LEED Spectroscopy
Low Energy Electron
Diffraction
Use of LEED for Surface Analysis
• Solid state drive structures revealed through LEED in comparison to
other techniques.
LEED Process
• The LEED experiment uses a beam of electrons of a well-defined low energy (typically in the range 20 -
200 eV) incident normally on the sample.
• The sample itself must be a single crystal with a well-ordered surface structure in order to generate a back-
scattered electron diffraction pattern.
• Only the elastically-scattered electrons contribute to the diffraction pattern ; the lower energy (secondary)
electrons are removed by energy-filtering grids placed in front of the fluorescent screen that is employed to
display the pattern.
Analysis of LEED
• Qualitatively, where the diffraction pattern is recorded and
analysis of the spot positions gives information on the symmetry
of the surface structure. In the presence of an adsorbate the
qualitative analysis may reveal information about the size and
rotational alignment of the adsorbate unit cell with respect to the
substrate unit cell.
• Quantitatively, where the intensities of diffracted beams are
recorded as a function of incident electron beam energy to
generate the so-called I-V curves. By comparison with theoretical
curves, these may provide accurate information on atomic
positions on the surface at hand.
Basic Theory
• By the principles of wave-particle duality, the beam of electrons may be
equally regarded as a succession of electron waves incident normally on the
sample.
• These waves will be scattered by regions of high localised electron density,
i.e. the surface atoms, which can therefore be considered to act as point
scatterers.
l = h/p
P=mv = (2mE)^1/2 = (2meV)^1/2
20 eV to 200 eV beam is used.
Wood’s Notation
Real Space and Reciprocal Space
Wegner-Seitz Cell
• By drawing a line in the middle of the two points, the smallest area
(or volume) is enclosed
• Called Wigner–Seitz primitive cell
Brillouin Zones
• Wegner-Seitz of Reciprocal Lattice is Known as First B.Z
• Brillouin zones contains the information
about whether a material will be a
• Conductor
• Insulator or intermediate
• Seek-Path: k-path finder
• Fermi Surface sphere where likelihood of electron exist.
Reciprocal crystal
• Let us now add in an adsorbate overlayer - a primitive ( 2 x 2 ) structure
with the adsorbed species shown bonded in on-top sites - and apply the
same logic as just used above to determine the reciprocal
vectors, b1* and b2*, for this overlayer.
• look at the another ( 2 x 2 ) structure on the same fcc(100) surface.
Reciprocal of FCC
• FCC is BCC
• BCC is FCC
Ewald sphere (Quantitatively)
• A most useful means to understand the occurrence of diffraction spots is the Ewald
construction.
• Let's begin slowly: We draw a sphere of radius 1/lambda, in the centre of which we imagine
the real crystal.
• Laue Condition is justified through
• Braggs Law Mathematically
• Ewald Sphere Geometrically
EWALD Sphere
• The incident plane wave falling on the crystal has a wave vector k i
• The diffracted plane wave has a wave vector k f
• The difference between the wave-vectors of diffracted and incident wave is
defined as scattering vector Dk = k f – ki (Laue Condition)
• The reciprocal lattice points are the values of momentum transfer where the
Bragg Diffraction Condition is satisfied and for diffraction to occur the
scattering vector must be equal to a reciprocal lattice vector.
• Geometrically this means that if the origin of reciprocal space is placed at
the tip of ki then diffraction will occur only for reciprocal lattice points that
lie on the surface of the Ewald sphere.
Ewald Sphere
• Ewald Sphere cuts the points where Laue condition is justified…
diffraction occurs.
• Fourier space, k- space, or momentum space in contrast to real space
or direct space.
Advantages of LEED
• Advantages
• Relatively simple and cheap
• experimental set-up (100 k€)
• High surface sensitivity
• Easy information on symmetry
• and shape of surface unit-cell
• Atomic structure can be retrieved
with high accuracy
• Thin monoatomic layers can be detected
• Used in Study of Brillouin Zones Creation
Drawbacks
• demanding data Analysis(strong multiple scattering)
• UHV essential
• no insulators accessible
(electron stimulated process may take place)
IBM-LEEM
• Low energy electron have high wavelength …….an issue
• When coupled to a light source (be it a synchrotron, a laboratory-based laser
or an He lamp) the instrumentation can provide most of the classical
techniques for surface characterization: PEEM, XPEEM.
• Low-Energy Electron Diffraction (LEED),
• Scanning Electron Microscopy (SEM),
• X-ray Photoelectron Spectroscopy (XPS),
• Ultraviolet Photoelectron Spectroscopy (UPS)
• Use of Spin-Solarized Electron Sources or
• Polarized Light add the Capability to
detect magnetic domains.
Parts of LEEM
• Electron Source
• Beam Splitter
• Electrostatic Lens
• Magnetostatic Lens
IBM LEEM
Operating Parameters
0 - 100 eV electron energy
field of view 1 - 100 μm
5 nm resolution in plane
vertical resolution: atomic steps, 0.1 nm
RT – 1200 oC
Extremely useful tool to study crystal growth in situ
LEEM Modes of Operation
a: MEM….Sample is cathode..…height variations changes the Specular Beam
b: Fresnel Diffraction......../2p
c: Backscattered Electrons….. Bright Field…the Reflection coefficient depends upon
Incident Energy of e and charge on the Nucleus in a non-monotonic way
d: Wave Interference
e: LEED
f: Diffracted beams….Satellite Spot
g: SPLEEM…Spin Polarized Electron Source…Magnetic Contrast
Spin Coupling with sample Surface
Magnetic Contrast SPLEEM
• Asymmetric Contrast
• P is correction factor
Movement of Atom
•Omicron Nanotechnology
•Cameca
•Zeiss
•JEOL
