A ranges, add 0.5%.
ure accuracy (4-wire remote sense). 2. Accuracies apply to 2- or 4-wire mode when properly zeroed.
Source V Mode, Manual Ohms: Total uncertainty = V source a­ ccuracy + I meas- 3. Manual ohms only – except 2420, 2425, 2430, 2440 for 2W range and 2400, 2401, or 2410 for 200MW range.
ure accuracy (4-wire remote sense). 4. Source readback enabled, offset compensation ON. Also available on 2410, 2420, 2425, 2430, and 2440 with similar a­ ccuracy
enhancement.
6-wire ohms mode: Available using active ohms guard and guard sense. Max. 5. In pulse mode, limited to 0.1 PLC measurement.
Guard Output Current: 50mA (except 1A range). Accuracy is load dependent. 6. Except 2440; default test current is 5µA.
Refer to White Paper no. 2033 for calculation f­ormula. 7. Except 2440; default test current is 0.5µA.
Guard Output Impedance: <0.1W in ohms mode.

Services Available
2400-3Y-EW 1-year factory warranty extended to 3 years from date of shipment
2400-C-3Y-EW 1-year factory warranty extended to 3 years from date of shipment
2401-3Y-EW 1-year factory warranty extended to 3 years from date of shipment
2410-3Y-EW 1-year factory warranty extended to 3 years from date of shipment
2410-C-3Y-EW 1-year factory warranty extended to 3 years from date of shipment
2420-3Y-EW 1-year factory warranty extended to 3 years from date of shipment
2420-C-3Y-EW 1-year factory warranty extended to 3 years from date of shipment
2425-3Y-EW 1-year factory warranty extended to 3 years from date of shipment
2425-C-3Y-EW 1-year factory warranty extended to 3 years from date of shipment
2430-3Y-EW 1-year factory warranty extended to 3 years from date of shipment
2430-C-3Y-EW 1-year factory warranty extended to 3 years from date of shipment
2440-3Y-EW 1-year factory warranty extended to 3 years from date of shipment
2440-C-3Y-EW 1-year factory warranty extended to 3 years from date of shipment
C/2400-3Y-ISO 3 (ISO-17025 accredited) calibrations within 3 years of purchase for Models 2400, 2400-C, 2400-LV*
C/2401-3Y-ISO 3 (ISO-17025 accredited) calibrations within 3 years of purchase for Model 2401*
C/2410-3Y-ISO 3 (ISO-17025 accredited) calibrations within 3 years of purchase for Models 2410, 2410-C*
C/2420-3Y-ISO 3 (ISO-17025 accredited) calibrations within 3 years of purchase for Models 2420, 2420-C*
SMU INSTRUMENTS

C/2425-3Y-ISO 3 (ISO-17025 accredited) calibrations within 3 years of purchase for Models 2425, 2425-C*
C/2430-3Y-ISO 3 (ISO-17025 accredited) calibrations within 3 years of purchase for Models 2430, 2430-C*
C/2440-3Y-ISO 3 (ISO-17025 accredited) calibrations within 3 years of purchase for Models 2440, 2440-C*
TRN-2400-1-C Course: Unleashing the Power of Your SourceMeter SMU Instrument
*Not available in all countries

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 Series 2400 SourceMeter SMU Instruments ®

System Speeds
Measurement1
MAXIMUM RANGE CHANGE RATE: 75/second.
MAXIMUM MEASURE AUTORANGE TIME: 40ms (fixed source).2

Sweep Operation3 Reading Rates (rdg./second) for 60Hz (50Hz):

Source-Measure5
Measure Source-Measure Pass/Fail Test4, 5 Source-Memory4
Speed NPLC/Trigger Origin To Mem. To GPIB To Mem. To GPIB To Mem. To GPIB To Mem. To GPIB
Series 2400 condensed specifications

Series 2400 condensed specifications

Fast 0.01 / internal 2081 (2030) 1754 1551 (1515) 1369 902 (900) 981 165 (162) 165
IEEE-488.1 Mode 0.01 / external 1239 (1200) 1254 1018 (990) 1035 830 (830) 886 163 (160) 163
Fast 0.01 / internal 2081 (2030) 1198 (1210) 1551 (1515) 1000 (900) 902 (900) 809 (840) 165 (162) 164 (162)
IEEE-488.2 Mode 0.01 / external 1239 (1200) 1079 (1050) 1018 (990) 916 (835) 830 (830) 756 (780) 163 (160) 162 (160)
Medium 0.10 / internal 510 (433) 509 (433) 470 (405) 470 (410) 389 (343) 388 (343) 133 (126) 132 (126)
IEEE-488.2 Mode 0.10 / external 438 (380) 438 (380) 409 (360) 409 (365) 374 (333) 374 (333) 131 (125) 131 (125)
Normal 1.00 / internal 59 (49) 59 (49) 58 (48) 58 (48) 56 (47) 56 (47) 44 (38) 44 (38)
IEEE-488.2 Mode 1.00 / external 57 (48) 57 (48) 57 (48) 57 (47) 56 (47) 56 (47) 44 (38) 44 (38)

Single Reading Operation Reading Rates (rdg./second) for 60Hz (50Hz):

Measure Source-Measure5 Source-Measure Pass/Fail Test4,5
Speed NPLC/Trigger Origin To GPIB To GPIB To GPIB
Fast (488.1) 0.01 / internal 537 140 135
Fast (488.2) 0.01 / internal 256 (256) 79 (83) 79 (83)
Medium (488.2) 0.10 / internal 167 (166) 72 (70) 69 (70)
Normal (488.2) 1.00 / internal 49 (42) 34 (31) 35 (30)

Component for 60Hz (50Hz): 4, 6

Source-Measure Pass/Fail Test5, 7
Speed NPLC/Trigger Origin Measure To GPIB Source Pass/Fail Test To GPIB
Fast 0.01 / external 1.04 ms (1.08 ms) 0.5 ms (0.5 ms) 4.82 ms (5.3 ms)
Medium 0.10 / external 2.55 ms (2.9 ms) 0.5 ms (0.5 ms) 6.27 ms (7.1 ms)
Normal 1.00 / external 17.53 ms (20.9 ms) 0.5 ms (0.5 ms) 21.31 ms (25.0 ms)

NOTES
1 Reading rates applicable for voltage or current measurements. Auto zero off, autorange off, filter off, display off, 4 Pass/Fail test performed using one high limit and one low math limit.
trigger delay = 0, and binary reading format. 5 Includes time to re-program source to a new level before making m ­ easurement.
2 Purely resistive lead. 1µA and 10µA ranges <65ms. 6 Time from falling edge of START OF TEST signal to falling edge of end of test signal.
3 1000 point sweep was characterized with the source on a fixed range. 7 Command processing time of :SOURce:VOLTage|CURRent:TRIGgered <nrf> command not included.

general
Noise Rejection: Programmability: IEEE-488 (SCPI-1995.0), RS-232, 5 user-definable power-up states plus
factory default and *RST.
NPLC NMRR CMRR
Fast 0.01 — 80 dB Digital Interface:
Medium 0.1 — 80 dB Interlock: Active low input.
Slow 1 60 dB 100 dB1 Handler Interface: Start of test, end of test, 3 category bits. +5V@ 300mA supply.
Not available on Model 2401.
1 Except lowest 2 current ranges = 90dB.
Digital I/O: 1 trigger input, 4 TTL/Relay Drive outputs (33V @ 500mA, diode clamped).
Load Impedance: Stable into 20,000pF typical. Not available on Model 2401.
Common mode voltage: 250V DC (40V DC for Model 2440). Power Supply: 100V to 240V rms, 50–60Hz (automatically detected at power up). Model
Common Mode Isolation: >109W, <1000pF. 2400, 2401: 190VA. Model 2410: 210VA. Model 2420: 220VA. Model 2425, 2430: 250VA.
Model 2440: 240VA.
OVERRANGE: 105% of range, source and measure.
COOLING: Model 2401: Convection. Model 2410, 2420, 2425, 2430, 2440: Forced air,
Max. Voltage Drop Between Input/Output and sense terminals: 5V.
variable speed.
Max. Sense Lead Resistance: 1MW for rated accuracy.
SMU INSTRUMENTS

EMC: Conforms to European Union Directive 89/336/EEC, EN 61326-1.

SENSE INPUT IMPEDANCE: >1010W.
Safety: UL listed to UL 61010B-1:2003: Conforms to European Union Low Voltage Directive.
GUARD OFFSET VOLTAGE: <150µV, typical (300µV for Models 2430, 2440).
Vibration: MIL-PRF-28800F Class 3 Random.
Source Output modes:
WARM-UP: 1 hour to rated accuracies.
Pulse (Model 2430 only)
Fixed DC level DIMENSIONS: 89mm high × 213mm wide × 370mm deep (3½ in × 83⁄8 in × 149⁄16 in). Bench
Memory List (mixed function) Configuration (with handle and feet):104mm high × 238mm wide × 370mm deep (41⁄8 in ×
Stair (linear and log) 93⁄8 in × 149⁄16 in).
Memory Buffer: 5,000 readings @ 5 digits (two 2,500 point buffers). Includes selected measured WEIGHT: 3.21kg (7.08 lbs) (Model 2425, 2430, 2440: 4.1kg, 9.0 lbs).
value(s) and time stamp. Lithium battery b­ ackup (3 yr+ battery life). ENVIRONMENT: Operating: 0°–50°C, 70% R.H. up to 35°C. Derate 3% R.H./°C, 35°–50°C.
SOURCE MEMORY LIST: 100 points max. Storage: –25°C to 65°C.

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 6430 Sub-femtoamp Remote
SourceMeter SMU Instrument ®

The Model 6430 Sub-Femtoamp Remote

SourceMeter SMU Instrument combines the
voltage and current sourcing and measurement
Combines broad functionality with exceptional measurement integrity

Combines broad functionality with exceptional measurement integrity

functions of Keithley’s popular SourceMeter
SMU instruments with sensitivity, noise, and
input resistance specifications superior to
electrometers. This unique combination of broad
functionality and exceptional measurement
integrity is made possible by the Model 6430’s
Remote PreAmp, which offers a very sensitive
bi-directional amplifier with sensitive feedback
elements for measuring or sourcing currents at
the device being tested. The high level signals
output by the Remote PreAmp are sent to the
controlling mainframe via a two-meter cable.
This allows the user to make a direct or very
short connection to the signal, minimizing the
effects of cable noise.
The Model 6430 makes voltage, current, and
resistance measurements at speeds no electrom-
eter can match. It can read up to 2000 source/
measure readings per second into internal memory. Currents can be measured in as little as 5ms on
• 0.4fA p-p (4E–16A) noise the 100nA range, decreasing to just a few hundred microseconds on the higher ranges.
(typical) The Model 6430’s distinguishing features include its excellent low current sensitivity and the Remote
• Remote PreAmp can be located PreAmp, which makes this sensitivity useful by eliminating long input cables. The Remote PreAmp
at the signal source to minimize is an integral part of the Model 6430’s feedback measuring system that cannot be operated inde-
cable noise pendently from the measurement mainframe, although it can be separated from the mainframe by up
to two meters of connection cable carrying high level signals.
• >1016W input resistance on
voltage measurements Applications
+100mA
• High speed — up to 2000 The Model 6430’s capabilities make it equally
readings/second useful for research work and for evaluating
sophisticated components in test labs for +10mA
• Up to 6½-digit resolution low-current, high-resistance, or sensitive semi-
conductor m ­ easurements. The low noise and
• Fast characterization drift performance of the Model 6430 also makes
–200V –20V +20V +200V

of components with it well suited for research studies in single

programmable digital I/O and electron devices, highly resistive nanowires and
interfaces nanotubes, polymers, highly resistive nano- –10mA

materials, and electrochemical amperometry

applications.
–100mA
High Speed Data Handling
The Model 6430 can read more than 2000 read-
ings per second into its internal memory buffer. The Model 6430 provides four-quadrant
The IEEE-488 bus output can transmit up to ­sourcing of up to 2.2W, as well as measure-
ment ­sensitivity down to sub-femtoamp and
75 source/measure readings per second to an microvolt levels. It can measure currents
SMU INSTRUMENTS

external computer controller, including pass/fail from the 1pA range (with just 0.4fA p-p noise
i­ ndication. typical) up to the 100mA range at up to 20V.
Voltage ranges from 200mV to 200V are
available. Current and voltage range settings
define the maximum source or sink voltage
or current.

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 6430 Sub-Femtoamp Remote
SourceMeter SMU Instrument ®

Typical applications: Measuring FET Gate Leakage and Channel Currents

Ordering Information Semiconductor ID
Combines broad functionality with exceptional measurement integrity

Combines broad functionality with exceptional measurement integrity

6430 Sub-femtoamp measurements
A
Remote SourceMeter Gate leakage or channel I G
D
D
SMU Instrument leakage in FET-based com- +
G G
ponents can generate errors +
A V DS

Accessories Supplied in MOSFETs, JFETs, a­ nalog V

switches, and many other
GS
6430-322-1B
S
Low Noise Triax Cable, ­circuits. By allowing research- S

3-slot triax to alligator ers to measure extremely Model 6430 Model 6430

clips, 20cm (8 in) low-level ­currents and voltag-

8607 Safety High Voltage es, the Model 6430 can help
Dual Test Leads them understand the design
limitations of these components and investigate alternative device structures or materials.
CA-176-1E PreAmp Cable,
2m (6.6 ft) SET research
CA-186-1B Banana Lead to The Model 6430’s superior low current measurement ability (0.4fA p-p noise typical) makes it
Screw Terminal extremely useful for single electron transistor (SET) and quantum-dot research. Using a technique
Adapter similar to a lock-in, the 6430 can measure currents with 1aA sensitivity (10 –18A = 6 electrons/second).
CAP-31 3-lug Protective The Measurement Industry’s Lowest Noise and Drift
Cap (2)
This data illustrates the Model 6430’s impressive s­ tability over a five-hour period, as well as its low
Instruction Manual short-term noise performance. This signal trace was acquired using the instrument’s AUTOFILTER
with a 5-­second rise time on the 1pA range. The inset close-up is a snapshot of the filtered signal,
Accessories Available showing the Model 6430’s low noise during the first 100-second period. The data was taken in a
7007-1 Shielded GPIB Cable, 1m (3.3 ft) laboratory environment where temperature varied about 1°C, with the instrument’s IN/OUT HI and
7007-2 Shielded GPIB Cable, 2m (6.6 ft) SENSE leads capped.
7007-4 Shielded GPIB Cable, 4m (13.1 ft)
7007-05 Shielded GPIB Cable, 0.5m (1.6 ft)
7078-TRX-6IN 3-slot, Low Noise, 0.15m (0.5 ft) Guarded
Triax Cable
8501-1 Trigger Link Cable, 1m (3.3 ft.) 2x10–15A
8501-2 Trigger Link Cable, 2m (6.6 ft.) 1 fA
8502 Trigger Link Adapter Box 1x10–15A
8503 Trigger Link DIN-to-BNC Trigger Cable
KPCI-488LPA IEEE-488 Interface/Controller for the PCI Bus 0
KUSB-488B IEEE-488 USB-to-GPIB Interface Adapter
–1x10–15A
Services Available
TRN-2400-1-C Course: Unleashing the Power of Your –2x10–15A
SourceMeter SMU Instrument
6430-3Y-EW 1-year factory warranty extended to 3 years
from date of shipment 0 1 2 3 4 5
C/6430-3Y-ISO 3 (ISO-17025 accredited) calibrations within 3 Hours
years of purchase*
*Not available in all countries

1x10–15A
SMU INSTRUMENTS

1 fA
0

–1x10–15A

0 10 20 30 40 50 60 70 80 90 100
Seconds

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 6430 Sub-Femtoamp Remote
SourceMeter SMU Instrument ®

Condensed Measure Specifications 1

Voltage Measurement Accuracy (4-wire sense) 3 Current Measurement Accuracy (2- or 4-wire sense) 4
Input 2 Accuracy (23°C ± 5°C) Accuracy
Range Max. Resolution Resistance 1 Year, ±(%rdg + volts) (23°C ± 5°C)
200.000 mV 1 µV >1016W 0.012% + 350 µV Max. Voltage 1 Year
2.00000 V 10 µV >1016W 0.012% + 350 µV Range Resolution Burden5 ±(%rdg + amps)
20.0000 V 100 µV >1016W 0.015% + 1.5 mV 1.00000 pA 10 aA < 1mV 1.0 % + 7 fA
200.000 V 1 mV >1016W 0.015% + 10 mV 10.0000 pA 100 aA < 1mV 0.50 % + 7 fA
100.000 pA 1 fA < 1mV 0.15 % + 30 fA
TEMPERATURE COEFFICIENT (0°–18°C and 28°–40°C): ±(0.15 × accuracy specification)/°C. 1.00000 nA 10 fA < 1mV 0.050 % + 200 fA
10.0000 nA 100 fA < 1mV 0.050 % + 2 pA
Model 6430 specifications

Model 6430 specifications

100.000 nA 1 pA < 1mV 0.050 % + 20 pA
1.00000 µA 10 pA < 1mV 0.050 % + 300 pA
Additional Measure Specifications 10.0000 µA 100 pA < 1mV 0.050 % + 2 nA
Output SETTLING Time (typical to 10% of final value): <2s, 1pA and 10pA ranges; <50ms, 100.000 µA 1 nA < 1mV 0.025 % + 6 nA
100pA through 10nA ranges; <5ms, 100nA through 100mA ranges. 1.00000 mA 10 nA < 1mV 0.027 % + 60 nA
Current Noise: When observed over 1 minute intervals, peak to peak noise will be within 10.0000 mA 100 nA < 1mV 0.035 % + 600 nA
400aA (typical) during 90% of the intervals using Autofilter (5s 10% to 90% rise time), with triax 100.000 mA 1 µA < 1mV 0.055 % + 6 µA
connectors capped, Autozero OFF, Source Delay = 0, on the 1pA range for at least 3 minutes. TEMPERATURE COEFFICIENT (0°–18°C and 28°–40°C): ±[(0.15 × accuracy specification) +
1fA]/°C.
Input Current: <3fA at 23°C, <40% RH; typically ±0.5fA/°C around 23°C, <40% RH.

Resistance Measurement Accuracy (4-wire sense with remote preamp)

Source I Mode, Auto Ohms
Normal Accuracy Enhanced Accuracy
Max. Default (23°C ± 5°C) (23°C ± 5°C) 7
Range Resolution Test Current 1 Year, ±(%rdg + ohms) 1 Year, ±(%rdg + ohms)
<2.00000 W 6 1 µW — Source I ACC + Measure VACC Measure I ACC + Measure VACC
20.0000 W 100 µW 100 mA 0.098% + 0.003 W 0.068% + 0.001 W
200.000 W 1 mW 10 mA 0.077% + 0.03 W 0.048% + 0.01 W
2.00000 kW 10 mW 1 mA 0.066% + 0.3 W 0.040% + 0.1 W
20.0000 kW 100 mW 100 µA 0.063% + 3 W 0.038% + 1 W
200.000 kW 1 W 10 µA 0.082% + 30 W 0.064% + 10 W
2.00000 MW 10 W 1 µA 0.082% + 300 W 0.064% + 100 W
20.0000 MW 100 W 1 µA 0.085% + 1 kW 0.067% + 500 W
200.000 MW 1 kW 100 nA 0.085% + 10 kW 0.068% + 5 kW
2.00000 GW 10 kW 10 nA 0.085% + 100 kW 0.070% + 50 kW
20.0000 GW 100 kW 1 nA 0.085% + 1 MW 0.070% + 500 kW
200.000 GW 1 MW 100 pA 0.205% + 10 MW 0.185% + 5 MW
2.00000 TW 10 MW 10 pA 0.822% + 100 MW 0.619% + 50 MW
20.0000 TW 100 MW 1 pA 2.06% + 1 GW 1.54% + 500 MW
>20.0000 TW — —
6 Source I ACC + Measure VACC Measure I ACC + Measure VACC

TEMPERATURE COEFFICIENT (0°–18°C and 28°–40°C): ±(0.15 × accuracy specification)/°C. NOTES

Source I Mode, Manual Ohms: Total uncertainty = I source a­ ccuracy + V measure accuracy 1. Speed = 10 PLC, Autofilter ON, properly zeroed and settled.
(4-wire sense). 2. Source I mode, I = 0.
3. Voltage measurement accuracy is not affected by the remote preamp.
Source V Mode: Total uncertainty = V source accuracy + I measure accuracy (4-wire sense). 4. Current measurement accuracy is not affected by the remote preamp; however, the 1pA through 100nA ranges
6-wire ohms mode: Available using active ohms guard and guard sense (mainframe rear panel are available only when using a preamp.
only). Max. Guard Output Current: 50 mA. Accuracy is load dependent. Refer to manual for 5. 4-wire mode.
calculation formula. 6. Manual ohms mode only.
7. Source readback enabled, offset compensation ON. Source delay must be pro­g rammed such that the source is
SMU INSTRUMENTS

Mainframe Guard Output Resistance: 0.1W in ohms mode. fully settled for each reading.

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 6430 Sub-Femtoamp Remote
SourceMeter SMU Instrument ®

Condensed System Speeds

Measurement1 NOTES
Maximum Range Change Rate: 75/second. 1. Reading rates applicable for voltage or current measurements. Auto zero off, autorange off, filter off, display
Single Reading operation reading rates (rdg/second) for 60Hz (50Hz): off, trigger delay = 0, source auto clear off, and b­ inary reading format.
2. Pass/Fail test performed using one high limit and one low math limit.
Source- Source-Measure 3. Includes time to re-program source to a new level before making m ­ easurement.
NPLC/ Measure Measure 3 Pass/Fail Test 2, 3 4. For sink mode, 1pA to 100mA range, accuracy is ±(0.15% + offset*4).
Speed Trigger Origin To GPIB To GPIB To GPIB 5. Voltage source accuracies are not affected by the remote preamp.
Fast 0.01 / internal 256 (256) 83 (83) 83 (83)
Medium 0.10 / internal 181 (166) 73 (70) 73 (70)
Normal 1.00 / internal 49 (42) 35 (31) 34 (30) General
Noise Rejection: NPLC NMRR CMRR
Condensed Source Specifications4
Model 6430 specifications

Model 6430 specifications

Fast 0.01 — 80 dB
Medium 0.1 — 80 dB
Voltage Programming Accuracy (4-wire sense) 5 Normal 1 60 dB 90 dB
Accuracy (1 Year) Noise
Programming 23°C ±5°C (peak-peak) Load Impedance: Stable into 20,000pF on the 100mA through 100µA r­ anges, 470pF on the
Range Resolution ±(% rdg. + volts) 0.1Hz – 10Hz 10µA and 1µA ranges, and 100pF on the nA and pA ranges. Refer to the User’s Manual for
200.000 mV 5 µV 0.02% + 600 µV 5 µV details on measuring large capacitive loads.
2.00000 V 50 µV 0.02% + 600 µV 50 µV Common mode voltage: ±42VDC maximum.
20.0000 V 500 µV 0.02% + 2.4 mV 500 µV Common Mode Isolation: >10 9W, <1000pF.
200.000 V 5 mV 0.02% + 24 mV 5 mV
Overrange: 105% of range, source and measure.
TEMPERATURE COEFFICIENT (0°–18°C and 28°–40°C): ±(0.15 × accuracy specification)/°C. Max. Voltage Drop Between Input/Output and sense terminals: 5V. (To meet
Max. Output power: 2.2W (four quadrant source or sink operation). specified accuracy with 4-wire sense, refer to the User’s Manual.)
Source/SINK Limits: ±21V @ ±105mA, ±210V @ ±10.5mA. Max. Sense Lead Resistance: 10 W for rated accuracy.
Voltage Regulation: Line: 0.01% of range. Load: 0.01% of range + 100µV. SENSE INPUT ResistANCE: 1MW.
NOISE 10Hz–1MHz (p-p): 10mV. Mainframe Guard Offset Voltage: 300µV, typical.
Over Voltage Protection: User selectable values, 5% tolerance. Factory default = None. Preamp Guard Offset Voltage: 1mV, typical.
Current Limit: Bipolar current limit (compliance) set with single value. Min. 0.1% of range. Preamp Guard Output Resistance: 110kW.
Source Output modes: Fixed DC level, Memory List (mixed function), Stair (linear
and log).
Current Programming Accuracy (with remote preamp) Source Memory List: 100 points max.
Accuracy (1 Year) 4 Noise Memory Buffer: 5,000 readings @ 5½ digits (two 2,500 point buffers). Includes
Programming 23°C ±5°C (peak-peak) selected measured value(s) and time stamp. Lithium battery backup (3 yr+ battery life).
Range Resolution ±(% rdg. + amps) 0.1Hz – 10Hz Digital Interface:
1.00000 pA 50 aA 1.0 % + 10 fA 5 fA Safety Interlock: Active low input.
10.0000 pA 500 aA 0.50 % + 30 fA 10 fA
Handler Interface: Start of test, end of test, 3 category bits. +5V @ 300mA supply.
100.000 pA 5 fA 0.15 % + 40 fA 20 fA
1.00000 nA 50 fA 0.050 % + 200 f A 50 fA Digital I/O: 1 trigger input, 4 TTL/Relay Drive outputs (33V @ 500mA sink, diode
10.0000 nA 500 fA 0.050 % + 2 pA 500 fA clamped).
100.000 nA 5 pA 0.050 % + 20 pA 3 pA Programmability: IEEE-488 (SCPI-1995.0), RS-232, 5 user-definable power-up states plus
1.00000 µA 50 pA 0.050 % + 300 pA 20 pA factory default and *RST.
10.0000 µA 500 pA 0.050 % + 2 nA 200 pA Power Supply: 100V–240V rms, 50–60Hz (automatically detected at power up),
100.000 µA 5 nA 0.031 % + 20 nA 500 pA 100VA max.
1.00000 mA 50 nA 0.034 % + 200 nA 5 nA
EMC: Conforms with European Union Directive 89/336/EEC EN 55011, EN 50082-1, EN 61000-
10.0000 mA 500 nA 0.045 % + 2 µA 50 nA
3-2 and 61000-3-3, FCC part 15 class B.
100.000 mA 5 µA 0.066 % + 20 µA 500 nA
Safety: Conforms with European Union Directive 73/23/EEC EN 61010-1.
TEMPERATURE COEFFICIENT (0°–18°C and 28°–40°C): ±(0.15 × accuracy specification)/°C.
Vibration: MIL-PRF-28800F, Class 3.
Max. output power: 2.2W (four quadrant source or sink operation).
WARM-UP: 1 hour to rated accuracies.
Source/Sink Limits: ±10.5mA @ ±210V, ±105mA @ ±21V .
DIMENSIONS: 89mm high × 213mm wide × 370mm deep (3½ in × 8 3⁄8 in × 14 9⁄16 in). Bench
CURRENT Regulation: Line: 0.01% of range. Load: 0.01% of range + 1fA. Configuration (with handle and feet): 104mm high × 238mm wide × 370mm deep (41 ⁄8 in
VOLTAGE Limit: Bipolar voltage limit (compliance) set with single value. Min. 0.1% of range. × 93⁄8 in × 149⁄16 in).
SMU INSTRUMENTS

Amplifier: 20mm high × 57mm wide × 97mm deep (0.783 in × 2.225 in × 3.75 in).
WEIGHT: 5.9kg (13 lbs).
ENVIRONMENT: Operating: 0°–40°C, 60% R.H. (non-condensing) up to 35°C. Derate 5%
R.H./°C, 35°–40°C. Storage: –25°C to 65°C. Non-condensing humidity.

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 4200-SCS Parameter Analyzer

The easy-to-use Model 4200-SCS performs labo-

ratory grade DC I-V, C-V, and pulse device char-
acterization, real-time plotting, and analysis with
high precision and sub-femtoamp resolution. It
is the best tool available for interactive paramet-
ric analysis and device characterization. It offers
the most advanced capabilities available in a
fully integrated characterization system, includ-
ing a complete, embedded PC with Windows
operating system and mass storage. Its self-­
Lab grade DC device characterization

Lab grade DC device characterization

documenting, point-and-click interface speeds
and simplifies the process of taking data, so
users can begin analyzing their results sooner.
Its Keithley Interactive Test Environment (KITE)
is so intuitive that even a novice can use the
­system with ease. This point-and-click software
offers a full range of functionality, from man-
aging tests, organizing results, and generating
reports to creating user libraries. Sophisticated
and simple test sequencing and external instru-
ment drivers make it simple to perform auto­
mated testing with combined DC I-V, pulse, and
• Characterize devices with up to C-V ­measurements.
9 source measure unit (SMU) APPLICATIONS:
instruments The modular design of the Model 4200-SCS pro-
Semiconductor Devices vides you with tremendous flexibility. It supports
• Sub-femtoamp resolution
measurements with optional • On-wafer parametric test up to nine internal source measure unit (SMU)
preamps instruments and optional Remote PreAmps that
• Wafer level reliability extend the resolution of any SMU from 100fA
• Ultra-fast I-V module for pulse and
pulse I-V capabilities • Packaged device characterization to 0.1fA. Its hardware options also include four
switch matrix configurations, meters, pulse
• C-V instrument makes C-V • High κ gate charge trapping
measurements as easy as DC I-V ­generators, and more.
• Isothermal testing of devices
• Ultra low frequency C-V and materials subject to self-
Optional instruments can be integrated into
measurement capability the Model 4200-SCS, such as dual-channel
heating effects
• Familiar, point-and-click Windows® pulse generators, a dual-channel digital
environment and intuitive GUI • Charge pumping to characterize ­oscillo­scope, and a C-V instrument, which is a
• Easy to use for both interactive and interface state densities in capacitance-voltage instrument that performs
automated tests MOSFET devices capacitance measurements from femtofarads to
nanofarads at frequencies from 1kHz to 10MHz.
• Real-time plotting and analysis • Resistive or capacitive MEMS
allow users to view results before drive characterization The C-V option includes the new C-V Power
a test has completed and to take
preemptive action as needed package, which supports high power C-V
Optoelectronic Devices measurements up to 400V and 300mA, up to
• Embedded PC provides the 60V of differential DC bias, and quasistatic C-V
additional benefits of a networked • Semiconductor laser diode
instrument including mapping DC/CW characterization ­measurements.
network drives and making test
results available to the corporate • DC/CW characterization of The exceptional low current performance of the
network transceiver modules Model 4200-SCS makes it the perfect solution
SMU INSTRUMENTS

• Simultaneously acquires data,

for research studies of single electron transistors
• PIN and APD characterization (SETs), molecular electronic devices, and other
analyzes plots, and prints reports
nanoelectronic devices that require I-V charac-
• Ideal for device character­iza­tion, Technology Development
device modeling, reliability testing, terization. The 4200-SCS can also be used to
and failure analysis • Carbon nanotube make four-probe van der Pauw resistivity and
characterization Hall v­ oltage measurements.
• Includes instrument and prober
drivers as well as interfaces to • Materials research For more information on the Model 4200-SCS,
popular modeling and circuit
simulation software • Electrochemistry see page 58.

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SMU INSTRUMENTS

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