Unit 2
Unit 2
Module 2
Lecture 13
1
Intrinsic semiconductors: In semiconductors and insulators, when an
external electric field is applied the conduction is not possible as there is
a forbidden gap, which is absent in metals (good conductors).
The field that needs to move electron to conduction band is extremely
large. Take the example of silicon, where the forbidden gap is about 1 eV.
This is approximately the energy difference between a location close to an
ion core and another location away from the ion core. The distance
between these two locations is about 1 Å (1010 m).
2
Therefore, a field gradient of approximately 1V/ (10 10 m) = 1010 Vm1 is
necessary to move an electron from the top of the valence band to the bottom of
the conduction band. Such a high field gradient is not realizable in practice.
1
1 {exp[ E EF ) / k BT ]}
3
4
5
6
The fraction of electrons at energy E is equal to the probability f(E). We can then write
for the number n of electrons promoted across the gap:
n = N exp(Eg/2kBT).
(3)
where N is the number of electrons available for excitation from the top of the valence band.
The promotion of some of the electrons across the gap leaves some vacant electron
sites in the valence band. These are called holes. As each excited electron leaves back
one hole, an intrinsic semiconductor contains an equal number of holes in the valence
band and electrons in the conduction band, that is ne = nh. The number of each of these
species is given by Equation(3). We can then write the conductivity of an intrinsic
semiconductor as:
i = ne e e + nh e h
(4)
where e is the electronic charge, ne and nh are concentrations of electrons and holes
per unit volume.
7
Fermi level of Intrinsic semiconductor
calculation:-
The number of free electrons per unit
volume in an intrinsic semiconductor
is n in conduction band and The
number of holes per unit volume in an
intrinsic semiconductor is p in valence
band .
Since n = p in intrinsic
semiconductors.
If we assume that, m*_e(mass of
electron)=m*_p(mass of hole)
8
9
10
11
3/ 2
2 m kT *
E F Ec
n 2 e
exp
kT
2
h
electron density
3
2m k T
EV E F
2
p 2 h
. exp
KT
2
h
hole density
12
3 3
2 m k T
* 2
E F Ec 2 m k T 2 Ev E F
2 e exp
2 exp h
kT h kT
2 2
h
int rinsic _ condition : n p
m exp
2
3EF EC
m
3
2 exp Ev EF
KT
e h
kT
3
2 EF mh 2
E Ec
e kT exp v
* k T
me
mh
2 EF 3
loge * loge exp Ev Ec
k T
kT 2 me
13
3kT m
Ev Ec
log e h
*
2
4 m e
If we assume that, m*e m*h
Ev Ec
EF
2
14
Fig.1.4. Position of Fermi level in an intrinsic semiconductor at various temperatures
(a) at T = 0 K, the Fermi level in the middle of the forbidden gap (b) as temperature increases, EF shifts upwards
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DEPARTMENT OF PHYSICS AND NANOTECHNOLOGY
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Module 2
Lecture 14
1
EXTRINSIC SEMICONDUCTOR
3
N – type semiconductor
When penta-valent impurity is added to the intrinsic
semiconductors, n type semi conductors are formed
n - type semiconductor
At T = 0K
Fig1.1
4
❖ When small amounts of penta-valent impurity such as
phosphorous are added during crystal formation, the impurity
atoms lock into the crystal lattice[ see above Fig1.1).
5
❖ It is possible to calculate an orbit for the fifth electron
assuming that it revolves around the positively charged
phosphorus ion, in the same way as for the “1s” electron around
the hydrogen nucleus.
❖ The electron of the phosphorus atom is moving in the
electric field of the silicon crystal and not in free space, as is the
case in the hydrogen atom.
❖ This brings in the dielectric constant of the crystal into the
orbital calculations, and the radius of the electron orbit here
turns out to be very large, about 80 Å, as against 0.5 Å for the
hydrogen orbit. Such a large orbit evidently means that the fifth
electron is almost free and is at an energy level close to the
conduction band.
6
❖At OK, the electronic system is in its lowest energy state, all
the valence electron will be in the valence band and all the
phosphorous atoms will be un-ioniszed.
❖ The energy levels of the donor atoms are very close to the
conduction band.
8
Fermi energy
9
Variation of Fermi level with donor concentration with temperature
P -Type Semiconductor
p - type semiconductor At T = 0K
13
Since the trivalent impurity accepts an electron, the
energy level of this impurity atom is called acceptor level.
This acceptor level lies just above the valence bond.
14
If the temperature is sufficiently high, in addition to the
above process, electron-hole pairs are generated due to the
breaking of covalent bonds.
Thus holes are more in number than electrons and hence
holes are majority carriers and electrons are minority carriers
17
For a particular temperature all the acceptor atoms are ionized.
Further increase in temperature results in generation of electron-hole
pair due to the breaking of covalent bonds and the material tend to
behave in intrinsic manner.
The Fermi level gradually moves towards the intrinsic Fermi level.
Na
Na
18
19
DEPARTMENT OF PHYSICS AND NANOTECHNOLOGY
SRM INSTITUTE OF SCIENCE AND TECHNOLOGY
21PYB102J –Semiconductor Physics
Module-II Lecture-15
1
Carrier Generation & Recombination
5
18PYB103J Module-II Lecture-3
2. Phonon Transition (OR) Shockley-Read-Hall generation/recombination
6
Another process is the generation/recombination by phonon emission. This process
is trap-assisted utilizing a lattice defect at the energy level Et within the
semiconductor band-gap. The excess energy during recombination and the
necessary energy for generation is transferred to and from the crystal lattice
(phonon). A theory describing this effect has been established by Shockley, Read,
and Hall. Therefore, the effect is throughout the literature referenced as Shockley-
Read-Hall (SRH) generation/recombination. Four sub-processes are possible:
Hole capture. The trapped electron moves to the valence band and neutralizes a
hole (the hole is captured by the occupied trap). A phonon with the energy Et -
Ev is generated.
7
Hole emission. An electron from the valence band is trapped leaving a hole in the
valence band (the hole is emitted from the empty trap to the valence band). The
energy necessary for this process is Et - Ev.
Electron emission. A trapped electron moves from the trap energy level to the
conduction band. For this process additional energy of the magnitude Ec - Et has to
be supplied.
8
3. Auger generation/recombination (or) Three particle transitions
9
In the direct band-to-band Auger mechanism three particles are involved. During
generation an electron hole pair is generated consuming the energy of a highly
energetic particle. In the opposite process, when an electron hole pair recombines,
the excess energy is transferred to a third particle. In detail the four possible
processes are as follows:
Electron capture. An electron from the conduction band moves to the valence band
neutralizing a hole in the valence band. The excess energy is transferred to an
electron in the conduction band.
Hole capture. Again, an electron from the conduction band moves to the valence
band and recombines with a valence hole. The excess energy is, in contrast to
Process 1, transferred to another hole in the valence band.
Electron emission. A highly energetic electron from the conduction band transfers
its energy to an electron in the valence band. The valence electron moves to the
conduction band generating an electron hole pair.
Hole emission. A highly energetic hole from the valence band transfers its energy
to an electron in the valence band which is then excited to the conduction band
generating an electron hole pair.
10
4. Impact ionization
11
Impact ionization is a pure generation process. Microscopically it is exactly the
same mechanism as the generation part of the Auger process: a highly energetic
carrier moves to the conduction or valence band, depending on the carrier type, and
the excess energy is used to excite an electron from the valence band to the
conduction band generating another electron hole pair. The major difference is the
cause of the effect. While it is purely the carrier concentration in the Auger
mechanism, for impact ionization it is the current density.
Electron emission. A highly energetic electron from the conduction band transfers
its energy to an electron in the valence band. The valence electron moves to the
conduction band generating an electron hole pair.
Hole emission. A highly energetic hole from the valence band transfers its energy
to an electron in the valence band which is then excited to the conduction band
generating an electron hole pair. 12
18PYB103J Module-II Lecture-3
DEPARTMENT OF PHYSICS AND NANOTECHNOLOGY
SRM INSTITUTE OF SCIENCE AND TECHNOLOGY
21PYB102J –Semiconductor Physics and Computational Methods
Module II Lecture-16
Solving Problems
1
1. Calculate the conductivity of intrinsic germanium at 300K
using the following data:
Solution:
2
2. A cadmium sulphide (Eg = 2.4eV) photo detector is illuminated with light
of wavelength 3000Å. The intensity of radiation falling on the detector is 30
W/m2. The area of the detector is 9 mm2. Assuming that each quantum
generates an electron-hole pair, calculate the number of pairs generated
per second.
Given data
wavelength= 3000 Å
Solution:-
3
Since this energy is higher than Eg(=2.4eV) electron-hole pairs will be generated.
4
3. Calculate the number of states lying in an energy interval of 0.02eV above the Fermi
energy for sodium crystal of unit volume (EF = 3.22eV for sodium).
5
4. For silicon semiconductor with band gap 1.12 eV, determine the position of
the Fermi level at 300 K if me* = 0.12 m0 and mh* = 0.28 m0.
6
DEPARTMENT OF PHYSICS AND NANOTECHNOLOGY
SRM INSTITUTE OF SCIENCE AND TECHNOLOGY
1
21PYB102J Module-II Lecture-17
Preview of lecture
The net flow of the ‘electron and holes’ in a semiconductor generates the current.
The process through which these charged particles move is called transport.
Subtopic :
I. Carrier Drift
II. Carrier Diffusion
2
21PYB102J Module-II Lecture-17
Carrier Transport
Drift Diffusion
T The
The electric field (E) is
involved in the movement movement or flow of the
of the charge carrier. charge carrier due to
density gradient (dn/dx)
3
21PYB102J Module-II Lecture-17
Carrier Transport Phenomena
4
21PYB102J Module-II Lecture-17
Carrier Drift
5
21PYB102J Module-II Lecture-17
Current density
• Ohm’s Law:
• I = JA and
Therefore
Or
Thus, J = nevd = ne μ E
σ = J/E = ne μ
or in terms of resistivity ρ
ρ = 1/ σ = 1/ ne μ
If the material is a semiconductor, the current flow would be due to electron and hole
movement.
21PYB102J Module-II Lecture-17 8
Correspondingly the current densities due to electron drift and hole are:
Jn (drift) = n μn eE
Jp (drift) = p μp eE
J (drift) = n μn eE + p μp eE
Comparison with J = σ E
σ= n μn e + p μp e
σi = nie(μn + μp )
21PYB102J Module-II Lecture-17 9
Carrier Diffusion
d(Δn) /dx
Fick’s law states that the rate at which carriers diffuse is proportional to the
density gradient and the movement is in the direction of negative Gradient, the
rate of flow of electrons is proportional to
- d(Δn) /dx
From which the rate of flow across unit area is got, equal to
= - Dp d(Δp) /dx
Jp = Jp (drift) + Jp (diffusion)
Continuity Equation
Lecture-17
14
21PYB102J Module-II Lecture-17
CONTINUITY EQUATION
• The contribution of the overall effect when drift, diffusion, and recombination occur
simultaneously in a semiconductor material. The governing equation is called the
continuity equation.
15
21PYB102J Module-II Lecture-17
⮚ The continuity equation describes
a basic concept, namely that a
change in carrier density over
time is due to the difference
between the incoming and
outgoing flux of carriers plus
the generation and minus the
Electron currents and possible recombination and recombination.
generation processes
The flow of carriers and recombination and generation rates are illustrated with Figure
16
21PYB102J Module-II Lecture-17
One-dimensional continuity equation for electrons
• Consider an infinitesimal slice with thickness dx located at x. The number of electrons in the slice
may increase due to the net current flow into the slice and the net carrier generation in the slice
(mainly four components contribution). {Law of conservation of charges}
• The number of electrons flowing into the slice at x, minus the number of electrons flowing
out at x + dx, plus the rate at which electrons are generated, minus the rate at which they
are recombined with holes in the slice.
• The first two components are found by dividing the currents at each side of the slice by the charge
of an electron.
• The overall rate of change in the number of electrons in the slice is given as below
17
21PYB102J Module-II Lecture-17 17
Expanding the expression for the current at x + dx in Taylor series yields
A similar continuity equation can be derived for holes, except that the sign of the first
term on the right-hand side of Eq is changed because of the positive charge
associated with a hole.
Gn = e- generation rate
Rn = e- recombination rate
Gp = hole generation rate
Rp = hole recombination rate
18
21PYB102J Module-II Lecture-17
For the one-dimensional case under low-injection condition, small electric
field, uniform doping etc.
The continuity equations for minority carriers :
(i.e., np in a p-type semiconductor or pn in an n-type semiconductor)
19
21PYB102J Module-II Lecture-17
DEPARTMENT OF PHYSICS AND NANOTECHNOLOGY
SRM INSTITUTE OF SCIENCE AND TECHNOLOGY
p-n Junction,
Biasing concept in p-n junction
Lecture
18
20
21PYB102J Module-II Lecture-18
Basic Structure of p-n Junction, Band Diagram of
p-n Junction in Thermal Equilibrium
⮚p-n junction is one of the basic building blocks of integrated circuits. Such a
junction can be formed by selective diffusion or ion implantation of n-type or p-type
dopant to the p-type or n-type semiconductor.
⮚When p-region and n-region are brought in close contact a p-n junction forms due
to the diffusion of charge carriers. While, holes diffuse from p region to n region,
electrons diffuse from n region to p region.
⮚Under thermal equilibrium a built in electric field directed from positive to negative
charge which gives rise to drift current and no net transport of carriers due to
diffusion is observed across the potential barrier(also called as depletion region).
⮚At thermal equilibrium, drift and diffusion component of current must cancel each
other, Jn and Jp is zero. Hence the Fermi level must be constant throughout and the
electron and hole concentrations on both sides remain same.
Flatband
diagram
Energy band diagram of a p-n junction (a) before and (b) after
merging the n-type and p-type regions
EF(p-region) = EF(n-region)
24
21PYB102J Module-II Lecture-
Basic Structure of p-n Junction, Band
Diagram of p-n Junction in Thermal
Equilibrium
(1
)
(3
(2 )
)
25
Formation of depletion 21PYB102J Module-II Lecture-
Basic Structure of p-n Junction, Band
Diagram of p-n Junction in Thermal
Equilibrium
When the p-n junction is applied with external voltage both electrons and hole
concentrations deviates from their equilibrium values. Also potential difference across
depletion region deviates from its equilibrium value Vbi by an amount of applied bias.
When the p-n junction is forward biased by Vf ,ie., positive terminal of the battery is
connected to the p-region and the negative terminal of the battery is connected to the
n-region, the potential difference across the depletion region decreases by Vbi – Vf
.The width of depletion region decreases. Thus more electrons move from n region to
p region and increase the diffusion current.
When the p-n junction is reverse biased by Vr ,ie., positive terminal of the battery is
connected to the n-region and the negative terminal of the battery is connected to the
p-region, the potential difference across the depletion region increases by Vbi +Vr.
The width of depletion region increases. Thus no electrons from n region and no
holes from p region diffuse across the junction. Now the current is due to the diffusion
of minority charge carriers in the p and n region which is extremely small.
28
21PYB102J Module-II Lecture-
Basic Structure of p-n Junction, Band
Diagram of p-n Junction in Thermal
Equilibrium
Metal-semiconductor junction
Ohmic Contact and Schottky Junction
⮚The rectifying semiconductor junction is called as Schottky diode and the non-
rectifying junction is called as ohmic contact.
Whenever, the work function of n type semiconductor is smaller than that of metal or
the work function of p type semiconductor is greater than that of metal, it forms
rectifying or Schottky junction.
Let φm and φs be the work function of metal and n type semiconductor , respectively
where
φm > φs.
When metal semiconductor contact is made, the conduction electrons begin to flow
from the semiconductor in to the metal until the Fermi energies on both sides of the
junction becomes equal. Therefore, metal becomes negative charged and the n-type
semiconductor becomes positive charged. As a result potential barrier is formed at
the metal semiconductor junction equal to φm – φS =eV.
N-type is connected to positive charge and metal to negative charge, the height of
the barrier on the semiconductor side increases by (Vs +V) and the metal
remains unchanged. Therefore the junction is said to be reverse biased and the
current flows from metal to semiconductor.
21PYB102J Module-II Lecture- 32
19
Rectifying Junction or Schottky Junction
For forward bias the net current increases exponentially with applied voltage and for
reverse bias, the net current is constant. Hence, the metal semiconductor contact
acts like a rectifier i.e. it conducts in forward bias but not in reverse bias and hence
called as rectifying contact.
Metal-Semiconductor n-type junction. Φm and Φsc are the metal and semiconductor
thermionic work functions, while χsc is the semiconductor electron affinity. W is the
depletion zone, Φ b the barrier as seen from the metal side and V0 from the semiconductor
side.
Whenever, the work function of metal is smaller than that of n type semiconductor it
forms non rectifying or ohmic junction.
Let φm and φs be the work function of metal and n type semiconductor , respectively
where
φm < φs.
When metal semiconductor contact is made, the conduction electrons begin to flow
from the metal to semiconductor until the Fermi energies on both sides of the
junction becomes equal. Therefore, metal becomes positive charged and the n-type
semiconductor becomes negative charged. As a result potential barrier is formed at
the metal semiconductor junction equal to φS – φm =eV.
N-type is connected to positive charge and metal to negative charge, the electrons
flow from semiconductor to metal without encountering an appreciable barrier.
Thus in both the cases the current is directly proportional to the applied voltage in
accordance with ohms law. Such contacts are called as ohmic contacts.
Thus, a Ohmic junction behaves as a resistor conducting in both forward and reverse
bias. The resistivity is determined by the bulk resistivity of the semiconductor.
Given Data
ni = 2.1×1019 e-s/m-3
μe = 0.4 m2V-1 s-1 and μh = 0.4 m2V-1 s-1
Solution
Before adding boron atoms, the semiconductor is an intrinsic SC
σi = nie (μe+μh)
= 2.1×1019 × 1.602 × 10-19 × (0.4 +0.2) = 2.01852 S/m
After adding boron atoms, the semiconductor become p-type SC
σp ≈ nboron e μh
= 4.5 ×1023 atoms/m-3 × 1.602 × 10-19 × 0.2
≈ 1.4418 × 104 S/m
Comment
The addition of p-type dopants makes the semiconductor more conductive in nature.
46
21PYB102J Module-II Lecture-
2) An abrupt silicon p-n junction consists of a p-type region containing 2 x 1016 cm-3 acceptors and an n-type region
containing also 1016 cm-3 acceptors in addition to 1017 cm-3 donors. ni2 = 1020 cm-3
A) Calculate the thermal equilibrium density of electrons and holes in the p-type region as well as both densities in the
n-type region.
Solution
a. The thermal equilibrium densities are: In the p-type region: p = Na = 2 x 1016 cm-3
n = ni 2 /p = 1020/2 x 1016 = 5 x 103 cm-3
φI = Vt ln [pn pp/ni2] = 0.0259 V × ln[2 x 1016 cm-3 × 9×1016 cm-3 /1020 cm-3]
= 0.79 V
c. Similarly, the built-in potential at 400 K equals 0.63 V, if you do carefully. You get ni (400K) = 4.52 × 1010 e-s/cm-3
47
21PYB102J Module-II Lecture-
3) Estimate the built-in potential of a pn based Si diode with the following assumptions
Solution
Module 2
Lecture 21
1
Semiconductor material for
optoelectronic applications: Introduction
Major semiconducting materials used for optoelectronics are III – V and II – VI groups.
Among the two groups of semiconductors, III – V is more suitable as they are direct
band gap materials which is necessary condition needed for optoelectronic devices to
convert electrical energy into light energy conversion.
III – V materials – Column III and V in the periodic table
III column – Al, Ga, In
V column - N, P, As, Sb
3
Semiconductor material for
optoelectronic applications: Introduction
The suitable choice of above materials depends on their quantum dimensions (1D, 2D
or 3D) for optoelectronic applications.
II-VI semiconducting materials: column II and VI in periodic table. They are having
wide range of optoelectronic properties ranging from far IR to UV region. This can be
easily tuned to different band gap (Eg) by incorporating magnetic ions. They have
stronger polarity due to ionic bonding character.
5
DEPARTMENT OF PHYSICS AND NANOTECHNOLOGY
SRM INSTITUTE OF SCIENCE AND TECHNOLOGY
Module 2
Lecture 22
1
Photocurrent in pn junction diode (Photodiode)
What is a photodiode?
❖ Photodiode is a form of light-weight sensor that converts light energy into
electrical voltage or current. Photodiode is a type of semi conducting device
with PN junction. Between the p (positive) and n (negative) layers, an
intrinsic layer is present. The photodiode accepts light energy as input to
generate electric current.
❖ It is also called as photodetector, photosensor or light detector. Photodiode
operates in reverse bias condition i.e., the p- side of the photodiode is
connected to negative terminal of battery (or the power supply) and n- side
to the positive terminal of battery.
❖ Typical photodiode materials are Silicon, Germanium, Indium Gallium
Arsenide Phosphide and Indium gallium arsenide.
❖ Internally, a photodiode has optical filters, built in lens and a surface area.
When surface area of photodiode increases, it results in more response time.
Few photo diodes will look like Light Emitting Diode (LED). It has two
terminals as shown below. The smaller terminal acts as cathode and longer
terminal acts as anode.
2
Photocurrent in pn junction diode (Photodiode)
❖ In a photodiode, the incident optical signal generates electron-hole pairs that gives rise to a photo
current across PN junction.
❖ When a PN junction is illuminated with light of photon energy (E) greater than Eg, photons are
absorbed in semiconductor and electron-hole pairs are generated both in n-region and p-region of
the junction.
❖ For the electron-hole pair to contribute towards current in external circuit, the generated electron
and holes must be separated before they recombine.
❖ Once electron-hole pairs are generated in the depletion layer, the electric field in the built-in-
potential or contact potential sweeps away the electron and holes in opposite directions.
❖ The photo generated minority carriers which are generated within one diffusion length from the
depletion layer edge, can also diffuse to the depletion region without recombining.
4
Working principle of Photodiode
❖ Generally, when a light is made to illuminate the PN junction, covalent bonds are
ionized. This generates hole and electron pairs. Photocurrents are produced due to
generation of electron-hole pairs. Electron hole pairs are formed when photons of energy
more than 1.1eV hits the diode.
❖ When the photon enters the depletion region of diode, it hits the atom with high energy.
❖ This results in release of electron from atom structure. After the electron release, free
electrons and hole are produced.
❖ In general, an electron will have negative charge and holes will have a positive charge.
The depletion energy will have built in electric filed. Due to that electric filed, electron
hole pairs moves away from the junction.
❖ Hence, holes move to anode and electrons move to cathode to produce photo current.
The photon absorption intensity and photon energy are directly proportional to each
other. When energy of photons is less, the absorption will be more. This entire process is
known as Inner Photoelectric Effect.
5
Energy band diagram of Photodiode
6
Photocurrent in Photodiode
If G is the generation rate of excess carrier and A is diode area then photo current,
the excess carrier in depletion region quickly moved by electric field (electron to
n-region and holes to p-region).
7
Photocurrent in Photodiode
8
Light Emitting Diode (LED) –
Construction and working principle
What is LED?
LED are semiconductor p-n junctions that under forward Semiconductors bring
quality to light!
bias conditions can emit radiation by electroluminescence
in the UV, visible or infrared regions of the electromagnetic
spectrum. The quanta of light energy released is
approximately proportional to the band gap of the
semiconductor.
1
Application of LED
2
Basics of LED
3
Principles of LED
The p-n junction diode is forward biased. Due to forward bias, the majority
carriers from ‘n’ and ‘p’ regions cross the junction and become minority
carriers in the other junction. That is electrons, which are majority carriers in
‘n’ region cross the junction and go to ‘p’ region and become minority carriers
in p-region.
Similarly, holes which are majority carries in ‘p’ region cross the junction and
go to ‘n’ region and become minority carriers in ‘n’ region and this
phenomenon is called minority carrier injection.
4
Radioactive Recombination
Now, if the biasing voltage is further increased, these excess minority carriers
diffuse away from the junction, and they directly recombine with the majority
carriers. i.e., the electrons, which are excess minority carriers in p-region
recombine with the holes which are the majority carriers in ‘p’ region and emit
light. Similarly, the holes which are excess minority carriers in ‘n’ region
recombine with the electrons which are majority carriers in ‘n’ region and emit
light.
5
Radioactive Recombination
Thus, radiative recombination events lead to photon emission. The number of radiative
recombination is proportional to the carrier injection rate and hence to the total current flowing
through the device as given by I I exp eVkT 1
0
where, I0 - the saturation current; V- the forward bias voltage; k - the Boltzmann constant ; -
varies from 1 and 2 depending on the semiconductor and temperature.
The optical photon emitted due to radiative recombination has the energy very close to the bandgap
hc
energy Eg and frequency of the emitted photon is given by E g , where, - the photon
wavelength; h – Planck’s constant; c - the velocity of light in vacuum.
6
Construction of LED
An LED must be constructed such that the light emitted by the radiative
recombination events can escape the structure.
7
Surface Emitting LED
8
Edge Emitting LED
9
Construction of a typical LED
10
Construction of a typical LED
where n1 is the refractive index of air (1.0), and n2 is the refractive index
of the semiconductor. For group III semiconductor n2 = 3.5; therefore, qc
= 16°
Therefore, all rays of light striking the surface at an angle exceeding 16°
suffer total internal reflection and as a result most of the emitted light is
reflected inside the semiconductor crystal.
11
Construction of a typical LED
12
Hemispherical Dome Shape
13
Hemispherical Dome Shape
14
LED Materials
The choice of the materials for an LED is decided by the spectral requirements
for a particular application. The most used materials for LEDs are GaP, GaAs
and their related ternary compound GaAsxP1-x.
The bandgap radiation of GaP, GaAs and GaAsP. GaP which gives a peak at
560 nm is very close to the wavelength of maximum eye response.
This makes GaP one of the most useful of all visible semiconductor light
sources since in addition to green light both red and other colours can be
produced by appropriate dopants.
15
DEPARTMENT OF PHYSICS AND NANOTECHNOLOGY
SRM INSTITUTE OF SCIENCE AND TECHNOLOGY
Module 2
Lecture 23
1
Optoelectronics Integrated Circuits
2
Optoelectronics Integrated Circuits
The passive components are those components which do not require electric
signals for their operation.
Therefore, the active components are lasers, photo detectors, switches,
modulators etc., and the passive components are spectral filters, couplers,
multiplexers, de-multiplexers, lenses etc.
3
Optoelectronics Integrated Circuits
4
Optoelectronics Integrated Circuits
5
Organic Light Emitting Diode (OLED)
Structure of OLED:
A simple OLED is made of six different layers. On the top and bottom layers
of protective glass or plastic. The top layer is called seal and the bottom layer
is substrate. In between seal and substrate, a negative terminal (cathode) and
positive terminal (anode), and finally between cathode and anode there are
two layers made of organic molecules called emissive layer which produces
light and the conductive layer.
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Organic Light Emitting Diode (OLED)
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Components of OLED
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How does OLED emit light?
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How does OLED emit light?
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Types of OLEDs
PMOLEDs are easy to make, but they consume more power than other types
of OLED, mainly due to the power needed for the external circuitry.
PMOLEDs are most efficient for text and icons and are best suited for small
screens (2- to 3-inch diagonal) such as those you find in cell
phones, Personal Digital Assistants ( PDAs) and MP3 players. Even with
the external circuitry, passive-matrix OLEDs consume less battery power
than the LCDs that currently power these devices.
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Types of OLEDs
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Types of OLEDs
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Types of OLEDs
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Types of OLEDs
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Advantages of OLEDs
The LCD is currently the display of choice in small devices and is also popular
in large-screen TVs. Regular LEDs often form the digits on digital clocks and
other electronic devices. OLEDs offer many advantages over both LCDs and
LEDs:
1. The plastic, organic layers of an OLED are thinner, lighter and more
flexible than the crystalline layers in an LED or LCD.
2. OLEDs are brighter than LEDs. Because the organic layers of an OLED are
much thinner than the corresponding inorganic crystal layers of an LED, the
conductive and emissive layers of an OLED can be multi-layered. Also,
LEDs and LCDs require glass for support, and glass absorbs some light.
OLEDs do not require glass.
3. OLEDs do not require backlighting like LCDs and hence they consume
much less power than LCDs. This is especially important for battery-
operated devices such as cell phones.
4. OLEDs are easier to produce and can be made to larger sizes. Because
OLEDs are essentially plastics, they can be made into large, thin sheets.
5. OLEDs have large fields of view, about 170 degrees. OLEDs produce their
own light, so they have a much wider viewing range.
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Disadvantages of OLEDs
OLED seems to be the perfect technology for all types of displays, but it also
has some problems:
1. Lifetime - While red and green OLED films have longer lifetimes (46,000
to 230,000 hours), blue organics currently have much shorter lifetimes.
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Applications of OLEDs
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DEPARTMENT OF PHYSICS AND NANOTECHNOLOGY
SRM INSTITUTE OF SCIENCE AND TECHNOLOGY
Module 2
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