Thanks to visit codestin.com
Credit goes to www.scribd.com

0% found this document useful (0 votes)
10 views8 pages

Introduction To Scanning Elec...

Uploaded by

nishantpiwhal39
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd
0% found this document useful (0 votes)
10 views8 pages

Introduction To Scanning Elec...

Uploaded by

nishantpiwhal39
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd
You are on page 1/ 8

Introduction to Scanning Electron

Microscopy (SEM)
Scanning Electron Microscopy (SEM) is an advanced imaging technique that allows for the detailed analysis of surface structures at the

nanoscale level. This presentation will delve into the instrumentation of SEM, explaining its fundamental principles, operational functions, and

its vast applications across different fields such as materials science, biology, and semiconductor manufacturing.
Introduction to Scanning Electron Microscopy (SEM)

W h at i s S E M ? P r i n c i p l e of O p e rat i o n C o m pa r i s o n w i t h O pt i ca l

M i c ros co py
SEM is a type of electron microscope that The SEM operates by scanning the sample

uses a focused beam of electrons to with a finely focused beam of electrons, SEM has a much higher resolution due to

generate high-resolution images of a producing signals including secondary the shorter wavelength of electrons,

sample's surface. electrons and X-rays. allowing imaging at the nanometer scale.
Components of SEM

Le n s e s a n d S ca n n e rs

Magnetic lenses focus the electron beam

onto the sample, while deflection coils

E l e ct ro n S o u rce allow for precise scanning across the

sample surface.

The electron gun generates the

primary electron beam. Common

sources include tungsten filaments

and field emission guns, both of D ete cto rs

which provide high-energy electrons

Various detectors collect signals emitted


for imaging.

from the sample, including secondary

electron detectors for topographic images

and energy-dispersive X-ray spectroscopy

(EDS) for elemental analysis.


Sample Preparation Essentials

I m p o r ta n ce of P re pa rat i o n C oat i n g Te c h n i q u e s Mounting Samples

Proper sample preparation is crucial to Non-conductive samples often require a Samples are typically mounted on a stub

obtain high-quality SEM images. Samples thin conductive coating, such as gold or using conductive adhesive or double-sided

must be clean, dry, and conductive to platinum, to enhance electron conductivity tape, ensuring stability during imaging.

prevent charging effects. and improve imaging quality.


SEM Imaging Techniques

S e co n d a r y E l e ct ro n I m a g i n g B a c k s catte re d E l e ct ro n X- ra y M i c roa n a l y s i s

Imaging
This technique captures secondary EDS can be used in conjunction with SEM

electrons emitted from the sample surface, By detecting backscattered electrons, this to determine the elemental composition of

providing detailed topographical images the sample by analyzing characteristic X-


technique offers compositional contrast

with high contrast. based on atomic number differences, rays emitted during electron

allowing for material characterization. bombardment.


Applications of SEM

B i o l o g i ca l A p p l i cat i o n s

In biology, SEM enables the visualization

of cellular structures, tissues, and

biomaterials, providing insights into

M ate r i a l s S c i e n ce morphology and surface properties.

SEM is extensively used in materials

science for analyzing microstructures,

fractures, and surface features of N a n ote c h n o l o g y

metals, polymers, and ceramics.

SEM plays a critical role in

nanotechnology for characterizing

nanoscale materials and devices,

supporting research and development in

various fields.
Advantages and Limitations of SEM

A d va n ta ge s L i m i tat i o n s C ost Fa cto rs

SEM provides high-resolution Samples must be vacuum- SEM instruments can be expensive,

images, D-like depth perception, compatible and conductive, requiring significant investment in

and the ability to analyze a wide limiting the types of materials that equipment and maintenance,

range of materials. It also allows can be studied. The sample limiting accessibility for some

for surface compositional analysis preparation process can be research institutions.

through EDS. complex and time-consuming.


Future Trends in Scanning Electron Microscopy (SEM)

The landscape of scanning electron microscopy (SEM) is rapidly evolving with technological advancements. Key trends include automation and

AI integration, in-situ analysis techniques, and the emergence of cryo-SEM methods. These developments are paving the way for enhanced

imaging capabilities and broader applications in materials and biological research.

Au to m at i o n a n d A I I n teg rat i o n I n -S i t u A n a l y s i s C r yo -S E M

Advances in automation and artificial Developments in in-situ techniques Cryogenic techniques allow the study of

intelligence are enhancing SEM enable real-time observation of dynamic biological samples in their natural state.

capabilities. processes.

You might also like