“Diffraction Pattern by Single Slit”
Submitted in Partial Fulfillment of the Requirements for the Degree of
Bachelor of Technology
In
Mechanical Engineering
(Under Guidance of
Dr. Vimal Kishore)
Head of Department
Dr. N.P. YADAV
Bundelkhand Institute of Engineering & Technology
(An Autonomous Institute A.K.T.U. Lucknow)
Department of Mechanical Engineering
Jhansi (U.P.) India - 284128
Session 2024-25
Bundelkhand Institute of Engineering & Technology, Jhansi (UP)
(Affiliated to Abdul Kalam Technical University, Lucknow)
CERTIFICATE
We hereby declare that the work is presented in this project entitled
“Diffraction Pattern by Single Slit” in partial Fulfilment for the award
of degree of Bachelor of Technology in Mechanical Engineering
submitted in the Department of Mechanical Engineering, Bundelkhand
Institute of Engineering & Technology, Jhansi (U.P.), India (Affiliated to
Uttar Pradesh Technical University, Lucknow) is an group work carried
out, under the guidance of Dr. Vimal Kishore , Department of Mechanical
Engineering.
We take this opportunity to express our profound gratitude
and deep regards to our guide Dr. Vimal Kishore for his
exemplary guidance, monitoring and constant
encouragement throughout the course of this report. The
blessing, help and guidance given by him time to time shall
carry us a long way in the journey of our life on which we are
about to embark. We also take this opportunity to express a
deep sense of gratitude to our honorable Head of the
Department Dr. N.P. YADAV, for his cordial support,
valuable information and guidance, which helped me in
completing this task through various stages. We are obliged
to all our faculty members for the valuable information
provided by them in their respective fields. We are grateful
for their cooperation during the period of our Project.
Lastly, we thank our friends for their constant encouragement
without which this Project would not be possible.
To study diffraction pattern by a single slit is to:
Understand Wave Behaviour
Analyse Intensity Distributions
Verify Diffraction Laws
Measure Wavelength of Light
Explore Slit Width Influence
Demonstrate Resolution Limitations
Single Slit Setup (Cardboard):
A slit mounted on a holder or a slit plate with adjustable slit
width.
Slits can be made from materials like metal or glass or blade
with precise etching.
Light Source:
A laser pointer (preferably red or green for visibility)
Screen:
A white paper, cardboard, or wall to project the diffraction pattern
Single Slit:
A cardboard or plastic sheet with a narrow slit cut into it (using a
precision knife).
Alternatively, use a pre-made slit plate or a razor blade to create
the slit.
Mounts and Supports:
Stands or clamps to hold the laser pointer, slit, and screen
steady.
A ruler or scale to measure distances and fringe widths.
Dark Room:
A dimly lit or dark space for better visibility of the diffraction
pattern
The working principle of the diffraction pattern by a single slit is
based on the phenomenon of wave interference and the Huygens-
Fresnel principle. Here's how it works:
Wavefront Division:
When light passes through a narrow slit, the slit acts as a secondary source of wavelets
(as per Huygens' principle).
Each point within the slit generates its own spherical wavelets that spread out in all
directions.
Superposition of Waves:
These wavelets interfere with each other as they propagate forward.
At certain angles, constructive interference occurs, creating bright regions, while at
other angles, destructive interference occurs, forming dark regions.
Intensity Distribution:
The intensity at any point on the screen is determined by the superposition of these
wavelets and depends on the phase difference between them.
The condition for minima (dark bands) is:
𝒂𝒔𝒊𝒏 𝜽 = 𝒎𝝀
Where:
𝒂 = Width of the slit
𝜽 = Angle at which the minimum occurs
𝐦 = Order of the minimum (𝑚 = ±1,±2, ±3 … … … excluding m=0m = 0m=0)
𝝀 = Wavelength of the light
[Explanation:
1. The light passing through different parts of the slit interferes.
2. At certain angles (𝜽), the path difference between light from one edge of the slit
and the other becomes an integer multiple of the wavelength (𝒎𝝀).
3. At these angles, destructive interference occurs, creating dark bands.
Key Notes:
The central maximum (m=0m = 0m=0) is bright and not a minimum.
The first minimum (𝒎 = ±1) is adjacent to the central maximum on either
side.
The higher-order minima (𝒎 = ±2, ±3……) occur progressively farther from
the centre. ]
The central maximum is the brightest region, and the intensity of subsequent
maxima decreases progressively.
Angular Position:
The angular position of the maxima and minima depends on the wavelength of light
and the width of the slit.
Diffraction Pattern Formation:
On a screen placed at some distance from the slit, a series of bright and dark fringes
(diffraction pattern) is observed.
The pattern consists of a central bright fringe (central maximum) that is wider and
brighter, flanked by secondary maxima and minima.
This principle demonstrates the wave nature of light
and is crucial for understanding phenomena like
optical resolution and wave interference.
To test and analyze the diffraction pattern
produced by a single slit, follow the steps below:
Apparatus Required:
1. Single-slit setup (slit width adjustable).
2. Monochromatic light source (e.g., laser).
3. Screen or detector (to observe the pattern).
4. Optical bench (for alignment of the setup).
5. Measuring tools (ruler or micrometer, to measure
distances and slit width).
Experimental Setup:
1. Place the monochromatic light source (such as a laser) on
one end of the optical bench.
2. Position the single slit in front of the light source, ensuring
the slit is perpendicular to the light beam.
3. Place a screen at a distance from the slit to observe the
diffraction pattern.
4. Align all components carefully to ensure the light beam
passes through the center of the slit.
Procedure:
1. Align the Setup:
Ensure the laser beam passes through the center of the slit.
Verify that the screen is aligned parallel to the slit.
2. Adjust Slit Width:
Adjust the slit width to observe changes in the diffraction
pattern.
Start with a narrow slit to ensure significant diffraction
occurs.
3. Observe the Diffraction Pattern:
A central bright fringe (central maximum) will appear on
the screen, flanked by alternating dark and bright fringes.
Note that the central maximum is the widest and brightest.
4. Measure Dimensions:
Measure the distance.
EXAMPLARY IMAGE OF MODEL
The conclusion of the single-slit diffraction experiment
highlights the key observations and principles underlying
wave optics. Here are the main points:
1. Nature of Light:
The experiment confirms the wave nature of light, as the diffraction
pattern cannot be explained by particle theory alone.
It demonstrates that light spreads out when it passes through a narrow
aperture, a fundamental property of waves.
2. Central Maximum:
The central maximum is the brightest and widest part of the
diffraction pattern.
Its intensity is significantly greater than that of the secondary
maxima.
The width of the central maximum is inversely proportional to the
slit width (𝒂), i.e., a narrower slit results in a broader central
maximum.
3. Intensity Distribution:
The intensity of the diffraction pattern decreases as we move away
from the central maximum.
Secondary maxima are fainter and narrower compared to the central
maximum.
4. Position of Minima:
The dark bands (minima) occur at angles given by 𝑎𝑠𝑖𝑛 𝜃 = 𝑚𝜆
where 𝑚= ±1, ±2, ±3…….
These minima are equally spaced on either side of the central
maximum for small angles.
5. Effect of Wavelength:
Longer wavelengths (𝝀) result in wider diffraction patterns.
This shows the dependence of diffraction on the wavelength of light.
6. Effect of Slit Width:
A narrower slit produces a broader diffraction pattern, demonstrating
the inverse relationship between slit width (aaa) and the angular
width of the central maximum.
Conclusion Statement:
The single-slit diffraction experiment provides clear
evidence of the wave behaviour of light, illustrating key
phenomena such as constructive and destructive
interference. The pattern's dependence on slit width and
wavelength is consistent with theoretical predictions,
validating the mathematical framework of wave optics.
o https://en.wikipedia.org.com:- for content
o https://www.youtube.com:- for guidance
o https://www.canva.com/ai-image-generator:- for image
generate
o Krishna’s Educational Publishers Engineering Physics by:-
S.K.GUPTA.
o NITIN KUMAR
o MADHAV GAHLOUT
o HARSHANK AGARWAL
