Data Sheet: 8-Channel, 12-Bit, Configurable ADC/DAC With On-Chip Reference, SPI Interface
Data Sheet: 8-Channel, 12-Bit, Configurable ADC/DAC With On-Chip Reference, SPI Interface
AD5592R
8-Channel, 12-Bit, Configurable ADC/DAC with On-Chip Reference, SPI Interface
Rev. G
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Data Sheet AD5592R
TABLE OF CONTENTS
REVISION HISTORY
8/2022—Rev. F to Rev. G
Changes to Features Section.......................................................................................................................... 1
Changes to General Description Section.........................................................................................................1
Changes to Specifications Section and Table 2...............................................................................................6
Changes to Timing Characteristics Section and t4 Parameter, Table 3........................................................... 9
Changes to t1 Parameter and t4 Parameter, Table 3; and Figure 4............................................................... 10
Added Figure 5; Renumbered Sequentially................................................................................................... 11
Changes to Thermal Resistance Section and Table 6................................................................................... 12
Added Electrostatic Discharge (ESD) Ratings Section, ESD Ratings for AD5592R/AD5592R-1 Section,
and Table 7; Renumbered Sequentially....................................................................................................... 12
Changes to Table 8........................................................................................................................................ 13
Deleted Table 8, Table 9, and Table 11; Renumbered Sequentially...............................................................13
Moved Figure 7 and Figure 8.........................................................................................................................13
Moved Figure 10............................................................................................................................................ 15
Changes to Table 9........................................................................................................................................ 15
Added DAC Output Range Section, Figure 40, and Figure 41...................................................................... 23
Changes to ADC Section............................................................................................................................... 24
Deleted Table 12............................................................................................................................................ 24
Changes to GPIO Section..............................................................................................................................25
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Data Sheet AD5592R
TABLE OF CONTENTS
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Data Sheet AD5592R
TABLE OF CONTENTS
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Data Sheet AD5592R
FUNCTIONAL BLOCK DIAGRAM (AD5592R-1)
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Data Sheet AD5592R
SPECIFICATIONS
VDD = 2.7 V to 5.5 V, VLOGIC = 2.7 V to 5.5 V (AD5592R-1 only), VREF = 2.5 V (external), RL = 2 kΩ to GND, CL = 200 pF to GND, typical values
are at TA = 25°C, unless otherwise noted. Typical specifications are verified by characterization, not production tested.
Table 2.
Parameter Min Typ Max Unit1 Test Conditions/Comments
TEMPERATURE RANGE
Specified Performance2 −40 +105 °C
−40 +125 °C AD5592RWBCPZ-RL7 and AD5592RWBCPZ-1-RL7
ADC PERFORMANCE fIN = 10 kHz sine wave
Resolution 12 Bits
Input Range 0 VREF V When using the internal ADC buffer, there is a dead band
of 0 V to 5 mV
0 2 × VREF V
Integral Nonlinearity (INL) −2 +2 LSB
−2.5 +2.5 LSB VDD = 5.5 V, input range = 0 V to VREF, AD5592RWBCPZ-
RL7 and AD5592RWBCPZ-1-RL7
Differential Nonlinearity (DNL) −1 +1 LSB
Offset Error ±5 mV
Gain Error 0.3 % FSR
Throughput Rate3 400 kSPS
350 kSPS AD5592RWBCPZ-RL7 and AD5592RWBCPZ-1-RL7
Track Time (tTRACK)3, 4 500 ns
Conversion Time (tCONV)3, 4 2 µs
2 2.36 µs AD5592RWBCPZ-RL7 and AD5592RWBCPZ-1-RL7
Signal-to-Noise Ratio (SNR) 69 dB VDD = 2.7 V, input range = 0 V to VREF
67 dB VDD = 5.5 V, input range = 0 V to VREF
61 dB VDD = 5.5 V, input range = 0 V to 2 × VREF
Signal-to-Noise-and-Distortion (SINAD) Ratio 69 dB VDD = 2.7 V, input range = 0 V to VREF
67 dB VDD = 3.3 V, input range = 0 V to VREF
60 dB VDD = 5.5 V, input range = 0 V to 2 × VREF
Total Harmonic Distortion (THD) −91 dB VDD = 2.7 V, input range = 0 V to VREF
−89 dB VDD = 3.3 V, input range = 0 V to VREF
−72 dB VDD = 5.5 V, input range = 0 V to 2 × VREF
Peak Harmonic or Spurious Noise (SFDR) 91 dB VDD = 2.7 V, input range = 0 V to VREF
91 dB VDD = 3.3 V, input range = 0 V to VREF
72 dB VDD = 5.5 V, input range = 0 V to 2 × VREF
Aperture Delay3 15 ns VDD = 3 V
12 ns VDD = 5 V
Aperture Jitter3 50 ps
Channel-to-Channel Isolation −95 dB fIN = 5 kHz
Input Capacitance 45 pF
Full Power Bandwidth 8.2 MHz At 3 dB
1.6 MHz At 0.1 dB
DAC PERFORMANCE5
Resolution 12 Bits
Output Range 0 VREF V
0 2 × VREF V
Integral Nonlinearity (INL) −1 +1 LSB
Differential Nonlinearity (DNL) −1 +1 LSB
Offset Error −3 +3 mV
Offset Error Drift3 8 µV/°C
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Data Sheet AD5592R
SPECIFICATIONS
Table 2.
Parameter Min Typ Max Unit1 Test Conditions/Comments
Gain Error ±0.2 % FSR Output range = 0 V to VREF
±0.1 % FSR Output range = 0 V to 2 × VREF
Zero Code Error 0.65 2 mV
Total Unadjusted Error ±0.03 ±0.25 % FSR Output range = 0 V to VREF
±0.015 ±0.1 Output range = 0 V to 2 × VREF
Capacitive Load (CL) Stability3 2 nF RL = ∞
10 nF RL = 1 kΩ
Resistive Load (RL) 1 kΩ
Short-Circuit Current 25 mA
DC Crosstalk3 −4 +4 µV Due to single channel, full-scale output change
DC Output Impedance 0.2 Ω
DC Power Supply Rejection Ratio (PSRR)3 0.15 mV/V DAC code = midscale, VDD = 3 V ± 10% or 5 V ± 10%
Load Impedance at Rails6 25 Ω
Load Regulation 200 µV/mA VDD = 5 V ± 10%, DAC code = midscale, −10 mA ≤ IOUT ≤
+10 mA
200 µV/mA VDD = 3 V ± 10%, DAC code = midscale, −10 mA ≤ IOUT ≤
+10 mA
Power-Up Time 7 µs Coming out of power-down mode, VDD = 5 V
DAC AC SPECIFICATIONS
Slew Rate 1.25 V/µs Measured from 10% to 90% of full scale
Settling Time 6 µs ¼ scale to ¾ scale settling to 1 LSB
DAC Glitch Impulse 2 nV-sec
DAC to DAC Crosstalk 1 nV-sec
Digital Crosstalk 0.1 nV-sec
Analog Crosstalk 1 nV-sec
Digital Feedthrough 0.1 nV-sec
Multiplying Bandwidth 240 kHz DAC code = full scale, output range = 0 V to VREF
Output Voltage Noise Spectral Density 200 nV/√Hz DAC code = midscale, output range = 0 V to 2 × VREF,
measured at 10 kHz
Signal-to-Noise Ratio (SNR) 81 dB
Peak Harmonic or Spurious Noise (SFDR) 77 dB
Signal-to-Noise-and-Distortion (SINAD) Ratio 74 dB
Total Harmonic Distortion (THD) −76 dB
REFERENCE INPUT
VREF Input Voltage 1 VDD V
DC Leakage Current −1 +1 µA No I/Ox pins configured as DACs
Reference Input Impedance 12 kΩ DAC output range = 0 V to 2 × VREF
24 kΩ DAC output range = 0 V to VREF
REFERENCE OUTPUT
VREF Output Voltage 2.495 2.5 2.505 V TA = 25°C
2.485 2.5 2.515 V TA = 25°C, AD5592RWBCPZ-RL7 and
AD5592RWBCPZ-1-RL7
VREF Temperature Coefficient 20 ppm/°C
Capacitive Load (CL) Stability 5 μF RL = 2 kΩ
Output Impedance3 0.15 Ω VDD = 2.7 V
0.7 Ω VDD = 5 V
Output Voltage Noise 10 µV p-p 0.1 Hz to 10 Hz
Output Voltage Noise Density 240 nV/√Hz TA = 25°C, f = 10 kHz, CL = 10 nF
Line Regulation 20 µV/V TA = 25°C, sweeping VDD from 2.7 V to 5.5 V
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Data Sheet AD5592R
SPECIFICATIONS
Table 2.
Parameter Min Typ Max Unit1 Test Conditions/Comments
10 µV/V TA = 25°C, sweeping VDD from 2.7 V to 3.3 V
Load Regulation
Sourcing 210 µV/mA TA = 25°C, −5 mA ≤ load current ≤ +5 mA
Sinking 120 µV/mA TA = 25°C, −5 mA ≤ load current ≤ +5 mA
Output Current Load Capability ±5 mA VDD ≥ 3 V
GPIO OUTPUT
ISOURCE, ISINK 1.6 mA
Output Voltage
High (VOH) VDD − 0.2 V ISOURCE = 1 mA
Low (VOL) 0.4 V ISINK = 1 mA
GPIO INPUT
Input Voltage VDD = 2.7 V to 5.5 V
High (VIH) 0.7 × VDD V
Low (VIL) 0.3 × VDD V
Input Capacitance 20 pF
Hysteresis 0.2 V
Input Current ±1 µA
LOGIC INPUTS
AD5592R Input Voltage VDD = 2.7 V to 5.5 V
High (VINH) 0.7 × VDD V
Low (VINL) 0.3 × VDD V
AD5592R-1 Input Voltage VLOGIC = 2.7 V to 5.5 V
High (VINH) 0.7 × VLOGIC V
Low (VINL) 0.3 × VLOGIC V
Input Current (IIN) −1 +1 µA Typically 10 nA, RESET = 1 µA typical
Input Capacitance (CIN) 10 pF
LOGIC OUTPUT (SDO)
Output High Voltage (VOH) ISOURCE = 200 µA
AD5592R VDD − 0.2 V VDD = 2.7 V to 5.5 V
AD5592R-1 VLOGIC − 0.2 VLOGIC = 2.7 V to 5.5 V
Output Low Voltage (VOL) ISINK = 200 µA
AD5592R 0.4 V VDD = 2.7 V to 5.5 V
AD5592R-1 0.4 V VLOGIC = 2.7 V to 5.5 V
Floating-State Output Capacitance 10 pF
TEMPERATURE SENSOR3
Resolution 12 Bits
Operating Range2 −40 +105 °C
−40 +125 °C AD5592RWBCPZ-RL7 and AD5592RWBCPZ-1-RL7
Accuracy ±3 °C 5 sample averaging
Track Time 5 µs ADC buffer enabled
20 µs ADC buffer disabled
POWER REQUIREMENTS
VDD 2.7 5.5 V
IDD 2.7 mA Digital inputs = 0 V or VDD, I/O0 to I/O7 configured as
DACs and ADCs, internal reference on, ADC buffer on,
DAC code = 0xFFF, range is 0 V to 2 × VREF for DACs
and ADCs
Power-Down Mode 3.5 µA
VDD = 5 V (Normal Mode) 1.6 mA I/O0 to I/O7 are DACs, internal reference, gain = 2
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Data Sheet AD5592R
SPECIFICATIONS
Table 2.
Parameter Min Typ Max Unit1 Test Conditions/Comments
1 mA I/O0 to I/O7 are DACs, external reference, gain = 2
2.4 mA I/O0 to I/O7 are DACs and sampled by the ADC, internal
reference, gain = 2
1.1 mA I/O0 to I/O7 are DACs and sampled by the ADC, external
reference, gain = 2
1 mA I/O0 to I/O7 are ADCs, internal reference, gain = 2
0.75 mA I/O0 to I/O7 are ADCs, external reference, gain = 2
0.5 mA I/O0 to I/O7 are general-purpose outputs
0.5 mA I/O0 to I/O7 are general-purpose inputs
0.5 mA I/O0 to I/O3 are general-purpose outputs, I/O4 to I/O7 are
general-purpose inputs
VDD = 3 V (Normal Mode) 1.1 mA I/O0 to I/O7 are DACs, internal reference, gain = 1
1 mA I/O0 to I/O7 are DACs, external reference, gain = 1
1.1 mA I/O0 to I/O7 are DACs and sampled by the ADC, internal
reference, gain = 1
0.78 mA I/O0 to I/O7 are DACs and sampled by the ADC, external
reference, gain = 1
0.75 mA I/O0 to I/O7 are ADCs, internal reference, gain = 1
0.5 mA I/O0 to I/O7 are ADCs, external reference, gain = 1
0.45 mA I/O0 to I/O7 are general-purpose outputs
0.45 mA I/O0 to I/O7 are general-purpose inputs
VLOGIC 1.62 VDD V AD5592R-1 only
ILOGIC 3 µA AD5592R-1 only
1 All specifications expressed in decibels are referred to full-scale input (FSR) and tested with an input signal at 0.5 dB below full scale, unless otherwise noted.
2 The minimum is the ambient temperature (TA) and the maximum is the junction temperature (TJ).
3 Guaranteed by design and characterization; not production tested.
4 See Figure 5.
5 DC specifications tested with the outputs unloaded, unless otherwise noted. Linearity calculated using a code range of 8 to 4095. There is an upper dead band of 10 mV
when VREF = VDD.
6 When drawing a load current at either rail, the output voltage headroom with respect to that rail is limited by the 25 Ω typical channel resistance of the output devices. For
example, when sinking 1 mA, the minimum output voltage = 25 Ω × 1 mA = 25 mV (see Figure 34).
TIMING CHARACTERISTICS
Guaranteed by design and characterization, not production tested; all input signals are specified with tR = tF = 5 ns (10% to 90% of VDD) and
timed from a voltage level of (VIL + VIH)/2; TA = TA, MIN to TA, MAX, unless otherwise noted.
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Data Sheet AD5592R
SPECIFICATIONS
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Data Sheet AD5592R
SPECIFICATIONS
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Data Sheet AD5592R
ABSOLUTE MAXIMUM RATINGS
TA = 25 °C, unless otherwise noted. Transient currents of up to 100 Do not use θJA, θJC, and θJB thermal resistances to perform direct
mA do not cause SCR latch-up. calculation/measurement of the die temperature because doing so
Table 5.
results in incorrect values. The thermal resistances assume 100%
of the power that is dissipated along the specified path between the
Parameter Rating
measurement points. The thermal resistances are directly depend-
VDD to GND −0.3 V to + 7 V ent on the PCB design and environment.
VLOGIC to GND −0.3 V to + 7 V
Analog Input Voltage to GND −0.3 V to VDD + 0.3 V
If direct measurement of the package is required, the ΨJT and ΨJB
values must be used because they more accurately reflect the true
AD5592R
thermal dissipation paths.
Digital Input Voltage to GND −0.3 V to VDD + 0.3 V
Digital Output Voltage to GND −0.3 V to VDD + 0.3 V θJC must only be used where an external heat sink is attached
AD5592R-1 directly to the package.
Digital Input Voltage to GND −0.3 V to VLOGIC + 0.3 V System level thermal simulation is highly recommended.
Digital Output Voltage to GND −0.3 V to VLOGIC + 0.3 V
VREF to GND −0.3 V to VDD + 0.3 V For more details about the thermal resistances, refer to JE-
Operating Temperature Range −40 °C (TA) to +125 °C (TJ) DEC51-12: Guidelines for Reporting and Using Electronic Package
Storage Temperature Range −65 °C to +150 °C Thermal Information.
Junction Temperature (TJ max) 150 °C Table 6. Thermal Resistance
Lead Temperature JEDEC industry standard Package Type θJA θJB θJC-TOP ΨJT ΨJB Unit
Soldering J-STD-020 CP-16-32 92.4 39.6 48.2 0.9 37.4 °C/W
Stresses at or above those listed under Absolute Maximum Ratings RU-16 127 60.2 42.2 2.6 59.1 °C/W
may cause permanent damage to the product. This is a stress CB-16-3 103.2 64 0 0 78 °C/W
rating only; functional operation of the product at these or any other ELECTROSTATIC DISCHARGE (ESD) RATINGS
conditions above those indicated in the operational section of this
specification is not implied. Operation beyond the maximum operat- The following ESD information is provided for handling of ESD-sen-
ing conditions for extended periods may affect product reliability. sitive devices in an ESD protected area only.
THERMAL RESISTANCE Human body model (HBM) per ANSI/ESDA/JEDEC JS-001.
Thermal performance is directly linked to printed circuit board Field induced charged device model (FICDM) per ANSI/ESDA/JE-
(PCB) design and operating environment. Careful attention to PCB DEC JS-002.
thermal design is required.
ESD Ratings for AD5592R/AD5592R-1
Thermal characteristics are specified for the worst-case conditions,
that is, a device soldered in a circuit board for surface-mount pack- Table 7. AD5592R/AD5592R-1, 16-Ball WLCSP, 16-lead LFCSP, and 16-Lead
ages. Thermal resistance values specified in Table 6 are simulated TSSOP
based on JEDEC specifications using a 2S2P thermal test board ESD Model Withstand Voltage (V) Class
(see JEDEC JESD51), except for θJC-TOP, which uses a JEDEC 1S HBM 1000 1C
test board. FICDM 1250 C3
θJA is the junction to ambient thermal resistance, measured in a ESD CAUTION
JEDEC natural convection environment.
ESD (electrostatic discharge) sensitive device. Charged devi-
θJC is the junction to case thermal resistance, measured at the cen- ces and circuit boards can discharge without detection. Although
tre of the package top surface, with an infinite heat sink attached to this product features patented or proprietary protection circuitry,
the package surface. damage may occur on devices subjected to high energy ESD.
θJB is the junction to board thermal resistance, measured at a point Therefore, proper ESD precautions should be taken to avoid
on the board 1mm from the package edge, along the package performance degradation or loss of functionality.
centre line, measured in a JEDEC θJB environment.
ΨJB is the junction to board thermal characterization parameter,
measured in a JEDEC natural convection environment.
ΨJT is the junction to package top thermal characterization parame-
ter, measured in a JEDEC natural convection environment.
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Data Sheet AD5592R
PIN CONFIGURATIONS AND FUNCTION DESCRIPTIONS
Figure 6. AD5592R 16-Ball WLCSP Pin Configuration Figure 8. AD5592R 16-Lead TSSOP Pin Configuration
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Data Sheet AD5592R
PIN CONFIGURATIONS AND FUNCTION DESCRIPTIONS
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Data Sheet AD5592R
PIN CONFIGURATIONS AND FUNCTION DESCRIPTIONS
Figure 9. AD5592R-1 16-Lead LFCSP Pin Configuration Figure 10. AD5592R-1 16-Ball WLCSP Pin Configuration
Table 9. AD5592R-1 Pin Function Descriptions
Pin No.
LFCSP WLCSP Mnemonic Description
1 B4 VDD Power Supply Input. The AD5592R-1 operates from 2.7 V to 5.5 V, and this pin must be decoupled with a 0.1 µF
capacitor to GND.
2 to 5, 8 to 10 B3, C4, C3, C2, I/O0 to I/O6 Input/Output 0 Through Input/Output 6. These pins can be independently configured as DACs, ADCs, or
D1, D4, C1 general-purpose digital inputs or outputs. The function of each pin is determined by programming the I/Ox pin
configuration registers (see Table 11 and Table 12).
6 D3 VREF Reference Input/Output. When the internal reference is enabled, the 2.5 V reference voltage is available on
this pin. A 0.1 µF capacitor connected from the VREF pin to GND is recommended to achieve the specified
performance from the AD5592R-1. When the internal reference is disabled, an external reference must be applied
to this pin. The voltage range for the external reference is 1 V to VDD.
7 D2 SDO Data Out. Logic output. The conversion results from the ADC, register reads, and temperature sensor information
are provided on this output as a serial data stream. The bits are clocked out on the rising edge of the SCLK input.
The MSB is placed on the SDO pin on the falling edge of SYNC. Because the SCLK can idle high or low, the next
bit is clocked out on the first rising edge of SCLK that follows a falling edge SCLK while SYNC is low (see Figure
4).
11 B2 I/O7 Input/Output 7. This pin can be configured as a DAC, ADC, or general-purpose digital input or output. The function
of this pin is determined by programming the I/Ox pin configuration registers (see Table 11 and Table 12). I/O7 can
also be configured as a BUSY signal to indicate when an ADC conversion is taking place (see Table 22).
12 B1 GND Ground Reference Point for All Circuitry on the AD5592R-1.
13 A1 SDI Data In. Logic input. Data to be written to the DACs and control registers is provided on this input and is clocked
into the register on the falling edge of SCLK.
14 A2 SCLK Serial Clock Input. Data is clocked into the input shift register on the falling edge of the serial clock input. Data can
be transferred at rates of up to 50 MHz when writing to the DACs. SCLK has a maximum speed of 20 MHz when
performing a conversion or clocking data from the AD5592R-1.
15 A3 VLOGIC Interface Power Supply. The voltage of this pin ranges from 1.62 V to 5.5 V.
16 A4 SYNC Synchronization. Active low control input. SYNC is the frame synchronization signal for the input data. When
SYNC goes low, data is transferred in on the falling edges of the next 16 clocks.
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Data Sheet AD5592R
TYPICAL PERFORMANCE CHARACTERISTICS
Figure 11. ADC INL, VDD = 5.5 V Figure 14. ADC DNL, VDD = 2.7 V
Figure 12. ADC DNL, VDD = 5.5 V Figure 15. Histogram of ADC Codes, VDD = 2.7 V
Figure 13. ADC INL, VDD = 2.7 V Figure 16. Histogram of ADC Codes, VDD = 5.5 V
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Data Sheet AD5592R
TYPICAL PERFORMANCE CHARACTERISTICS
Figure 17. ADC Multiplying Bandwidth Figure 20. DAC Adjacent Code Glitch
Figure 18. DAC INL Figure 21. DAC Digital-to-Analog Glitch (Rising)
Figure 19. DAC DNL Figure 22. DAC Digital-to-Analog Glitch (Falling)
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Data Sheet AD5592R
TYPICAL PERFORMANCE CHARACTERISTICS
Figure 23. DAC Settling Time (100 Code Change, Rising Edge) Figure 26. DAC Settling Time, Output Range = 0 V to 2 × VREF
Figure 24. DAC Settling Time (100 Code Change, Falling Edge) Figure 27. DAC Settling Time for Various Capacitive Loads
Figure 25. DAC Settling Time, Output Range = 0 V to VREF Figure 28. DAC Sine Wave Output, Output Range = 0 V to 2 × VREF,
Bandwidth = 0 Hz to 20 kHz
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Data Sheet AD5592R
TYPICAL PERFORMANCE CHARACTERISTICS
Figure 29. DAC Sine Wave Output, Output Range = 0 V to VREF, Bandwidth = Figure 32. DAC Output Noise Spectral Density (NSD)
0 Hz to 20 kHz
Figure 33. DAC Output Sink and Source Capability, Output Range = 0 V to
Figure 30. DAC 1/f Noise with External Reference VREF
Figure 31. DAC 1/f Noise with Internal Reference Figure 34. DAC Output Sink and Source Capability, Output Range = 0 V to 2 ×
VREF
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Data Sheet AD5592R
TYPICAL PERFORMANCE CHARACTERISTICS
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Data Sheet AD5592R
TERMINOLOGY
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Data Sheet AD5592R
TERMINOLOGY
Gain Temperature Coefficient DC crosstalk due to load current change is a measure of the impact
that a change in load current on one DAC has to another DAC kept
Gain temperature coefficient is a measurement of the change in at midscale. It is expressed in μV/mA.
gain error with changes in temperature. It is expressed in ppm of
FSR/°C. Digital Crosstalk
Offset Error Digital crosstalk is the glitch impulse transferred to the output of one
DAC at midscale in response to a full-scale code change (all 0s
Offset error is a measurement of the difference between VOUT to all 1s and vice versa) in the input register of another DAC. It is
(actual) and VOUT (ideal), expressed in mV, in the linear region of measured in standalone mode and is expressed in nV-sec.
the transfer function. Offset error can be negative or positive.
Analog Crosstalk
DC Power Supply Rejection Ratio (PSRR)
Analog crosstalk is the glitch impulse transferred to the output of
PSRR indicates how the output of the DAC is affected by changes one DAC due to a change in the output of another DAC. It is
in the supply voltage. PSRR is the ratio of the change in VOUT to a measured by loading one of the input registers with a full-scale
change in VDD for a full-scale output of the DAC. It is measured in code change (all 0s to all 1s and vice versa), then executing a
mV/V. VREF is held at 2 V, and VDD is varied by ±10%. software LDAC (see Table 21), and monitoring the output of the
Output Voltage Settling Time DAC whose digital code was not changed. The area of the glitch is
expressed in nV-sec.
Output voltage settling time is the amount of time it takes for the
output of a DAC to settle to a specified level for a ¼ to ¾ full-scale DAC-to-DAC Crosstalk
input change and is measured from the rising edge of SYNC. DAC-to-DAC crosstalk is the glitch impulse transferred to the output
Digital-to-Analog Glitch Impulse of one DAC due to a digital code change and subsequent analog
output change of another DAC. It is measured by loading the attack
Digital-to-analog glitch impulse is the impulse injected into the channel with a full-scale code change (all 0s to all 1s and vice
analog output when the input code in the DAC register changes versa), using the write to and update commands while monitoring
state. It is normally specified as the area of the glitch in nV-sec, and the output of the victim channel that is at midscale. The energy of
is measured when the digital input code is changed by 1 LSB at the the glitch is expressed in nV-sec.
major carry transition (0x7FF to 0x800).
Multiplying Bandwidth
Digital Feedthrough
The amplifiers within the DAC have a finite bandwidth; the multiply-
Digital feedthrough is a measure of the impulse injected into the ing bandwidth is a measure of this. A sine wave on the reference
analog output of the DAC from the digital inputs of the DAC, but (with full-scale code loaded to the DAC) appears on the output.
is measured when the DAC output is not updated. It is specified in The multiplying bandwidth is the frequency at which the output
nV-sec, and measured with a full-scale code change on the data amplitude falls to 3 dB below the input.
bus, that is, from all 0s to all 1s and vice versa.
Voltage Reference Temperature Coefficient
Reference Feedthrough (TC)
Reference feedthrough is the ratio of the amplitude of the signal at Voltage reference TC is a measure of the change in the reference
the DAC output to the reference input when the DAC output is not output voltage with a change in temperature. The voltage reference
being updated. It is expressed in dB. TC is calculated using the box method, which defines the TC as the
Noise Spectral Density maximum change in the reference output over a given temperature
range expressed in ppm/°C, as follows:
Noise spectral density is a measurement of the internally generated VREF MAX − VREF MIN
random noise. Random noise is characterized as a spectral density TC = VREF NOM × Temp Range × 106 (3)
(nV/√Hz). It is measured by loading the DAC to midscale and
measuring noise at the output. It is measured in nV/√Hz. where:
VREF(MAX) is the maximum reference output measured over the total
DC Crosstalk temperature range.
DC crosstalk is the dc change in the output level of one DAC in VREF(MIN) is the minimum reference output measured over the total
response to a change in the output of another DAC. It is measured temperature range.
with a full-scale output change on one DAC (or soft power-down VREF(NOM) is the nominal reference output voltage, 2.5 V.
and power-up) while monitoring another DAC maintained at mid- Temp Range is the specified temperature range of −40°C to
scale. It is expressed in μV. +125°C.
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Data Sheet AD5592R
THEORY OF OPERATION
Output Buffer
The output buffer is designed as an input/output rail-to-rail buffer.
The output buffer can drive 2 nF capacitance with a 1 kΩ resistor
in parallel. The slew rate is 1.25 V/µs with a ¼ to ¾ scale settling
time of 6 µs. By default, the DAC outputs update directly after data
has been written to the input register. The LDAC register is used to
delay the updates until additional channels have been written to, if
Figure 38. Internal Block Diagram of the DAC Architecture required. See the Readback and LDAC Mode Register section for
more information.
The DAC channels have a shared gain bit that sets the output
range as 0 V to VREF or 0 V to 2 × VREF. Because the gain bit
DAC Output Range
is shared by all channels, it is not possible to set different output
ranges on a per channel basis. The input coding to the DAC is The DAC output voltage range can be configured to 0 V to VREF
straight binary. The ideal output voltage is given by (gain = 1) or 0 V to 2 × VREF (gain = 2) using the DAC range bit
of the general-purpose control register, as shown in Figure 40 and
D
VOUT = G × VREF × (4) Figure 41, respectively. When VREF = VDD, the 0 V to 2 × VREF
2N
range does not allow the DAC to swing the output beyond VDD.
where:
D is the decimal equivalent of the binary code (0 to 4095) that is
loaded to the DAC register.
G = 1 for an output range of 0 V to VREF, or G = 2 for an output
range of 0 V to 2 × VREF. N = 12.
Resistor String
The simplified segmented resistor string DAC structure is shown
in Figure 39. The code loaded to the DAC register determines the
switch on the string that is connected to the output buffer.
Because each resistance in the string has the same value, R, the
string DAC is guaranteed monotonic.
Figure 40. Output Voltage Range of the DAC with Gain = 1 (Unloaded
Condition)
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Data Sheet AD5592R
THEORY OF OPERATION
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Data Sheet AD5592R
THEORY OF OPERATION
GPIO SECTION that this result is not confused with the readback from the DAC0
channel. The temperature conversion takes 5 µs with the ADC
Each of the eight I/Ox pins can be configured as a general-purpose buffer enabled and 20 µs when the buffer is disabled. Calculate the
digital input pin by programming the GPIO read configuration regis- temperature by using the following formulae:
ter (see the GPIO Read Configuration Register section) or as a
digital output pin by programming the GPIO write configuration reg- For ADC gain = 1,
ister (see the GPIO Write Configuration Register section). When an ADC Code − 0.5 / VREF × 4095
I/Ox pin is configured as an output, the pin can be set high or low Temperature (°C) = 25 + 2.654 × 2.5 / VREF
by programming the GPIO write data register (see the GPIO Write
Data Register section). Logic levels for general-purpose outputs are For ADC gain = 2,
relative to VDD and GND. When an I/Ox pin is configured as an
Temperature (°C) =
input, its status can be determined by setting Bit 10 in the GPIO ADC Code − 0.5 / 2 × VREF × 4095
read configuration register. The next SPI operation clocks out the 25 + 1.327 × 2.5 / VREF
state of the GPIO pins. When an I/Ox pin is set as an output, it is
possible to read its status by also setting it as an input pin. When The range of codes returned by the ADC when reading from the
reading the status of the I/Ox pins set as inputs, the status of an temperature indicator is approximately 645 to 1084 (for ADC gain
I/Ox pin set as both an input and output pin is also returned. = 1), corresponding to a temperature between −40°C (TA) and
+125°C (TJ). The accuracy of the temperature indicator, averaged
INTERNAL REFERENCE over five samples, is typically 3°C.
The AD5592R/AD5592R-1 contain an on-chip 2.5 V reference.
The reference is powered down by default and is enabled by
setting Bit 9 in the power-down/reference control register (see
the Power-Down/Reference Control Register section). When the
on-chip reference is powered up, the reference voltage appears on
the VREF pin and may be used as a reference source for other com-
ponents. When the internal reference is used, it is recommended to
decouple the internal reference to GND using a 100 nF capacitor.
It is recommended that the internal reference be buffered before
using it elsewhere in the system. When the reference is powered
down, an external reference must be connected to the VREF pin.
Suitable external reference sources for the AD5592R/AD5592R-1
include the AD780, AD1582, ADR431, REF193, and ADR391.
RESET FUNCTION
The AD5592R has an asynchronous RESET pin. For normal oper-
ation, RESET is tied high. A falling edge on RESET resets all
registers to their default values and reconfigures the I/Ox pins to
their default values (85 kΩ pull-down to GND). The reset function
takes 250 µs maximum; do not write new data to the AD5592R
during this time. The AD5592R has a software reset that performs
the same function as the RESET pin. The reset function is activated
by writing 0x5AC to the software reset register (see the Software
Reset Register section).
TEMPERATURE INDICATOR
The AD5592R/AD5592R-1 contain an integrated temperature indi-
cator, which can be read to provide an estimation of the die tem-
perature. The temperature reading can be used in fault detection
where a sudden rise in die temperature may indicate a fault condi-
tion such as a shorted output. Temperature readback is enabled by
setting Bit 8 in the ADC sequence register (see the ADC Sequence
Register section) to 1. The temperature result is then added to the
ADC sequence. The temperature result has an address of 0b1000
(see the Temperature Reading Format section, Table 31); take care
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Data Sheet AD5592R
SERIAL INTERFACE
The AD5592R/AD5592R-1 have a serial interface (SYNC, SCLK, Bits[14:12] select which DAC is addressed. Bits[11:0] are the 12-bit
SDI, and SDO), which is compatible with SPI standards, as well as data loaded to the selected DAC, with Bit 11 being the MSB of
with most DSPs. The input shift register is 16 bits wide (see Table the DAC data. Table 13 shows the control register map for the
10). The MSB (Bit 15) determines what type of write function is AD5592R/AD5592R-1. The register map allows the operation of
required. When Bit 15 is 0, a write to the control register is selected. each of the I/Ox pins to be configured. ADCs can be selected for
The control register address is selected by Bits[14:11]. Bits[10:9] inclusion in sampling sequences. DACs can be updated individually
are reserved and are 0s. Bits[8:0] set the data that is written to or simultaneously (see the LDAC Mode Operation section). GPIO
the selected control register. When Bit 15 is 1, data is written to a settings are also controlled via the register map.
DAC channel (assuming that channel has been set to be a DAC).
Table 10. Input Shift Register Format
MSB LSB
15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0
0 Control register address 0 0 Control register data
1 DAC address 12-bit DAC data
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Data Sheet AD5592R
SERIAL INTERFACE
POWER-UP TIME have the additional option of being configured as push/pull or open-
drain. The input/output channels are configured by writing to the
When power is applied to the AD5592R/AD5592R-1, the power-on appropriate configuration registers, as shown in Table 11 and Table
reset block begins to configure the device and to load the registers 12 (see the Register Map section). To assign a particular function to
with their default values. The configuration process takes 250 µs; an input/output channel, the user writes to the appropriate register
do not write to any of the registers during this time. and sets the corresponding bit to 1. For example, setting Bit 0 in
WRITE MODE the DAC configuration register to 1 configures I/O0 as a DAC (see
Table 19). See the Register Map section for details.
Figure 4 shows the read and write timing for the AD5592R/
AD5592R-1. A write sequence begins by bringing the SYNC line In the event that the bit for an input/output channel is set in multiple
low. Data on SDI is clocked into the 16-bit shift register on the configuration registers, the input/output channel takes the function
falling edge of SCLK. After the 16th falling clock edge, the last dictated by the last write operation. The exceptions to this rule
data bit is clocked in. SYNC is brought high, and the programmed are that an I/Ox pin can be set as both a DAC and an ADC or
function is executed (that is, a change in a DAC input register or as a digital input and output. When an I/Ox pin is configured as
a change in a control register). SYNC must be brought high for a DAC and ADC, its primary function is as a DAC, and the ADC
a minimum of 20 ns before the next write. All interface pins must can measure the voltage being provided by the DAC. This feature
be operated close to the VDD or VLOGIC rails to minimize power can monitor the output voltage to detect short circuits or overload
consumption in the digital input buffers. conditions.
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Data Sheet AD5592R
SERIAL INTERFACE
Table 12. Bit Descriptions for the I/Ox Pin Configuration Registers
Bit(s) Bit Name Description
15 MSB Set this bit to 0.
[14:11] Register address Selects which pin configuration register is addressed.
0100: ADC pin configuration.
0101: DAC pin configuration.
0110: pull-down configuration (default condition at power-up).
1000: GPIO write configuration.
1010: GPIO read configuration.
1100: GPIO open-drain configuration.
1101: three-state configuration.
[10:8] Reserved Reserved. Set these bits to 0.
[7:0] IO7 to IO0 Enable register function on selected I/Ox pin.
0: no function selected.
1: set the selected I/Ox pin to the register function.
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Data Sheet AD5592R
SERIAL INTERFACE
GENERAL-PURPOSE CONTROL REGISTER midscale. The input data is then read back. Bits[14:12] contain the
address of the DAC register being read back, and Bit 15 is 1 (see
The general-purpose control register (see the General-Purpose Table 32).
Control Register section) enables or disables certain functions
associated with the DAC, ADC, and I/Ox pin configuration (see
Table 17). The general-purpose control register sets the gain of the
DAC and ADC. Bit 5 sets the input range for the ADC, and Bit 4
sets the output range of the DAC.
The general-purpose control register also enables/disables the
ADC buffer and precharge function (see the ADC Section section
for more details). The register can also be used to lock the I/Ox pin
configuration to prevent accidental change. When Bit 7 (IO_LOCK
bit) is set to 1, writes to the configuration registers are ignored.
DAC WRITE OPERATION Figure 44. DAC Readback Operation
To set a pin as a DAC, set the appropriate bit in the DAC pin
configuration register to 1 (see Table 19). For example, setting Bit ADC OPERATION
0 to 1 enables I/O0 as a DAC output. Data is written to a DAC To set a pin as an ADC, set the appropriate bit in the ADC pin
when the MSB (Bit 15) of the serial write is 1. Bits[14:12] determine configuration register to 1 (see Table 18). For example, setting Bit
which DAC is addressed, and Bits[11:0] contain the 12-bit data to 0 to 1 enables I/O0 as an ADC input. The ADC channels of the
be written to the DAC, as shown in Table 29. Data is written to AD5592R/AD5592R-1 operate as a traditional multichannel ADC,
the selected DAC input register. Data written to the input register where each serial transfer selects the next channel for conversion.
can be automatically copied to the DAC register, if required. Data is Writing to the ADC sequence register (see the ADC Sequence
transferred to the DAC register based on the setting of the LDAC Register section and Table 16) selects the ADC channels to be
mode register (see Table 21). included in the sequence, and the REP bit determines if the se-
quence is repeated. The SYNC signal is used to frame the write
LDAC Mode Operation to the converter on the SDI pin. The data that appears on the
SDO pin during the initial write to the ADC sequence register is
When the LDAC mode bits (Bits[1:0]) are 00 respectively, new
invalid. When the sequence register is written to, the ADC begins
data is automatically transferred from the input register to the DAC
to track the first channel in the sequence. Tracking takes 500 ns;
register, and the analog output updates. When the LDAC mode
do not initiate a conversion until this time has passed. The next
bits are 01, data remains in the input register. This LDAC mode
SYNC falling edge initiates a conversion on the selected channel.
allows writes to input registers without affecting the analog outputs.
The subsequent SYNC falling edge begins clocking out the ADC
When the input registers have been loaded with the desired val-
result and also initiates the next conversion. The ADC operates
ues, setting the LDAC mode bits to 10 transfers the values in
with one cycle latency. Thus, the conversion result corresponding
the input registers to the DAC registers, and the analog outputs
to each conversion is available one serial read cycle after the cycle
update simultaneously. The LDAC mode bits then revert back to 01,
in which the conversion was initiated. Note that for a valid ADC
assuming their previous setting was 01 (see Table 21).
conversion, the first falling edge of SCLK must occur within the time
DAC READBACK t4 (mentioned in Table 3 and Table 4) after every falling edge of
SYNC (see Figure 5).
The input register of each DAC can be read back via the SPI
interface. Reading back the DAC register value can be used to If more than one channel is selected in the ADC sequence register,
confirm that the data was received correctly before writing to the the ADC converts all selected channels sequentially in ascending
LDAC register, or to check what value was last loaded to a DAC. order on successive SYNC falling edges. Once all the selected
Data can only be read back from a DAC when there is no ADC channels in the sequence register are converted, the ADC repeats
conversion sequence taking place. the sequence if the REP bit is set. If the REP bit is clear, the ADC
goes three-state. Figure 45 to Figure 48 show typical ADC modes
To read back a DAC input register, it is first necessary to enable of operation. I/O7 can be configured as a BUSY output pin to indi-
the readback function and select which DAC register is required. cate when a conversion result is available. BUSY goes low while a
This is achieved by writing to the DAC read back register (see Table conversion takes place and goes high when the conversion result is
15). Set the Bits[4:3] to 11 to enable the readback function. Bits[2:0] available. The conversion result is clocked out on the SDO pin on
select which DAC data is required. The DAC data is clocked out of the following read/write operation. For an ADC conversion, Bit 15 is
the AD5592R/AD5592R-1 on the subsequent SPI operation. Figure 0, Bits[14:12] contain the ADC address, and Bits[11:0] contain the
44 shows an example of setting I/O3, configured as a DAC, to
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Data Sheet AD5592R
SERIAL INTERFACE
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Data Sheet AD5592R
SERIAL INTERFACE
Changing an ADC Sequence As the command to stop the sequence is written, an ADC conver-
sion is also taking place. This conversion must finish before a new
The channels included in an ADC sequence can be changed by sequence can be written to the ADC sequence register. Allow a
first stopping an existing conversion sequence (see Figure 49). The minimum of 2 µs between starting the write to end the current
ADC conversion sequence is stopped by clearing the REP, TEMP, sequence and starting the write to select a new sequence. After
and ADC7 to ADC0 bits in the ADC sequence register (see the selecting the new sequence, allow an ADC track time of 500 ns
ADC Sequence Register section) to 0. before initiating the next conversion.
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Data Sheet AD5592R
SERIAL INTERFACE
ADC Conversion Result Table 26). When in an open-drain configuration, the output is driven
to GND when a data bit in the GPIO write data register sets the
For every selected channel in the ADC sequencer, the ADC conver- pin low. When the pin is set high, the output is not driven and must
sion result is clocked out on SDO in the format given in Table 30. be pulled high by an external resistor. Open-drain configuration
The ADC channel address is provided along with the 12-bit ADC allows for multiple output pins to be tied together. If all the pins
data for every valid ADC conversion result. Use the ADC channel are normally high, the open-drain configuration allows for one pin
address while assigning the ADC data for further processing. to pull down the others pins. This method is commonly used where
GPIO OPERATION multiple pins are used to trigger an alarm or an interrupt pin.
Each of the I/Ox pins of the AD5592R/AD5592R-1 can operate as To change the state of the I/Ox pins, a write to the GPIO write data
a general-purpose, digital input or output pin. The function of the register (see the GPIO Write Data Register section) is required.
pins is determined by writing to the appropriate bit in the GPIO read Setting a bit to 1 gives a Logic 1 on the selected output. Clearing a
configuration register (see the GPIO Read Configuration Register bit to 0 gives a Logic 0 on the selected output.
section) and the GPIO write configuration register (see the GPIO
Write Configuration Register section). Setting Pins as Inputs
To set a pin as a general-purpose input, set the appropriate bit in
Setting Pins as Outputs the GPIO read configuration register to 1 (see the GPIO Read Con-
To set a pin as a general-purpose output, set the appropriate bit figuration Register section and Table 24). For example, setting Bit
in the GPIO write configuration register to 1 (see Table 22). For 0 to 1 enables I/O0 as a general-purpose input. To read the state
example, setting Bit 0 to 1 enables I/O0 as a general-purpose of the general-purpose inputs, write to the GPIO read configuration
output. The state of the output pin is controlled by setting or register to set Bit 10 to 1 and also any of Bits[7:0] that correspond
clearing the bits in the GPIO write data register (see the GPIO Write to a general-purpose input pin. The following SPI operation clocks
Data Register section and Table 23). A data bit is ignored if it is out the state of any pins set as general-purpose inputs. Figure 50
written to a location that is not configured as an output. shows an example where I/O4 to I/O7 are set as general-purpose
inputs. I/O3 is assumed to be a DAC. To read the status of I/O7 to
The outputs can be independently configured as push/pull or open- I/O4, Bit 10 and Bits[7:4] are set to 1. To read the status of I/O5 and
drain outputs. When in a push/pull configuration, the output is I/O4, only Bit 10, Bit 5, and Bit 4 need to be set to 1. The status
driven to VDD or GND, as determined by the data in the GPIO of I/O7 and I/O6 are not read, and Bits[7:6] are read as 0. Figure
write data register. To set a pin as an open-drain output, set the 50 also has a write to a DAC to show that other operations can be
appropriate bit in the GPIO open-drain configuration register to included when reading the status of the general-purpose pins.
1 (see the GPIO Open-Drain Configuration Register section and
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Data Sheet AD5592R
SERIAL INTERFACE
THREE-STATE PINS register. See the LDAC Mode Operation section for details of the
LDAC mode function.
The I/Ox pins can be set to three-state by writing to the three-state
configuration register, as shown in the Three-State Configuration
Register section and Table 27.
85 KΩ PULL-DOWN RESISTOR PINS
The I/Ox pins can be connected to GND via a pull-down resistor
(85 kΩ) by setting the appropriate bits in the pull-down configuration
register, as shown in the Pull-Down Configuration Register section
and Table 20.
POWER-DOWN MODE
The AD5592R/AD5592R-1 have a power configuration register to
reduce the power consumption when certain functions are not
needed. The power-down register allows any channels set as
DACs to be individually placed in a power-down state. When in a
power-down state, the DAC outputs are three-state. When a DAC
channel is put back into normal mode, the DAC output returns to
its previous value. The internal reference and its buffer are powered
down by default and are enabled by setting the EN_REF bit in the
power-down register. The internal reference voltage then appears
at the VREF pin.
There is no dedicated power-down function for the ADC, but the
ADC is automatically powered down if none of the I/Ox pins are
selected as ADCs. The PD_ALL bit powers down all the DACs, the
reference and its buffer, and the ADC simultaneously. The Power-
Down/Reference Control Register section shows the power-down
register.
RESET FUNCTION
The AD5592R/AD5592R-1 can be reset to their default conditions
by writing to the software reset register, as shown in the Software
Reset Register section and Table 28. This write resets all registers
to their default values and reconfigures the I/Ox pins to their default
values (85 kΩ pull-down resistor to GND). The reset function
takes 250 µs maximum; do not write new data to the AD5592R/
AD5592R-1 during this time. The AD5592R has a RESET pin that
performs the same function. For normal operation, RESET is tied
high. A falling edge on RESET triggers the reset function.
READBACK AND LDAC MODE REGISTER
The values contained in the AD5592R/AD5592R-1 registers can be
read back to ensure that the registers are correctly set up. The
register readback is initiated by writing to the configuration register
readback and LDAC mode register (see the Configuration Register
Readback and LDAC Mode Register section and Table 21) with Bit
6 set to 1. Bits[5:2] select which register is to be read back. The
register data is clocked out of the AD5592R/AD5592R-1 on the next
SPI transfer.
Bits[1:0] of the configuration register readback and LDAC mode
register select the LDAC mode. The LDAC mode determines if
data written to a DAC input register is also transferred to the DAC
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Data Sheet AD5592R
APPLICATIONS INFORMATION
MICROPROCESSOR INTERFACING can also be used. This method is the same as when using the
ADSP-BF531.
Microprocessor interfacing to the AD5592R/AD5592R-1 is via a
serial bus that uses a standard protocol compatible with DSPs and
microcontrollers. The communications channel requires a 4-wire
interface consisting of a clock signal, a data input signal, a data
output signal, and a synchronization signal. The devices require a
16-bit data-word with data valid on the falling edge of SCLK.
AD5592R/AD5592R-1 TO SPI INTERFACE
The SPI interface of the AD5592R/AD5592R-1 is designed to be
easily connected to industry-standard DSPs and microcontrollers.
Figure 51 shows the AD5592R/AD5592R-1 connected to the Ana-
log Devices, Inc., ADSP-BF531 Blackfin® DSP. The Blackfin has an
integrated SPI port that can be connected directly to the SPI pins of
the AD5592R/AD5592R-1.
LAYOUT GUIDELINES
In any circuit where accuracy is important, careful consideration
of the power supply and ground return layout helps to ensure the
rated performance. The printed circuit board (PCB) on which the
AD5592R or the AD5592R-1 is mounted must be designed so that
the AD5592R/AD5592R-1 lie on the analog plane.
The AD5592R/AD5592R-1 must have ample supply bypassing of
10 µF in parallel with 0.1 µF on each supply, located as close to the
package as possible, ideally right up against the device. The 10 µF
Figure 51. ADSP-BF531 SPI Interface capacitors are the tantalum bead type. The 0.1 µF capacitor must
have low effective series resistance (ESR) and low effective series
AD5592R/AD5592R-1 TO SPORT INTERFACE inductance (ESI). Ceramic capacitors, for example, provide a low
The Analog Devices ADSP-BF527 has two serial ports (SPORT). impedance path to ground at high frequencies to handle transient
Figure 52 shows how a SPORT interface can be used to control currents due to internal logic switching.
the AD5592R/AD5592R-1. The ADSP-BF527 has an SPI port that
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Data Sheet AD5592R
REGISTER MAP
The AD5592R/AD5592R-1 has programmable user configuration The Data Format Details: AD5592R/AD5592R-1 ADC and DAC
registers that are used to configure the device. Table 13 shows a Readback section provides data formats for the ADC and the DAC
complete list of the user configuration registers. See the Register readback.
Details: AD5592R/AD5592R-1 Control Register Map section for
details about the functions of each of the bits.
REGISTER SUMMARY: AD5592R/AD5592R-1 CONTROL REGISTER MAP
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Data Sheet AD5592R
REGISTER MAP
NOP Register
Name: NOP
No operation.
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Data Sheet AD5592R
REGISTER MAP
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Data Sheet AD5592R
REGISTER MAP
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Data Sheet AD5592R
REGISTER MAP
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Data Sheet AD5592R
REGISTER MAP
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Data Sheet AD5592R
REGISTER MAP
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Data Sheet AD5592R
REGISTER MAP
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Data Sheet AD5592R
REGISTER MAP
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Data Sheet AD5592R
REGISTER MAP
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Data Sheet AD5592R
REGISTER MAP
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Data Sheet AD5592R
REGISTER MAP
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Data Sheet AD5592R
REGISTER MAP
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Data Sheet AD5592R
REGISTER MAP
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Data Sheet AD5592R
REGISTER MAP
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Data Sheet AD5592R
REGISTER MAP
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Data Sheet AD5592R
REGISTER MAP
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Data Sheet AD5592R
REGISTER MAP
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Data Sheet AD5592R
OUTLINE DIMENSIONS
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Data Sheet AD5592R
OUTLINE DIMENSIONS
EVALUATION BOARDS
Model1 Description
EVAL-AD5592R-1SDZ Evaluation Board
EVAL-SDP-CB1Z Controller Board
1 Z = RoHS Compliant Part.
AUTOMOTIVE PRODUCTS
The AD5592RW and AD5592RW-1 models are available with controlled manufacturing to support the quality and reliability requirements
of automotive applications. Note that these automotive models may have specifications that differ from the commercial models; therefore,
designers should review the Specifications section of this data sheet carefully. Only the automotive grade products shown are available for use
in automotive applications. Contact your local Analog Devices account representative for specific product ordering information and to obtain the
specific Automotive Reliability reports for these models.
©2014-2022 Analog Devices, Inc. All rights reserved. Trademarks and Rev. G | 54 of 54
registered trademarks are the property of their respective owners.
One Analog Way, Wilmington, MA 01887-2356, U.S.A.