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Design and Correction of Optical Systems: Lecture 1: Basics 2017-04-07 Herbert Gross

This document provides an overview of the basics of optical system design and correction. It outlines the preliminary schedule for a lecture series on this topic, which will cover fundamentals like the law of refraction, materials and components, paraxial optics, geometrical aberrations, and optimization techniques. The document also lists some of the key concepts that will be discussed, such as Fresnel formulas, optical system modeling, raytracing, and approaches for calculating optical system performance.

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0% found this document useful (0 votes)
537 views46 pages

Design and Correction of Optical Systems: Lecture 1: Basics 2017-04-07 Herbert Gross

This document provides an overview of the basics of optical system design and correction. It outlines the preliminary schedule for a lecture series on this topic, which will cover fundamentals like the law of refraction, materials and components, paraxial optics, geometrical aberrations, and optimization techniques. The document also lists some of the key concepts that will be discussed, such as Fresnel formulas, optical system modeling, raytracing, and approaches for calculating optical system performance.

Uploaded by

KenS.Mao
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
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You are on page 1/ 46

Design and Correction of Optical

Systems

Lecture 1: Basics
2017-04-07
Herbert Gross

Summer term 2017 www.iap.uni-jena.de


2

Preliminary Schedule - DCS 2017


Law of refraction, Fresnel formulas, optical system model, raytrace, calculation
1 07.04. Basics
approaches
Dispersion, anormal dispersion, glass map, liquids and plastics, lenses, mirrors,
2 14.04. Materials and Components
aspheres, diffractive elements
Paraxial approximation, basic notations, imaging equation, multi-component
3 21.04. Paraxial Optics
systems, matrix calculation, Lagrange invariant, phase space visualization
Pupil, ray sets and sampling, aperture and vignetting, telecentricity, symmetry,
4 28.04. Optical Systems
photometry
Longitudinal and transverse aberrations, spot diagram, polynomial expansion,
5 05.05. Geometrical Aberrations
primary aberrations, chromatical aberrations, Seidels surface contributions
Fermat principle and Eikonal, wave aberrations, expansion and higher orders,
6 12.05. Wave Aberrations
Zernike polynomials, measurement of system quality
Diffraction, point spread function, PSF with aberrations, optical transfer function,
7 19.05. PSF and Transfer function
Fourier imaging model
Rayleigh and Marechal criteria, Strehl definition, 2-point resolution, MTF-based
8 26.05. Further Performance Criteria
criteria, further options
Principles of optimization, initial setups, constraints, sensitivity, optimization of
9 02.06. Optimization and Correction
optical systems, global approaches
Symmetry, lens bending, lens splitting, special options for spherical aberration,
10 09.06. Correction Principles I
astigmatism, coma and distortion, aspheres
Field flattening and Petzval theorem, chromatical correction, achromate,
11 16.06. Correction Principles II
apochromate, sensitivity analysis, diffractive elements
Overview, photographic lenses, microscopic objectives, lithographic systems,
12 23.06. Optical System Classification
eyepieces, scan systems, telescopes, endoscopes

13 30.06. Special System Examples Zoom systems, confocal systems

14 07.07. Further Topics New system developments, modern aberration theory,...


3

Contents

1. Refraction
2. Fresnel formulas
3. Optical systems
4. Raytrace
5. Calculation approaches
4

Law of Refraction

 Angle deviation at skew incidence


 Change of magnification at curved surfaces, lensing effect

P
n n'
ray

s surface
normal
i O e
i'

s' Q
interface
plane
5

Law of Refraction

 Scalar law of refraction


(Snells law)
n  sin i  n' sin i'

 n   n    
 
2
n  2 e
 Vectorial form s '   s    e  s  1     1  e  s 
n'  n'  n'  
 
interface
 Special case reflection

    
s '  s  2  e  e  s 
reflection

refraction
s'
s'
 All vectors in the plane of incidence
normal i i'
direction
 Fundamental basis:
i e
Principle of Fermat
Invariance of field components
s

incidence n n'
6

Law of Refraction

 Simple derivation of the law of refraction:


constant optical path length for two rays, n  a  n'a'
optical path length:
product of index of refraction times geometrical path length

 Geometrical condition of triangles


a  d  sin i
a'  d  sin i '
a'
n'
 Insertion delivers the law of d i'
refraction
i
a
n  sin i  n' sin i'
n
7

Law of Refraction

 Scalar law of refraction n  sin i  n' sin i'


 Sine is limited by -1…+1:

1. gracing incidence at i=90°


i'
total internal reflection
90
2. total internal reflection with
n/n' = 1.9
i‘ = 90° 80 n/n' = 1.5
n/n' = 1.2
for sin i n' / n 70 n/n' = 1
n/n' = 1/1.2
60 n/n' = 1/1.5
n/n' = 1/1.9
50

grazing
40
incidence
30

20

10

0 i
0 10 20 30 40 50 60 70 80 90
8

Fresnel Formulas

 Schematical illustration of the ray refraction ( reflection at an interface


 The cases of s- and p-polarization must be distinguished

a) s-polarization b) p-polarization

B E
r r
reflection
reflection transmission
Er Br transmission

Et Bt

i i' Bt i i' Et
normal to the i normal to the i
interface interface

n n' n n'
Ei Bi
incidence
B incidence
i interface Ei interface
9

Fresnel Formulas

 Electrical transverse polarization


TE, s- or s-polarization, E perpendicular to incidence plane 
 Magnetical transverse polarization
TM, p- or p-polarization, E in incidence plane ||

 Boundary condition of Maxwell equations


1  E1n   2  E2n
at a dielectric interface:
continuous tangential component of E-field E1t  E2t

E Er
 Amplitude coefficients for rTE  r rTM 
reflected field Ee Ee TM
TE

 rTM  1
E n
transmitted field tTE  t  rTE  1 tTM 
Ee n'
TE

P Pt n' cos i' 2


 Reflectivity and transmission R  r  r2 T  t
of light power Pe Pe n  cos i
10

Fresnel Formulas: Stokes Relations

 Relation between the amplitude coefficients for reflection/transmission:

1. s-components:
field components additive
minus sign due to phase jump

t  r  1 incidence reflection
cross section
2. p-components: area

energy preservation but change of field


amplitudes
area size due to projection, Er Ei
correction factor, no additivity of
intensities
cos i '
t||   r||  1 Et
continuous
tangential
cos i component

transmission
11

Fresnel Formulas

 Coefficients of amplitude for reflected rays, s and p

sin(i  i' ) n  cos i  n'2 n 2  sin 2 i n  cos i  n' cos i' kez  ktz
rE     
sin(i  i' ) n  cos i  n' n  sin i n  cos i  n' cos i' kez  ktz
2 2 2

tan(i  i' ) n'2  cos i  n  n'2 n 2  sin 2 i n' cos i  n  cos i' n'2 kez  n 2  ktz
rE||     2
tan(i  i' ) n'  cos i  n  n' n  sin i n' cos i  n  cos i' n' kez  n 2  ktz
2 2 2 2

 Coefficients of amplitude for transmitted rays, s and p

2n  cos i 2n  cos i 2n  cos i 2kez


t E    
n  cos i  n' cos i' n  cos i  n'2 n 2  sin 2 i n  cos i  n' cos i' kez  ktz

2n  cos i 2n'n  cos i 2n  cos i 2n'2 kez


t E||     2
n' cos i  n  cos i' n'  cos i  n  n' n  sin i n' cos i  n  cos i' n' kez  n 2  ktz
2 2 2 2
12

Fresnel Formulas

 Typical behavior of the Fresnel amplitude coefficients as a function of the incidence angle
for a fixed combination of refractive indices

 i=0
Transmission independent
on polarization
Reflected p-rays without
phase jump t
Reflected s-rays with
phase jump of p
(corresponds to r<0) t
r
 i = 90°
No transmission possible
Reflected light independent r
on polarization

 Brewster angle:
completely s-polarized
i
reflected light
Brewster
13

Fresnel Formulas: Energy vs. Intensity

Fresnel formulas, different representations:

1. Amplitude coefficients, with sign

2. Intensity cefficients: no additivity due to area projection

3. Power coefficients: additivity due to energy preservation

r,t
R,T
R,T
1 1
1

0.8 0.9
0.9

0.6 0.8
0.8
t T
0.4 0.7 0.7
t T
0.2 0.6 0.6
r 0.5
T(In)
0 0.5
T(In)
-0.2 0.4 0.4

0.3 0.3
-0.4
r 0.2 0.2
R
-0.6
R(In)
0.1 0.1
-0.8 R
R(In)
0 i 0 i
-1 i 0 10 20 30 40 50 60 70 80 90 0 10 20 30 40 50 60 70 80 90
0 10 20 30 40 50 60 70 80 90
14

Fresnel Formulas

 Reflectivity and transmittivity of power

sin 2 (i  i' ) tan 2 (i  i' ) sin 2i' cos 2i cos 2i  sin 2i'
R  R||  T  T|| 
sin 2 (i  i' ) tan 2 (i  i' ) sin 2 (i  i' ) sin 2 (i  i' )  cos 2 (i  i' )
 Arbitrary azimuthal angle t of polarization: decompositioin of components

R  R||  cos 2 t e  R  sin 2 t e T  T||  cos 2 t e  T  sin 2 t e

 In case of vanishing absorption:


Energy preservation R T  1
 Special case of normal incidence
n R
 n  n'  4n  n'
2

R    T 
n  n'2
1.4 2.778 %
 n  n '  1.5 4.0 %
 Typical values for some glasses and optical materials in air 1.8 8.16 %
2.4 16.96 %
15

Transmission in Optical Systems

 Residual reflectivity of the (identical) surfaces in an optical system with n surfaces:


Overall transmission of energy:

Tges  1 R 
T
n
1

0.9
 Transmission decreases
nonlinear 0.8

0.7
 Practical consequences:
R=1%
1. loss of signal energy 0.6
2. contrast reduction in R=2%
0.5
case of imaging
3.occurence of ghost images 0.4

0.3
R=4%
0.2
R = 10 % R=6%
0.1

0 n
0 10 20 30 40 50 60
16

Brewster Angle

 Brewster case of reflection:


reflected and transmitted ray are perpendicular

i i'  90
Brewster case
 Condition of Brewster angle
n' reflection
tan iB  transmission
n
90°
 The reflected light is completely
i
s polarized i'
normal to the
interface i

 Application:
stack of plates under Brewster angle n n'
as polarizer
incidence
interface
17

Total Internal Reflection in Fibers

 Total internal reflection between core and cladding in a step index fiber

Ref: M. Kaschke
18

Total Internal Reflection

n
 Limiting angle ic of total internal
reflection: i ic
no light leaves the medium with i
the higher index

R  R||  1 n'

 Condition: i'
n'
sin ic  refracted rays
1. refraction
2. limiting case 3. total internal reflection
n of total internal reflection

plane of interface
medium n

total internal source point total internal


reflection reflection
19

Total Internal Reflection

 In case of total internal reflection, the Fresnel formulae reads

n cos i   1  n 2 sin 2 i  n'2 n3 cos i  n'2   1  n 2 sin 2 i  n'2


r  r|| 
n cos i   1  n sin i  n'
2 2 2
n3 cos i  n'2   1  n 2 sin 2 i  n'2

z
 The wave penetrates the boundary
and generates an evanescent wave phase surfaces

which propagates
along the boundary evanescent :
parallel

incident

reflected
20

Evanescent Field

 Visualization of the evanescent wave


 Evanescent field: finite penetration depth
propagation parallel to the interface plane
 Data: n = 1.5 , n‘ = 1.0 ; q = 45°

Ref: Peatros
21

Description of Optical Systems

 Interface surfaces
- mathematical modelled surfaces
- planes, spheres, aspheres, conics, free shaped surfaces,…

 Size of components
- thickness and distances along the axis
- transversal size,circular diameter, complicated contours

 Geometry of the setup


- special case: rotational symmetry
- general case: 3D, tilt angles, offsets and decentrations, needs vectorial approach

 Materials
- refractive indices for all used wavelengths
- other properties: absorption, birefringence, nonlinear coefficients, index gradients,…

 Special surfaces
- gratings, diffractive elements
- arrays, scattering surfaces
22

Modelling of Optical Systems

 Principal purpose of calculations:

1. Solving the direct problem of System, data of the structure


understanding the properties: (radii, distances, indices,...)
analysis

2. Solving the inverse problem:


Finding the concret system data Analysis
for a required functionality: Synthesis
imaging
synthesis lens design
aberration
theory inverse
problem

Function, data of properties,


quality performance
(spot diameter, MTF, Strehl ratio,...)

Ref: W. Richter
23

Approximation of Optical Models

Paraxial model no aberrations


 Imaging model with levels (focal length, magnification, aperture,..)
of refinement
linear
approximation

Analytical approximation no higher order


(3rd order aberrations,..) aberrations
Geometrical
optics
exact geometry no diffraction

approximation
là0

no description of
Scalar approximation small structures
Helmholtz equation and polarization
(PSF, OTF,...) effects
Wave optics

no description of
no time dependence
short pulses
Maxwell equations exact
24

Modelling of Optical Systems

ray
tracing final analysis
final analysis reference ray in
intersection reference ray in the image plane
Geometrical the image space
points
raytrace
 Five levels of modelling: with Snells law optical path
length
longitudinal
aberrations
transverse
aberration
Rayleigh unit
reference equivalence
sphere types of differen
inte-
aberrations gration tiation

1. Geometrical raytrace with analysis wave


aberration W
definition
full
aperture
analysis
Geometrical
orthogonal single types of
2. Equivalent geometrical quantities, equivalents
classification
expansion aberrations
exponential
classification function
of the
Zernike rms geometrical
spot diagramm
coefficients value
phase

3. Physical model: Physical pupil


sum of
coefficients
model function Marechal
complex pupil function Kirchhoff
Fourier
transform
approxima-
tion
integral Luneburg integral
( far field )
4. Primary physical quantities point spread
sum of
squares Marechal
Marechal approximation
Primary function (PSF) approxima-
5. Secondary physical quantities physical
quantities maximum
tion
of the squared
amplitude
auto-
correlation Strehl
Duffieux Fourier number
integral
 Blue arrows: conversion of quantities transform
squared
amplitude
integration of
spatial
frequencies Fourier
optical geometrical transform
Secondary optical
transfer function
physical approximation transfer function
quantities approximation threshold value threshold value
diameter of the spatial frequency spatial
spot frequency approximation
spot diameter
resolution
25

Scheme of Raytrace

 Ray: straight line between two intersection points


 System: sequence of spherical surfaces
 Data: - radii, curvature c=1/r
- vertex distances
- refractive indices
u'
j-1 d
- transverse diameter ray d sj
s j-1
 Surfaces of 2nd order: oblique thickness
i
j
i' u'j
j
Calculation of intersection points
y
j
analytically possible: fast d
j-1 d
j
computation vertex distance opti
axi

medium n medium n
j-1 j

surface r
surface r j
j-1
26

Workflow Raytrace

Step homogeneous medium


No j equation of a straight line

 Two step process: inhomogeneous medium


solution of the eikonal equation
e.g. with Runge-Kutta method
1. Transition to next surface transport of the ray
over a distance in the sequential raytrace :
intersection point, medium next surface index

non-sequential raytrace : correct


test of plausibility index from the smallest distance of all
alternatives
2. Dielectric interface calculation of the
intersection of the ray surface of second order :
refraction and new direction with the next surface analytical solution for intersection
point with the ray
aspherical surface :
test of plausibility numerical iterative calculation of the
intersection point

vignetting of the ray due to the size of


check if intersection the surface
point is correct
ray does not hit the surface

refraction of the ray

calculation of the new


ray direction special case : total reflection
transition of the ray
into the new medium
reflection of the ray

new direction due to diffraction at a


diffractive surface
Step
No j+1 change of the direction due to
scattering at the surface
27

Raytrace Formulas

 Different sets of formulas:


1. Paraxial formulas, for reference of ideal imaging
2. Meridional formulas, for circular symmetry
3. Vectorial formulas, 3D systems, state of the art today
4. Differential formulas, transfer of neighbourhood, ray density, astigmatism

 Special aspects:
1. Aspherical surfaces, numerical iterative calculation of intersection points
2. Gradient media, eikonal differentail equation, Runge-Kutta numerical stepwise
3. Diffractive elements, local grating equation
4. Non-sequential raytrace, illumination and straylight
5. Scattering surfaces, Monte-Carlo decision for new direction
6. Photometric correct raytracing, transfer of relative weighting factor
7. Polarization raytrace, transfer of Jones vector on a ray
8. Geometrical approximated edge diffraction, ray deviation depends on edge distance
28

Paraxial y-U-Method

 Paraxial ray trace


formulas i

 Parameters of ray
description: Q
Q' i'
1. ray height y r
rsinu
-rsinu -U
2. ray angle U
-U -U' M

 Transfer to next surface L'


index j -à j+1
L

height

angle of incidence y j  y j 1  d j 1  U j 1

refraction i j  c j  y j  U j 1
nj
new direction angle ij '  ij
nj'
U j '  U j 1  i j  i j '  y j c j  i j '
29

Normal Distance of Rays to Surface Vertex

 Projection of ray to surface vertex point


length: Q

 In the paraxial regime identical with ray intersection height y

chief ray marginal


ray

yo
yp
QHS1
U1 QRS1 W1
z
normals to
the ray

object starting entrance


plane plane pupil
30

Exact Meridional Q-U-Raytrace Method

 Exact raytrace scheme in the meridional plane


 Ray description parameters:
- angle u with optical axis
- distance Q between ray and surface vertex point

 Set of formuals:
(1) angle of incidence
sin i  Qc  sinu cos i  1  sin2 i
(2) refraction
n
sin i '  sin i cos i '  1  sin2 i '
(3) new angle of ray n'
u'  u  i  i '
(4) auxiliary parameter
Q
G
(5) distance to vertex cos u  cos i
sin i'sin u ' cos u ' G
(6) intersection length Q' Q  Qj 1  Qj  d sin u'
c cos u cos u ' cos i'
(7) final distance L j 1  L j  d

Q1  L sin u
31

Exact Meridional Q-U-Raytrace Method (2)

 Set of formuals (2):


Q'
L' 
(8) final intersection length sin u'
sin(u  i)
(9) intersection point y G  1  cos(u  i)
c
1  cos(u  i)
z G  sin(u  i)
c

(10) failure condition 1: sini 1


ray don‘t hit surface

(11) failure condition 2:


total internal reflection sin i ' 1
32

Vectorial Raytrace

yj
normal
vector
xj
intersection
ej
yj+1
point Pj
sj ray intersection
point
xj+1

dj Pj+1
sj+1
distance
surface ej+1 normal
vector
No j
 General 3D geometry z
 Tilt and decenter of surfaces surface
No j+1
 General shaped free form surfaces
 Full description with 3 components
 Global and local coordinate systems
33

Vectorial Raytrace Formulas

 Restrictions:
- surfaces of second order, fast analytical calculation of intersection point possible
- homogeneous media  j 
  
s j   j 
 Direction unit vector of the straight ray  
 j 

 xj
  
 Vector of intersection point on a surface rj   y j 
 
 zj 
 Ray equation with skew thickness dsj   
rj  rj 1  d s , j 1  s j 1
index j of the surface and the space behind

 Equation of the surface 2.order H j d s2, j 1  2Fj d s , j 1  G j  0


The coefficients H, F, G contains the surface shape parameters
34

Vectorial Raytrace Formulas (2)

 Special case spherical surface with H j  c j


curvature c = 1/R  
G j  c j x 2j  y 2j  z 2j  2 z j
Coefficients H, G, F
Fj   j  c j x j j  y j j  z j j 

Unit vector normal to the surface   cjxj 


  
ej    cj y j 
1  c z 
 j j

 Insertion of the ray equation into surface equation:


skew thickness Gj
d s , j 1 
F j  F j2  H j G j
 
cosi j  s j  e j
 Angle of incidence
2
 nj 
 Refraction cos i ' j  1   
 1  cos2 i j
 n j 1 

or
reflection cos i ' j   cos i j
35

Vectorial Raytrace Formulas (3)

 Auxiliary parameter  j  n j 1 cosi ' j n j cosi j

 nj   j 
 New ray direction vector s j 1  s  e
n j 1 j n j 1 j
36

Conic Sections

 Explicite surface equation, resolved to z


z

c x2  y2 
Parameters: curvature c = 1 / R 1 1  1   c x
2 2
 y2 
conic parameter 
 Influence of k on the surface shape Parameter Surface shape
=-1 paraboloid
<-1 hyperboloid
=0 sphere
>0 oblate ellipsoid (disc)
0>>-1 prolate ellipsoid (cigar )

 Relations with axis lengths a,b of conic sections


2
a b
b
1 1
    1 c 2 a
b a c1    c 1 
37

Aspherical Surface Types

 Conic section
z

c x2  y2 
Special case spherical
1 1  1   c x2 2
 y2 
 Cone x2  y2
z
q

 Toroidal surface with


radii Rx and Ry in the two
z  Ry  R  R 
y x R x2
x
2
 y
2
2

section planes

 Generalized onic section without cx x 2  c y y 2


z
1  1  1   x cx2 x 2  1   y c y2 y 2
circular symmetry

 Roof surface z  y  tan q


38

Aspherical Surfaces with Rotational Symmetry

 Classical representation of an aspheric surface with rotational symmetry:


- basic shape of a conic section
- correction of real sag height with Taylor expansion

c  y2
z( y)    ck y 2 k  2 y aspherical
1  1  1   c y
2 2
k 1 surface

 Aspherical constants cj z(y)


z deviation
Usually only even orders, no cusp on axis

 Problems with this representation:


height
- deviation z not perpendicular to surface y
spherical
surface
- Taylor expansion terms not orthogonal
- oscillations of higher order terms

z
39

Numerical Iterative Raytrace at Aspheres

 Calculation of the intersection point with an aspherical surface:


- no fast analytical calculation possible
y
- iterative numerical computation is used
tangential plane in Q2
- often problems with stability for ray
steep aspheres tangential plane in Q1

sj
surface No j
 General scheme: z-projection
Qo Q1
- intersection point with vertex plane Q0 Q'1
- projection onto surface, point Q1 Q2
Q
- determine the tangential plane in Q1
e2
- intersection with tangential plane Q‘1
unit vector in Q
- projection onto surface, point Q2
-…
vertex
plane

z
40

Diffracting Surfaces

 Surface with grating structure:


new ray direction follows the grating equation
 Local approximation in the case of space-varying
grooves
grating width
 n  ml g ˆ 
s '  s   g   e
n' n' d

 Raytrace only into one desired diffraction order p

 Notations: gp

g : unit vector perpendicular to grooves 
e
d : local grating width

m : diffraction order s

e : unit normal vector of surface s
 Applications:
- diffractive elements
- line gratings d
- holographic components
41

Raytracing in Grin Media

 Ray: in general curved line  n


n 
 Numerical solution of Eikonal equation  x
2   n
 Step-based Runge-Kutta algorithm d r
 n  n  D   n 
4th order expansion, adaptive step width dt 2
  y 
 Large computational times necessary for high accuracy n  n 
 z
 
y

x
Brechzahl :
n(x,y,z)

b
b
y'

c s x'
c
s

Strahl
42

Description of Grin Media

 Analytical description of grin media by Taylor expansions of the function n(x,y,z)


 Separation of coordinates nn o,l c1hc 2 h 2 c 3 h 4 c 4 h 6 c 5 h 8 c 6 zc 7 z 2 c 8 z 3 c 9 z 4
c10 xc11 x 2 c12 x 3c13 yc14 y 2 c15 y 3
 Circular symmetry, nested expansion with mixed terms

nn o,l c1h 2 c2 h 4 c3 h 6 c4 h 8  z c5 c6 h 2 c7 h 4 c8 h 6 c9 h 8 
  
 z 2 c10 c11h 2 c12 h 4 c13h 6 c14 h 8  z 3 c15c16 h 2 c17 h 4 c18h 6 c19 h 8 
 Circular symmetry only radial

n  n o ,l 1  c 2 ( c 1 h ) 2  c 3 ( c 1 h ) 4  c 4 ( c 1 h ) 6  c 5 ( c 1 h ) 8  c 6 ( c 1 h ) 10
 Only axial gradients
n  n o ,l 1 c 2 ( c 1 z ) 2  c 3 ( c 1 z ) 4  c 4 ( c 1 z ) 6  c 5 ( c 1 z ) 8

 Circular symmetry, separated, wavelength dependent

n  n o,l  c 1,l h 2  c 2,l h 4  c 3,l h 6  c 4,l h 8  c 5,l z  c 6,l z 2  c 7,l z 3


43

Gradient Lenses

 Refocusing in parabolic profile

off axis ray bundle

axis ray bundle waist


points

 Helical ray path in 3 dimensions

y y y'
perspectivic view

x x'

x z

view
along z
44

Non-Sequential Raytrace

 Conventional raytrace:
- the sequence of surface hits of a ray is pre-given and is defined by the index vector
- simple and fast programming of the surface-loop of the raytrace
 Non-sequential raytrace:
- the sequence of surface hits is not fixed
- every ray gets ist individual path
- the logic of the raytrace algorithm determines the next surface hit at run-time
- surface with several new directions of the ray are allowed:
1. partial reflection, especially Fresnel-formulas
2. statistical scattering surfaces
3. diffraction with several grating orders or ranges of deviation angles
 Many generalizations possible:
several light sources, segmented surfaces, absorption, …
 Applications:
1. illumination modelling
2. statistical components (scatter plates)
3. straylight calculation
45

Nonsequential Raytrace: Examples

1. Prism with total internal


reflection 1

2. Ghost images in optical systems Reflex 1 - 2

with imperfect coatings Reflex 3 - 2 Signal


1 2 3 4
46

Non-Sequential Raytrace: Examples

3. Illumination systems, here:


- cylindrical pump-tube of a solid state laser
- two flash lamps (A, B) with cooling flow tubes (C, D)
- laser rod (E) with flow tube (F, G)
- double-elliptical mirror
for refocussing (H)
Different ray paths H 7

possible 1
E: laser B: glass
rod tube of
2 lamp
A: flash
lamp gas
4
C: water
5 cooling
3
F: water G: glass D: glass
cooling tube of 6 tube of
cooling cooling

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