Cite: Hiu Yung Wong, "Semiconductor Database," https://github.com/hywong2/Semiconductor_Database/.
PDF files of the papers can be found in the corresponding folders.
FinFET14nm:
K. Mehta and H. -Y. Wong, "Prediction of FinFET Current-Voltage and Capacitance-Voltage Curves Using Machine Learning With Autoencoder," in IEEE Electron Device Letters, vol. 42, no. 2, pp. 136-139, Feb. 2021, doi: 10.1109/LED.2020.3045064.
1D-PiN_Diode:
Y. S. Bankapalli and H. Y. Wong, "TCAD Augmented Machine Learning for Semiconductor Device Failure Troubleshooting and Reverse Engineering," 2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Udine, Italy, 2019, pp. 1-4, doi: 10.1109/SISPAD.2019.8870467.
GaO_Schottky_Diode_T_WF:
Harsaroop Dhillon, Kashyap Mehta, Ming Xiao, Boyan Wang, Yuhao Zhang, and Hiu Yung Wong, "TCAD-Augmented Machine Learning with and without Domain Expertise," in IEEE Transactions on Electron Devices, vol. 68, no. 11, pp. 5498-5503, Nov. 2021, doi: 10.1109/TED.2021.3073378.
Vertical GaN diode BV:
Albert Lu, Jordan Marshall, Yifan Wang, Ming Xiao, Yuhao Zhang, Hiu Yung Wong, "Vertical GaN diode BV maximization through rapid TCAD simulation and ML-enabled surrogate model," Solid-State Electronics, Volume 198, 2022, 108468, https://doi.org/10.1016/j.sse.2022.108468.
Inverter_Contact_Resistance:
Thomas Lu, Varada Kanchi, Kashyap Mehta, Sagar Oza, Tin Ho, and Hiu Yung Wong, "Rapid MOSFET Contact Resistance Extraction from Circuit using SPICE Augmented Machine Learning without Feature Extraction," in IEEE Transactions on Electron Devices, vol. 68, no. 12, pp. 6026-6032, Dec. 2021, doi: 10.1109/TED.2021.3123092.
1D-PiN-Inverse-Design:
K. Mehta, S. S. Raju, M. Xiao, B. Wang, Y. Zhang and H. Y. Wong, "Improvement of TCAD Augmented Machine Learning Using Autoencoder for Semiconductor Variation Identification and Inverse Design," in IEEE Access, vol. 8, pp. 143519-143529, 2020, doi: 10.1109/ACCESS.2020.3014470.
1D-PiN-Diode-ML-with-Noise:
S. S. Raju, B. Wang, K. Mehta, M. Xiao, Y. Zhang and H. -Y. Wong, "Application of Noise to Avoid Overfitting in TCAD Augmented Machine Learning," 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kobe, Japan, 2020, pp. 351-354, doi: 10.23919/SISPAD49475.2020.9241654.
SC_Qubit_Readout_Optimization:
Albert Lu and Hiu Yung Wong, "Rapid Simulation Framework for Superconducting Qubit Readout System Inverse Design and Optimization," 2024 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), San Jose, CA, USA, 2024, pp. 01-04, doi: 10.1109/SISPAD62626.2024.10733335.
2D_Planar_Transistor_Inverse_Design:
T. Lu, A. Lu and H. Y. Wong, "Device Image-IV Mapping using Variational Autoencoder for Inverse Design and Forward Prediction," 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kobe, Japan, 2023, pp. 161-164, doi: 10.23919/SISPAD57422.2023.10319583.
LSTM_NBTI_PMOS_FinFET:
Fanus Arefaine, Meng Duan, Ravi Tiwari, Lee Smith, Souvik Mahapatra, and Hiu Yung Wong, "Using Long Short-Term Memory (LSTM) Network to Predict Negative-Bias Temperature Instability," 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), 2021, pp. 60-63, doi: 10.1109/SISPAD54002.2021.9592531.
LSTM_NBTI_PMOS_FinFET:
Albert Lu, Yu Foon Chau, and Hiu-Yung Wong, "Physics-Informed Neural Network for Predicting Out-of-Training-Range TCAD Solution with Minimized Domain Expertise," 2025 9th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), Hong Kong.
GaO_Parameters_Variation:
M. Eng and H. Y. Wong, "Automatic TCAD Model Parameter Calibration using Autoencoder," 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kobe, Japan, 2023, pp. 277-280, doi: 10.23919/SISPAD57422.2023.10319530.
Vertical_GaN_Diode_IV_BV_CV:
N. Yee, A. Lu, Y. Wang, M. Porter, Y. Zhang and H. Y. Wong, "Rapid Inverse Design of GaN-on-GaN Diode with Guard Ring Termination for BV and (VFQ)−1 Co-Optimization," 2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD), Hong Kong, 2023, pp. 143-146, doi: 10.1109/ISPSD57135.2023.10147511.
SDE_Input_LLM_Data:
L. M. Long Nguyen, A. Lu and H. Y. Wong, "TCAD Structure Input File Generation Using Large Language Model," 2024 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), San Jose, CA, USA, 2024, pp. 1-4, doi: 10.1109/SISPAD62626.2024.10733015.
Neuromophic_Circuit_Correction_ML:
Vedant Sawal and Hiu Yung Wong, "Stuck-at Faults in ReRAM Neuromorphic Circuit Array and their Correction through Machine Learning," 2024 IEEE Latin American Electron Devices Conference (LAEDC), Guatemala City, Guatemala, 2024, pp. 1-4, doi: 10.1109/LAEDC61552.2024.10555838.