Thanks to visit codestin.com
Credit goes to www.scribd.com

0% found this document useful (0 votes)
224 views12 pages

Types of Noise

The document discusses two main types of noise that affect analog circuits: device electronic noise and environmental noise. Device electronic noise includes thermal noise and flicker noise. Thermal noise is caused by random electron motion in conductors and is modeled as a voltage or current source in series/parallel with the conductor. Its power spectral density is proportional to temperature and resistance. Flicker noise is caused by traps and defects at oxide-silicon interfaces and its power decreases with increasing frequency. Thermal noise is used to quantify the significance of flicker noise through the calculation of a corner frequency. Noise analysis involves constructing statistical noise models to predict average noise power and power spectral density.
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PPTX, PDF, TXT or read online on Scribd
0% found this document useful (0 votes)
224 views12 pages

Types of Noise

The document discusses two main types of noise that affect analog circuits: device electronic noise and environmental noise. Device electronic noise includes thermal noise and flicker noise. Thermal noise is caused by random electron motion in conductors and is modeled as a voltage or current source in series/parallel with the conductor. Its power spectral density is proportional to temperature and resistance. Flicker noise is caused by traps and defects at oxide-silicon interfaces and its power decreases with increasing frequency. Thermal noise is used to quantify the significance of flicker noise through the calculation of a corner frequency. Noise analysis involves constructing statistical noise models to predict average noise power and power spectral density.
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PPTX, PDF, TXT or read online on Scribd
You are on page 1/ 12

Types of Noise

Noise
• Noise limits the minimum signal level that a circuit can process with acceptable
quality
• Noise is a random process and its value cannot be predicted
• Noise analysis is accomplished by observing for a long time and and constructing
a statistical model
• Average power of noise is predictable using the model
• Power spectral density of a noise is defined as average power carried by x(t) in
one Hertz bandwidth around f
Types of Noise
• Analog signals processed by integrated circuits are corrupted by two types of
noise
1. Device electronic noise
2. Environmental noise
• Environmental noise are random disturbances that a circuit experiences through
supply or ground lines
• Device electronic noise is again classified into two
1. Thermal Noise
2. Flicker Noise
Thermal Noise
Resistor Thermal Noise
• Random motion of electrons in a conductor introduces fluctuations in the voltage
even if average current is zero
• Modeled by series with voltage source or parallel with current source
Analysis of Thermal Noise
• One-sided power spectral density is
Sv(f)=4kTR,f>=0
• Where k=1.38× 10−23 J/K is the Boltzman constant
• T is the temperature in kelvin and R is the Resistance
• Noise voltage is
𝑉𝑛2 =4kTR
• The equation suggests thermal noise is white
• Polarity of voltage source is unimportant
• Low temperature operation decrease noise in analog circuits
MOSFET Thermal Noise
• Noise generated in the channel is significant
• For long channel MOS in saturation ,channel noise can be modeled current
source between D and S

𝐼ഥ𝑛2 =4kT𝛾𝑔𝑚

• 𝛾 is derived to be 2/3 for long channel transistors and large value for submicron
devices
• Theoretical estimation of 𝛾 is still under research
• The ohmic sections of MOS also contribute thermal noise
• For a wide transistor gate distributed resistance is more significant
• 𝑅1 -distributed gate resistance
• 𝑅1 = 𝑅𝐺 /3
Controlling Thermal noise
• Noise current of a MOS decreases if the transconductance drops
𝑉 2 = 𝐼ഥ2 𝑅2
𝑛 𝑛
2
= 4kT( 𝑔𝑚 ) 𝑅2
3
• Effect of 𝑅𝐺 can be reduced by proper layout
Flicker Noise
• At the gate oxide-silicon interface many dangling bonds appear, giving rise to
extra energy states
• As carriers move through the interface some are randomly trapped and later
released by the energy states

• Average power of flicker noise cannot predict easily


• Depends on cleanness of interface and CMOS technology
Analysis of Flicker Noise
• Modeled as a voltage source series with gate and roughly given by
2 𝐾
𝑉𝑛 =
𝐶𝑜𝑥 𝑤𝐿𝑓
• K-Process dependent on the order of 10−25 𝑉 2 F
• Spectral density is inversely proportional to frequency

• Also believed that PMOS exhibit less noise than NMOS


Corner Frequency
• In order to quantify the significance of flicker noise with thermal noise ,plot both
densities on same axes
• The intersection point serves as measure of what part of band is corrupted by
flicker noise, called as corner frequency

2 𝐾 𝐾 3
• 4kT( 𝑔𝑚 ) 𝑅2 = → 𝑓c= 𝑔𝑚
3 𝐶𝑜𝑥 𝑤𝐿𝑓𝑐 𝐶𝑜𝑥 𝑤𝐿 8𝑘𝑇
THANKS

You might also like