Chapter 1
Chapter 1
Principles of
Electronic
Materials and
Devices
Second Edition
S. O. Kasap
© 2002 McGraw-Hill
Nucleus
1s
K 2s
L 2p
1s22s22p2 or [He]2s22p2
Fig. 1.1: The shell model of the atom in which the electrons are
confined to live within certain shells and in subshells within shells.
From Principles of Electronic Materials and Devices, Second Edition, S.O. Kasap (© McGraw-Hill, 2002)
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Stable orbit has radius ro
+e
v
ro
e
Fig. 1.2: The planetary model of the hydrogen atom in which the
negatively charged electron orbits the positively charged nucleus.
From Principles of Electronic Materials and Devices, Second Edition, S.O. Kasap (© McGraw-Hill, 2002)
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ro r=¥
Molecule
+ +
Separated atoms
ro
0 0 r
Interatomic separation, r ro
Eo
Repulsion
Attraction
FR = Repulsive force
EA = Attractive PE
Fig. 1.3: (a) Force vs interatomic separation and (b) Potential energy vs
interatomic separation.
From Principles of Electronic Materials and Devices, Second Edition, S.O. Kasap (© McGraw-Hill, 2002)
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H-atom H-atom
Electron shell
1I 1I
Covalent bond
H-H Molecule
2 1
2 1
1 2
Fig. 1.4: Formation of a covalent bond between two H atoms leads
to the H2 molecule. Electrons spend majority of their time between
the two nuclei which results in a net attraction between the electrons
and the two nuclei which is the origin of the covalent bond .
From Principles of Electronic Materials and Devices, Second Edition, S.O. Kasap (© McGraw-Hill, 2002)
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Covalent bond
H H H H
+ L shell + covalent
bonds
K shell
H H H H
(a) (b)
109.5°
H
H
H
H
(c)
Fig. 1.7: In metallic bonding the valence electrons from the metal
atoms form a "cloud of electrons" which fills the space between
the metal ions and "glues" the ions together through the coulombic
attraction between the electron gas and positive metal ions.
From Principles of Electronic Materials and Devices, Second Edition, S.O. Kasap (© McGraw-Hill, 2002)
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Cl
Na
3s 3s 3p
Cl Cl
Na+ Na+
.) .) 3p
3s
r ro
(b) (c)
(a) (b)
6
r=¥ +
Cl Na
0.28 nm 1.5 eV
0 Separation, r
Cohesive energy
r=¥
Cl Na
6
6.3
+
Cl Na
ro = 0.28 nm
Fig. 1.10: Sketch of the potential energy per ion-pair in solid NaCl.
Zero energy corresponds to neutral Na and Cl atoms infinitely
separated.
From Principles of Electronic Materials and Devices, Second Edition, S.O. Kasap (© McGraw-Hill, 2002)
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Cl
H
) *
) *¢
= >
?
H
(a) (b)
Fig. 1.12: The origin of van der Waals bonding between water
molecules. (a) The H2O molecule is polar and has a net permanent
dipole moment. (b) Attractions between the various dipole moments
in water gives rise to van der Waals bonding.
From Principles of Electronic Materials and Devices, Second Edition, S.O. Kasap (© McGraw-Hill, 2002)
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Time averaged electron (negative charge)
distribution
Closed L Shell
Ne
A B
van der Waals force
Synchronized fluctuations
of the electrons
Attractive
F A F
Lo + dL
dFN
0 r
Repulsive
dr
ro
dFN dFN
=
>
Fig. 1.14: (a) Applied forces F strech the solid elastically from Lo to
d L . The force is divided amongst chains of atoms that make the
solid. Each chain carriers a force d FN. (b) In equilibrium, the
applied force is balanced by the net force d FN between the atoms
as a result of their increased separation.
From Principles of Electronic Materials and Devices, Second Edition, S.O. Kasap (© McGraw-Hill, 2002)
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Square Container
Area ) =
Face *
LO Face )
LN
Gas atoms =
vx x
vz z
Iz
y
Iy
(b)
ro Interatomic separation, r
0
rav
Uo A¢ C¢
B¢ T2
B A C T1 KE
Umin = Uo
Umin
Fig. 1.18: The potential energy PE curve has a minimum when the
atoms in the solid attain the interatomic separation at r = ro. Due to
thermal energy, the atoms will be vibrating and will have vibrational
kinetic energy. At T = T1, the atoms will be vibrating in such a way
that the bond will be stretched and compressed by an amount
corresponding to the KE of the atoms. A pair of atoms will be
vibrating between B and C. Their average separation will be at A
and greater than ro.
From Principles of Electronic Materials and Devices, Second Edition, S.O. Kasap (© McGraw-Hill, 2002)
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State A
State B, KE = 0,
E = UB
State A
State C, KE = 0,
E = UC
Rotating disks
0.5
0
0 500 1000 1500 2000
Speed (m/s)
T1
Average KE at T2
T2 > T1
EA Energy, E
V
M v
m
Gas Atom
Compression
,N < 0
m
,N> 0
Extension
m
v=0V v = 3 mV
Voltage, LJ
A B
Time
v = +5 mV
Electron
LJ
Flow
4 + Time
Electron
Flow
Current
Stable
U
A*
E A*
A U
A
,U A
U
B
B
X
XA XA* XB
System Coordinate, X = Position of Center of Mass
Fig. 1.27: Tilting a filing cabinet from state A to its edge in state A*
requires an energy EA. After reaching A*, the cabinet
spontaneously drops to the stable position B. PE of state B is lower
than A and therefore state B is more stable than A.
From Principles of Electronic Materials and Devices, Second Edition, S.O. Kasap (© McGraw-Hill, 2002)
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A A* B
U = PE(x)
UA*
A*
EA
UA= UB A B
X
Displacement
a
X
O
θ = 90° y
θ = 180° θ = 0° x
θ = 270°
Fig. 1.29: An impurity atom has four site choices for diffusion to
a neighboring interstitial vacancy. After N jumps, the impurity
atom would have been displaced from the original position at O.
From Principles of Electronic Materials and Devices, Second Edition, S.O. Kasap (© McGraw-Hill, 2002)
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(a) FCC Unit Cell
24 =
= =
(b) (c)
Fig. 1.30: (a) The crystal structure of copper is Face Centered Cubic
(FCC). The atoms are positioned at well defined sites arranged periodically
and there is a long range order in the crystal. (b) An FCC unit cell with
closed packed spheres. (c) Reduced sphere representation of the FCC unit
cell. Examples: Ag, Al, Au, Ca, Cu, C-Fe (>912 C), Ni, Pd, Pt, Rh
From Principles of Electronic Materials and Devices, Second Edition, S.O. Kasap (© McGraw-Hill, 2002)
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a
a b
Examples: Alkali metals (Li, Na, K, Rb), Cr,
Mo, W, Mn, α-Fe (< 912°C), β-Ti (> 882°C).
Fig. 1.31: Body centered cubic (BCC) crystal structure. (a) A BCC
unit cell with closely packed hard spheres representing the Fe
atoms. (b) A reduced-sphere unit cell.
From Principles of Electronic Materials and Devices, Second Edition, S.O. Kasap (© McGraw-Hill, 2002)
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Layer B
Layer A
Layer B
Layer A
Layer A Layer A
(a) (b)
=
(c) (d)
Examples: Be, Mg, =-Ti ( < 882°C ), Cr, Co, Zn, Zr, Cd
=
=
Fig. 1.33: The diamond unit cell is cubic. The cell has eight atoms.
Grey Sn (= Sn) and the elemental semiconductors Ge and Si have
this crystal structure.
From Principles of Electronic Materials and Devices, Second Edition, S.O. Kasap (© McGraw-Hill, 2002)
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S
=
Zn
=
=
Fig. 1.34: The Zinc blende (ZnS) cubic crystal structure. Many
important compound crystals have the zinc blende structure.
Examples: AlAs, GaAs, GaP, GaSb, InAs, InP, InSb, ZnS, ZnTe.
From Principles of Electronic Materials and Devices, Second Edition, S.O. Kasap (© McGraw-Hill, 2002)
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Ratio of radii = 1 Ratio of radii = 0.75
25¢
1¢ 1¢
25¢
1¢ Unit cell
Fig. 1.36: A possible reduced sphere unit cell for the NaCl (rock salt)
crystal. An alternative unit cell may have Na+ and Cl interchanged.
Examples: AgCl, CaO, CsF, LiF, LiCl, NaF, NaCl, KF, KCl, MgO
From Principles of Electronic Materials and Devices, Second Edition, S.O. Kasap (© McGraw-Hill, 2002)
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Cl
+
Cs
Fig. 1.37: A possible reduced sphere unit cell for the CsCl crystal.
An alternative unit cell may have Cs+ and Cl interchanged.
Examples: CsCl, CsBr, CsI, TlCl, TlBr, TlI.
From Principles of Electronic Materials and Devices, Second Edition, S.O. Kasap (© McGraw-Hill, 2002)
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1/ th of an atom
8
4 Half of an atom
= 24
4 =
Fig. 1.38: The FCC unit cell. The atomic radius is 4 and the lattice
parameter is =
From Principles of Electronic Materials and Devices, Second Edition, S.O. Kasap (© McGraw-Hill, 2002)
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z
Unit Cell Geometry z
c Unit cell
zo P [121]
c > = c
O b y xo yo y
C a
a a
b x b
x
(a) A parallelepiped is chosen to describe geometry of (b) Identification of a direction in a crystal
a unit cell. We line the x, y and z axes with the edges of
the parallelepiped taking lower-left rear corner as the
origin
[001]
[111]
[010] a
[010] y y
a
[110] x
[100] [110]
[111] [111]
[111]
[111]
(c) Directions in cubic crystal system
[111]
Fig. 1.39
From Principles of Electronic Materials and Devices, Second Edition, S.O. Kasap (© McGraw-Hill, 2002)
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z
z intercept at ¥
b
Miller Indices (hkl ) :
1 1 1 (210)
c 1 1 ¥
x intercept at a/2 2
y
a
x Unit cell y intercept at b
(100)
z
z (111)
(110) (111)
y
y
y x
x
z
(b) Various planes in the cubic lattice
y = a
z = 1/2a
a y
O¢
x
(a) (012) plane
aÖ 2
a
a a A = a2Ö 2
A = a2
Fig. 1.41: The (012) plane and planar concentrations in an FCC crystal.
From Principles of Electronic Materials and Devices, Second Edition, S.O. Kasap (© McGraw-Hill, 2002)
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Covalently bonded layer
(c) Buckminsterfullerene
Fig. 1.44: Point defects in the crystal structure. The regions around
the point defect become distorted; the lattice becomes strained.
From Principles of Electronic Materials and Devices, Second Edition, S.O. Kasap (© McGraw-Hill, 2002)
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Schottky defect
Frenkel defect
Substitutional impurity.
Doubly charged
Compression
Tension
(b) Around the dislocation there is a strain field as the atomic bonds have
been compressed above and stretched below the islocation line
Dislocation line
Dislocation ) *
line
, +
(b) The screw dislocation in (a) as viewed from above.
Liquid
(a) (b)
Grain
Grain boundary
(c)
Grain boundary
Broken bond (dangling
bond)
Fig. 1.51: The grain boundaries have broken bonds, voids, vacancies,
strained bonds and "interstitial" type atoms. The structure of the grain
boundary is disordered and the atoms in the grain boundaries have higher
energies than those within the grains.
From Principles of Electronic Materials and Devices, Second Edition, S.O. Kasap (© McGraw-Hill, 2002)
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H2O
Reconstructed Absorbed
Dangling bond surface Oxygen
H H2
O
Surface
Surface atoms
Bulk crystal
Corner
Screw
dislocation
O2
Zn2+
"Free" (or mobile)
electron within the
crystal.
Seed
(a) Quartz Growing Crystal
container Crystal Si
Quartz Ingot
crucible
Molten RF induction
Si coil to heat
Graphite graphite
susceptor susceptor
(100)
Flat
Plane
Single crystal Si ingot (about 2 m)
Cut wafer
(b)
Ground edge or flat [100]
Direction
Fig. 1.55: (a) The schematic illustration of the growth of a single crystal
Si ingot by the Czochralski technique. (b) The crystallographic
orientation of the silicon ingot is marked by grounding a flat. The ingot
can be as long as 2 m. Wafers are cut using a rotating annular diamond
saw. Typical wafer thickness is 0.6-0.7mm
From Principles of Electronic Materials and Devices, Second Edition, S.O. Kasap (© McGraw-Hill, 2002)
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Silicon (or Arsenic) atom
Oxygen (or Selenium) atom
Quartz tube
Molten alloy
Heater coil
H
H
(c) Two dimensional schematic representation
H
H of the structure of hydrogenated amorphous
silicon. The number of hydrogen atoms shown
is exaggerated.
H
H
Crucible
VACUUM
PUMP
Plasma
Silane
gas CVD Chamber
Electrode
(SiH4)
Vacuum
RF Power
Vacuum Generator
Pump
1400 Solid
TEMPERATURE (°C)
Liquid Formation of first solid
1300
L20
1200 1195 °C
Heterogeneous mixture
L0 1130 °C S20 of liquid and solid.
1100
1083 °C S0
1000 Solid
Crystal grains
Time
(a)
1500 L100
LIQUID S100
TEMPERATURE (°C)
1400
I D US
U ID
1300 L I Q SOL
L20 + S
U ID IDU
1200 Q L
LI SO
1100 S20
L0 SOLID
S0
1000
0 20 40 60 80 100
Ni Content (wt.%)
Pure Cu Pure Ni
(b)
S
1300 L
DU
0
UI
Q
LI
TEMPERATURE (°C)
S
DU
S(36%Ni)
LI
SO
L(20%Ni) 1200 L
1 S
1
L X
2
S
L 2
S(28%Ni) 3
S
3 SOLID
L(13%Ni) (=-PHASE)
1100
S
S(20%Ni) 4
1000
0 20 40 60
wt.% Ni
Pure Cu C0
First
solidification
(S1) Ni rich
Grain boundary
SOL
IDU
S
SOLID
Fig. 1.65: The phase diagram of Si with impurities near the low
concentration region.
From Principles of Electronic Materials and Devices, Second Edition, S.O. Kasap (© McGraw-Hill, 2002)
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0-)6
Impurity concentration
Melt
Direction of travel
Zone refined region
C0 Impure C0
B A
Solid
CB'
Purified CB
region x
(a) Heat is applied locally starting at one (c) The impurity concentration profile in the
end. The impurity concentration in the re- refrozen solid after one pass.
frozen solid at B is CB < C0. The impurity
concentration in the melt is CL' > C0.
Impurity concentration
C0
C0 Impure
B' A'
Solid
Zone refined region
C0
(b) As the torch travels towards the 106 x
right, the refrozen solid at B' has CB'
where CB < CB' < C0. The impurity (d) Typical impurity concentration profile
after many passes.
concentration in the melt is now even
greater than CL'
VU
Brine
TEMPERATURE
L
Salt
SO
Brine Brine + Salt
X1 Xs X3 Wt.% Salt
DU
SOL
S S B
=+ L IDU
IDU
LIQU
= L+>
S
= 200 C SOLIDUS E SOLIDUS D SOLIDUS
P 19.2% 183°C 61.9% 97.5%
>
Q Q'
VUS
SOLVUS
= 100 a+b
SOL
>
R' R R''
0
0 20 40 60 80 100
Pure Pb Composition in wt.% Sn Pure Sn
Fig. 1.68: The equilibrium phase diagram of the Pb-Sn alloy. The
microstructures on the left show the observations at various points
during the cooling of a 90%Pb-10%Sn from the melt along the dashed
line (the overall alloy composition remains constant at 10 %Sn)
From Principles of Electronic Materials and Devices, Second Edition, S.O. Kasap (© McGraw-Hill, 2002)
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400
L (61.9%Sn)
L L L
A
L IQ LIQUID
300
UI
SOL
Temperature (oC)
α DU L (61.9%Sn)
S
IDU
M US B
Eutectic
L α α+L U ID
N L I Q
S
200 C O E L+β D SOLIDUS
Eutectic
L (61.9%Sn) P
183°C
F
61.9% β
α (19%Sn)
SOLVUS
V US
Eutectic
100 SOL α+β α (light)
Primary α
Eutectic and β (dark)
Q G
0
Pb 20 40 60 80 Sn
Composition in wt.% Sn
T Cooling of a 60%Pb- Cooling of 38.1%Pb-
T
40%Sn alloy 61.9%Sn alloy
L
L+α L
M
235°C N O L+β+α L + Eutectic solid (β+α)
P
183°C β+α 183 °C
E F
Q Eutectic solid (β+α)
t G
t
Fig. 1.69: The alloy with the eutectic composition cools like a pure
element exhibiting a single solidification temperature at 183°C. The
solid has the special eutectic structure. The alloy with the
composition 60%Pb-40%Sn when solidified is a mixture of primary α
and eutectic solid.
From Principles of Electronic Materials and Devices, Second Edition, S.O. Kasap (© McGraw-Hill, 2002)
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Lattice Crystal
Basis
=
90°
=
Unit cell Unit cell
= > ?
Fig. 1.70: (a) A simple square lattice. The unit cell is a square with a
side=. (b) Basis has two atoms. (c) Crystal = Lattice + Basis. The
unit cell is a simple square with two atoms. (d) Placement of basis
atoms in the crystal unit cell.
From Principles of Electronic Materials and Devices, Second Edition, S.O. Kasap (© McGraw-Hill, 2002)
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UNIT CELL GEOMETRY
CUBIC SYSTEM
= = > = ?a = b = g = 90°
ORTHORHOMBIC SYSTEM
= ¹ > ¹ ? a = b = g = 90°
Fig. 1.71: The seven crystal systems (unit cell geometries) and fourteen
Bravais lattices.
From Principles of Electronic Materials and Devices, Second Edition, S.O. Kasap (© McGraw-Hill, 2002)
http://Materials.Usask.Ca