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Circuits & Layout: N. Weste D. Harris

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0% found this document useful (0 votes)
183 views50 pages

Circuits & Layout: N. Weste D. Harris

layout

Uploaded by

Siam Hasan
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
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Circuits & Layout

N. Weste D. Harris
Outline
A Brief History
 CMOS Gate Design
 Pass Transistors
 CMOS Latches & Flip-Flops
 Standard Cell Layouts
 Stick Diagrams
A Brief History
 1958: First integrated circuit (IC)
 Flip-flop using two transistors
 Built by Jack Kilby at TI

 2010 Courtesy Texas Instruments

 Intel Core i7 mprocessor


 2.3 billion transistors
 64 Gb Flash memory
[Trinh09]
 > 16 billion transistors © 2009 IEEE
Growth Rate
 53% compound annual growth rate over 50
years
 No other technology has grown so fast so long
 Driven by miniaturization of transistors
 Smaller is cheaper, faster, lower in power!
 Revolutionary effects on society

[Moore65]
Electronics Magazine
Annual Sales
 More
than 1019 transistors
manufactured in 2008
1 billion for every human on the planet
Invention of the Transistor
 Vacuum tubes ruled the first half of 20th
century
 Large, expensive, power-hungry, unreliable
 1947: first point contact transistor
 John Bardeen and
Walter Brattain
at Bell Labs
 See Crystal Fire
by Riordan,
Hoddeson AT&T
Archives.
Reprinted with
permission.
Transistor Types
 Bipolar transistors
 npn or pnp silicon structure
 Small current into very thin base layer controls
large currents between emitter and collector
 Base currents limit integration density
 Metal Oxide Semiconductor Field Effect
Transistors
 nMOS and pMOS MOSFETS
 Voltage applied to insulated gate controls
current between source and drain
 Low power allows very high integration
MOS Integrated Circuit
 1970’s processes usually had only nMOS
transistors
 Inexpensive, but consume power while idle

Intel
Museum.
[Vadasz69]
Reprinted
© 1969 IEEE. with
permission.

 1980s-present: CMOS processes for low idle


power
Moore’s Law: Then
 1965: Gordon Moore plotted number of
transistors on each chip
 Fits straight line on semilog scale
 Transistor counts have doubled every 26 months

Integration Levels
SSI: 10 gates
MSI: 1000 gates
LSI: 10,000 gates
VLSI: > 10k gates
[Moore65]
Electronics Magazine
And Now …
Feature Size
 Minimum feature size shrinking 30% every
2-3 years
Corollaries
 Many other factors grow exponentially
 Ex: clock frequency, processor performance
CMOS Gate Design
 Activity: Sketch a 4-input CMOS NOR gate

A
B
C
D
Y
Complementary CMOS
 Complementary CMOS logic gates
 nMOS pull-down network
pMOS
 pMOS pull-up network pull-up
network
inputs
 a.k.a. static CMOS output

nMOS
pull-down
Pull-up OFF Pull-up ON network

Pull-down OFF Z (float) 1

Pull-down ON 0 X (crowbar)
Series and Parallel
nMOS: 1 = ON
a a a a
 a
0 0 1 1
g1
g2

pMOS: 0 = ON
0 1 0 1
 b b b b b
(a) OFF OFF OFF ON

 Series: a a a a a
0 0 1 1
g1
 both must be ON g2
0 1 0 1
b b b b b

 Parallel: (b) ON OFF OFF OFF

either can be ON
a a a a a

g1 g2 0 0 0 1 1 0 1 1
b b b b b

(c) OFF ON ON ON

a a a a a

g1 g2 0 0 0 1 1 0 1 1
b b b b b

(d) ON ON ON OFF
Conduction Complement
 Complementary CMOS gates always
produce 0 or 1
 Ex: NAND gate Y
A
 Series nMOS:
B
 Y=0 when both inputs are 1
 Thus Y=1 when either input is 0
 Requires parallel pMOS

 Rule of Conduction Complements


 Pull-up network is complement of pull-down
 Parallel  series, series  parallel
Compound Gates
 Compound gates can do any
inverting function
Y = AgB + C gD (AND-AND-OR-INVERT, AOI22)
A C A C
B D B D
(a) (b)

C D
A B C D
A B
(c)
(d)

C D
A
A B
B
Y Y
C
A C
D
B D
(f)

(e)
Example: O3AI
Y = ( A + B + C ) gD

A
B
C D
Y
D
A B C
Signal Strength
 Strength of signal
 How close it approximates ideal voltage source
 VDD and GND rails are strongest 1 and 0
 nMOS pass strong 0
 But degraded or weak 1
 pMOS pass strong 1
 But degraded or weak 0
 Thus nMOS are best for pull-down network
Pass Transistors
 Transistors can be used as switches
Transmission Gates
 Pass transistors produce degraded outputs
 Transmission gates pass both 0 and 1 well
Input Output
g = 0, gb = 1 g = 1, gb = 0
g
a b 0 strong 0
a b g = 1, gb = 0 g = 1, gb = 0
a b 1 strong 1
gb

g g g
a b a b a b
gb gb gb
Tri-States
 Tristate buffer produces Z when not
enabled
EN
EN A Y
A Y
0 0 Z
0 1 Z
1 0 0 EN
1 1 1
A Y

EN
Non-Restoring Tri-States
 Transmission gate acts as tri-state buffer
 Only two transistors
EN
 But non-restoring
 Noise on A is passed on to Y A Y

EN
Tristate Inverter
 Tristate inverter produces restored output
 Violates conduction complement rule
 Because we want a Z output

A A
A
EN
Y Y Y
EN

EN = 0 EN = 1
Y = 'Z' Y=A
Multiplexers
 2:1multiplexer chooses between
two inputs
S
S D1 D0 Y
0 X 0 0 D0 0
0 X 1 1 Y
D1 1
1 0 X 0
1 1 X 1
Gate Level MUX Design
 Y = SD1 + SD0 (too many transistors)
 How many transistors are needed? 20
D1
S Y
D0

D1 4 2
S 4 2 Y
D0 4 2
2
Transmission Gate MUX
 Non-restoring mux uses two
transmission gates
S
 Only 4 transistors
D0
S Y
D1

S
Inverting MUX
 Inverting multiplexer
 Use compound AOI22
 Or pair of tristate inverters
 Essentially the same thing
 Non-inverting multiplexer adds an inverter
D0 S D0 D1 S
S D1 S S
Y Y D0 0
S S S S Y
D1 1
4:1 Multiplexer
 4:1 mux chooses one of 4 inputs using two
selects
 Two levels of 2:1 muxes
 Or four tristates
D Latch
 When CLK = 1, latch is transparent
 D flows through to Q like a buffer
 When CLK = 0, the latch is opaque
 Q holds its old value independent of D
 a.k.a. transparent latch or level-sensitive
latch
CLK
CLK
D
Latch

D Q
Q
D Latch Design
 Multiplexer chooses D or old Q

CLK
CLK
D Q Q
1
Q D Q
0
CLK CLK

CLK
D Latch Operation

Q Q
D Q D Q

CLK = 1 CLK = 0

CLK

Q
D Flip-flop
 When CLK rises, D is copied to Q
 At all other times, Q holds its value
 a.k.a. positive edge-triggered flip-flop,
master-slave flip-flop
CLK
CLK
D
Flop

D Q
Q
D Flip-flop Design
 Built from master and slave D latches
CLK CLK
CLK QM
D Q
CLK CLK CLK CLK
CLK
Latch
Latch

QM
D Q
CLK CLK
D Flip-flop Operation
QM Q
D

CLK = 0

QM
D Q

CLK = 1

CLK

Q
Race Condition
 Back-to-back flops can malfunction from
clock skew
 Second flip-flop fires late
 Sees first flip-flop change and captures its result
 Called hold-time failure or race condition

CLK1
CLK1 CLK2 CLK2

Q1 Q1
Flop

Flop

D Q2
Q2
Non-overlapping Clock
 Non-overlapping clocks can prevent races
 As long as non-overlap exceeds clock skew
 This class will use them for safe design
 Industry manages skew more carefully instead
2 1
QM
D Q

2 2 1 1

2 1

1

2
Gate Layout
 Layout can be very time consuming
 Design gates to fit together nicely
 Build a library of standard cells
 Standard cell design methodology
 VDD and GND should abut (standard height)
 Adjacent gates should satisfy design rules
 nMOS at bottom and pMOS at top
 Gates include well and substrate taps
Example: Inverter
Example: NAND3
 Horizontal diffusion layers (N & P)
 Vertical polysilicon gates
 Metal1 P/G rails
 VDD at top
 VSS at bottom
 32 l by 40 l
Stick Diagram
 Symbolic layout
n-diffusion
p-diffusion automatic
contact
poly (silicon)
metal_1 no contact

metal_2 / metal_2
 When two lines of added
the same layer cross, contact
automatically forms or via
● x
an electrical contact
Stick Diagram
Device type Device symbol Symbolic
layout
D D

Enhancement nMOS G G

S S

D D

Depletion nMOS G G

S S

S D

pMOS G G
S
D
Stick Diagram
VDD D

G ●
D
G ●S
S
D
VOUT ● VOUT
VIN VIN G D
G S S

VSS

VDD
VDD
S ●S
G
QP G
D
D ●
VIN Vout VIN
D VOUT
●D
QN G
G S
S

VSS
Contacts / Vias
 Contact
 metal_1 and diffusion ● ●

 metal_1 and poly


 Via
● ●
 M2  M1 or M3 M2
etc.
 Buried Contact
 Poly to diffusion
Stick Diagrams
 Stick diagrams help plan layout fast
 Need not be to scale
 Draw with color pencils or dry-erase
markers
Wiring Tracks
 wiring track is the space needed for a wire
 4 l width, 4 l spacing from neighbor = 8 l pitch
 Transistors also consume one wiring track
Well Spacing
 Wells must surround transistors by 6 l
 Implies 12 l between opposite transistor flavors
 Leaves room for one wire track
Area Estimation
 Estimate area by counting wiring tracks
 Multiply by 8 to express in l
Example: O3AI
 Sketch a stick diagram for O3AI and
estimate area Y = ( A + B + C ) gD
Activity
 Sketch
a stick diagram for a 4-input
NOR gate
VDD
A B C D

GND

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