4.
Density of States /
Fermi-Dirac Statistics
• Calculation of density of states
• Density of states for specific materials
• Characterization of effective mass
• Rules of filling electronic states
• Derivation of Fermi‐Dirac Statistics
• Intrinsic carrier concentration
• Potential, field, and charge
• E‐k diagram vs. band‐diagram
Suggested readings: Pierret Ch. 4, Neamen Ch. 3, Ch.4.1
EE 5530 C. F. Huang 1
Carrier Density
Carrier number = Number of states x filling factor
Carrier = moving charges in semiconductors
Total number of occupants
= Number of apartments
x The fraction occupied
EE 5530 C. F. Huang 2
Density of States
How many density of states per unit energy?
∆k
States between E1 + ∆E & E1 = 2 × ( + k and − k )
δk
∆k
= 2×
2π / Na
States per unit energy @ E1
Na ∆k
=
π ∆E
EE 5530 C. F. Huang 3
1D DOS
L
Na ∆k Na dk
States per unit energy
= =
π ∆E π dE
L
2k 2 2m∗ ( E − E0 )
E − E=
0 k
⇒=
2m ∗
2
m*
dk m∗
=
dE 2 2 ( E − E0 )
States per unit energy per unit length
1 dk 1 m∗
≡ DOS = =
π dE π 2 2 ( E − E0 )
=2π/L ×2 if spin is considered
EE 5530 C. F. Huang 4
1D DOS (continued)
∫
Band I
DOS ( E )dE = constant
EE 5530 C. F. Huang 5
2D DOS
Show that 2D DOS is a constant independent of energy!
EE 5530 C. F. Huang 6
3D DOS
States between E1 + ∆E & E1
4 4 3
π (k + ∆k ) − π k
3
V 2
=2( spin ) × 3 3 = k ∆k
2π 2π 2π π 2
L W H
V ∆k
States per unit energy @ E1 = 2 k 2
π ∆E
2 2
2kx2 k y 2kz 2 2k 2
2
k 2
2m ( E − E0 )
∗
dk m ∗
E − E= + + =
E − E=
0 k
⇒= 2
⇒ =
0
2 m∗ 2 m∗ 2 m∗ 2 m∗
2m ∗
dE 2 2 ( E − E0 )
States per unit energy per unit volume
m∗
≡ DOS (3D=
) 2 m ∗
( E − E0 )
π
2 3
EE 5530 C. F. Huang 7
3D DOS(continued)
EE 5530 C. F. Huang 8
DOS of GaAs
Conduction band
mn∗ 2mn∗ ( E − Ec )
gc ( E ) =
π 2 3
Valence band
m∗ 2 m∗ ( E − E )
hh hh v
π 2 3
gv ( E ) =
mlh∗ 2mlh∗ ( E − Ev )
π 2 3
EE 5530 C. F. Huang 9
Ellipsoidal Bands and DOS
2 k12 2 k22 2 k32
E − Ec= + + β
2m1 2mt
∗ ∗
2mt∗
α
2 2 2
k k k
1= 1
+ + 2 3
β
2ml∗ ( E − Ec ) 2mt∗ ( E − Ec ) 2mt∗ ( E − Ec )
2 2 2 X Nel
k12 k22 k32
= + +
α 2
β 2
β2
4 4 3 keff
2
Volume
= k − space N
= el παβ π keff
3 3
transform with volume conserved
3
4 2m ( E − EC ) 2m ( E − Ec ) 2m ( E − Ec ) 4 2mn∗ ( E − Ec )
∗ ∗ ∗
N el π l
≡ π
t t
3 2 2 2 3 2
2 ∗2 1
m = N el (m m )
∗
n
3 ∗
l t
3
Density of states effective mass
EE 5530 C. F. Huang 10
DOS of Ge
N
= el 8=
/2 4
2 ∗2 1
m = 4 (m m )
∗
n
3 ∗
l t
3
Conduction band
mn∗ 2mn∗ ( E − Ec )
gc ( E ) =
π 2 3
EE 5530 C. F. Huang 11
DOS of Si
N el = 6
2 ∗2 1
m = 6 (m m )
∗
n
3 ∗
l t
3
Conduction band
mn∗ 2mn∗ ( E − Ec )
gc ( E ) =
π 2 3
EE 5530 C. F. Huang 12
DOS in valence band
Valence band
( E − Ev ) mlh∗ 2mlh∗ ( E − Ev ) m p 2m p ( E − Ev )
∗ ∗
∗
mhh 2mhh
∗
gv ( E ) = + =
π
2 3
π
2 3
π 2 3
∗ 3/ 2
=m∗p [(mhh ) + (mlh∗ )3/ 2 ]2 / 3
EE 5530 C. F. Huang 13
Carrier Density
Carrier number = Number of states x filling factor
DOS
EE 5530 C. F. Huang 14
E‐k diagram and Electronic States
Number of
states per
E-k diagram Density of states unit energy
per unit
volume
EE 5530 C. F. Huang 15
Rules for filling up the States
In equilibrium
• Pauli Principle: Only one electron per state
• Total number of electrons is conserved NT = ∑i Ni
• Total energy of the system is conserved ET = ∑ i Ei N i
EE 5530 C. F. Huang 16
Derivation of Fermi‐Dirac Statistics
Considering an illustrative example: 3 Energy Levels
NT
= ∑
= N 5i i
=ET ∑
= E N 12
i i i
2! 5! 7! 2! 5! 7 ! 2! 5! 7!
W203 = ⋅ ⋅ W122 = ⋅ ⋅ W041 = ⋅ ⋅
1!2 ! 0!5! 3! 4! 1!1! 2!3! 5!2! 0!2 ! 4!1! 6!1!
= 35 = 420 = 35
Most probable!
EE 5530 C. F. Huang 17
Occupation Statistics
EE 5530 C. F. Huang 18
Occupancy probability
f(E): Occupancy probability at E
EE 5530 C. F. Huang 19
For general cases
For Si‐states with Ni stated being occupied
maximum
Si !
W =∏ 2! 5! 7!
i ( Si − N i )! N i ! recall that W122 = ⋅ ⋅
1!1! 2!3! 5!2!
ln(W
= ) ∑ [ln S !− ln( S
i
i i − N i )!− ln N i !]
Stirling approx.
≅ ∑ [ Si ln Si − Si − ( Si − N i )ln( Si − N i ) + ( Si − N i ) − N i ln N i + N i ]
i
= ∑ [ S ln S − ( S
i
i i i − N i )ln( Si − N i ) − N i ln N i ]
EE 5530 C. F. Huang 20
Find Max. with Lagrange‐Multiplier
dln(W )=0
∂lnW
dln(W )= ∑ dN i since
= NT ∑
= N i i constant
∂N i
→ ∑ i dN i =
i
0
Si
= ∑ ln − 1 dN i − α ∑ dN i − β ∑ Ei dN i
Ni
i i i
since
= ET ∑
=i
EN i i constant
Si
∑i ln N − 1 − α − β Ei dN i → ∑ i Ei dN i =
0
i
=0
EE 5530 C. F. Huang 21
Continued
Si
ln − 1 − α − β Ei =
0
Ni
N 1
f (E) ≡ i = α +β E
Si 1 + e
f max = 1
1
at E EF , f ( EF ) ≡
= ⇒α= + β EF 0
2
Ni 1 1
f ( E=
) = =
S i 1 + e β ( E − EF ) 1 + e ( E − EF ) / k B T
1
at E → ∞, f ≅ f Boltzman
= ( E ) Ae − E / kB=
T
⇒β
k BT
EE 5530 C. F. Huang 22
Another Perspective: Detailed Balance
E1 + E2 = E3 + E4
f 0 ( E1 ) f 0 ( E2 ) [1 − f 0 ( E3 ) ][1 − f 0 ( E4 ) ] −
A =0
f 0 ( E3 ) f 0 ( E4 ) [1 − f 0 ( E1 ) ][1 − f 0 ( E2 ) ]
1
The only solution is f 0 ( E ) =
1 + e β ( E − EF )
Pauli Principle, energy, and number conservation all satisfied
Analogy:
EE 5530 C. F. Huang 23
Few comments on Fermi‐Dirac
Statistics
• Applies to all spin‐1/2 particles (Pauli exclusive principle)
• Information about spin is not explicit; multiply DOS by 2.
May be more complicated for magnetic semiconductors.
• Coulomb‐interaction (coulomb blockade) among
particles is neglected, therefore it applies to extended
solids, not to small molecules
Physically apart
EE 5530 C. F. Huang 24
Carrier Distribution
EE 5530 C. F. Huang 25
Electron Concentration in 3D solids
Etop
n=∫ g c ( E ) f ( E )dE
EC
Etop mn∗ 2mn∗ ( E − EC ) 1
=∫ β ( E − EF )
dE
Ec π
2 3
1+ e
∞mn∗ 2mn∗ ( E − EC ) 1
≅∫ β ( E − Ec ) β ( Ec − EF )
dE
Ec π 2 3
1+ e e
2
= NC F1 2 (ηc )
π
∞
ξ dξ
where F1 2 (η ) = ∫ ξ −η
, Fermi-Dirac integral of order 1/2
0
1+ e
ξ= E − EC
ηc ≡ β ( EF − EC )
32
2π mn∗
NC ≡ 2 2 , Effective density of conduction band states
hβ
EE 5530 C. F. Huang 26
Boltzmann vs. Fermi‐Dirac Statistics
2
n NC F1 2 (ηc ) → N C eηc if − ηc ≡ β ( EC − EF ) > 3 or EC − EF > 3kT
π
2
F1 2 (ηc )
π
EE 5530 C. F. Huang 27
Effective Density of States
2
=n NC F1 2 (ηc ) → N C eηc if − ηc ≡ β ( EC − EF ) > 3
π
Delta function with
strength Nceηc
EE 5530 C. F. Huang 28
pn product
if β ( EC − EF ) > 3 and β ( EV − EF ) < −3
n = N C e − β ( Ec − E F )
p = N V e + β ( Ev − E F )
− β ( E c − Ev ) 3kT
n× p =N C NV e
− β Eg
= N C NV e
3kT
EE 5530 C. F. Huang 29
Fermi‐Level for Intrinsic
Semiconductors
• Intrinsic Semiconductors: no impurity, no defects
n= p= ni
− β Eg
ni2 = N C NV e
−β E g 2
ni = N C NV e
EF ≡ Ei
p ⇒ N C e − β ( Ec − Ei ) =
n= NV e + β ( Ev − Ei )
Eg 1 NV n=p
Ei
= + ln
2 2β NC
ni = 1010/cm3 in Si at room temp. not enough
to make electronic devices
EE 5530 C. F. Huang 30
Intrinsic Carrier Density
EE 5530 C. F. Huang 31
E‐k diagram vs. band‐diagram
EE 5530 C. F. Huang 32
Position Resolved E‐k Diagram
m0
m*
EE 5530 C. F. Huang 33
E‐k Diagram vs. Band‐diagram
EE 5530 C. F. Huang 34
Potential, Field and Charge
P.E=. Ec − Eref
Eref
− qV = Ec − Eref
dV 1 dEc
ε=
− =
dx q dx
ρ dε d 2V
= = − 2
ε s dx dx
EE 5530 C. F. Huang 35
Effective Density of States
2
=n NC F1 2 (ηc ) → N C eηc if − ηc ≡ β ( EC − EF ) > 3
π
EE 5530 C. F. Huang 36
E‐k diagram vs. band‐diagram
EE 5530 C. F. Huang 37
Alternative Expression for n
By defintion,
= i when E F
n n= Ei
ni = N C e − β ( Ec − Ei )
− β ( Ec − E F ) − β ( Ec − Ei ) − β ( Ei − EF ) β ( EF − Ei )
=n N=
C e N C e = e ni e
Similarly,
p = ni e β ( Ei − EF )
EE 5530 C. F. Huang 38