Atomic Force Microscopy Analysis Platform.
Currently at pre-release stage so expect some errors and bugs
NanoLocz is a free interactive AFM image viewer and analysis platform. It's designed for browsing and analysing height data from AFM and HS-AFM imaging with the aim of increasing throughput.
Capabilities:
- Image Levelling
- Line Profiling
- Video Alignment
- Particle Detection (height or reference based)
- Single Particle Tracking
- Particle Alignment
- Localization AFM
- Export as: .tiff, .gif, .avi, .png, .jpeg, .pdf, .txt, .csv, .xls
Compatible file types: .spm, .jpk, .ARIS, .tiff.... more being added
please request (to [email protected]) if your preferred file format is not here
Options for Install:
- NanoLocz as MATLAB app - Requires MATLAB
- NanoLocz for Mac
- NanoLocz for Windows
Option 1. NanoLocz as MATLAB app: Open 'NanoLocz_PreRelease.mlappinstall' file. This will open MATLAB if not already open and ask you to install. Once installed the app can be used from the apps tab. For quick access right click the NanoLocz app to add to Favourites and/or Quick Access Toolbar
Option 2. NanoLocz for Mac: Open 'Install file' folder and open 'MyAppInstaller_web' -> follow the install instructions in popup.
Option 3. NanoLocz for Windows: Open 'Install file' folder and open 'MyAppInstaller_mcr.exe' -> follow the install instructions in popup.
Note: loading on start-up of the app can take ~1min for Mac/Windows versions
THE SOFTWARE IS PROVIDED “AS IS”, WITHOUT WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, INCLUDING BUT NOT LIMITED TO THE WARRANTIES OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE AND NONINFRINGEMENT. IN NO EVENT SHALL THE AUTHORS OR COPYRIGHT HOLDERS BE LIABLE FOR ANY CLAIM, DAMAGES OR OTHER LIABILITY, WHETHER IN AN ACTION OF CONTRACT, TORT OR OTHERWISE, ARISING FROM, OUT OF OR IN CONNECTION WITH THE SOFTWARE OR THE USE OR OTHER DEALINGS IN THE SOFTWARE.
Contributions are extremely welcome.
Distributed under the terms of the GNU GPL v3.0 license, "NanoLocz" is free and open source software
- If using the Localization Atomic Force Microscopy method please cite:
Heath, G.R., Kots, E., Robertson, J.L. et al. Localization atomic force microscopy. Nature 594, 385–390 (2021)
A preprint describing the NanoLocz workflow will be uploaded soon...