VLSIGURU DFT TRAINING SCAN INSERTION LAB OBSERVATIONS
SCAN INSERTION LAB OBSERVATIONS
Test Case 2: -
Problem Definition: - Design has S2 violations, fix using command
Inputs: -
Synthesis Netlist
Library Model
Dofile commands
Outputs: -
Scan inserted Netlist
ATPG Dofile
ATPG Testproc
Scan Def
What is issue?
Ans. Design has 3 S2 violations
How resolved?
Ans.Set test logic –set on –reset on –clock on =>dofile command adds required mux
and inverter gates to clear DRC violations
Observations: -
1) Write block diagram with all DFT inputs?
FastClk
Reset
Input Scan Channel Top Design: DmaWr
Output Scan channel
Scan_En
Testen
2) How many clock domains?
Ans. FastClk
3) How many resets?
Ans. Reset
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VLSIGURU DFT TRAINING SCAN INSERTION LAB OBSERVATIONS
4) Number of scan chains
Ans. 1 scan chain
5) Clock mixing or not clock mixing?
Ans.Not clock mixing
6) How many Lockup-latches are added during scan insertion?
Ans.No lockup latches are added during scan insertion.
7) Is it top-down or bottom up approach?
Ans. Top-down approach
8) How many terminal lockup latches are added?
Ans. zero
9) Number of scan flops and non-scan flops in the
design? Ans. 37scannable flops and 3 non-scan elements
10) Chain length?
Ans. 40.
11) Number of DRC
violations? Ans. 3 S2violations
12) Write diagram with issues? (2 out of total 4)
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VLSIGURU DFT TRAINING SCAN INSERTION LAB OBSERVATIONS
13) Write diagram with solution?
14) Log file: - please note your observations from the log file
Ans.Top module is DmaWr
Number of shift registers =2
Number of MUX inserted =3
Number of new Pins inserted= 4 (1 scan inputs, 1 scan outputs, scan_en, test_en )
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