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The document discusses various novel algorithms and methods for defect detection in flexible integrated circuit packaging and printed circuit boards. Techniques include adaptive differentiation, curvature and geometry features, deep learning approaches, and multi-branch networks for accurate identification of defects. The focus is on improving detection accuracy and efficiency in semiconductor manufacturing processes.

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bowshikabir23
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8 views2 pages

XXXXXXX

The document discusses various novel algorithms and methods for defect detection in flexible integrated circuit packaging and printed circuit boards. Techniques include adaptive differentiation, curvature and geometry features, deep learning approaches, and multi-branch networks for accurate identification of defects. The focus is on improving detection accuracy and efficiency in semiconductor manufacturing processes.

Uploaded by

bowshikabir23
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as DOCX, PDF, TXT or read online on Scribd
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A novel defect detection algorithm for flexible integrated circuit package substrates

Sensing High-Density IC Substrates: Adaptive Fractional Differentiation for Accurate Image


Segmentation

A novel solder joints inspection method using curvature and geometry features in high-
density flexible IC substrates surface mount technology

A fast oxidation region detection algorithm based on differential geometry approach for
high-density flexible integrated circuit packaging substrates

Detection of oxidation region of flexible integrated circuit substrate based on topology


mapping

Integrated Circuit Packaging Defect Analysis and Deep Learning Detection Method

An novel image de-noising model based on gradient and adaptive curvature features and its
application

Multibranched Dilated Convolution With Feature Fusion and Dropout for Accurate Wafer
Surface Defect Detection

Deep Regression Neural Network for Industrial Surface Defect Detection

MAFF-Net: PCB defect detection via feature-enhancement fusion

Knowledge augmented broad learning system for computer vision based mixed-type defect
detection in semiconductor manufacturing

An Adaptive Defect-Aware Attention Network for Accurate PCB-Defect Detection

FI2Net: a two-stage network with information fusion and integration mechanisms for surface
defect detection

Reliable and Lightweight Adaptive Convolution Network for PCB Surface Defect Detection

Multiscale Convolution-Based Probabilistic Classification for Detecting Bare PCB Defects

Refined Defect Detector With Deformable Transformer and Pyramid Feature Fusion for
PCB Detection

EL-PCBNet: An efficient and lightweight network for PCB defect detection

Printed Circuit Board Defect Detection Using Deep Learning via A Skip-Connected
Convolutional Autoencoder

ASSA-UNet: An Efficient UNet-Based Network for Chip Internal Defect Detection

Mixed-type wafer defect detection based on multi-branch feature enhanced residual module

Lightweight intelligent detection algorithm for surface defects in printed circuit board

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