VLSI DESIGN
Module – I 08 Hours
Introduction: Historical Perspective, VLSI Design Methodologies, VLSI Design Flow,
Design Hierarchy, Concept of Regularity, Modularity and Locality, VLSI Design Styles,
Computer-Aided Design Technology.
Fabrication of MOSFETs: Introduction, Fabrication Processes Flow – Basic Concepts, The
CMOS n-Well Process, Layout Design Rules, Stick Diagrams, Full-Customs Mask Layout
Design.
MOS Transistor: The Metal Oxide Semiconductor (MOS) Structure, The MOS System
under External Bias, Structure and Operation of MOS Transistor (MOSFET), MOSFET
Current-Voltage Characteristics, MOSFET Scaling and Small-Geometry Effects, MOSFET
Capacitance.
(Chapter 1 to 3 of Text Book 1 and for Stick Diagram Text Book 2)
Module – II 14 Hours
MOS Inverters – Static Characteristics: Introduction, Resistive-Load Inverters, Inverters
with n-Type MOSFET Load, CMOS Inverter.
MOS Inverters – Switching Characteristics and Interconnect Effects: Introduction,
Delay-Time Definitions, Calculation of Delay-Times, Inverter Design with Delay Constraints,
Estimation of Interconnect Parasitics, Calculation of Interconnect Delay, Switching Power
Dissipation of CMOS Inverters.
Combinational MOS Logic Circuits: Introduction, MOS Logic Circuits with Depletion
nMOS Loads, CMOS Logic Circuits, Complex Logic Circuits, CMOS Transmission Gates
(Pass Gates).
(Chapter 5 to 7 of Text Book 1)
Module – III 18 Hours
Sequential MOS Logic Circuits: Introduction, Behaviour of Bistable Elements, SR Latch
Circuits, Clocked Latch and Flip-Flop Circuits, CMOS D-Latch and Edge-Triggered Flip-Flop.
Dynamic Logic Circuits: Introduction, Basic Principles of Pass Transistor Circuits, Voltage
Bootstrapping, Synchronous Dynamic Circuit Techniques, Dynamic CMOS Circuit
Techniques, High Performance Dynamic CMOS Circuits.
Semiconductor Memories: Introduction, Dynamic Random Access Memory (DRAM), Static
Random Access Memory (SRAM), Non-volatile Memory, Flash Memory.
Design for Testability: Introduction, Fault Types and Models, Ad Hoc Testable Design
Techniques, Scan-Based Techniques, Built-In Self-Test (BIST) Techniques, Current
Monitoring IDDQ Test.
Text Books:
1. Sung-Mo Kang and Yusuf Leblebici, CMOS Digital Integrated Circuits: Analysis and
Design, 3rd Edn., Tata McGraw-Hill Publishing Company Limited, 2003.
2. K. Eshraghian and N.H.E. Weste, Principles of CMOS VLSI Design – a Systems
Perspective, 2nd Edn., Addison Wesley, 1993.
Reference Books:
1. Jan M. Rabaey, Anantha Chandrakasan, Borivoje Nikolic, Digital Integrated Circuits –
A Design Perspective, 2nd Edn., PHI.
2. Wayne Wolf, Modern VLSI Design System – on – Chip Design, 3rd Edn., PHI
3. Debaprasad Das, VLSI Design, Oxford University Press, New Delhi, 2010.
4. John P. Uyemura, CMOS Logic Circuit Design, Springer (Kluwer Academic
Publishers), 2001.
5. Ken Martin, Digital Integrated Circuit Design, Oxford University Press, 2000.