Advantest V93000 SOC
Basic User Training
Software Overview
Agenda
• Learning Objectives
• Relevance
• SmarTest Overview & Structure
• Eclipse Workcenter
• Perspectives, Editors & Views
• SmarTest Device Directory
• .technology File
• Creating Device
• Model, Device License Files
• Technical Documentation Center (TDC)
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Learning Objectives
• Understand the SmarTest software concept
• Understand the SmarTest file structure
• Understand the purpose of the different tools and how they are linked
together
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Relevance
A basic understanding of the software helps to keep a high-
level view when developing a test program
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SmarTest Overview
SETUPS TOOL KIT
Application
Test Program
Instruments
PINS
PINS Model Eclipse IDE
Pin
Pin Groups
Groups Pin Config Editor
Customer Data
Data Test Flow Bridge Level Editor
LEVELS
LEVELS
Specs
Specs Timing Editor
Equations
Equations
Operator
Prober Pattern Editor
Level
Level Sets
Sets Handler
Analog Setup Tool
TIMING
TIMING Routing Editor
Specs
Specs Testflow Signal Analyzer
Equations
Equations
C/C++ Developm.
Timing
Timing Sets
Sets
Wavetables
Wavetables Toolkit (Eclipse CDT)
PATTERNS
PATTERNS
Labels
Labels
Bursts
Bursts
RESULTS
ANALOG
ANALOG
Module
Module Setup
Setup DATALOG
DATALOG
Routing
Routing
Waveforms
Waveforms Testsuite REPORT
REPORT WINDOW
WINDOW
Sequencing
Sequencing
TIMING
TIMING DIAGRAM
DIAGRAM
Clock
Clock Settings
Settings Level Pattern
TEST
TEST Timing Analog ERROR
ERROR MAP
MAP
TestMethod
TestMethod Spec Test
(UTM)
(UTM) ANALOG
ANALOG
TestMethod
TestMethod WAVEFORMS
WAVEFORMS
library
library FLAGS
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SmarTest Path and File Structure
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SmarTest 7.2.x features
Protocol Editor Design level DUT access
• Protocol Editor supports pre-defined and user defined
protocols (JTAG, SPI, I2C, MDIO, DDR, USB, PCIe…)
• Automates vector generation and modification at a higher
abstraction level
Tools
• Integrated Result Tool
• Shmoo Tool
• Test Cell Control Tool
• Test Program 360
• Concurrent test framework enhancements
• DC Scale limits
• TMLimits
Current Profiling Fast DUT power characterization
• Run time current measurement without pattern modification
• TM-API based setup for DC Scale cards
• Waveform view in signal analyzer
SmarTest Program Manager Optimized test development
• Collaborative test program development and debug
• Re-use of optimized test setups and Test Methods
• Template based test (master test plan)
• SmarTest Data Link to manage vector file handling
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Launching Smartest (ONLINE/OFFLINE)
ONLINE Start
OFFLINE Start
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Eclipse Workspace Selection at Startup
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Integrated Environment
Eclipse Workcenter
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Eclipse Perspectives
• Perspectives are sets of window panes in your Workcenter
• Perspectives are specific arrangements of editors and views
• Predefined Perspectives:
• You can change or create new perspectives which fulfill your
specific needs
• Window ->Reset Perspective (restore default configuration)
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Eclipse Perspectives
Accessing perspectives
• Window => Open Perspective or via icons
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Eclipse Perspectives
Setup Perspective
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Eclipse Perspectives
Hardware Perspective / Monitoring Hardware Status
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Eclipse Perspectives
C/C++ Perspective
Click on the
UTM project in
the explorer
frame and now
you see the C-
build console for
the UTM project
Compilation
errors and
warnings will be
shown here
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C++ Test Method Templates
Universal Test Method (UTM) Libraries
• dc_tml
• ac_tml
• ccf_tml
• commandRunner
• multi_group_dc_tml
• miscellaneous_tml
• MTP_ExecutionEngine_tml
• pptia_tml
• scan_tml
• smartCalc
• tmu_tml
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Eclipse Perspectives
Debug Perspective: Running a Debug Session
Debug icons
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Eclipse Perspectives
Views and Perspectives
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Navigation
Test Program Explorer
Use the Test Program Explorer to
• Load, edit (launch editors), and save setup data
• Show logical content of test programs
• Visualize current context of execution
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Navigation
Navigator
Use the Navigator to
• Perform file operations (copy, paste, …)
• Switch current devices
• Maintain your current workspace (import, close,
delete projects)
• Load setup files
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Integrated Testflow Tools
Flow Sequence Editor and Flow Data Editor
Flow Sequence Editor to Debug Flow Data Editor to Edit
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Pin Configuration Tool
Digital pins Analog or RF pins
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Eclipse Toolbar
The icons and drop down menus of the Eclipse Toolbar represent
the former SmarTest Toolbar
Setup Results Debug Memory Test Scan Analog Production System
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Setup Tools
Pin Configuration
Timing Setup
Level Setup
Pattern edit &
debug
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Functional debug Tools
Timing Diagram
Pattern edit
& debug*
Error Map
* same GUI as in the setup tools
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Result Analysis Tools
Pin Margin
Integrated result
analysis tool
HW monitor
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Test Cell Control Tool
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Data Handling
Load, Save, Apply
• Load – download from the setup files in the disk Workstation
workstation to the V93000 hardware
• Save – from the V93000 hardware to the setup files in
the disk workstation
• Upload – from the V93000 hardware to the workstation
main memory Disk
Main
a d Memory
lo
v e
sa d
o a
l
up
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Data Handling
Device Directory
• A device directory is a structure that contains all basic test
setup elements
• Each device configured on the V93000 SOC Series has its
own device directory
• Each time you use the system, a file
called .device_inuse_soc is stored in your home directory
• This file remembers which device you were using last, and
sets a path to its device directory
• If a project directory is being used, a lock file is created in
the device directory. This prevents other users from using
that device software.
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Creating a new Device Directory
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Selecting Device Path
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Adding Device Directory
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Device Directory Structure
• When a new device file (test program) is created, the subdirectories
below are generated automatically
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Storing Device Parameters
.technology File
• As extra options when creating a device
Located under <device_directory>/.technology
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License
The license scheme includes three licenses
1. License for Smartest
Smartest Online License
2. License for S&S Calibration converter
SW Online Value Package
3. License for S&S MIGRATION FRAMEWORK
SW Offline Tool package
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Quitting SmarTest
To exit SmarTest click
File > Exit
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SmarTest Documentation TDC
Access: https://www.advantest.com/V93000/help/index.jsp
The SmarTest documentation is provided in the V93000 Technical
Documentation Center (TDC)
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SmarTest Help
When running SmarTest you can launch SmarTest Help by choosing
Help > Help Contents
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SmarTest Dynamic Help
1. Load all the setup files of your device
2. In the Flow Data Editor, select any test method, right click
and choose “Modify Test Method… F3”
3. Open your test method in the Test Method editor
4. In SmarTest click Help > Dynamic Help
5. Highlight an API; the related information from TDC pops up
on the right side
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