Probability
Probability
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Sample Spaces
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The time taken
to ready the
camera for
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Example 2.3 | Message Delays
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Events
Recall set
operations
Event combinations
– The union of two events consists of all outcomes that are contained in either of the
two events, denoted as 𝐸𝐸1 ∪ 𝐸𝐸2.
– The intersection of two events is the event that consists of all outcomes that are
contained in both of the two events, denoted as 𝐸𝐸1 ∩ 𝐸𝐸2.
– The complement of an event in a sample space is the set of outcomes in the sample
space that are not in the event. We denote the complement of the event 𝐸𝐸 as 𝐸𝐸𝐸.
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Example 2.4 | Events
› Suppose that the recycle times of two cameras are recorded. Consider only whether or not
the cameras conform to the manufacturing specifications. We abbreviate yes and no as y
and n. Consider the sample space 𝑆𝑆 = {𝑦𝑦𝑦𝑦, 𝑦𝑦𝑦𝑦, 𝑛𝑛𝑛𝑛, 𝑛𝑛𝑛𝑛}.
– Suppose that the subset of outcomes for which at least one camera conforms is denoted as
𝐸𝐸1. Then, 𝐸𝐸1 = {𝑦𝑦𝑦𝑦, 𝑦𝑦𝑦𝑦, 𝑛𝑛𝑛𝑛}.
– Suppose that the subset of outcomes for which both cameras do not conform, denoted as
𝐸𝐸2, contains only the single outcome, 𝐸𝐸2 = {𝑛𝑛𝑛𝑛}.
– Other examples of events are 𝐸𝐸3 = Ø, the null set, and 𝐸𝐸4 = 𝑆𝑆, the sample space.
– If 𝐸𝐸5 = {𝑦𝑦𝑦𝑦, 𝑛𝑛𝑛𝑛, 𝑛𝑛𝑛𝑛}, 𝐸𝐸1 ∪ 𝐸𝐸5 = 𝑆𝑆, 𝐸𝐸1 ∩ 𝐸𝐸5 = 𝑦𝑦𝑦𝑦, 𝑛𝑛𝑛𝑛 , 𝐸𝐸1′ = 𝑛𝑛𝑛𝑛
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Example 2.5 | Camera Recycle Time
Camera recycle times might use the sample space S = R+.
Let E1 = {x | 10 ≤ x < 12} and E2 = {x | 11 < x < 15}
Then,
and
Also
And
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Venn Diagrams
We can use Venn diagrams to represent a sample space and events
in a sample space.
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They cannot
happen
simultaneously i.e.
Mutually Exclusive Events no overlap, no
outcome is shared
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Counting Techniques
• In complicated examples, determining the outcomes in the sample space (or an
event) can become difficult
• In these cases, counts of the numbers of outcomes in the sample space and
various events are used to analyze the random experiments.
• These methods are referred to as counting techniques.
• Multiplication Rule
• Permutations
• Combinations
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Example 2.7 | Web Site Design
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Counting – Multiplication Rule
Assume an operation can be described as a sequence of k steps, and
› The number of ways to complete step 1 is n1, and
› The number of ways to complete step 2 is n2 for each way to complete step
1, and
› The number of ways to complete step 3 is n3 for each way to complete step
2, and so fourth
The total number of ways to complete the operation is 𝑛𝑛1 × 𝑛𝑛2 × ⋯ × 𝑛𝑛𝑘𝑘
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Example 2.8 | Printed Circuit Board
Answer: P48 = 8! 8 ⋅ 7 ⋅ 6 ⋅ 5 ⋅ 4!
= = 8 ⋅ 7 ⋅ 6 ⋅ 5 = 1,680 different designs are possible
(8 − 4)! 4!
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Counting – Permutations
Permutations of Subsets
The number of permutations of subsets of r elements selected from a set of n
different elements is
n!
P = n(n − 1)(n − 2)...(n − r + 1)=
n
(n − r )!
r
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Example 2.9 | Hospital Schedule
A hospital operating room needs to schedule three knee surgeries and two hip
surgeries in one day. We denote a knee surgery as k, and hip surgery as h. The
number of possible sequences of three knee and hip surgeries is
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Counting – Permutations
Permutations of Similar Objects
n!
n1 ! n2 ! ... nr !
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Example 2.11a | Sampling without
Replacement
› A bin of 50 parts contains 3 defectives and 47 non-defective parts. A sample of 6
parts is selected from the 50 without replacement. How many samples of size 6
contain 2 defective parts?
› The first step is to select 2 parts form the 3 defective parts in the bin The number
of different ways this step can be completed is
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Example 2.11b | Sampling without
Replacement
The second step is to select the remaining 4 parts form the 47 acceptable parts in
the bin. The number of different ways the second step can be completed is
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Example 2.11c | Sampling without
Replacement
Therefore, from the multiplication rule, the number of subsets of size
6 that contain exactly 2 defective parts is
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Simply choose
(instead of
Counting – Combinations
arrange in any
order)
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Interpretations and Axioms of Probability
› Probability is used to quantify the likelihood, or chance, that an outcome of a
random experiment will occur
› The likelihood of an outcome is quantified by assigning a number from the
interval [0,1] to the outcome (or a percentage from 0 to 100%)
› 0 indicates an outcome will not occur
› 1 indicates that an outcome will occur with certainty
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Interpretations and Axioms of Probability
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Interpretations and Axioms of Probability
For example, suppose that we select 1 laser diode randomly from a batch of
100. Randomly implies that it is reasonable to assume that each diode in the
batch has an equal chance of being selected. The probability model for this
experiment assigns probability of 0.01 to each of the 100 outcomes, because
each outcome in the sample space is equally likely
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Interpretations and Axioms of Probability
For a discrete sample space, the probability of an event can be defined by the
reasoning used in the preceding example
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Example 2.13 | Probabilities of Events
A random experiment can result in one of the outcomes {a, b, c, d} with probabilities 0.1, 0.3,
0.5, 0.1, respectively
Let A denote the event {a, b}, B the event {b, c, d}, and C the event {d}
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Axioms of Probability
Probability is a number that is assigned to each member of a collection of events
from a random experiment that satisfies the following properties:
1. P(S) = 1
2. 0 ≤ P(E) ≤ 1
3. For any two events E1 and E2 with 𝐸𝐸1 ∩ 𝐸𝐸2 = Ø,
𝑃𝑃(𝐸𝐸1 ∪ 𝐸𝐸2 ) = 𝑃𝑃(𝐸𝐸1) + 𝑃𝑃(𝐸𝐸2)
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Unions of Events and Addition Rules
Joint events are generated by applying basic set operations to individual events,
specifically:
• Unions of events, 𝐴𝐴 ∪ 𝐵𝐵
• Intersections of events, 𝐴𝐴 ∩ 𝐵𝐵
• Complements of events, 𝐴𝐴′
Probabilities of joint events can often be determined from the probabilities of the
individual events it comprises
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Example 2.15a | Semiconductor Wafers
A wafer is randomly selected from a batch of 940 wafers in a
semiconductor manufacturing process
– Let H denote the event that the wafer contains high levels of contamination
› Then P(H) = 358/940.
– Let C denote the event of the wafer is in center of a sputtering tool
› Then P(C) = 626/940.
Location of Tool
Challenge:
Contamination Total
Center Edge
Can you
represent the Low 514 68 582
table as Venn
or tree High 112 246 358
diagram
Total 626 314 940
Section 2.4 Unions of Events and Addition Rules
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Example 2.15b | Semiconductor Wafers
𝑃𝑃(𝐻𝐻 ∩ 𝐶𝐶) is the probability that the wafer is from the center of the sputtering tool and
contains high levels of contamination
𝑃𝑃(𝐻𝐻 ∩ 𝐶𝐶) = 112/940
The event (𝐻𝐻 ∪ 𝐶𝐶) is the event that a wafer is from the center of the sputtering tool
or contains high levels of contamination (or both)
𝑃𝑃 𝐻𝐻 ∪ 𝐶𝐶 = 𝑃𝑃 𝐻𝐻 + 𝑃𝑃 𝐶𝐶 − 𝑃𝑃(𝐻𝐻 ∩ 𝐶𝐶)
= (358 + 626 − 112)/940 = 872/940 Contamination Location of Tool Total
Center Edge
Low 514 68 582
Practical Interpretation: To better High 112 246 358
understand the sources of contamination,
Total 626 314 940
yield from different locations on wafers are
routinely aggregated
Section 2.4 Unions of Events and Addition Rules
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Addition Rule
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Addition Rule
Three or More Events
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Conditional Probability
› The probability of an event B under the knowledge that the outcome will
be in event A is called the conditional probability of B given A, denoted
as 𝑃𝑃(𝐵𝐵 | 𝐴𝐴)
› A digital communications channel has an error rate of 1 per 1000 bits
transmitted. Errors are rare, occur in bursts. If a single bit is transmitted, we
might model the probability of an error as 1/1000. However, if the previous
bit was in error because of the bursts, we might believe that the probability
that the next bit will be in error is greater than 1/1000.
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Conditional Probability
This definition can be understood in a special case in which all outcomes of a random
experiment are equally likely. If there are N total outcomes,
𝑃𝑃(𝐴𝐴) = (number of outcomes in A) / N
𝑃𝑃(𝐴𝐴 ∩ 𝐵𝐵) = (number of outcomes in 𝐴𝐴 ∩ 𝐵𝐵) / N
𝑃𝑃(𝐵𝐵 | 𝐴𝐴) = (number of outcomes in 𝐴𝐴 ∩ 𝐵𝐵) / (number of outcomes in A)
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Example 2.17 | Surface Flaws and
Defectives
Table 2.2 provides an example of 400 Parts Classified
parts classified by surface flaws and as Surface Flaws
(functionally) defective. Of the parts with Defective Total
surface flaws (40 parts), the number of Yes (F ) No (F' )
defective ones is 10. Therefore, Yes (D ) 10 18 28
𝑃𝑃(𝐷𝐷 | 𝐹𝐹) = 10/40 = 0.25 No (D' ) 30 342 372
Total 40 360 400
And of the parts without surface flaws
Practical Interpretation
(360 parts), the number of defective ones
The probability of being defective is five times greater
is 18. Therefore,
for parts with surface flaws. This calculation illustrates
𝑃𝑃(𝐷𝐷 | 𝐹𝐹𝐹) = 18/360 = 0.05 how probabilities are adjusted for additional
information. The result also suggests that there may
be a link between surface flaws and functionally
defective parts, which should be investigated
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Random Samples
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Intersections of Events and Multiplication and
Total Probability Rules
› The conditional probability definition can be rewritten to provide a
formula known as the multiplication rule for probabilities
Section 2.6 Intersections of Events and Multiplication and Total Probability Rules
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Example 2.19 | Machining Stages
The probability that the 1st stage of a numerically controlled machining operation
meets specifications is 0.90. The probability that it meets specifications in the 2nd
stage, given that met specifications in the first stage is 0.95.
› Let A and B denote the events that the 1st and 2nd stages meet specifications,
respectively.
› 𝑃𝑃(𝐴𝐴 ∩ 𝐵𝐵) = 𝑃𝑃(𝐵𝐵 | 𝐴𝐴) · 𝑃𝑃(𝐴𝐴) = 0.95 · 0.90 = 0.855
Section 2.6 Intersections of Events and Multiplication and Total Probability Rules
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Total Probability Rule
› A and A′ are mutually exclusive.
› 𝐴𝐴 ∩ 𝐵𝐵 and 𝐴𝐴′ ∩ 𝐵𝐵 are mutually
exclusive
› 𝐵𝐵 = 𝐴𝐴 ∩ 𝐵𝐵 ∪ (𝐴𝐴′ ∩ 𝐵𝐵)
Section 2.6 Intersections of Events and Multiplication and Total Probability Rules
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Example 2.20 | Semiconductor
Contamination
Information about product failure based on chip manufacturing process contamination is
given below. Find the probability of failure.
Section 2.6 Intersections of Events and Multiplication and Total Probability Rules 42
Total Probability Rule
Section 2.6 Intersections of Events and Multiplication and Total Probability Rules
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Independence
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Independence
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Bayes’ Theorem
› Thomas Bayes addressed essential question in 1700s of
finding the probability that a condition was present (high
contamination) given an outcome (a semiconductor failure)
› Bayes’ theorem states that,
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Example 2.26
The conditional probability that a high level of contamination was present when a
failure occurred is to be determined. The information is summarized here.
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Bayes’ Theorem
Note:
Numerator expression is always one of the terms in the sum of the denominator.
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