Overview of mixed signal testing
Goals
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Review of basics of digital devices Review of basics of analog devices Review of components in a typical digital test system Review of components in a traditional analog test system Thoroughly explain the components of a mixed signal test system
2006/9/15
Dept. of Electronic Engineering, National Yunlin Univ. of Science and Technology. ~ Weir Lin
Digital signals
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Two signal levels.
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On/off, 1/0. Word = 2 bytes = 4 nibbles = 16 bits. Always valid no matter how much time passes. Sequence or group of levels. Control signals. Number storage. Unsuitable for high speed transmission.
Dept. of Electronic Engineering, National Yunlin Univ. of Science and Technology. ~ Weir Lin
Information storage with digital signals.
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Serial or parallel data.
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Uses for digital signals.
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2006/9/15
Standard logic symbols
inverter NAND NOR XNOR
'
6(7
buffer AND OR XOR
D flip-flop
&/ 5
2006/9/15
Dept. of Electronic Engineering, National Yunlin Univ. of Science and Technology. ~ Weir Lin
Digital test systems
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Basic components
pattern memory Format, Timeset memory Remote host Network interface
Measurement unit Test option Clock, External Calibration instrument Circuit
Load board
Test system controller CPU Reference & device power supplies Header
System power supplies
2006/9/15
Dept. of Electronic Engineering, National Yunlin Univ. of Science and Technology. ~ Weir Lin
Digital test systems
2006/9/15
Dept. of Electronic Engineering, National Yunlin Univ. of Science and Technology. ~ Weir Lin
Fundamental digital test items
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Functional testing
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Evaluation of device functionality verifies that a device s transfer function matches the one which it was designed. Test Vector : a parallel set of test patterns. May require millions of test vectors.
Vector 1 Vector 2 Output Output strobe
2006/9/15
Dept. of Electronic Engineering, National Yunlin Univ. of Science and Technology. ~ Weir Lin
Fundamental digital test items
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Logic level
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Place input levels at worst case conditions and monitor output levels to make sure that they are within specification limits.
VIH=2v VIL =0.8v VOH=2.4v VOL=0.4v
2006/9/15
Dept. of Electronic Engineering, National Yunlin Univ. of Science and Technology. ~ Weir Lin
Fundamental digital test items
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Parametric testing
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Get precise data on a pin condition s
DC measurement
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Use PMU (parametric measurement unit or precision measurement unit) Voltage output low/high, power supply current input leakage current .
2006/9/15
Dept. of Electronic Engineering, National Yunlin Univ. of Science and Technology. ~ Weir Lin
10
Fundamental digital test items
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Absolute measurement
Output edge strobe period
Relative measurement
Output edge Phase Phase Phase Phase 1 2 3 4 move
Setup time
2006/9/15 Dept. of Electronic Engineering, National Yunlin Univ. of Science and Technology. ~ Weir Lin
11
Analog signals
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Continuously and infinite levels Contain a lot of information in a little bit of signal.
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Variation in frequency, amplitude, phase . DC analog signal provides no information, only power.
Contain no information without time
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Analog building blocks do mathematical operations on signal. This is why they were names analog signals, because they were used to mimic the behavior of physical systems, thus the signals are analogous to real world.
2006/9/15
Dept. of Electronic Engineering, National Yunlin Univ. of Science and Technology. ~ Weir Lin
12
Analog test system
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Rack and stack system.
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Instrument.
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Oscilloscope, pattern generator, arbitrary waveform generator, spectrum analyzer, network analyzer, LCR meter
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Mini-computer based. I/O interface.
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IEEE-488(GPIB), RS-232, ethernet .
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Long test time. Precise reference trigger system. If device is unique, a new load board must be created.
2006/9/15
Dept. of Electronic Engineering, National Yunlin Univ. of Science and Technology. ~ Weir Lin
13
Mixed signal circuits
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Mixed signal devices are those which mix analog and digital circuits
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ADC, DAC, sample-hold or track-hold, SC circuit .
Categories of specification
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Dynamic range Resolution Conversion accuracy Conversion speed Signal boundary Linearity
Dept. of Electronic Engineering, National Yunlin Univ. of Science and Technology. ~ Weir Lin
2006/9/15
14
Mixed signal tester
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The use of DSP to analyze and generate analog signal via digital signal.
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Reduce test time and enhance accuracy.
Clock, timing synchronization
Control, stimulus Device Under test
Waveform digitizer Waveform generator
Vector memory
Conditioning, measurement
Storage (capture) memory
DSP processor
Digital subsystem
Measurement unit
Analog subsystem
2006/9/15
Dept. of Electronic Engineering, National Yunlin Univ. of Science and Technology. ~ Weir Lin
